CN-122017365-A - Testing device for dielectric properties of insulating material

Abstract

The invention relates to the field of test fixtures, in particular to a test device for dielectric properties of insulating materials. The testing device for dielectric properties of insulating materials comprises a first flange, a second flange, a first electrode, a second electrode, an insulating cold conducting piece, a vacuum tube and a vacuum tube, wherein the first flange is provided with a first cold conducting piece, an elastic piece is arranged in the first cold conducting piece, the second flange is connected with the first flange in a sealing mode and surrounds the first flange to form a sealing cavity, the second flange is provided with the second cold conducting piece, the first electrode is in abutting connection with the first electrode, the second electrode is arranged opposite to the first electrode to form a testing station, the insulating cold conducting piece is respectively arranged between the first cold conducting piece and the first electrode and between the second cold conducting piece and the second electrode, and the vacuum tube penetrates through the first flange and is communicated with the sealing cavity. The testing device for dielectric properties of the insulating material solves the problems of low accuracy and reliability of the traditional testing device, shortens the time for replacing and testing the sample and improves the testing efficiency.

Inventors

• Kong Haozhang
• SUN WENTAO
• HUANG CHUANJUN
• LI LAIFENG

Assignees

• 中国科学院理化技术研究所

Dates

Publication Date

20260512

Application Date

20260129

Claims (10)

1. 1. A test apparatus for dielectric properties of an insulating material, comprising: the first flange is provided with a first cold guide piece, and an elastic piece is arranged in the first cold guide piece; The second flange is connected with the first flange in a sealing way and is surrounded with the first flange to form a sealing cavity, and a second cold guide piece is arranged on the second flange; a first electrode, the elastic piece is abutted with the first electrode; A second electrode disposed opposite the first electrode to form a test station; The insulating cold guide piece is respectively arranged between the first cold guide piece and the first electrode and between the second cold guide piece and the second electrode; And the vacuum tube penetrates through the first flange and is communicated with the sealing cavity.
2. 2. The testing device for dielectric properties of insulating materials according to claim 1, wherein three testing stations are arranged symmetrically in parallel, each testing station is correspondingly provided with the first electrode, the second electrode, the insulating cold guide and the elastic member, and leads of the three testing stations are respectively connected with different interfaces of the low Wen Hang sockets on the second flange.
3. 3. The test device for dielectric properties of insulating materials according to claim 2, wherein three low Wen Hang sockets are provided, and three low Wen Hang sockets are connected to leads of three test stations in a one-to-one correspondence, respectively.
4. 4. The test device for the dielectric properties of an insulating material according to claim 1, wherein the sample contact surfaces of the first electrode and the second electrode are provided with plating layers, the first electrode sleeve is provided with a protective electrode, and a gap is formed between the protective electrode and the first electrode.
5. 5. The test device for the dielectric properties of an insulating material according to claim 4, wherein the gap is less than or equal to 0.5 mm.
6. 6. The device for testing dielectric properties of insulating materials according to any one of claims 1 to 5, wherein the first cold guide and the second cold guide are made of oxygen-free copper, and the first cold guide and the first flange and the second cold guide and the second flange are welded and fixed.
7. 7. The test device for dielectric properties of insulating material according to any one of claims 1 to 5, wherein the elastic member is in a pre-compressed state, and the first electrode is brought into close contact with the test sample and the test sample is brought into close contact with the second electrode by the elastic force of the elastic member.
8. 8. The device according to any one of claims 1 to 5, wherein the second flange is provided with a bead, the second flange is connected to the first flange by an indium wire in a sealing manner, and the indium wire is disposed around the bead.
9. 9. The test device for the dielectric properties of an insulating material according to any one of claims 1 to 5, wherein the insulating cold guide comprises an aluminum nitride ceramic sheet.
10. 10. The test device for dielectric properties of an insulating material according to claim 9, wherein both side surfaces of the insulating cold guide are coated with heat conductive layers, the heat conductive layers filling gaps between the insulating cold guide and the first cold guide, and between the insulating cold guide and the second cold guide, respectively.

Description

Testing device for dielectric properties of insulating material Technical Field The invention relates to the field of test fixtures, in particular to a test device for dielectric properties of insulating materials. Background With the rapid development of modern technology, insulating materials used under low temperature conditions have shown great application potential in many key fields, such as superconducting power transmission, nuclear fusion energy, magnetic levitation trains, quantum computation, deep space exploration and the like. These extremely low temperature environments require extremely high reliability of the electrical system, and the properties of the insulating material are particularly important in such environments. Electrical parameters such as dielectric constant and dielectric loss of the insulating material are significantly changed under low temperature conditions, and these changes are often nonlinear and difficult to predict. Therefore, evaluating the dielectric properties of insulating materials in different temperature ranges is of vital importance for optimizing design, developing new materials and ensuring the normal operation of the system. In order to accurately measure the dielectric properties of the insulating material, a special test fixture is required. However, during cooling from room temperature to low temperature, thermal shrinkage of the insulating material occurs, resulting in separation of the clamping contact surface, which introduces a large uncertainty. In addition, current cryogenic test environments generally provide limited space to maintain cryogenic temperatures, further limiting the size of the test fixture. Therefore, the ideal test fixture has the advantages of small volume, simple structure and capability of ensuring stable clamping of the sample and being not influenced by environmental temperature change. The dielectric properties of the insulating material are affected not only by temperature but also by the surrounding gaseous medium. In low temperature testing, the surrounding gaseous environment such as vacuum, nitrogen, helium, etc. may have a significant impact on the test results. The existing low-temperature test fixture often lacks a sealing system, and is difficult to control the microscopic atmosphere environment where the sample is located, so that the actual performance of the material under a specific working condition cannot be truly reflected by test data. Disclosure of Invention The invention provides a testing device for dielectric properties of insulating materials, which is used for solving the defects of low accuracy and low reliability of low-temperature insulating material testing in the related technology. The invention provides a testing device for dielectric properties of insulating materials, which comprises: the first flange is provided with a first cold guide piece, and an elastic piece is arranged in the first cold guide piece; The second flange is connected with the first flange in a sealing way and is surrounded with the first flange to form a sealing cavity, and a second cold guide piece is arranged on the second flange; a first electrode, the elastic piece is abutted with the first electrode; A second electrode disposed opposite the first electrode to form a test station; The insulating cold guide piece is respectively arranged between the first cold guide piece and the first electrode and between the second cold guide piece and the second electrode; And the vacuum tube penetrates through the first flange and is communicated with the sealing cavity. According to one embodiment of the invention, three test stations are arranged symmetrically in parallel, each test station is correspondingly provided with the first electrode, the second electrode, the insulating cold guide piece and the elastic piece, and leads of the three test stations are respectively connected with different interfaces of the low Wen Hang sockets on the second flange. According to one embodiment of the invention, three low Wen Hang sockets are arranged, and the three low Wen Hang sockets are respectively connected with leads of three testing stations in a one-to-one correspondence. According to one embodiment of the invention, the sample contacting surfaces of the first electrode and the second electrode are provided with a plating layer, the first electrode is sleeved with a protective electrode, and a gap is formed between the protective electrode and the first electrode. According to one embodiment of the invention, the gap is less than or equal to 0.5 mm. According to one embodiment of the invention, the first cold guide piece and the second cold guide piece are made of oxygen-free copper, and the first cold guide piece is welded and fixed with the first flange and the second cold guide piece is welded and fixed with the second flange. According to one embodiment of the present invention, the elastic member is in a pre-compressed state, and t