CN-122016040-A - Hg system+Automatic abnormality detection method for microwave clock

CN122016040ACN 122016040 ACN122016040 ACN 122016040ACN-122016040-A

Abstract

The invention provides an automatic anomaly detection method of an Hg + microwave clock, which comprises the steps of setting comparison thresholds of items of spectrum lamp voltage, current, temperature, ambient temperature, crystal oscillator temperature and microwave state, setting sampling time TO be T after power-on starting, starting multi-thread polling, sampling the spectrum lamp voltage VL, the current CL, the ambient temperature TL, the ambient temperature TE, the crystal oscillator temperature TO and the microwave state WS, sending sampling data TO an upper computer through a serial port after sampling, calculating each item through a comparison algorithm TO obtain an anomaly characterization value, obtaining whether the item or the state is abnormal according TO the anomaly characterization value, eliminating a current fluorescence detection result when an anomaly detection mechanism detects the corresponding anomaly, and carrying out fluorescence detection again on the current state TO assist experimenters TO rapidly and accurately locate the anomaly, so that the anomaly does not have any influence on an experimental system and experimental data.

Inventors

PAN YAN
WANG NUANRANG
WANG YUNJIA
FENG SHILONG
XUE XIAOBO
ZHANG SHENGKANG

Assignees

北京无线电计量测试研究所

Dates

Publication Date: 20260512
Application Date: 20251226

Claims (6)

1. An automatic anomaly detection method for an Hg + microwave clock is characterized by comprising the following steps: setting comparison thresholds of spectrum lamp voltage, current, temperature, environment temperature, crystal oscillator temperature and microwave state items; after power-on is started, setting the sampling time as T, starting multithreading polling, sampling the voltage VL, the current CL, the ambient temperature TL, the ambient temperature TE, the crystal oscillator temperature TO and the microwave state WS of the spectrum lamp, and after sampling, sending sampling data TO an upper computer through a serial port; Calculating each item through a comparison algorithm to obtain an abnormal characterization value; obtaining whether the item or the state is abnormal or not according to the abnormal characterization value; When the abnormality detection mechanism detects the corresponding abnormality, the current fluorescence detection result is removed, and the current state is subjected to fluorescence detection again.
2. The method of claim 1, wherein the comparison threshold comprises an upper limit and a lower limit, which are respectively a spectrum lamp voltage VL MAX 、VL MIN , a current CL MAX 、CL MIN , an ambient temperature TE MAX 、TE MIN and a crystal oscillator temperature TO MAX 、TO MIN .
3. The method of claim 2, wherein the formula of the comparison algorithm is: VL MIN ≤VL≤VL MAX CL MIN ≤CL≤CL MAX TL MIN ≤TL≤TL MAX TE MIN ≤TE≤TE MAX TO MIN ≤TO≤TO MAX 。
4. A method according to claim 3, wherein the obtaining of the anomaly characterization value is achieved by the following algorithm: the algorithm of the state item is: The characterization value algorithm is as follows:
5. The method of claim 4, wherein deriving whether the item or the state is abnormal based on the abnormality characterization value comprises: if the spectrum lamp temperature threshold is set to be [20 ℃ and 60 ℃, and the actually measured spectrum lamp temperature is 75 ℃, the abnormal characterization value of the spectrum lamp temperature is 0, and the system can indicate the occurrence time and the occurrence position of the current abnormality and display the current abnormality in a human-computer interface.
6. The method of claim 5, wherein when the anomaly detection mechanism detects a corresponding anomaly, the fluorescence detection result is not applicable to the lock computation and the point data is re-measured.

Description

Automatic abnormality detection method for Hg + microwave clock Technical Field The invention relates to the technical field of anomaly detection, in particular to an automatic anomaly detection method for an Hg + microwave clock. Background The Hg + microwave clock is a high-precision frequency standard based on a novel working principle, and the performance of the Hg + microwave clock is obviously superior to that of the traditional atomic frequency standard such as hydrogen, rubidium, cesium and the like. The system has three outstanding advantages of extremely strong anti-interference capability on physical particles and external field disturbance, extremely small influence of motion effect and remarkably prolonged quantum state coherence time. Because the whole system has complex structure and needs long-term power-up operation, the system must quickly locate the abnormality when faults occur, and when no human value is kept, the system automatically operates, if fault data is confirmed and used by the system, the experimental result can be greatly influenced. Therefore, a complete automatic abnormality detection method must be implemented, so that an experimenter is assisted in rapidly and accurately positioning an abnormality, the abnormality is ensured not to have any influence on an experimental system and experimental data, and meanwhile, an abnormality data removal method is provided, so that an accurate guarantee is provided for long-term stable operation of the experimental system. Disclosure of Invention The invention provides an automatic detection method for abnormality of an Hg + microwave clock, which is used for assisting experimenters in rapidly and accurately positioning the abnormality and ensuring that the abnormality does not have any influence on an experimental system and experimental data. In a first aspect, there is provided a method for automatically detecting an abnormality of an Hg + microwave clock, including: setting comparison thresholds of spectrum lamp voltage, current, temperature, environment temperature, crystal oscillator temperature and microwave state items; after power-on is started, setting the sampling time as T, starting multithreading polling, sampling the voltage VL, the current CL, the ambient temperature TL, the ambient temperature TE, the crystal oscillator temperature TO and the microwave state WS of the spectrum lamp, and after sampling, sending sampling data TO an upper computer through a serial port; Calculating each item through a comparison algorithm to obtain an abnormal characterization value; obtaining whether the item or the state is abnormal or not according to the abnormal characterization value; When the abnormality detection mechanism detects the corresponding abnormality, the current fluorescence detection result is removed, and the current state is subjected to fluorescence detection again. In one embodiment, the comparison threshold includes an upper limit and a lower limit, which are respectively a spectrum lamp voltage VL MAX、VLMIN, a current CL MAX、CLMIN, an ambient temperature TE MAX、TEMIN, and a crystal oscillator temperature TO MAX、TOMIN. In one embodiment, the formula of the comparison algorithm is: VLMIN≤VL≤VLMAX CLMIN≤CL≤CLMAX TLMIN≤TL≤TLMAX TEMIN≤TE≤TEMAX TOMIN≤TO≤TOMAX。 In one embodiment, the anomaly characterization value is obtained by the following algorithm: the algorithm of the state item is: The characterization value algorithm is as follows: in one embodiment, obtaining whether the item or the state is abnormal according to the abnormal characterization value includes: if the spectrum lamp temperature threshold is set to be [20 ℃ and 60 ℃, and the actually measured spectrum lamp temperature is 75 ℃, the abnormal characterization value of the spectrum lamp temperature is 0, and the system can indicate the occurrence time and the occurrence position of the current abnormality and display the current abnormality in a human-computer interface. In one embodiment, when the anomaly detection mechanism detects a corresponding anomaly, the fluorescence detection result is not suitable for the lock calculation and the point data needs to be re-measured. The embodiment of the invention provides an automatic anomaly detection method for an Hg + microwave clock, which comprises the steps of setting comparison thresholds of spectral lamp voltage, current, temperature, ambient temperature, crystal oscillator temperature and microwave state items, setting sampling time TO be T after power-on, starting multi-thread polling, sampling the spectral lamp voltage VL, current CL, ambient temperature TL, ambient temperature TE, crystal oscillator temperature TO and microwave state WS, sending sampling data TO an upper computer through a serial port after sampling, calculating each item through a comparison algorithm TO obtain an anomaly characterization value, obtaining whether the item or the state is abnormal according TO the anomaly characteri