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CN-122017404-A - Multi-test channel distribution method for electronic element detection

CN122017404ACN 122017404 ACN122017404 ACN 122017404ACN-122017404-A

Abstract

The invention relates to the technical field of electronic component detection, in particular to a multi-test channel distribution method for electronic component detection, according to the method, the structural modeling of the test task is realized by acquiring the pin topological structure data and the I/O characteristic parameters of the multi-pin electronic element and carrying out pin functional domain division and channel topological segment decomposition in combination with the test task requirement. And based on the current load balance state of the test channel, dynamic load compensation estimation is performed, so that the prospective of resource scheduling is improved. And further constructing a test channel operation dependency graph, quantifying resource conflict and signal interference in the test process, and generating a channel allocation scheme with cooperative optimization. The method realizes the real-time dynamic allocation of the multi-channel test tasks, effectively improves the channel utilization rate, reduces the test conflict, enhances the test parallelism and the system efficiency, and is suitable for the automatic detection scene of the multifunctional electronic element with high pin number.

Inventors

  • ZHENG ZIYANG

Assignees

  • 佛山市天泽测试服务有限公司

Dates

Publication Date
20260512
Application Date
20260127

Claims (10)

  1. 1. A multi-test channel allocation method for electronic component inspection, the method comprising: Acquiring pin topology structure data and I/O characteristic parameters of the multi-pin electronic element, and dividing pin functional domains according to the pin topology structure data and the I/O characteristic parameters to obtain pin functional domain data; Carrying out test channel topology segment decomposition on the test task demand data and the pin functional domain data to obtain channel topology decomposition data; acquiring current test channel load balancing data, and carrying out dynamic load compensation estimation according to the current test channel load balancing data and channel topology decomposition data to obtain load compensation estimation data; The method comprises the steps of constructing a test channel operation dependency graph according to load compensation estimation data to obtain channel operation dependency graph data, carrying out test conflict quantification according to the channel operation dependency graph data to obtain channel conflict quantified data, carrying out test channel collaborative allocation generation according to the channel conflict quantified data to obtain test channel collaborative allocation data so as to realize real-time dynamic optimization allocation of multiple test channels.
  2. 2. The multi-test channel allocation method for electronic component inspection according to claim 1, wherein said performing pin domain division according to pin topology data and I/O characteristic parameters to obtain pin domain data comprises: analyzing the pin-channel coupling relation according to the pin topological structure data and the I/O characteristic parameters to obtain pin-channel coupling matrix data; Acquiring pin test time sequence data, and performing test coordination frequency calculation according to the pin test time sequence data to obtain test coordination frequency data; And constructing a digital twin connected domain according to the pin-channel coupling matrix data and the test coordination frequency data to obtain pin functional domain data.
  3. 3. The multi-test channel allocation method for electronic component inspection according to claim 2, wherein the performing digital twin connected domain construction according to the pin-channel coupling matrix data and the test coordination frequency data to obtain pin functional domain data comprises: Virtual test topology coverage characteristic extraction and dynamic signal transmission characteristic extraction are carried out according to the pin-channel coupling matrix data and the test coordination frequency data, so that virtual topology coverage characteristic data and dynamic signal transmission characteristic data are respectively obtained; Generating a twin coupling diagram of the pin-channel coupling matrix data according to the virtual topology coverage characteristic data and the dynamic signal transmission characteristic data to obtain twin coupling diagram data; carrying out virtual-real mismatch area detection on the twin coupling diagram data to obtain virtual-real calibration diagram data, wherein the virtual-real mismatch area detection comprises signal delay mismatch detection, level abnormality fault detection and test authority dynamic verification detection; performing test condition time sequence constraint injection on the virtual and real calibration chart data to obtain time sequence constraint chart data; and extracting the function communication subdomain according to the time sequence constraint graph data to obtain the pin function domain data.
  4. 4. The multi-test channel allocation method for electronic component inspection according to claim 1, wherein said performing test channel topology segment decomposition on test task requirement data and pin function domain data to obtain channel topology decomposition data comprises: Performing topology division on test task demand data and pin function domain data to obtain channel topology division data; extracting signal transmission characteristics and key test nodes according to the channel topology division data to respectively obtain the signal transmission characteristics data and the key test node data; Performing test time sequence dependence processing on the channel topology division data according to the signal transmission characteristic data and the key test node data to obtain time sequence dependence data; and constructing a dynamic dependency graph according to the time sequence dependency data to obtain channel topology decomposition data.
  5. 5. The multi-test channel allocation method for electronic component inspection according to claim 1, wherein the performing dynamic load compensation estimation according to current test channel load balancing data and channel topology decomposition data to obtain load compensation estimation data comprises: performing multi-signal test time sequence superposition calculation according to current test channel load balancing data and channel topology decomposition data to obtain time sequence superposition data; performing signal density kernel distribution calculation according to the time sequence superposition data to obtain local load aggregation intensity data; carrying out channel carrying capacity calculation and test response period calculation according to current test channel load balancing data to respectively obtain carrying capacity data and response period data; and carrying out dynamic load compensation time deduction on the local load aggregation strength data according to the bearing capacity data and the response period data to obtain load compensation estimated data.
  6. 6. The multi-test channel allocation method for electronic component inspection according to claim 1, wherein the performing test channel operation dependency graph construction according to the load compensation estimation data to obtain channel operation dependency graph data comprises: Performing test channel segment operation dependency sub-graph construction according to current test channel load balancing data and channel topology decomposition data to obtain operation dependency sub-graph data; performing dynamic weight assignment on the operation dependent sub-graph data according to the load compensation estimation data to obtain dynamic weight graph data; and carrying out directed acyclic allocation optimization according to the dynamic weight graph data to obtain the channel operation dependency graph data.
  7. 7. The multi-test channel allocation method for electronic component inspection according to claim 1, wherein said performing test conflict quantization based on channel operation dependency graph data to obtain channel conflict quantized data comprises: Performing test resource occupation mapping according to the channel operation dependency graph data to obtain resource occupation data; extracting conflict tuples according to the resource occupation data to obtain conflict tuple data; and carrying out signal overlapping tension quantization according to the conflict metadata to obtain channel conflict quantized data.
  8. 8. The multi-test channel allocation method for electronic component inspection according to claim 7, wherein said performing signal overlap tension quantization based on conflicting tuple data to obtain channel conflict quantized data comprises: Calculating the non-steady signal overlapping degree and the time sequence occupied intersection degree according to the conflict tuple data to respectively obtain dynamic boundary overlapping data and time sequence occupied intersection degree data; Carrying out shared test node competition analysis according to the dynamic boundary overlapping data and the time sequence occupation intersection data to obtain node competition analysis data; carrying out signal tension propagation modeling according to the node competition analysis data to obtain tension propagation matrix data; and carrying out gravitation compensation regulation and control on the high-priority test task according to the tension propagation matrix data to obtain channel conflict quantized data.
  9. 9. The method for multi-test channel allocation for electronic component inspection according to claim 1, wherein said generating test channel cooperative allocation data according to channel conflict quantized data to obtain test channel cooperative allocation data, so as to realize real-time dynamic optimized allocation of multiple test channels, comprises: carrying out conflict core cluster identification according to the channel conflict quantized data to obtain conflict core cluster data; performing test channel topology allocation sequence optimization according to the conflict core cluster data to obtain allocation sequence optimization data; And generating test channel cooperative allocation data according to the allocation sequence optimization data so as to drive the digital twin test platform to execute real-time dynamic optimization allocation of multiple test channels.
  10. 10. A multi-test channel allocation apparatus for electronic component testing, characterized in that the apparatus comprises a memory, a processor and a multi-test channel allocation program for electronic component testing stored on the memory and executable on the processor, the multi-test channel allocation program for electronic component testing being configured to implement the steps of the multi-test channel allocation method for electronic component testing as claimed in any one of claims 1 to 9.

Description

Multi-test channel distribution method for electronic element detection Technical Field The invention relates to the technical field of electronic element detection, in particular to a multi-test channel distribution method for electronic element detection. Background With the rapid development of electronic manufacturing technology, integrated circuits and multi-pin electronic components are increasingly used in communication, automotive electronics, industrial control and consumer electronics, and the complexity and integration thereof are continuously improved. In the production, manufacture and quality detection links, comprehensive, efficient and accurate testing of the electrical performance of the multi-pin element becomes a key step for guaranteeing the reliability of the product. The traditional electronic component detection mostly adopts a single-channel or fixed-channel distributed test mode, is difficult to cope with the parallel test requirements of high-pin-count, multi-I/O type and complex topological structure devices, is easy to cause the problems of uneven utilization rate of test channel resources, test time sequence conflict, signal crosstalk and the like, and seriously affects the test efficiency and accuracy. When the existing test system processes multitasking parallel detection, the deep modeling of the pin topological structure and the I/O functional characteristics is generally lacking, the time sequence dependence, the resource competition and the electric coupling characteristics among different test signals cannot be fully considered, the channel allocation strategy is stiff, and dynamic optimization is difficult to realize. Especially in the complex scenario of coexistence of heterogeneous test tasks (such as digital I/O, analog signals, power pins, etc.), the problems of unbalanced load of the test channel, critical path delay, frequent test conflicts, etc. are particularly prominent. In addition, the traditional method is used for mapping channels based on static configuration, lacks the capability of sensing and feedback adjustment of real-time test states, and cannot realize closed-loop optimization. The foregoing is provided merely for the purpose of facilitating understanding of the technical solutions of the present invention and is not intended to represent an admission that the foregoing is prior art. Disclosure of Invention The invention mainly aims to provide a multi-test channel distribution method for electronic element detection, and aims to solve the technical problems that the existing multi-test channel distribution method in electronic element detection is difficult to consider a multi-pin topological structure, I/O characteristics and a real-time load state, so that channel resource utilization rate is low, test conflict frequently occurs and dynamic collaborative optimization capability is lacked. To achieve the above object, the present invention provides a multi-test channel allocation method for electronic component inspection, the method comprising: Acquiring pin topology structure data and I/O characteristic parameters of the multi-pin electronic element, and dividing pin functional domains according to the pin topology structure data and the I/O characteristic parameters to obtain pin functional domain data; Carrying out test channel topology segment decomposition on the test task demand data and the pin functional domain data to obtain channel topology decomposition data; acquiring current test channel load balancing data, and carrying out dynamic load compensation estimation according to the current test channel load balancing data and channel topology decomposition data to obtain load compensation estimation data; The method comprises the steps of constructing a test channel operation dependency graph according to load compensation estimation data to obtain channel operation dependency graph data, carrying out test conflict quantification according to the channel operation dependency graph data to obtain channel conflict quantified data, carrying out test channel collaborative allocation generation according to the channel conflict quantified data to obtain test channel collaborative allocation data so as to realize real-time dynamic optimization allocation of multiple test channels. Optionally, the performing pin domain division according to the pin topology structure data and the I/O characteristic parameter to obtain pin domain data includes: analyzing the pin-channel coupling relation according to the pin topological structure data and the I/O characteristic parameters to obtain pin-channel coupling matrix data; Acquiring pin test time sequence data, and performing test coordination frequency calculation according to the pin test time sequence data to obtain test coordination frequency data; And constructing a digital twin connected domain according to the pin-channel coupling matrix data and the test coordination frequency data to obtain pin f