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CN-122017522-A - MCU electric characteristic automatic test system

CN122017522ACN 122017522 ACN122017522 ACN 122017522ACN-122017522-A

Abstract

The invention discloses an MCU electric characteristic automatic test system, which comprises upper computer software and a hardware test board card, wherein the upper computer software is used for establishing test excitation of simulation parameters of a chip to be tested, controlling test instrument equipment to be connected with the hardware test board card through a communication interface to perform data interaction with the chip to be tested, automatically completing test flow control and test data analysis and processing, the hardware test board card comprises a test main control MCU, a signal switching array, an impedance control and voltage regulation module, a calibration module and a special interface, the test main control MCU controls the signal switching array to realize test channel switching, the impedance control and voltage regulation module is used for providing adjustable test voltage and impedance, and the calibration module is used for realizing voltage and impedance self calibration, wherein the system has a self-calibration function and test channel isolation function, and the special interface is compatible with MCU products in different packaging forms.

Inventors

  • DAI ZHAOJUN
  • LI DONGDONG
  • Lian Hengxing

Assignees

  • 上海华虹集成电路有限责任公司

Dates

Publication Date
20260512
Application Date
20260113

Claims (10)

  1. 1. The MCU electrical characteristic automatic test system is characterized by comprising upper computer software and a hardware test board card; the upper computer software is used for establishing test excitation of simulation parameters of the chip to be tested, controlling test instrument equipment and the hardware test board card, and connecting with the chip to be tested through a communication interface to perform data interaction, and automatically completing test flow control, test data analysis and processing; The hardware test board comprises a test main control MCU, a signal switching array, an impedance control and voltage regulation module, a calibration module and a special interface; the test main control MCU controls the signal switching array to realize switching of the test channels; the impedance control and voltage regulation module is used for providing adjustable test voltage and impedance; the calibration module is used for realizing voltage and impedance self calibration; the system has the self-calibration function and the test channel isolation function, and the special interface is compatible with MCU products in different packaging forms.
  2. 2. The automated MCU electrical property testing system of claim 1, wherein the host software integrates Pytest a test framework based on Python development and encapsulates a VISA device driver and a Jlink/COM chip interface driver to control the instrument device and the chip to be tested.
  3. 3. The MCU electrical characteristic automatic test system of claim 1, wherein the hardware test board card is composed of an interface module, a test array switching module and a board level test module, the interface module is connected with a power supply and a signal SMA of instrument equipment and connected with a serial port and Jlink of a PC, the test array switching module realizes a signal switching array function, and the board level test module integrates the impedance control and voltage regulation module and a calibration module.
  4. 4. The MCU electrical characteristic automatic test system according to claim 1, wherein the signal switching array is composed of relays, and the test master MCU realizes selection of a chip to be tested connected with a PC or the test master MCU in four paths of chip to be tested paths by controlling on-off of the relays.
  5. 5. The MCU electrical characteristic automatic test system according to claim 1, wherein the test main control MCU of the hardware test board controls the digital potentiometer and the voltage regulating module through the SPI interface, the upper computer software sends a setting instruction to the test main control MCU through the serial port, and the test main control MCU adjusts the impedance of the digital potentiometer or the output voltage of the voltage regulating module and the rising/falling slope of the voltage through the SPI interface after the command analysis.
  6. 6. The MCU electrical characteristic automatic test system of claim 1, wherein the self-calibration function comprises power-on self-calibration and Golden sample periodic test comparison in test, the test main control MCU carries out ADC conversion on output voltage of a voltage regulation module and compares the output voltage with input voltage of instrument equipment, and submits test errors and early warning.
  7. 7. The automated MCU electrical property test system of claim 1, wherein: the special interface is a unified plug-in interface, and a power supply, a ground, a communication interface and IO trigger signals distributed beside pins of the chip to be tested are connected to the test platform through the short circuit cap so as to adapt to pin distribution of different chips.
  8. 8. The automated MCU electrical characteristic testing system of claim 1, wherein the host computer software integrates an analysis algorithm for collecting test data and judging its rationality, and automatically selects to execute retesting, calibration or optimizing test excitation.
  9. 9. The automated test system for electrical characteristics of an MCU of claim 1, The system supports multi-chip test scheduling, and realizes batch automatic test of a plurality of chips to be tested through a signal switching array.
  10. 10. The automated test system for electrical characteristics of an MCU of claim 1, The development flow of the electric characteristic test case comprises the steps of configuring and calling test instrument equipment, developing an embedded program of a chip to be tested to set a chip state, traversing test voltage and frequency environment parameters again, automatically acquiring a test result returned by the instrument or a test result of a test main control MCU, and finally storing test data into a file.

Description

MCU electric characteristic automatic test system Technical Field The invention relates to the field of integrated circuits, in particular to an MCU electric characteristic automatic test system. Background With the rapid development of integrated circuit technology, a Microcontroller (MCU) has evolved into a highly integrated system on a chip (SoC), and several tens of analog and digital-analog hybrid functional modules such as a Power Management Unit (PMU), a band gap reference source (BG), an analog-to-digital converter (ADC), a digital-to-analog converter (DAC), an operational amplifier (OPA), a Comparator (COMP), an internal oscillator (RCH), an external crystal oscillator interface (LXTAL), a liquid crystal drive (LCD controller) and the like are integrated in a single chip. The chip needs to comprehensively test the electrical characteristic parameters of each simulation module in the sample verification stage so as to ensure the reliability and consistency of the product in complex application scenes. However, the existing MCU electrical characteristic test mainly relies on a manual operation mode, and has the following significant drawbacks: Firstly, the test coverage is seriously insufficient, each simulation module comprises a plurality of electrical characteristic indexes, and the test of each index is required to be carried out under a plurality of environmental conditions. For example, the power module needs to cover the full range of VDD voltage 0-5.5 v and VBAT voltage 0-5.5 v, and verify the combination conditions of power-on time sequence, power-on slope, output level and other dimensions of the two. In the manual test mode, an operator can only select limited typical voltage points of 1.8V, 3.3V, 5.5V and the like for each parameter to verify, and cannot traverse all cross conditions, so that the test coverage rate is low, and potential defects under the limit working condition are difficult to expose. Secondly, the contradiction between the test efficiency and the sample size is remarkable, namely, the electric characteristic test needs to use a plurality of instruments and equipment such as a programmable power supply, a waveform generator, a frequency meter, a digital multimeter, an oscilloscope and the like in a coordinated manner, and the operation flows of manually configuring instrument parameters, switching test channels and recording test data are tedious and time-consuming. In the face of short marketing period required by the market, the verification department has to choose between the test depth and the progress to further compress the test sample size, and the discrete characteristic of the simulation parameters just needs a large sample size to be effectively evaluated, and the contradiction directly affects the accuracy of product quality risk evaluation. The test precision and stability are difficult to ensure, the analog signals are extremely sensitive to impedance matching and electromagnetic crosstalk of a test path, particularly high-precision OPA, ADC and other modules, and obvious measurement errors can be introduced in the process of impedance mismatch of test connecting lines, signal crosstalk during multi-channel parallel test and shunt and voltage division effects caused by a common power supply of a plurality of chips to be tested. The existing test platform lacks a systematic self-calibration mechanism and a channel isolation design, and the repeatability and accuracy of test results cannot be guaranteed. And fourthly, the packaging compatibility and the adapting cost are high, the MCU products have a plurality of line types, different packaging forms such as QFP, QFN, BGA are covered, and the definition difference of each packaging pin is obvious. The traditional test scheme needs to design a test main board for each package independently, has large hardware investment and long development period, is unfavorable for flexible multiplexing of test resources, and is difficult to adapt to the development rhythm of multi-type parallelism. In summary, the existing manual test mode cannot meet the requirements of the high-integration MCU chip on the comprehensiveness, the high efficiency, the accuracy and the compatibility of the electrical characteristic verification, so that the balance between the product verification period and the quality assurance capability is severely restricted, and an automatic, high-precision and generalized electrical characteristic test solution is urgently needed. Disclosure of Invention In the summary section, a series of simplified form concepts are introduced that are all prior art simplifications in the section, which are described in further detail in the detailed description section. The summary of the invention is not intended to define the key features and essential features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter. The invention aims to solve