CN-122003595-A - System and method with tilted light path for edge/corner defect imaging/repair of installed hollow glass units

Abstract

The present disclosure provides defect mitigator systems and methods having oblique optical paths that identify and/or mitigate one or more defects in an electronic device of an installed hollow glass unit, wherein the defects are located at edges or corners of the spacer or below the spacer.

Inventors

• Bruce. Baum Baxter

Assignees

• 唯景操作公司

Dates

Publication Date

20260508

Application Date

20231214

Priority Date

20230803

Claims (20)

1. 1. A defect mitigator system, comprising: One or more optical elements configured to provide a final oblique optical path for the imaging illumination and the mitigation laser beam, wherein the final oblique optical path is incident at an angle to a surface of a light sheet (lite) having electronic devices disposed thereon, and An imaging system for detecting one or more defects in the electronic device based on light from the imaging illumination reflected from the surface of the light sheet.
2. 2. The defect mitigator system of claim 1, wherein the one or more optical elements comprise one or more focusing lenses to focus the imaging illumination and the mitigation laser beam along the final oblique optical path at a focal plane at the surface of the optical sheet.
3. 3. The defect mitigator system of claim 1, wherein the one or more optical elements include a first mirror fixed at a first angle and a second mirror fixed at a second angle.
4. 4. The defect mitigator system of claim 3, wherein the first angle of the first mirror and the second angle of the second mirror provide the final oblique optical path at the angle of incidence to the surface of the optical sheet.
5. 5. The defect mitigator system of claim 3, wherein the one or more optical elements comprise a dichroic mirror for delivering the mitigation laser beam to the first mirror and for reflecting the imaging illumination from the surface of the light sheet to a camera.
6. 6. The defect mitigator system of claim 1, wherein the one or more optical elements are configured to provide a field of view for the imaging illumination and the mitigation laser beam, the field of view being located (i) at a corner or an inner edge of a spacer of an installed hollow glass unit, or (ii) below the spacer of the installed hollow glass unit.
7. 7. The defect mitigator system of claim 1, wherein the mitigation laser beam is configured to mitigate one or more defects in the electronic device located (i) at corners or inner edges of a spacer of an installed hollow glass unit, or (ii) below the spacer of the installed hollow glass unit.
8. 8. The defect mitigator system of claim 1, wherein the mitigation laser beam is configured to limit one or more defects in the electronic device at or proximate to corners or inner edges of spacers of installed hollow glass units.
9. 9. The defect mitigator system of claim 1, further comprising a laser input for receiving the mitigation laser beam from at least one laser source.
10. 10. The defect mitigator system of claim 9, further comprising one or more optical fibers in communication between the at least one laser source and the laser input.
11. 11. The defect mitigator system of claim 1, further comprising one or more translation stages on which the one or more optical elements are mounted.
12. 12. The defect mitigator system of claim 11, wherein the one or more translation stages are configured to translate the one or more optical elements to provide a field of view of the imaging illumination and the mitigation laser beam, the field of view being at or proximate to a corner or an inner edge of a spacer of an installed hollow glass unit.
13. 13. The defect mitigator system of claim 12, wherein the one or more translation stages comprise: (i) An X-Y stage for translating the one or more optical elements in a plane parallel to the surface of the light sheet, and a Z stage configured to translate the one or more optical elements in a direction perpendicular to the plane, or (Ii) A single stage configured to translate the one or more optical elements in an x-direction, a y-direction, and/or a z-direction.
14. 14. A method of mitigating one or more defects in an optical sheet of an installed hollow glass unit, the method comprising: incrementally moving the focal plane of the illumination beam to a plurality of heights; capturing an image at each of the plurality of heights, wherein during each exposure time during which the image is captured, the illumination beam translates in a cyclical motion; Determining a plurality of difference images by subtracting the background image from each captured image; Determining a plurality of uncolored regions in the light sheet from the plurality of difference images, and A focal plane is determined based on an uncolored region from the plurality of uncolored regions having a maximum intensity and/or a minimum spot area.
15. 15. The method of claim 14, wherein the focal plane of the illumination beam is incrementally moved by 50 mm.
16. 16. The method of claim 14, further comprising determining a starting height of the plurality of heights based on whether relief is made from an interior or exterior of a structure in which the installed hollow glass unit is installed.
17. 17. The method of claim 14, further comprising determining the background image by imaging a portion of the light sheet that does not contain the uncolored region.
18. 18. The method as in claim 14, further comprising: determining information about the installed hollow glass unit, and The plurality of altitudes is determined based on the information.
19. 19. The method of claim 14, further comprising determining a limiting path of a relief laser beam at the focal plane based on a centroid of the uncolored region having the maximum intensity and/or the minimum spot area.
20. 20. The method of claim 14, further comprising confining the one or more defects by focusing a mitigation laser beam at the focal plane.

Description

System and method with tilted light path for edge/corner defect imaging/repair of installed hollow glass units Cross Reference to Related Applications The present application claims the benefit and priority of U.S. provisional application 63/517,579, entitled "system and method for edge/corner defect imaging/repair of an installed hollow glass unit （SYSTEMS AND METHODS WITH TILTED OPTICAL PATH FOR EDGE/CORNER DEFECT IMAGE/REPAIR ON INSTALLED INSULATED GLASS UNIT）", filed on 3, 2023, and entitled" portable defect mitigator for electrochromic window (PORTABLE DEFECT MITIGATORS FOR ELECTROCHROMIC WINDOWS) ", the present application is also a partial continuation of U.S. patent application 16/949,703 filed on 11, 2020, entitled" portable defect mitigator for electrochromic window (PORTABLE DEFECT MITIGATORS FOR ELECTROCHROMIC WINDOWS) ", which is a continuation of U.S. patent application 16/949,703, filed on 12, 2017, entitled" portable defect mitigator for electrochromic window (PORTABLE DEFECT MITIGATORS FOR ELECTROCHROMIC WINDOWS) ", which is a continuation of 15/833,924, which is a division of U.S. patent application 13/859,623 filed on 4, 2013, which is a partial continuation of U.S. patent application 13/610,612, filed on 11, 2012, which is a provisional application No. 13/612, and which is a full disclosure of U.S. patent application No. 14,614, 2012, which is filed on 11, 2012, and which is incorporated by reference herein in its entirety by reference, and claims for all patent application No. 13/859,534, which is filed on 4, and filed on 14, and entitled" provisional application of full disclosure on the same reference as that is incorporated herein by reference. Technical Field The present disclosure relates to apparatus, systems, and methods for alleviating defects in electronic devices on a substrate, such as flat panel displays, photovoltaic windows, electrochromic devices, and the like, particularly electrochromic windows, for example, that an end user may visually perceive such defects in the electronic device. Background Electrochromic is a phenomenon that exhibits reversible electrochemically mediated changes in optical properties when a material is placed in different electronic states, typically subjected to a change in voltage. The optical characteristic is typically one or more of color, transmittance, absorbance, and reflectance. While electrochromic has been discovered in the 60 s of the 20 th century, electrochromic devices unfortunately still present various problems and have not yet begun to realize their full commercial potential. Electrochromic materials may be incorporated into windows and mirrors, for example. The color, transmittance, absorbance and/or reflectance of such windows and mirrors may be altered by inducing changes in the electrochromic material. However, there is a need for improvements in electrochromic technology, equipment, and related methods of making and/or using them, as conventional electrochromic windows suffer from problems such as high deficiencies and low versatility. Electrochromic windows are manufactured by forming electrochromic devices on panes of transparent material. During the production process, the electrochromic device on the pane is checked in detail for any defects that may cause visual distortion or anomalies to the end user of the window. These drawbacks are then alleviated. Mitigation may include isolating short-circuit type defects using a probe, and then overloading and breaking the short-circuit conduction path by applying a localized arc, thereby "quick clearing" (zap) the short-circuit defect. Other mitigation methods include, for example, identifying visual defects, and then confining each defect with a laser, electronically isolating the defect, and thereby reducing or eliminating visual effects that would otherwise occur if the window were in a colored state. Similar mitigation measures have also been taken for other electronic devices on the substrate, such as flat panel displays, in which such defects can be visually perceived by the end user. Defects of electronic devices on one machine may be analyzed and then mitigated on another machine in the production facility setting. Such defect detection and mitigation equipment for flat panel displays is commercially available under the trade names ARRAYCHECKER TM and ARRAYSAVER TM, manufactured by, for example, oribotech corporation of bellica, ma. Disclosure of Invention Systems, methods, apparatus for identifying and mitigating defects in electronic devices on a substrate, which may be included in flat panel displays, photovoltaic windows, electrochromic windows, and the like. In some cases, the apparatus may be a portable defect mitigator that can be easily transported to identify and mitigate defects in electronic devices located in the field (e.g., electrochromic windows installed in a building). The portable defect mitigator may be a hand-held operated design that can be easily ma