CN-122017369-A - Pulse interference source testing system

CN122017369ACN 122017369 ACN122017369 ACN 122017369ACN-122017369-A

Abstract

The invention discloses a pulse interference source testing system which comprises a tested unit, a pulse voltage applying module, a constant current applying module, a data acquisition operation module and a central control module. The device comprises a tested unit, a pulse voltage applying module, a constant current applying module, a data acquisition operation module, a central control module and a two-stage test flow, wherein the tested unit simulates a device structure comprising an interference source circuit and a disturbed circuit, the pulse voltage applying module is used for applying adjustable pulse voltage to the interference source circuit, the constant current applying module is used for providing constant weak current for the disturbed circuit, the data acquisition operation module acquires current signals in the disturbed circuit in real time, and the central control module coordinates the work of the modules to execute the two-stage test flow. The method can quantitatively evaluate the interference degree of the high-voltage pulse signal on the weak current signal, and is suitable for electromagnetic compatibility verification of safety equipment such as electrical penetration pieces of the nuclear power station.

Inventors

WU XUEMEI
CAO JUN
HUANG HAITANG
LIU ZHENHUA
ZHANG HAOYU
WU XU

Assignees

江苏中电线缆研究院有限公司

Dates

Publication Date: 20260512
Application Date: 20260130
Priority Date: 20251225

Claims (10)

1. The pulse interference source test system is characterized by comprising: the tested unit is used for simulating the equipment structure comprising an interference source circuit and a disturbed circuit; the pulse voltage applying module is connected to the interference source circuit and used for applying an adjustable pulse voltage signal; a constant current applying module connected to the disturbed circuit for providing a constant weak current signal; the data acquisition operation module is connected to the disturbed circuit and used for acquiring and recording current signal changes in the disturbed circuit in real time; And the central control module is respectively connected with the pulse voltage applying module, the constant current applying module and the data acquisition operation module and used for controlling the test flow, parameter setting and data recording.
2. The system of claim 1, wherein the unit under test is a test device simulating an electrical feedthrough structure, comprising a shielded enclosure with a feedthrough assembly mounted thereto, a junction box simulator, and a connection cable.
3. The pulse interference source testing system according to claim 1, wherein the output voltage range of the pulse voltage applying module is 0V-1000V, and the voltage change rate is not lower than 2V/10ms.
4. The pulse interference source testing system according to claim 1, wherein the current signal output by the constant current application module is nanoampere level current, and the current range is 0.1-4 na.
5. The pulse interference source testing system of claim 1, further comprising a metallic shielding housing for positioning the unit under test to isolate external electromagnetic interference.
6. The pulse interference source testing system of claim 1, wherein the data acquisition computing module comprises a high precision current sensor, a voltage sensor, and a data logger.
7. A method of testing for interference to weak current signals using a pulsed voltage of a system according to any one of claims 1-6, comprising the steps of: First stage test: S1, applying constant weak current to a disturbed circuit through the constant current application module, and stabilizing for a preset time; S2, pulse voltage which is gradually increased from an initial voltage to a target voltage is applied to an interference source circuit through the pulse voltage application module, and the fluctuation condition of a current signal in the interfered circuit is recorded through the data acquisition operation module in the process; And (3) testing in the second stage: s3, applying constant high voltage to an interference source circuit through the pulse voltage applying module; s4, applying constant weak current to the disturbed circuit through the constant current applying module, and stabilizing the constant weak current for a preset time; s5, gradually reducing the voltage of the interference source circuit from the constant high voltage through the pulse voltage applying module, and recording the fluctuation condition of the current signal in the interfered circuit through the data acquisition operation module in the process.
8. The test method according to claim 7, wherein in the first stage test, the pulse voltage is increased from 0V to 900V at a rate of not less than 2V/10ms.
9. The test method according to claim 7, wherein in the second stage test, the constant high voltage is 1000V and the depressurization rate is higher than-2V/10 ms.
10. The test method of claim 7, wherein the predetermined time of settling is 1 minute.

Description

Pulse interference source testing system Technical Field The invention relates to the technical field of electromagnetic compatibility testing, in particular to a pulse interference source testing system. Background The advanced electrical penetration belongs to a nuclear safety 1E class device, belongs to a part of a containment pressure boundary, needs to ensure the integrity of the containment pressure boundary under normal working conditions and design reference accident working conditions, prevents radioactive fission products from leaking out, has signal interference problems when the loops of an RPN system and an RIC system are placed in the same penetration, is used as key equipment of the containment pressure boundary in severe industrial environments, and can be internally provided with various signal loops, such as a reactor power measurement system loop and a reactor core measurement system loop. The high-voltage pulse signals in the loops can generate electromagnetic interference on adjacent weak current signals, so that the normal operation of equipment is influenced and the nuclear safety is even threatened. There is currently a lack of a systematic, dedicated test scheme that can quantitatively evaluate the degree of interference of pulse voltages with weak current signals in such specific scenarios. The existing electromagnetic compatibility testing method is often aimed at a general environment, the internal structure, the spatial layout and the signal characteristics of the penetrating piece cannot be accurately simulated, and the testing result has weak guidance. Therefore, development of a specific test system and method with strong pertinence, standard operation and reliable results is needed. Disclosure of Invention According to the technical problems to be solved, the pulse interference source testing system is provided. To achieve the above object, the present invention discloses a pulse interference source testing system comprising The tested unit is used for simulating the equipment structure comprising an interference source circuit and a disturbed circuit; the pulse voltage applying module is connected to the interference source circuit and used for applying an adjustable pulse voltage signal; a constant current applying module connected to the disturbed circuit for providing a constant weak current signal; the data acquisition operation module is connected to the disturbed circuit and used for acquiring and recording current signal changes in the disturbed circuit in real time; And the central control module is respectively connected with the pulse voltage applying module, the constant current applying module and the data acquisition operation module and used for controlling the test flow, parameter setting and data recording. Further, the unit under test is a test device simulating an electrical penetration structure, and comprises a shielding shell provided with a feed-through assembly, a junction box simulation device and a connecting cable. Further, the output voltage range of the pulse voltage applying module is 0V-1000V, and the voltage change rate is not lower than 2V/10ms. Further, the current signal output by the constant current application module is nanoampere-level current, and the current range is 0.1 nA-4 nA. Still further, the system also comprises a metal shielding room for placing the unit under test to isolate external electromagnetic interference. Still further, the data acquisition operation module comprises a high-precision current sensor, a voltage sensor and a data recorder. A method for testing interference of a pulse interference source testing system on weak current signals comprises the following steps: First stage test: S1, applying constant weak current to a disturbed circuit through the constant current application module, and stabilizing for a preset time; S2, pulse voltage which is gradually increased from an initial voltage to a target voltage is applied to an interference source circuit through the pulse voltage application module, and the fluctuation condition of a current signal in the interfered circuit is recorded through the data acquisition operation module in the process; And (3) testing in the second stage: s3, applying constant high voltage to an interference source circuit through the pulse voltage applying module; s4, applying constant weak current to the disturbed circuit through the constant current applying module, and stabilizing the constant weak current for a preset time; s5, gradually reducing the voltage of the interference source circuit from the constant high voltage through the pulse voltage applying module, and recording the fluctuation condition of the current signal in the interfered circuit through the data acquisition operation module in the process. Further, in the first stage test, the pulse voltage was increased from 0V to 900V, and the rate of the increase was not lower than 2V/10ms. Further, in the second stage t