CN-122017431-A - Bus capacitor life estimation method and device, storage medium and electronic equipment

CN122017431ACN 122017431 ACN122017431 ACN 122017431ACN-122017431-A

Abstract

The invention relates to the technical field of electronics, in particular to a bus capacitor life estimation method, a device, a storage medium and electronic equipment, which comprise the following steps of sampling period Collecting operation characteristic parameters and instantaneous environment temperature of a system where the bus capacitor is positioned in real time, and judging the working condition category corresponding to the current sampling period according to the operation characteristic parameters Acquiring the unit damage life corresponding to the working condition category Correction coefficient Calculating the damage life increment of the current sampling period The calculation formula is: And subtracting the total accumulated damage life from the rated life of the bus capacitor to obtain the residual life of the bus capacitor. The bus capacitor online life estimation method can finish high-precision and high-efficiency bus capacitor online life estimation on the premise of not adding extra hardware sampling equipment, and has good working condition self-adaption capability.

Inventors

CHAI HONGSHENG
XUE YAFEI
DENG JING
ZHAO XIANG
WANG YANAN
WANG ZHUO

Assignees

辰致汽车科技集团有限公司重庆创新研究分公司
辰致汽车科技集团有限公司

Dates

Publication Date: 20260512
Application Date: 20260316

Claims (9)

1. A bus capacitor life estimation method, comprising: With sampling period Collecting operation characteristic parameters and instantaneous environment temperature of a system where the bus capacitor is located in real time; Judging the working condition category corresponding to the current sampling period according to the operation characteristic parameters Acquiring the unit damage life corresponding to the working condition category Correction coefficient ; Calculating to obtain the damage life increment of the current sampling period The calculation formula is: ; Accumulating the damage increment of all sampling periods to obtain the total accumulated damage life; subtracting the total accumulated damage life from the rated life of the bus capacitor to obtain the residual life of the bus capacitor.
2. The method for estimating the service life of the bus capacitor according to claim 1, wherein the correction coefficient is determined by inquiring a pre-established mapping relationship between the ambient temperature corresponding to the working condition category and the correction coefficient according to the working condition category and the instantaneous ambient temperature, and wherein different working condition categories respectively correspond to independent mapping relationships.
3. The method for estimating a life of a bus capacitor according to claim 1, wherein said unit damage life corresponding to said operating condition type is calculated by the formula In which, in the process, For the unit damage life under nominal conditions, Is of the working condition type The corresponding actual operating voltage is used to determine, Is of the working condition type The corresponding rated operating voltage is set to be the same, As a coefficient of voltage stress, Is of the working condition type The corresponding rated operating temperature is set to be the same, In order to be able to achieve an instantaneous ambient temperature, Is of the working condition type Corresponding temperature rise values.
4. The bus capacitor life estimation method according to claim 1, wherein determining the working condition category corresponding to the current sampling period according to the operation characteristic parameter includes: matching the operation characteristic parameters of the current sampling period with a pre-established working condition class characteristic library; The working condition category feature library comprises a plurality of working condition categories, and each working condition category is associated with a corresponding feature parameter range or category center; and according to the matching result, attributing the operation characteristic parameters of the current sampling period to the working condition category with the highest matching degree.
5. The bus capacitor life estimation method according to claim 4, wherein the construction of the operating condition class feature library comprises: collecting historical operation data, and extracting multidimensional operation characteristic parameters corresponding to each group of data to form characteristic vectors; performing offline clustering on the feature vectors by adopting a K-means clustering algorithm, and dividing actual operation conditions into 5-12 working condition categories; and taking the clustering center vector corresponding to each working condition category as a category center of the working condition category, and storing the clustering center vector into the working condition category feature library.
6. The method of estimating a lifetime of bus capacitor according to claim 1 wherein said operating characteristic parameters include an average operating voltage, a load current characteristic value, a modulation ratio and a power factor.
7. A bus capacitor life estimating device, comprising: a data acquisition module configured to sample at a sampling period Collecting operation characteristic parameters and instantaneous environment temperature of a system where the bus capacitor is located in real time; The working condition judging module is configured to judge the working condition category corresponding to the current sampling period according to the operation characteristic parameters ; The parameter query module is configured to judge the working condition category corresponding to the current sampling period according to the operation characteristic parameters Acquiring the unit damage life corresponding to the working condition category Correction coefficient ; The damage increment calculating module is configured according to a formula Calculating the damage life increment of the current sampling period ; The accumulation module is configured to accumulate the damage life increment of all sampling periods to obtain the total accumulated damage life; And the residual life calculating module is configured to subtract the total accumulated damage life from the rated life of the bus capacitor and output the residual life of the bus capacitor.
8. A computer-readable storage medium, on which a computer program is stored, characterized in that the program, when executed by a processor, implements the bus capacitance lifetime estimation method according to any one of claims 1 to 6.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the bus capacitance lifetime estimation method of any one of claims 1 to 6 when executing the program.

Description

Bus capacitor life estimation method and device, storage medium and electronic equipment Technical Field The invention relates to the technical field of electronics, in particular to a bus capacitor life estimation method and device, a storage medium and electronic equipment. Background The bus capacitor (mostly film capacitor) is used as a core energy storage and filtering element of power electronic equipment such as a motor driving system, a frequency converter and the like, the health state of the bus capacitor directly determines the operation reliability of the whole equipment, the reliability of the film in the capacitor is a weak link of the whole system, and the performance attenuation of the bus capacitor is easy to cause equipment faults and influence the stable operation of the system. The traditional bus capacitor life prediction method is characterized in that a prediction model is built by relying on single parameters such as working temperature, internal temperature rise and the like, and obvious limitations exist under actual complex and changeable operation conditions. In practical application, the working voltage and ripple current of the capacitor are key factors influencing the service life of the capacitor, wherein the ripple current is the root cause of the aggravation of the internal temperature rise of the capacitor and the loss, and a single parameter model cannot reflect the influence of multi-factor coupling effect on the service life of the capacitor. In the existing partial online life prediction scheme, the ripple current is directly measured in an attempt mode of hardware sampling such as sampling resistor to perfect a prediction model, but the mode not only increases the hardware complexity of a system, but also improves the research, development and application cost of equipment. In summary, how to comprehensively consider the influence of multiple working conditions and multiple stresses on the service life of the bus capacitor on the premise of not adding additional hardware investment and realize high-precision online service life prediction of the capacitor has become a key technical problem of improving the reliability of a power electronic equipment system and pushing equipment to change from periodic maintenance to predictive maintenance. Disclosure of Invention The invention aims to provide a bus capacitor life estimation method, a device, a storage medium and electronic equipment, which can finish high-precision and high-efficiency bus capacitor online life estimation on the premise of not adding additional hardware sampling equipment and have good working condition self-adaption capability. In order to achieve the above purpose, the technical scheme adopted by the invention is as follows: In a first aspect, the invention discloses a bus capacitor life estimation method, which comprises the following steps: With sampling period Collecting operation characteristic parameters and instantaneous environment temperature of a system where the bus capacitor is located in real time; Judging the working condition category corresponding to the current sampling period according to the operation characteristic parameters Acquiring the unit damage life corresponding to the working condition categoryCorrection coefficient; Calculating to obtain the damage life increment of the current sampling periodThe calculation formula is:; Accumulating the damage increment of all sampling periods to obtain the total accumulated damage life; subtracting the total accumulated damage life from the rated life of the bus capacitor to obtain the residual life of the bus capacitor. According to the technical scheme, the real-time calculation of the service life damage is realized by collecting the system operation characteristic parameters and the instantaneous environment temperature in real time in a sampling period and combining the working condition type judgment, the dynamic change of the working condition and the environment temperature can be accurately captured, the service life damage calculation is synchronous with the actual aging process of the capacitor, the timeliness and the accuracy of residual service life evaluation are effectively improved, and the evaluation deviation caused by the working condition mutation and the temperature fluctuation is avoided. And the current working condition category is judged according to the operation characteristic parameters, the corresponding unit damage service life and correction coefficient are matched, the targeted adaptation of the working condition and service life damage model is realized, the differential influence of multi-factor coupling effect on the service life of the capacitor under different working conditions can be fully embodied, the physical aging mechanism of the capacitor is attached, the technical problem that the traditional single-parameter model can not reflect multi-working condition coupling damage is solved, and the se