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CN-122016891-A - X-ray diffractometer sample stage compatible with different manufacturers

CN122016891ACN 122016891 ACN122016891 ACN 122016891ACN-122016891-A

Abstract

The invention belongs to the technical field of diffraction instrument matching equipment, and discloses an X-ray diffraction instrument sample table compatible with different manufacturers, which comprises three structural layers with vertical layering and splicing design, wherein an interface unit layer comprises a bearing base integrated with various interfaces of different types and is used for being in butt joint with X-ray diffraction instrument goniometers of different manufacturers, splicing with a core function execution layer is realized by means of conical surface locating pins, annular magnetic attraction grooves and the like, an independent driving and control module is arranged in the core function execution layer and is used for independently completing functions of translation, rotation, inclination angle adjustment and the like, and a sample bearing and fixing layer is provided with a plurality of sample clamps matched with samples of different forms. The invention effectively solves the technical pain points of non-uniform mechanical interfaces, incompatible control protocols, recalibration after replacement and the like of sample platforms of different manufacturers at present, and simultaneously has the advantages of compact structure, convenient operation and control, high switching efficiency, accurate and reliable positioning, plug and play and the like.

Inventors

  • JIANG RENZHI
  • DING YUKUI

Assignees

  • 华中科技大学

Dates

Publication Date
20260512
Application Date
20260330

Claims (9)

  1. 1. The utility model provides an X ray diffractometer sample platform compatible different producers, its characterized in that, this sample platform includes the structural layer of three-layer perpendicular layering and concatenation design, namely mutually independent and coordinated interface unit layer, core function execution layer, sample bear and fixed layer, wherein: The interface unit layer is positioned at the bottommost layer of the whole sample table and comprises a bearing base and a locking mechanism, wherein a buckle type interface, a bolt fastening interface and a magnetic type interface are integrated on the bearing base and are used for being in butt joint with angle meters of X-ray diffractometers of different manufacturers during butt joint; in addition, each interface is provided with a conical surface locating pin and an annular magnetic attraction groove, and is used for being aligned with the lower interface of the core function execution layer when being spliced and executing magnetic attraction pre-fixing after light pressure; The core function execution layer is positioned at the middle level of the whole sample stage, interfaces are arranged on the upper side and the lower side of the core function execution layer, the lower interface is used for performing splicing with the interface unit layer, and the upper interface is used for performing splicing with the sample bearing and fixing layer; the sample bearing and fixing layer is positioned at the uppermost layer of the whole sample stage and is provided with a plurality of sample clamps respectively adapting to samples in different forms, and each sample clamp is spliced with the upper interface of the core function execution layer by adopting a buckle type interface and can be replaced freely according to requirements.
  2. 2. The X-ray diffractometer sample stage of claim 1, wherein the interface unit layer is preferably further built-in with a level adjustment element for fast correcting the micro tilt angle of the instrument mounting surface, ensuring the levelness of the core function executing layer.
  3. 3. X-ray diffractometer sample stage according to claim 1 or 2, characterized in that the interface unit layer preferably corresponds to an X-ray diffractometer of a different manufacturer, respectively to a dedicated adapter module, and each adapter module is marked with a brand identification.
  4. 4. The X-ray diffractometer stage according to any one of claims 1-3, wherein for the core function performing layer the driving and control module comprises a plurality of functional modules, preferably an X/Y/Z axis translation assembly driven by a stepper motor, a θ/ω biaxial rotation assembly, a tilt angle adjustment assembly for grazing incidence diffraction testing, a temperature change module, an in situ electrochemical module, a rotation transmission module, an auto-sampling module, etc.
  5. 5. The X-ray diffractometer sample stage according to claim 4, wherein for the core function execution layer, the plurality of standardized expansion interfaces reserved on the side face of the core function execution layer are preferably used for adding at least one of a temperature control sample stage, an atmosphere control cabin supporting inert gas or reaction gas to be introduced, a stress loading accessory, a laser positioning module, a sample automatic identification sensor and the like, so that expansion splicing of the side face direction is realized.
  6. 6. The X-ray diffractometer sample stage of claim 5, wherein a height expansion switching module is preferably further arranged between the core function execution layer and the interface unit layer, wherein the height expansion switching module is used for executing required adjustment on the overall height of the sample stage and ensuring that the sample is always positioned at the focus circle center of the X-ray diffractometer, thereby realizing superposition splicing in the longitudinal direction.
  7. 7. An X-ray diffractometer sample stage according to any one of claims 1-6 wherein all functional parameters of the core function execution layer are preferably pre-calibrated and stored without the need to re-commission the functional parameters when the different units are spliced.
  8. 8. The X-ray diffractometer sample stage according to any one of claims 1-7, characterized in that it preferably comprises for the sample carrying and fixing layer a number of functional modules, namely glass sample grooves, quartz plates and tabletting means provided for powder samples, for ensuring that the sample surface is flat and coplanar with the focus circle of the X-ray diffractometer, magnetic clamps, vacuum adsorption clamps and universal clamps provided for bulk/single crystal samples, for meeting the fixing requirements of samples of different dimensions, materials, ultra thin sample stage and horizontal calibration components provided for film/coating samples, for ensuring that the film surface remains perpendicular to the incident X-rays, and in-situ temperature/atmosphere integration modules etc.
  9. 9. An X-ray diffractometer sample stage according to any one of claims 1-8 wherein the sample carrying and holding layer is preferably further integrated with a sample anti-migration limiting structure for preventing data distortion caused by sample sliding during testing.

Description

X-ray diffractometer sample stage compatible with different manufacturers Technical Field The invention belongs to the technical field of diffractometer matching equipment, and particularly relates to an X-ray diffractometer sample table compatible with different manufacturers. Background The sample stage of the multifunctional X-ray diffractometer (XRD) is one of the core components for carrying, fixing and adjusting the sample, and its function directly affects the accuracy of diffraction data, experimental efficiency and expansibility of the test scenario. For different test requirements, the multifunctional sample stage needs to integrate various adjusting and controlling functions. More specifically, the multifunctional sample stage needs to provide functions of translation (X/Y/Z axis), rotation (theta/omega axis), inclination angle adjustment and the like, thereby realizing high-precision test, and meanwhile, the multifunctional sample stage also needs to integrate auxiliary units of temperature control, atmosphere, stress and the like, thereby realizing in-situ XRD test, which is important in research of material science (such as battery materials, superalloy and the like). However, further researches show that the product in the prior art still has the defects of poor overall compatibility, mismatching of machinery and interfaces of XRD sample tables of different manufacturers, and obvious differences in mounting hole sites, positioning references and bearing designs of the angle meters of different manufacturers because the multifunctional sample table is required to be accurately butted with the angle meters of the diffractometers. For example, the automatic sample stage of the bruke D8 series has a completely different magnetic attraction positioning interface from the snap-in interface of the panaceae Empyrean series, and cannot be installed in a cross way. The standard of mechanical interface is not unified, so that the multifunctional sample tables of different brands cannot be interchanged, meanwhile, the sample tables of imported original factories are high in price and maintenance price, so that the use cost is high, and the popularization and the use are difficult. Accordingly, there is a continuing need in the art for research and improvement to address the above technical pain points in the prior art. Disclosure of Invention Aiming at one or more of the defects or improvement demands of the prior art, the invention provides an X-ray diffractometer sample stage compatible with different manufacturers, wherein the whole design mechanism of modular splicing and interface modularization can be realized by improving the integral structure composition and the space arrangement form of the X-ray diffractometer sample stage, especially the modularized structural design of key components such as an interface unit layer, a core function execution layer and the like, the mutual arrangement mode of the modularized structural design and the mutual arrangement mode of the modularized structural design, so that the invention effectively solves the technical pain points of non-uniform mechanical interfaces, incompatible control protocols, recalibration after replacement and the like of the sample stages of different manufacturers at present, and simultaneously has the advantages of compact structure, convenient control, high switching efficiency, accurate positioning, plug and play and the like. In order to achieve the above object, according to the present invention, there is provided an X-ray diffractometer sample stage compatible with different manufacturers, characterized in that the sample stage comprises three structural layers of vertical layering and splicing design, namely an interface unit layer, a core function executing layer, and a sample bearing and fixing layer, which are mutually independent and cooperatively linked, wherein: The interface unit layer is positioned at the bottommost layer of the whole sample table and comprises a bearing base and a locking mechanism, wherein a buckle type interface, a bolt fastening interface and a magnetic type interface are integrated on the bearing base and are used for being in butt joint with angle meters of X-ray diffractometers of different manufacturers during butt joint; in addition, each interface is provided with a conical surface locating pin and an annular magnetic attraction groove, and is used for being aligned with the lower interface of the core function execution layer when being spliced and executing magnetic attraction pre-fixing after light pressure; The core function execution layer is positioned at the middle level of the whole sample stage, interfaces are arranged on the upper side and the lower side of the core function execution layer, the lower interface is used for performing splicing with the interface unit layer, and the upper interface is used for performing splicing with the sample bearing and fixing layer; the sample bear