CN-122016874-A - Multi-system microwave nondestructive testing imaging scanning system and method

CN122016874ACN 122016874 ACN122016874 ACN 122016874ACN-122016874-A

Abstract

A multi-system microwave nondestructive testing imaging scanning system and method relate to the technical field of nondestructive testing and comprise a near-field probe, a single-port vector network analyzer, a plane scanning frame and an upper computer, wherein the near-field probe is used for transmitting microwave signals to a tested target and receiving reflected microwave signals formed by reflection of the tested target, a test port of the single-port vector network analyzer is in communication connection with the near-field probe and used for receiving reflected microwave signals returned by the near-field probe and carrying out analysis and calculation to demodulate S11 complex parameters of the tested target, the plane scanning frame is used for carrying the near-field probe and carrying out two-dimensional space point-by-point scanning on a tested target detection plane, the upper computer is respectively in communication connection with the single-port vector network analyzer and the plane scanning frame and respectively transmits a movement control instruction and a sweep frequency parameter configuration instruction to the plane scanning frame and the single-port vector network analyzer, meanwhile, the single-port vector network analyzer is used for receiving S11 complex parameters uploaded by the single-port vector network analyzer and constructing an original three-dimensional data matrix, and the system is used for solving the problems of complex structure and low defect identification degree in the traditional system.

Inventors

ZHANG HUABIN
Liao Lingtou
XIAN LIANG
LIU XIAOLONG
HU AOYU
SHU GUOQIANG
HUANG YICHENG
WEN QIANG
LI MINGLIN
LIU HONGJUN

Assignees

成都菲斯洛克电子技术有限公司

Dates

Publication Date: 20260512
Application Date: 20260416

Claims (10)

1. A multi-system microwave non-destructive inspection imaging scanning system, comprising: The near-field probe is used for transmitting microwave signals to the measured target and receiving reflected microwave signals formed by the reflection of the measured target; the single-port vector network analyzer is used as a detection host, a test port of the single-port vector network analyzer is in communication connection with the near-field probe and is used for receiving reflected microwave signals returned by the near-field probe, analyzing and calculating the reflected microwave signals in a preset sweep frequency range, demodulating S11 complex parameters of a detected target, wherein the S11 complex parameters comprise amplitude information and phase information; the plane scanning frame is used for carrying the near-field probe and moving along the X-axis and Y-axis directions according to the control instruction in a preset stepping way to realize the point-by-point scanning of the two-dimensional space of the detected plane of the detected object, each stay position on the moving track of the plane scanning frame is a scanning point, and each scanning point corresponds to a unique two-dimensional space coordinate point; The upper computer is respectively in communication connection with the single-port vector network analyzer and the plane scanning frame and is used for issuing a movement control instruction to the plane scanning frame, issuing a sweep frequency parameter configuration instruction to the single-port vector network analyzer, receiving S11 complex parameters of each scanning point uploaded by the single-port vector network analyzer in a sweep frequency range, and constructing a space X-axis, a space Y-axis and a frequency containing space X-axis, space Y-axis Original three-dimensional data matrix of axes And imaging analysis software is integrated in the upper computer.
2. The multi-system microwave nondestructive testing imaging scanning system of claim 1, wherein the working distance of the near-field probe is less than one wavelength for obtaining sub-wavelength resolution information of the measured object.
3. The multi-system microwave nondestructive testing imaging scanning system of claim 1, wherein the imaging analysis software comprises: the amplitude imaging module is used for extracting reflection amplitude information of each scanning point under a specific frequency point from the original three-dimensional data matrix and generating an amplitude image; the phase imaging module is used for extracting reflection phase information of each scanning point under a specific frequency point from the original three-dimensional data matrix and generating a phase image; the synthetic aperture radar imaging module is used for regarding each scanning point as a virtual array element, performing phase compensation and coherent accumulation processing on any point in an imaging area, realizing transverse focusing enhancement and generating SAR images; the time domain reflection imaging module is used for transforming the frequency domain measurement data in the original three-dimensional data matrix into the time domain, acquiring reflection distribution at different depths of the measured target and generating a TDR image.
4. The multi-system microwave nondestructive testing imaging scanning system of claim 3, wherein the imaging process of said amplitude imaging module comprises selecting a single frequency point Extracting the reflection amplitude at the frequency from the original three-dimensional data matrix And normalize the reflection amplitude to map into gray image 。
5. The multi-system microwave nondestructive testing imaging scanning system of claim 3, wherein the phase imaging module comprises a single frequency point Extracting the reflection phase at that frequency from the original three-dimensional data matrix Disentangled reflection phase is processed, and phase images are generated by the disentangled reflection phase 。
6. The multi-system microwave nondestructive testing imaging scanning system of claim 3, wherein the synthetic aperture radar imaging module comprises the following imaging processes: each scanning point is regarded as a virtual array element; for any point in the imaging region By wave number And the distance of the antenna to the focal point Performing phase compensation; coherently accumulating responses of all scan points at the point to generate a SAR image 。
7. The multi-system microwave nondestructive testing imaging scanning system of claim 6, wherein the SAR image has a calculation formula: In the formula, Is the number of waves to be used, For the distance of the antenna to the focal point, Is S11 complex parameter in the original three-dimensional data matrix, and As a function of the frequency variation, For the on-line of the frequency, As a lower limit of the frequency of the signal, Is an imaginary part.
8. The multi-system microwave nondestructive testing imaging scanning system of claim 3, wherein the time domain reflectometry imaging module comprises the following imaging processes: For each spatial point in the original three-dimensional data matrix Frequency domain data of (2) Performing inverse Fourier transform to obtain time domain waveform ; By selecting a particular time window The reflected signal in the depth range of the gating target is used for extracting the peak amplitude or energy in the time window as a pixel value to generate a TDR image 。
9. The multi-system microwave nondestructive testing imaging scanning system of claim 8 wherein said time window The determining method of (1) comprises the following steps: According to the average relative dielectric constant of the measured material And a target depth range By the relation: Establishing a mapping between time and depth, wherein For the speed of light in vacuum, 。
10. A multi-system microwave nondestructive testing imaging scanning method applied to the system of any one of claims 1-9, comprising the following steps: S1, building a system and setting scanning parameters, wherein the scanning parameters comprise a scanning range, a scanning stepping range and a scanning range of a vector network analyzer; s2, controlling the plane scanning frame to drive the near-field probe to move point by point, and at each coordinate point At the position, triggering a single-port vector network analyzer to measure the reflection coefficient S11 parameter of a measured sample to obtain an original three-dimensional data matrix ; S3, reading an original three-dimensional data matrix, and processing the matrix through an amplitude imaging algorithm, a phase imaging algorithm, a synthetic aperture radar imaging algorithm and a time domain reflection imaging algorithm respectively to correspondingly generate an amplitude image, a phase image, an SAR image and a TDR image; and S4, comparing the four images generated by analysis, and comprehensively identifying the defect or abnormal region of the tested sample.

Description

Multi-system microwave nondestructive testing imaging scanning system and method Technical Field The invention relates to the technical field of nondestructive testing, in particular to a multi-body microwave nondestructive testing imaging scanning system and method. Background The microwave nondestructive detection is a nondestructive detection technology for realizing detection evaluation by utilizing the interaction of microwaves and detected materials, and has the advantages of wide test coverage, capability of adapting to various detection objects, wide working frequency, capability of matching different detected objects to adjust the detection frequency, strong characterization capability on the change of parameters such as material density, uniformity and the like, high detection sensitivity, strong reflection characteristic on metal materials, strong penetrability on nonmetallic materials, small attenuation coefficient, capability of effectively penetrating dirt, ash layers, dielectric coatings and the like, capability of rapidly and continuously monitoring in real time without using a coupling agent by adopting a non-contact detection mode, no need of material pollution, no ionizing radiation, low power of an emission signal, safety detection, no electromagnetic damage to the irradiated objects, strong environmental adaptability, small influence on the conditions such as temperature, dust, chemical atmosphere and the like, and capability of being applied in high-low temperature environments. However, in the prior art, a dual-port vector network analyzer is generally adopted, or a complex reference branch comprising a T-shaped tube, a directional coupler and a short-circuit piston is required to be built, or a signal separation and phase adjustment module is additionally arranged to build an interference light path, so that not only are the parts of a system more, the integration difficulty is high, the debugging process is complicated, but also the production, building and maintenance costs of equipment are greatly improved, in addition, the imaging processing in the prior art mainly relies on single frequency domain information of amplitude or phase, the abundant information such as time domain and spatial coherence contained in broadband sweep data cannot be fully excavated, the detection sensitivity for weak scattering defects and deep defects is limited, and tiny anomalies in the material can not be identified, and the cooperative analysis system of various imaging modes is not built for different defect types and detection scenes in the prior art, and the suitability for defects with different characteristics (such as point defects, deep layering defects and surface tiny cracks) is poor. Therefore, we propose an imaging scanning system and method with simple structure and high defect recognition. Disclosure of Invention The invention aims to provide a multi-system microwave nondestructive testing imaging scanning system and method, which are used for solving the problems of complex structure and low defect recognition degree in the prior art. The invention is realized by the following technical scheme: A multi-system microwave non-destructive inspection imaging scanning system comprising: The near-field probe is used for transmitting microwave signals to the measured target and receiving reflected microwave signals formed by the reflection of the measured target; the single-port vector network analyzer is used as a detection host, a test port of the single-port vector network analyzer is in communication connection with the near-field probe and is used for receiving reflected microwave signals returned by the near-field probe, analyzing and calculating the reflected microwave signals in a preset sweep frequency range, demodulating S11 complex parameters of a detected target, wherein the S11 complex parameters comprise amplitude information and phase information; the plane scanning frame is used for carrying the near-field probe and moving along the X-axis and Y-axis directions according to the control instruction in a preset stepping way to realize the point-by-point scanning of the two-dimensional space of the detected plane of the detected object, each stay position on the moving track of the plane scanning frame is a scanning point, and each scanning point corresponds to a unique two-dimensional space coordinate point; The upper computer is respectively in communication connection with the single-port vector network analyzer and the plane scanning frame and is used for issuing a movement control instruction to the plane scanning frame, issuing a sweep frequency parameter configuration instruction to the single-port vector network analyzer, receiving S11 complex parameters of each scanning point uploaded by the single-port vector network analyzer in a sweep frequency range, and constructing a space X-axis, a space Y-axis and a frequency containing space X-axis, space Y-axis Original three-di