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CN-122017508-A - Double-pulse testing method suitable for three-phase common-substrate power module

CN122017508ACN 122017508 ACN122017508 ACN 122017508ACN-122017508-A

Abstract

The invention discloses a double pulse test method suitable for a three-phase common substrate power module, which comprises the following steps of S1, performing double pulse test of upper bridge wave generation, and setting common part stray inductance as The respective stray inductances of each phase are the same and are all The method comprises the following steps of S1.1, calculating stray inductance during single-phase wave generation Step S1.2, calculating stray inductance during three-phase parallel wave generation Step S1.3 calculating the stray inductance of the common part Step S1.4, calculating newly added constraint conditions Step S2, performing double pulse test of lower bridge wave generation. According to the double-pulse testing method suitable for the three-phase common-substrate power module, the stray inductance of the common part is calculated through the testing waveform, and the new constraint condition is calculated, so that the double-pulse testing result is more reasonable.

Inventors

  • LUO JIRONG
  • WANG CHENGQUN
  • SHI SHAOLEI
  • WU YUFEI

Assignees

  • 浙江伊控动力系统有限公司

Dates

Publication Date
20260512
Application Date
20260127

Claims (5)

  1. 1. The double pulse test method suitable for the three-phase common substrate power module is characterized by comprising the following steps of: Step S1, performing double pulse test of upper bridge wave generation, and setting common part stray inductance as The respective stray inductances of each phase are the same and are all The specific implementation is as follows: Step S1.1, calculating stray inductance during single-phase wave generation ; Step S1.2, calculating stray inductance during three-phase parallel wave generation ; Step S1.3 calculating stray inductances of the common part ; Step S1.4, calculating newly added constraint conditions ; And S2, performing double pulse test of lower bridge wave generation.
  2. 2. A double pulse test method for a three phase common substrate power module as defined in claim 1, the method is characterized in that the step S1.1 is specifically implemented as follows: Taking a bridge arm of an upper bridge of any phase, testing the current flowing through a DC+ terminal through a current probe and testing the voltage at two ends of the upper bridge pipe of the phase through a voltage probe, thereby completing the double-pulse test circuit construction during single-phase wave generation, and setting that the current and the voltage acquired by an oscilloscope and the corresponding time sequence are respectively as follows when the circuit is switched on for the second time And The sampling data time interval of the oscilloscope is ; The original waveform is subjected to mean value filtering, the filtering order is set to be n f , and the filtered current and voltage sequences are respectively And The bus voltage is calculated as: (1); For a pair of Performing differentiation, wherein the following is made The number of the steps is, if any, (2); It is assumed that there is no delay between the voltage probe and the current probe, i.e. the delay between the voltage probe and the current probe And defining a sequence of curves comprising gap intervals Which satisfies the conditions that, (3); Wherein, the The total stray inductance for the power loop to be calculated; Definition of the data for computation Is the gap interval of , wherein, Is a curve sequence The point corresponding to the minimum of (a), i.e., (4); The maximum notch amplitude is Definition of Is a curve sequence Is closest to the preset value, i.e., (5); Definition of the definition And (3) with At the position of The gap distance of (2) is d, and there is, (6); Stray inductance including DC supporting capacitor and stray inductance of power module, set maximum Is that Taking 0.1nH as step length, and respectively taking For the following Each value of (2) has a corresponding curve And a distance d, find the minimum value among all d Then corresponding to Namely in time delay The total stray inductance calculated below; because of the time delay between the actual voltage probe and the current probe, the current data needs to be processed Translating, setting the absolute value of the maximum delay between the voltage probe and the current probe as Maximum translation point number is obtained The method can be used for solving the problems that, (7); When (when) When translating leftwards, the translation point number is , The data missing on the right after the translation is complemented, and then the current after the translation is obtained In order to achieve this, the first and second, (8); When (when) When translating rightwards, the translation point number is , The data missing from the left after the translation is filled up, so that the current after the translation can be obtained In order to achieve this, the first and second, (9); Referring to formulas (2) to (6), the same is true by translating the points Post current And Calculating the gap distance d Find the smallest in all cases If the minimum Appear at the current When not translating, then delay If the ratio is smallest Appear at the current During translation, the minimum is set Translation Point when present The calculated delay of the probe is, (10); Wherein when When translating to the left, the actual current probe lags behind the voltage probe When (1) When translating to the right, the actual voltage probe lags behind the current probe ; Thus, in all cases, the smallest Corresponding to Namely in time delay The total stray inductance L 1 calculated below; Thus, the first and second substrates are bonded together, (11)。
  3. 3. A double pulse test method for a three phase common substrate power module as defined in claim 2, the method is characterized in that the step S1.2 is specifically implemented as follows: The upper bridge of the three phases is connected in parallel, the same double pulse wave is adopted, the tested bridge arm is set to be the phase in the step S1.1, wherein, the current probe tests the current flowing through the DC+ terminal, the voltage probe tests the voltage at two ends of the U-phase upper bridge pipe, the step S1.1 is referred to, and the noise sense when the three phases are connected in parallel is calculated according to the measured voltage and current waveform when the circuit is opened for the second time , (12)。
  4. 4. A method of double pulse testing for a three phase common substrate power module according to claim 3, wherein in step S1.3, the method is calculated according to steps S1.1 and S1.2 And Combining (11) and (12) to obtain the stray inductance of the common part In order to achieve this, the first and second, (13)。
  5. 5. A double pulse testing method for a three phase common substrate power module as defined in claim 4, it is characterized in that in step S1.4, the voltage peak value of the allowable power module is set as Then get maximum The method can be used for solving the problems that, (14); For the newly added constraint condition, namely, during the double pulse test, proper driving parameters are selected to ensure the current drop stage when the tube is opened Absolute value is not more than 。

Description

Double-pulse testing method suitable for three-phase common-substrate power module Technical Field The invention belongs to the technical field of power module testing, and particularly relates to a double-pulse testing method suitable for a three-phase common-substrate power module. Background In the existing high-voltage electric drive system of the automobile, a power module is widely applied. The conventional power module adopts a three-phase independent ceramic substrate, and the three-phase common substrate power module integrates the three phases together and shares one ceramic substrate, so that the module volume is reduced, the cost is reduced, and the schematic diagrams of the conventional power module and the three-phase common substrate power module are shown in the attached figure 1. The current common dynamic test method for power modules is the double pulse test method. The conventional double pulse test method only tests double pulses of one phase at a time, and the voltage stress of the phase tube does not exceed a set value by adjusting driving parameters during the test. The conventional double-pulse testing method has no problem for a conventional power module, but has applicability problem for a three-phase common-substrate power module. This is because each phase of the conventional power module is connected to the DC supporting capacitor through a respective independent DC terminal, the coupling between the phases is small, and the stray inductance of the common portion is small, whereas the three-phase common substrate power module shares one substrate between the phases and is connected to the DC supporting capacitor through a common DC terminal, and the coupling between the phases is large, and the stray inductance of the common portion is large. If the conventional double-pulse test method is used for testing the three-phase common-substrate power module, the influence of the test on other two phases cannot be considered. This can lead to the situation that when the inverter is in operation, it is possible that a phase is on, its di/dt is large, so that the voltage drop over the stray inductance of the common part is large, and so that overvoltage stresses occur on the tubes where the other two phases are off. Disclosure of Invention The invention mainly aims to provide a double-pulse test method suitable for a three-phase common substrate power module, which is used for calculating stray inductances of a common part through test waveforms and calculating new constraint conditions. Double pulse test is carried out according to the new constraint condition, so that the condition of overvoltage stress caused by the influence of the parasitic inductance of the public part during the working of the inverter is avoided, and the double pulse test result is more reasonable. In order to achieve the above object, the present invention provides a double pulse test method suitable for a three-phase common substrate power module, comprising the following steps: Step S1, performing double pulse test of upper bridge wave generation, and setting common part stray inductance as The respective stray inductances of each phase are the same and are allThe specific implementation is as follows: Step S1.1, calculating stray inductance during single-phase wave generation ; Step S1.2, calculating stray inductance during three-phase parallel wave generation; Step S1.3 calculating stray inductances of the common part; Step S1.4, calculating newly added constraint conditions; And S2, performing double pulse test of lower bridge wave generation. As a further preferable technical scheme of the technical scheme, step S1.1 is specifically implemented as follows: Taking a bridge arm of an upper bridge of any phase, testing the current flowing through a DC+ terminal through a current probe and testing the voltage at two ends of the upper bridge pipe of the phase through a voltage probe, thereby completing the double-pulse test circuit construction during single-phase wave generation, and setting that the current and the voltage acquired by an oscilloscope and the corresponding time sequence are respectively as follows when the circuit is switched on for the second time AndThe sampling data time interval of the oscilloscope is; The original waveform is subjected to mean value filtering, the filtering order is set to be n f, and the filtered current and voltage sequences are respectivelyAndThe bus voltage is calculated as: (1); For a pair of Performing differentiation, wherein the following is madeThe number of the steps is, if any, (2); It is assumed that there is no delay between the voltage probe and the current probe, i.e. the delay between the voltage probe and the current probeAnd defining a sequence of curves comprising gap intervalsWhich satisfies the conditions that, (3); Wherein, the The total stray inductance for the power loop to be calculated; Definition of the data for computation Is the gap interval