Search

CN-122016416-A - Transmission electron microscope carrier net collecting system and method for nano particles

CN122016416ACN 122016416 ACN122016416 ACN 122016416ACN-122016416-A

Abstract

The invention provides a transmission electron microscope carrier net collecting system and a transmission electron microscope carrier net collecting method for nano particles, which enable the nano particles carried by carrier gas to be smoothly introduced into the system through the communication design of a connecting device and an external air source, avoid pollution risks caused by repeated transfer in the traditional method, enable a converging pipeline to be positioned above a clamping cavity and enable an outlet end to face a carrier net supporting surface, enable air flow and particles to directionally move, enable the nano particles to be deposited on the carrier net in a concentrated mode, reduce loss or adhesion of the particles in the cavity, remarkably improve deposition efficiency, enable an exhaust pipeline to be communicated with the clamping cavity and the outside, enable the carrier gas to be stably discharged in the deposition process, form a controllable air flow field, and prevent air flow vortex or backflow from interfering deposition uniformity. The system simplifies the operation flow through structural integration, does not need an intermediate collecting medium, directly realizes transition from a gaseous environment to a transmission electron microscope carrier network, and reduces the possibility of particle agglomeration and morphology change.

Inventors

  • FAN BOWEN
  • CHENG GUANGHUA

Assignees

  • 西北工业大学

Dates

Publication Date
20260512
Application Date
20260311

Claims (10)

  1. 1. A transmission electron microscope-based collection system for nanoparticles, comprising: the transmission electron microscope screen clamping device comprises a screen clamping device (1), wherein a clamping cavity (11) for accommodating a transmission electron microscope screen (2) is arranged in the screen clamping device, and a screen supporting surface (12) is arranged in the clamping cavity (11); the connecting device (3) is detachably connected with the net carrying clamping device (1), and the connecting device (3) is provided with an air inlet channel (31) communicated with an external air source (4); The convergence pipeline (13) is arranged in the net carrying clamping device (1) and is positioned above the clamping cavity (11), and the outlet end of the convergence pipeline (13) faces the net carrying supporting surface (12); And the exhaust pipeline (14) is arranged in the net carrying clamping device (1) and is communicated with the clamping cavity (11) and the outside.
  2. 2. The transmission electron microscope carrier collection system for nanoparticles according to claim 1, characterized in that the carrier clamping device (1) and the connecting device (3) are detachably connected by means of mutually cooperating screw structures.
  3. 3. The grid-mounted collection system for nanoparticles of claim 1, wherein the converging channel (13) is of a funnel-shaped configuration with an inner wall at an angle of 20 ° to 60 ° to the axis of the converging channel (13).
  4. 4. A transmission electron microscope-based collection system for nanoparticles according to claim 3, characterized in that the inner wall of the converging channel (13) is at an angle of 30 ° to the axis of the converging channel (13).
  5. 5. The transmission electron microscope grid collection system for nanoparticles according to claim 1, characterized in that the exhaust duct (14) comprises two symmetrically arranged cylindrical ducts (141), the inlet end of the cylindrical duct (141) being at the same level as the grid support surface (12).
  6. 6. The transmission electron microscope carrier net collecting system for nano particles according to claim 1, wherein the bottom of the carrier net clamping device (1) is further provided with a carrier net taking and placing channel (15) communicated with the clamping cavity (11).
  7. 7. The transmission electron microscope carrier collection system for nanoparticles according to claim 1, characterized in that the outside of the carrier holding device (1) is further provided with a columnar outer structure (16).
  8. 8. A method of collecting nanoparticles by transmission electron microscopy, implemented on the basis of a transmission electron microscopy collection system for nanoparticles according to any one of claims 1 to 7, characterized in that it comprises: S1, arranging a transmission electron microscope carrier net (2) in a clamping cavity (11) of a carrier net clamping device (1); S2, introducing the gas flow loaded with the nano particles into the system through a connecting device (3); S3, guiding the air flow through a convergence pipeline (13) and then depositing the air flow on the transmission electron microscope carrier net (2); and S4, exhausting the deposited airflow out of the system through an exhaust pipeline (14).
  9. 9. The method according to claim 8, wherein in step S3, the nanoparticles are uniformly deposited on the carrier web by controlling the air flow rate of the air exhaust duct (14).
  10. 10. The method according to claim 8, wherein in the step S1, the operation of picking and placing the transmission electron microscope carrier web (2) is performed by using a jig through the carrier web picking and placing channel (15).

Description

Transmission electron microscope carrier net collecting system and method for nano particles Technical Field The invention belongs to the technical field of nano materials, and particularly relates to a transmission electron microscope grid-loaded collection system and method for nano particles. Background The nano material has wide application potential in the fields of catalysis, photoelectric devices, biomedical materials, energy conversion and the like by virtue of the unique microcosmic characteristics of large specific surface area, high surface energy, size effect, quantum effect and the like. The characteristics enable parameters such as particle size distribution, morphology, crystal structure and the like of the nano particles to directly determine macroscopic performance of the nano particles, so that reliable control and characterization of microscopic characteristics of the particles become a key foundation in research and development of high-precision nano materials. In order to obtain high-purity and low-pollution nano-particles, a gaseous environment preparation method (such as laser ablation and vapor deposition) is favored because of controllable reaction and wide applicability, however, the nano-particles usually exist in an aerosol form in a gaseous environment and must be efficiently collected and deposited on a Transmission Electron Microscope (TEM) carrier network so as to utilize high-resolution imaging of the TEM for particle size, morphology and defect analysis. The direct deposition mode can avoid errors caused by intermediate steps, and is a core link for ensuring the authenticity and statistical reliability of characterization data. However, the current method for collecting the nano particles in the gaseous environment is mainly dependent on methods such as filtration membrane filtration, liquid trapping or electrostatic deposition, and the like, and has the obvious defects that firstly, the collection efficiency is low, the air flow field is controlled unstably, so that the particles are deposited unevenly on a TEM (transmission electron microscope) carrier network, agglomeration or morphology change is easy to cause, secondly, a sample is required to be transferred to the carrier network for the second time, pollution risks and human errors are introduced, and finally, in-situ characterization of the nano particles with short service life or high activity cannot be supported, so that the technical problems of accuracy and efficiency of nano material research are limited. Disclosure of Invention In order to solve the technical problems that in the background technology, the collection of the nano particles in the current gaseous environment is mostly dependent on methods such as filtration membrane filtration, liquid trapping or electrostatic deposition, and the like, the methods are easy to cause agglomeration or morphology change, introduce pollution risks and human errors, are limited in use and restrict the accuracy and efficiency of nano material research, the invention provides a transmission electron microscope carrier network collection system and a transmission electron microscope carrier network collection method for the nano particles. In order to achieve the above purpose, the present invention adopts the following technical scheme: In a first aspect, the present invention provides a transmission electron microscope-based collection system for nanoparticles, comprising: the holding cavity for holding the transmission electron microscope carrier net is arranged in the carrier net holding device, the inner part of the clamping cavity is provided with a net carrying supporting surface; the connecting device is detachably connected with the carrying net clamping device and is provided with an air inlet channel communicated with an external air source; The convergence pipeline is arranged in the screen-carrying clamping device and is positioned above the clamping cavity, and the outlet end of the convergence pipeline faces the screen-carrying supporting surface; and the exhaust pipeline is arranged in the net carrying clamping device and is communicated with the clamping cavity and the outside. Optionally, the carrying net clamping device and the connecting device are detachably connected through mutually matched thread structures. Optionally, the converging duct is of a funnel structure, and an included angle between an inner wall of the converging duct and an axis of the converging duct is 20 ° to 60 °. Optionally, the inner wall of the convergent channel is at an angle of 30 ° to the convergent channel axis. Optionally, the exhaust pipeline comprises two symmetrically arranged cylindrical pipelines, and the inlet ends of the cylindrical pipelines and the supporting surface of the carrier net are positioned at the same horizontal height. Optionally, a carrying net picking and placing channel communicated with the clamping cavity is further arranged at the bottom of th