CN-122017299-A - Test and measurement instrument with built-in advanced data pattern generator

Abstract

Test and measurement instruments with built-in advanced data pattern generators. A test and measurement instrument includes a display, one or more transmitters, one or more receivers, one or more channels configured to transmit and receive signals, a data pattern generator, and a High Speed Serial Trigger (HSST) circuit operating at 1 gigabit per second or faster, coupled to the one or more receivers, to receive data patterns from the data pattern generator to employ the high speed serial trigger circuit.

Inventors

• D. Chetty
• J.H. Andrews

Assignees

• 特克特朗尼克公司

Dates

Publication Date

20260512

Application Date

20251111

Priority Date

20251103

Claims (20)

1. 1. A test and measurement instrument, comprising: A display; one or more transmitters; One or more receivers; One or more channels configured to transmit and receive signals; data pattern generator, and A high speed serial flip flop (HSST) circuit, which operates at 1 gigabit per second or faster, is connected to the one or more receivers to receive the data pattern from the data pattern generator to thereby employ the high speed serial flip flop circuit.
2. 2. The test and measurement instrument of claim 1, wherein an output of one of the one or more transmitters is connected to an input channel of the test and measurement instrument.
3. 3. The test and measurement instrument of claim 1, wherein an output of one of the one or more transmitters is connected to an external connector interface of the test and measurement instrument.
4. 4. The test and measurement instrument of claim 1, further comprising one or more processors, the data pattern generator comprising code executed by the one or more processors to cause the one or more processors to generate the data pattern.
5. 5. The test and measurement instrument of claim 4, wherein the one or more processors are further configured to execute code to cause the one or more processors to display a user interface on a display.
6. 6. The test and measurement instrument of claim 5, wherein the code that causes the one or more processors to display a user interface includes code that causes the one or more processors to receive user input to specify a pattern to be generated.
7. 7. The test and measurement instrument of claim 6, wherein the user input may include one of a training mode, a stored mode, a manually entered mode, or a modified mode.
8. 8. The test and measurement instrument of claim 6, wherein the generated data patterns are modifiable by one or more of user input through a user interface, trigger events from the HSST circuit, and a change in state of the test and measurement instrument.
9. 9. The test and measurement instrument of claim 1, further comprising a scrambler and an encoder.
10. 10. The test and measurement instrument of claim 9, wherein the generated data pattern is from a scrambler, an encoder, or both a scrambler and an encoder.
11. 11. A method of generating a data pattern from a test and measurement instrument, comprising: displaying a user interface providing a selection to allow a user to define a data pattern; receiving a user-defined data pattern through a user interface; generating waveforms according to user-defined data patterns, and The waveforms are selectively routed to at least one of an input channel of the test and measurement instrument and an external interface of the test and measurement instrument.
12. 12. The method of claim 11, wherein generating a waveform comprises generating a new waveform according to a user-defined data pattern.
13. 13. The method of claim 11, wherein generating the waveform includes accessing a memory to retrieve data corresponding to a user-defined data pattern.
14. 14. The method of claim 11, further comprising receiving a selection of a route for the waveform through a user interface.
15. 15. The method of claim 11, wherein generating a waveform comprises generating a waveform at a rate of 1 gigabit per second or faster.
16. 16. The method of claim 11, wherein generating the waveform comprises altering the waveform according to one or more of the second user inputs received through the user interface.
17. 17. The method of claim 11, wherein generating the waveform comprises one of using a scrambler, using an encoder, using both a scrambler and an encoder, or not using either a scrambler or an encoder.
18. 18. An oscilloscope, comprising: A display; one or more transmitters; One or more receivers; One or more channels configured to transmit and receive signals; A data pattern generator for generating waveforms according to user-defined data patterns, and A path selector to selectively route waveforms to at least one of either an input channel of the oscilloscope and an external connector interface of the oscilloscope.
19. 19. The oscilloscope of claim 18, wherein the data pattern generator operates at a speed of 1 gigabit per second or more.
20. 20. The oscilloscope of claim 18, further comprising one or more processors, the data pattern generator comprising code executed by the one or more processors to cause the one or more processors to generate a data pattern.

Description

Test and measurement instrument with built-in advanced data pattern generator Cross Reference to Related Applications The present disclosure is a non-provisional application filed on 11/2024, U.S. provisional application No. 63/719,037, entitled "TEST AND MEASUREMENT INSTRUMENT WITH BUILT-IN ADVANCED DATA PATTERN GENERATOR," the disclosure of which is incorporated herein by reference in its entirety, and claims the benefit thereof. Technical Field The present disclosure relates to test and measurement instruments, and more particularly to test and measurement instruments, such as oscilloscopes, having built-in advanced data pattern generators. Background An Arbitrary Waveform Generator (AWG) includes one type of test and measurement instrument that provides signals for testing a Device Under Test (DUT). Typically, users employ these AWGs in addition to the type of measurement of the test and measurement instrument. Some test and measurement instruments, such as oscilloscopes, have integrated or built-in an Arbitrary Function Generator (AFG). AFG can generate functions, but is typically in the analog domain. There is currently no option to loop high-speed serial data back to the instrument analog channel. Being able to use the same instrumentation that performs testing and measurement on the DUT for data pattern generation would eliminate a significant amount of complexity in the test environment. Drawings Fig. 1 shows an embodiment of a test and measurement instrument with an advanced data pattern generator. Fig. 2 illustrates an embodiment of a user interface that allows a user to select a scrambler (scrambler) and an encoder to generate a corresponding waveform. Fig. 3 shows a flow chart of an embodiment of a method of generating a high level data pattern waveform. Detailed Description Embodiments of the present disclosure generally include a high-level data pattern generator integrated within a test and measurement instrument (such as an oscilloscope) for signal analysis, for example. The advanced data pattern generator output signal may be used external to the instrument or may be routed internally to the channel front end for direct acquisition. For example, an oscilloscope with a built-in high-speed serial data pattern generator may send high-speed serial data back to the analog channel of the oscilloscope according to some embodiments of the present disclosure. This makes it easier for the user to use (exercise) the high-speed triggering capability of the oscilloscope or any other feature. Further, according to some embodiments, it will be possible to create or load waveforms of different protocols based on scrambling and coding mechanisms. Embodiments of the present disclosure are not necessarily limited to implementation in an oscilloscope. The built-in advanced data pattern generator may also employ any piece of test equipment or feature of a Device Under Test (DUT). It need not be an oscilloscope. One embodiment includes an oscilloscope with an advanced data pattern generator, with or without a high speed serial trigger circuit. Fig. 1 shows an embodiment of a test and measurement instrument 10 with an advanced data pattern generator. The use of Advanced Data Pattern Generators (ADPGs) allows for the verification of any high-speed serial flip-flops or other instrument features. ADPG may be used in the quality control stage of any instrument or other product to verify High Speed Serial Triggers (HSST). The user will have the ability to generate a customizable waveform, such as inserting error bits, or loading any waveform of interest from memory. ADPGs may generate high-speed waveforms based on the available bandwidth of the instrument, which in some embodiments exceeds 25 gigabits per second (Gbps). ADPG allows a user to exercise any instrument, other test equipment, or Device Under Test (DUT). The presence of ADPG in another instrument such as an oscilloscope eliminates the need for another piece of equipment such as an arbitrary waveform generator. As used herein, the term "high speed" means a speed of 1 gigabit per second (Gbps) or higher. In fig. 1, the instrument 10 has one or more transmitters and one or more receivers, and the instrument 10 may include one or more transceivers having both. The following discussion will refer to transmitters and receivers associated with channels 1 and 2 of the instrument, it being understood that the instrument may include many more transmitters, receivers and channels. The numbers 1 and 2 are used to distinguish between two different channels and do not imply that only two channels are present. In the embodiment shown in fig. 1, the instrument has a receiver 12 connected to the channel 1 of the instrument and a receiver 14 connected to the second channel (channel 2). The instrument also has one or more transmitters, such as transmitter 16 on channel 1 and transmitter 18 on channel 2. The input channels connected to the receivers 12 and 14 may include some