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CN-122017420-A - Automatic test method for chip electromagnetic compatibility and conductive radiation interference test platform

CN122017420ACN 122017420 ACN122017420 ACN 122017420ACN-122017420-A

Abstract

The application provides an automatic test method for chip electromagnetic compatibility and a test platform for conducting radiation interference, which comprises the steps of receiving a test parameter set configured by a user by utilizing a first graphical user interface, wherein the test parameter set comprises configuration parameters for radiation interference test and/or conducting interference test of a tested chip, positioning and identifying interaction elements in a second graphical user interface provided by test instrument control software of an operating instrument control end based on an image identification technology, generating and executing an analog user operation instruction, controlling the test instrument control software to automatically complete test parameter setting and start the radiation interference test and/or conducting interference test, and acquiring test data output by the test instrument control software after the test is completed to generate an electromagnetic compatibility test result report of the tested chip. The application can effectively solve the problems of separation of radiation and conduction testing equipment, complicated operation, lack of integrated automatic management and control and the like in the conventional chip electromagnetic compatibility test.

Inventors

  • WANG WEIMIN
  • CHENG HAO
  • WU YONGLE

Assignees

  • 北京邮电大学

Dates

Publication Date
20260512
Application Date
20260227

Claims (10)

  1. 1. An automated testing method for electromagnetic compatibility of a chip is characterized by comprising the following steps: Receiving a test parameter set configured by a user by utilizing a first graphical user interface, wherein the test parameter set comprises configuration parameters for radiation interference test and/or conduction interference test of a chip to be tested; generating and executing a simulation user operation instruction according to the interaction element and the test parameter set, controlling the test instrument control software to automatically complete test parameter setting and starting the corresponding radiation interference test and/or the conduction interference test; after the test is completed, test data output by the test instrument control software are obtained, and an electromagnetic compatibility test result report aiming at the tested chip is generated based on the test data.
  2. 2. The automated testing method of chip electromagnetic compatibility of claim 1, wherein receiving a user configured set of test parameters using a first graphical user interface comprises: receiving a test parameter set input by a user by utilizing the first graphical user interface, wherein the test parameter set is used for defining a test task to be executed and comprises configuration parameters of at least one of a radiation interference test and a conduction interference test for a chip to be tested; The validity of the test parameter set is verified based on a preset parameter rule base, and if the test parameter set passes the verification, the test parameter set is stored in a preset parameter base or a current task parameter queue; And loading the test parameter set from the preset parameter library or the current task parameter queue to start a subsequent automatic test flow.
  3. 3. The automated testing method of chip electromagnetic compatibility according to claim 1, wherein the locating and identifying the interactive elements in the second graphical user interface provided by the testing instrument control software running on the instrument control end based on the image recognition technology comprises: receiving a scheduling instruction, and acquiring an activation window and coordinate information in a second graphical user interface provided by the test instrument control software; screenshot is carried out on the designated screen area of the activation window or the second graphical user interface according to the coordinate information, and an interface screenshot is obtained; And calling a template matching algorithm, and carrying out matching calculation on a pre-stored interaction element template corresponding to the input of the test parameter set and the control button with the interface screenshot by adopting a preset optimization strategy to identify interaction elements and determine the position coordinates of the interaction elements in a screen coordinate system, wherein the optimization strategy comprises at least one of cutting the interface screenshot in a region, matching the same interaction elements for a plurality of times and dynamically adjusting a similarity threshold according to the display resolution of the second graphical user interface.
  4. 4. The method according to claim 1, wherein the generating and executing the simulated user operation instruction according to the interaction element and the test parameter set, controlling the test instrument control software to automatically complete the test parameter setting and start the corresponding radiation interference test and/or the conduction interference test, includes: Generating an operation request containing the position coordinates of the interaction elements and parameter values to be input according to the test parameter set; generating and executing a simulated user operation instruction in response to the operation request; Before or during execution of the simulated user operation instruction, controlling an application program window of the test instrument control software to be in a foreground activation state; And monitoring a state indicating element representing the test running state in the second graphical user interface to judge the test process, and triggering a predefined abnormal recovery flow when the abnormal state prompt is identified.
  5. 5. The automated testing method of chip electromagnetic compatibility of claim 1 or 4, wherein the simulating the user operation instruction comprises: And controlling a mouse pointer to move to the position coordinates of the interaction element and simulating a clicking instruction, and/or controlling a keyboard to simulate a key input, a focus switching or a confirmation event to input a parameter value to be input.
  6. 6. The method of claim 1, wherein generating an electromagnetic compatibility test result report for the chip under test based on the test data comprises: Performing filtering and/or smoothing on the test data, wherein the smoothing comprises a Gaussian smoothing algorithm; Integrating the field intensity distribution data of the radiation interference test and the disturbance current or voltage spectrum data of the conduction interference test into the same report, and generating a field intensity distribution diagram corresponding to the field intensity distribution data and a spectrum analysis diagram corresponding to the disturbance current or voltage spectrum data, wherein the report comprises at least one of the field intensity distribution diagram, the spectrum analysis diagram and a test arrangement photo.
  7. 7. A conducted radiation interference test platform in communication with a control subsystem for performing the automated test method of chip electromagnetic compatibility of any one of claims 1 to 6.
  8. 8. An automated testing system for chip electromagnetic compatibility, comprising: A hardware subsystem comprising a near field scanning unit for performing a radiated interference test, a conducted test unit for performing a conducted interference test, and a signal processing unit for performing a radiated interference test and/or a conducted interference test; A control subsystem communicatively coupled to the hardware subsystem for performing the automated test method for chip electromagnetic compatibility of any one of claims 1-6; Wherein the control subsystem comprises: Graphical user interface control software for providing the first graphical user interface; and the automatic control program is used for controlling test instrument control software running on an instrument control end by adopting an image recognition and simulation operation technology so as to operate the hardware subsystem.
  9. 9. The automated testing system of claim 8, wherein the automated control program comprises: the flow control module is used for dispatching test tasks, generating dispatching instructions, generating operation requests according to test parameter sets, monitoring test running states and managing abnormal recovery flows; The image recognition module is used for responding to the scheduling instruction, acquiring the activation window and coordinate information of the second graphical user interface and capturing a screenshot to obtain an interface screenshot, recognizing interactive elements in the interface screenshot by adopting a template matching algorithm and an optimization strategy and determining the position coordinates of the interactive elements in a screen coordinate system; The operation execution module is used for responding to the operation request to generate and execute a simulated user operation instruction; and the window management module is used for managing the activation state of the application program window of the test instrument control software and ensuring that the application program window is in a foreground activation state.
  10. 10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements a method for automated testing of chip electromagnetic compatibility according to any one of claims 1 to 6 when executing the computer program.

Description

Automatic test method for chip electromagnetic compatibility and conductive radiation interference test platform Technical Field The application relates to the field of electronic information, in particular to an automatic test method for chip electromagnetic compatibility and a test platform for conducted radiation interference. Background Transistor sizes in integrated circuits have been scaled into the nanoera to date from moore's law. High-precision electronic devices are always pursued for miniaturization and high performance from design to application. Along with the improvement of the manufacturing process, the through silicon via (Through Silicon Via, TSV) three-dimensional integrated chip is widely applied in the field of electronic information by virtue of high-density integration, high performance and the like. However, miniaturization and process complexity make electromagnetic compatibility feature detection of the electromagnetic interference feature challenging, and accurate and effective integrated testing of radiation interference and conduction interference becomes a key problem to be solved urgently in the industry. Although research at home and abroad has advanced, there is still a bottleneck problem in the field to be solved and broken through. In the traditional TSV chip electromagnetic compatibility test, radiation and conduction test equipment are separated and lack of an integrated management and control platform, the test generally depends on manual operation, parameter configuration is complex and human errors are easy to introduce, the traditional automation scheme is mostly developed based on special software or non-Python language, compatibility is poor, secondary development difficulty is high, a part of semi-automatic systems cannot realize full-flow unattended operation, the test is required to be interrupted at night without people, the whole period is prolonged, meanwhile, the traditional system lacks an integrated visual interface, the operation threshold is high, data processing depends on external software, and the efficiency is low. Therefore, developing an automatic test technology for electromagnetic compatibility test of chips, realizing the integrated visual management and control of near field scanning and conduction test and the full-flow automation of radiation test, becomes the key for solving the pain point of the industry. Disclosure of Invention In view of the foregoing, embodiments of the present application provide an automated testing method for electromagnetic compatibility of chips and a platform for testing conducted radiation interference, so as to eliminate or improve one or more of the drawbacks of the prior art. A first aspect of the present application provides a method for automatically testing electromagnetic compatibility of a chip, the method comprising: Receiving a test parameter set configured by a user by utilizing a first graphical user interface, wherein the test parameter set comprises configuration parameters for radiation interference test and/or conduction interference test of a chip to be tested; generating and executing a simulation user operation instruction according to the interaction element and the test parameter set, controlling the test instrument control software to automatically complete test parameter setting and starting the corresponding radiation interference test and/or the conduction interference test; after the test is completed, test data output by the test instrument control software are obtained, and an electromagnetic compatibility test result report aiming at the tested chip is generated based on the test data. In some embodiments of the application, the receiving, with the first graphical user interface, the user-configured test parameter set includes: receiving a test parameter set input by a user by utilizing the first graphical user interface, wherein the test parameter set is used for defining a test task to be executed and comprises configuration parameters of at least one of a radiation interference test and a conduction interference test for a chip to be tested; The validity of the test parameter set is verified based on a preset parameter rule base, and if the test parameter set passes the verification, the test parameter set is stored in a preset parameter base or a current task parameter queue; And loading the test parameter set from the preset parameter library or the current task parameter queue to start a subsequent automatic test flow. In some embodiments of the present application, the positioning and identifying the interactive element in the second graphical user interface provided by the test instrument control software running on the instrument control end based on the image identification technology includes: receiving a scheduling instruction, and acquiring an activation window and coordinate information in a second graphical user interface provided by the test instrument control software;