CN-122017297-A - Modularized test fixture and application method thereof

CN122017297ACN 122017297 ACN122017297 ACN 122017297ACN-122017297-A

Abstract

The application relates to the technical field of insertion loss jigs, and provides a modularized test jig and a use method thereof, wherein the jig comprises a first motherboard, a second motherboard and a first high-speed connector, wherein the first motherboard is provided with a first radio frequency adapter, a first motherboard PCB wire and a first high-speed connector; the system comprises a first motherboard, a second motherboard, at least one replaceable daughter board and a plurality of signal transmission channels, wherein the first motherboard is provided with a first radio frequency adapter, a first motherboard PCB wire and a first high-speed connector, the second motherboard is provided with a second radio frequency adapter, a second motherboard PCB wire and a second high-speed connector, and the replaceable daughter board is provided with a second high-speed connector, a daughter board PCB wire and a fourth high-speed connector which are electrically connected in sequence, and two ends of the replaceable daughter board are respectively connected with the first motherboard and the second motherboard in an inserting way to form a complete signal transmission channel. According to the application, the quick adjustment of the insertion loss value is realized by replacing the daughter board, the problems of low test efficiency, incomplete gear, short service life and high maintenance cost of the conventional insertion loss board are solved, and the flexibility and reliability of the test are improved.

Inventors

ZHOU XINBO

Assignees

恒为科技（上海）股份有限公司

Dates

Publication Date: 20260512
Application Date: 20260325

Claims (6)

1. A modularization test fixture, its characterized in that includes: the first motherboard comprises a first radio frequency adapter, a first motherboard PCB wire and a first high-speed connector which are electrically connected in sequence; the second motherboard comprises a second radio frequency adapter, a second motherboard PCB wire and a second high-speed connector which are electrically connected in sequence; the at least one replaceable sub-board comprises a third high-speed connector, a sub-board PCB wiring and a fourth high-speed connector which are electrically connected in sequence; The third high-speed connector of the replaceable daughter board is connected with the first high-speed connector of the first motherboard in an inserting way, the fourth high-speed connector of the replaceable daughter board is connected with the second high-speed connector of the second motherboard in an inserting way, so that the first radio frequency adapter, the first motherboard PCB wire, the first high-speed connector, the third high-speed connector, the daughter board PCB wire, the fourth high-speed connector, the second motherboard PCB wire and the second radio frequency adapter are sequentially and electrically connected, the insertion loss values of the replaceable daughter board, the first motherboard and the second motherboard are fixed reference insertion loss values, the insertion loss value of the replaceable daughter board is fixed preset insertion loss values, and the total insertion loss value of the test fixture is the sum of the fixed reference insertion loss value of the first motherboard, the fixed preset insertion loss value of the replaceable daughter board and the fixed reference insertion loss value of the second motherboard.
2. The modular test fixture of claim 1, further comprising a test fixture comprising a substrate and a plurality of electrical contact terminals disposed on the substrate, the electrical contact terminals being connected to the rf adapter on the motherboard by coaxial cables.
3. The modular test fixture of claim 1, wherein the lengths and linewidths of the first and second motherboard PCB traces are configured to provide a fixed reference insertion loss value and the lengths and linewidths of the daughter board PCB traces are configured to provide a fixed preset insertion loss value.
4. The modular test fixture of claim 1, wherein the first high-speed connector and the third high-speed connector are mated, the second high-speed connector and the fourth high-speed connector are mated, one of the first high-speed connector and the third high-speed connector, or the second high-speed connector and the fourth high-speed connector is provided with at least one positioning post and an elastic clamping piece, and the other high-speed connector is provided with a positioning hole corresponding to the position of the positioning post and a clamping part mated with the elastic clamping piece; The positioning column is inserted into the positioning hole to realize insertion guide, and the elastic clamping piece is clamped with the clamping part to realize self-locking fixation after insertion.
5. The modular test fixture of claim 1, wherein the daughter board PCB traces are pure transmission line structures or differential Attenuator structure, difference The attenuator structure comprises a first resistor, a second resistor and a third resistor, wherein the third high-speed connector is connected with the fourth high-speed connector through the first resistor and the second resistor respectively, and the third resistor is connected between the first resistor and the second resistor.
6. A method of testing using the modular test fixture of any one of claims 1 to 5, comprising the steps of: Fixing a first motherboard on a first test fixture through a first radio frequency adapter, and fixing a second motherboard on a second test fixture through a second radio frequency adapter; selecting a corresponding replaceable sub-board from a plurality of replaceable sub-boards with different insertion loss values according to the target insertion loss value; Inserting the selected third high-speed connector of the replaceable daughter board into the first high-speed connector of the first motherboard, and inserting the fourth high-speed connector of the replaceable daughter board into the second high-speed connector of the second motherboard assembly; And accessing test signals through the first radio frequency adapter and the second radio frequency adapter for testing.

Description

Modularized test fixture and application method thereof Technical Field The application relates to the technical field of insertion loss jigs, in particular to a modularized test jig and a using method thereof. Background The chip capability of the sample of the current test project and other situations needing to add a fixed value insertion loss are generally required to use a fixed value insertion loss jig board (also called an insertion loss board for short), and a typical application scenario is shown in fig. 1; the design characteristics of the insertion loss board (see fig. 2) commonly used at present are as follows: a, adopting 405mm by 165mm (namely 15.94inch by 6.5 inch) four-layer PCB strip lines, wherein the insertion loss of a pure transmission line is matched with the design of a 2.92mm radio frequency adapter, and fig. 3 and 4 show the insertion loss at different frequencies in fig. 2, and fig. 3 is the minimum insertion loss, namely 0.58dB@5.5GHz (the loss is 0.58dB at the frequency of 5.5 GHz); 1.01dB@12.89GHz (loss 1.01dB at 12.89 GHz), 1.03dB@13.28GHz (loss 1.03dB at 13.28 GHz), FIG. 4 shows the maximum insertion loss, 5.74dB@5.5GHz (loss 5.74dB at 5.5 GHz), 11.04dB@12.89GHz (loss 11.04dB at 12.89 GHz), and 11.33dB@13.28GHz (loss 11.33dB at 13.28 GHz). And b, adopting 0.5dB insertion loss stepping (all insertion loss of the application take 12.89GHz as reference frequency). The common problems of the use of the insertion loss board are as follows: A. testing generally needs to try different insertion loss (the current upper limit is about 35 dB), and the implementation mode is that a plurality of pairs of coaxial cables are replaced to target insertion loss line pairs by using a torque wrench, so that the testing efficiency is low. B. The foolproof mechanism in the test process is too few (only a moment spanner), the influence of personnel factors cannot be avoided, and the risk of test errors is large. C. The insertion loss board lacks part of gears from 5dB to 7dB, the new cost is high, the part of insertion loss values (such as 18dB and 33 dB) can be realized by using 2 insertion loss boards, more pairs of coaxial cables are needed to be matched, and the test error is large. The plugging life of the radio frequency adapter of 2.92mm is about 500 times, and the plugging life is short and the price is high. E. the test fixture is damaged and the replacement cost is high. Disclosure of Invention In order to help solve the above technical problems, the present application provides a modular test fixture and a method for using the same. In a first aspect, the present application provides a modular test fixture, which adopts the following technical scheme: A modular test fixture, comprising: the first motherboard comprises a first radio frequency adapter, a first motherboard PCB wire and a first high-speed connector which are electrically connected in sequence; the second motherboard comprises a second radio frequency adapter, a second motherboard PCB wire and a second high-speed connector which are electrically connected in sequence; the at least one replaceable sub-board comprises a third high-speed connector, a sub-board PCB wiring and a fourth high-speed connector which are electrically connected in sequence; The third high-speed connector of the replaceable daughter board is connected with the first high-speed connector of the first motherboard in an inserting way, the fourth high-speed connector of the replaceable daughter board is connected with the second high-speed connector of the second motherboard in an inserting way, so that the first radio frequency adapter, the first motherboard PCB wire, the first high-speed connector, the third high-speed connector, the daughter board PCB wire, the fourth high-speed connector, the second motherboard PCB wire and the second radio frequency adapter are sequentially and electrically connected, the insertion loss values of the replaceable daughter board, the first motherboard and the second motherboard are fixed reference insertion loss values, the insertion loss value of the replaceable daughter board is fixed preset insertion loss values, and the total insertion loss value of the test fixture is the sum of the fixed reference insertion loss value of the first motherboard, the fixed preset insertion loss value of the replaceable daughter board and the fixed reference insertion loss value of the second motherboard. The modularized test fixture further comprises a test fixture, wherein the test fixture comprises a substrate and a plurality of electric contact terminals arranged on the substrate, and the electric contact terminals are connected with the radio frequency adapter on the motherboard through coaxial cables. The lengths and line widths of the first motherboard PCB trace and the second motherboard PCB trace are set to provide a fixed reference insertion loss value, and the lengths and line widths of the daughter board PCB trace are set to