CN-122017521-A - Testing device

CN122017521ACN 122017521 ACN122017521 ACN 122017521ACN-122017521-A

Abstract

The application discloses a testing device which comprises a testing machine, a resource adjusting plate and a switching module, wherein a plurality of groups of testing resources are formed on the testing machine, the resource adjusting plate is installed on the surface of the testing machine, a plurality of grooves are formed in the resource adjusting plate and correspond to the groups of testing resources on the testing machine, and the switching module comprises a plurality of groups of switching modules which are respectively installed on the grooves of the resource adjusting plate and are connected with the testing resources. By the device, flexible calling of the test resources on the testing machine is realized, and the flexibility of the testing device and the matching capability of the testing device with different test projects are improved.

Inventors

SUN RUIFENG
ZHOU DEXIANG
LIU JUN
PAN FEI

Assignees

天芯互联科技有限公司

Dates

Publication Date: 20260512
Application Date: 20260106

Claims (10)

1. A test device, the test device comprising: The testing machine is provided with a plurality of groups of testing resources; The resource adjusting plate is arranged on the testing machine, a plurality of grooves are formed in the resource adjusting plate, and the grooves correspond to a plurality of groups of testing resources on the testing machine; The switching module comprises a plurality of switching modules which are respectively arranged on the grooves of the resource adjusting plate and connected with the test resources.
2. The test device of claim 1, wherein the switching module comprises a normal switching module and a high frequency switching module.
3. The test device according to claim 1, wherein the resource adjusting plate is provided with a plurality of fixing holes around the circumference corresponding to the slots, and the adapter module is fixed to the resource adjusting plate through a fixing member and the fixing holes.
4. The testing device according to claim 1, wherein a locking mechanism is further arranged on the testing machine, the locking mechanism comprises two clamping plates which are arranged oppositely, the resource adjusting plate is placed between the two clamping plates, and the resource adjusting plate is fixed on the testing machine through the locking mechanism.
5. The test device of claim 1, further comprising an EVB test board for placing a chip to be tested, wherein the resource adjustment board is further provided with a windowing area for placing the EVB test board, and the windowing area is disposed corresponding to a central area of the tester.
6. The test device according to claim 5, wherein the EVB test board is provided with a test socket for mounting a chip to be tested, and a capacitor, a resistor and a dedicated chip for realizing the test of the chip to be tested; The EVB test board is also provided with a test connector protruding out of the surface of the EVB test board, and the test connector is connected with the switching module through a special wiring and then connected with test resources of the tester.
7. The test device of claim 6, wherein the EVB test board is further provided with a direct connection port directly connected to the tester, and the direct connection port penetrates the EVB test board and is directly connected to the test resource on the tester at the bottom.
8. The test apparatus of claim 1, wherein the resource adjustment plate comprises a plurality of first slots, the plurality of first slots being disposed in correspondence with core test resources of the tester.
9. The test device of claim 8, wherein the resource adjustment plate further comprises a plurality of second slots disposed on a side of the first slot along the first direction and away from the fenestration area, the second slots being disposed corresponding to extended test resources of the tester.
10. The test device of claim 8 or 9, wherein a plurality of the adapter modules are mounted on the slots of the resource adjustment plate in a first direction; the thickness of the test resource protruding out of the surface of the tester is not smaller than the thickness of the resource adjusting plate.

Description

Testing device Technical Field The invention relates to the technical field of chip testing, in particular to a testing device. Background Chip testing refers to using a tester platform to check whether the chip meets design requirements, and classifying and defining the defects of the chip according to the design specifications. The ATE tester is one kind of automatic equipment, and integrates various signal sources and reference standards for chip test to form one or several special testers, and the performance test of chip is completed under the cooperation of probe station or other equipment, such as sorting machine, etc. The test and verification of the chip are mainly finished by an ATE (Automatic Test Equipment) tester, the ATE tester is connected with the chip by a special probe card or LB Board (also called an IC test Load Board), the probe card or LB Board is usually high in development cost, the functions of the probe card or LB Board cannot be modified after production and is suitable for products with determined schemes and mass production, a plurality of probe cards or LB boards with different functions or different versions are possibly required to be input for greatly increasing the development period and development cost under the condition that the scheme is not determined or still needs to be further verified, and an EVB Board (Evaluation Board or experiment verification Board) can only be connected with instruments in a laboratory, and some functional tests cannot be finished and cannot deeply verify the performance of the chip. Disclosure of Invention The application mainly solves the technical problem of providing a testing device, which is characterized in that a resource adjusting plate is used for flexibly installing switching modules with required quantity on a testing machine, and the switching modules are used for flexibly calling testing resources on the testing machine, so that the matching capability of the testing machine with different testing items is improved, and the testing requirements of different chips are further met. In order to solve the problems, the application provides a testing device in a first aspect, wherein the testing device comprises a testing machine, a resource adjusting plate, a switching module and a switching module, wherein a plurality of groups of testing resources are formed on the testing machine, the resource adjusting plate is installed on the testing machine, a plurality of grooves are formed in the resource adjusting plate, the grooves are arranged corresponding to the groups of testing resources on the testing machine, and the switching module comprises a plurality of grooves which are respectively installed on the grooves of the resource adjusting plate and are connected with the testing resources. The switching module comprises a common switching module and a high-frequency switching module. The resource adjusting plate is provided with a plurality of fixing holes around the corresponding slots, and the switching module is fixed on the resource adjusting plate through fixing pieces and the fixing holes. Wherein, the testing machine is also provided with a locking mechanism which comprises two clamping plates arranged oppositely, the resource adjusting plate is placed between the two clamping plates and is fixed on the testing machine through the locking mechanism. The testing device further comprises an EVB testing board used for placing chips to be tested, a windowing area used for placing the EVB testing board is further arranged on the resource adjusting board, and the windowing area corresponds to the central area of the testing machine. The EVB test board is also provided with a test connector protruding out of the surface of the EVB test board, and the test connector is connected with the switching module through a special wiring and then connected with test resources of the tester. The EVB test board is also provided with a direct connection port which is directly connected with the tester, and the direct connection port penetrates through the EVB test board and is directly connected with the test resources on the tester at the bottom. The resource adjusting plate comprises a plurality of first grooves, and the first grooves are arranged corresponding to core testing resources of the testing machine. The resource adjusting plate further comprises a plurality of second grooves, the second grooves are formed in one side, away from the windowing area, of the first grooves along the first direction, and the second grooves are arranged corresponding to the extended test resources of the testing machine. The plurality of switching modules are arranged on the grooves of the resource adjusting plate along the first direction, and the thickness of the test resource protruding out of the surface of the tester is not smaller than the thickness of the resource adjusting plate. The application has the advantages that the test resources on the te