CN-122017525-A - Method for supporting data merging by multi-site test of upper computer

CN122017525ACN 122017525 ACN122017525 ACN 122017525ACN-122017525-A

Abstract

The application relates to the technical field of industrial automation test and discloses a method for combining multi-station test support data of an upper computer, which comprises the steps that the upper computer establishes a mapping relation between a test station serial number and a physical position offset; the method comprises the steps of responding to a global index signal of a sorting machine to update a global index variable, calculating a unique identifier of a device of each site according to the global index variable and a physical position offset, accessing a virtual shift register according to the unique identifier, inquiring a historical state to decide to issue an enabling or shielding instruction and execute state inheritance, and associating and splicing the cleaned asynchronous test logs by taking the unique identifier of the device as a main key. According to the application, by constructing a logic operation system, the mechanical motion is mapped into the unique identifier which does not change along with time, the test and motion time sequence is decoupled, the problem of data dislocation caused by communication delay, retest or physical empty materials in multi-station test is effectively solved, and the accuracy of production data is ensured.

Inventors

Request for anonymity

Assignees

南京宏泰半导体科技股份有限公司
上海宏泰芯半导体科技有限公司

Dates

Publication Date: 20260512
Application Date: 20260129

Claims (10)

1. The method for supporting data combination by multi-station testing of the upper computer is applied to a testing system comprising the upper computer, a sorting machine and a plurality of testing stations arranged according to the physical station sequence, and is characterized by comprising the following steps: s100, system initialization and physical mapping construction, wherein an upper computer reads a configuration file, and establishes a mapping relation between a station serial number of each test station and a physical position offset to determine the station interval number of each test station relative to the first test station; S200, acquiring a global index signal and monitoring periodic variation, wherein an upper computer receives the global index signal sent by the sorting machine and updates an internally maintained global index variable in response to the variation of the global index signal, and the global index variable is used as a space-time reference standard of the test system; S300, calculating device unique identifiers of all the test sites in parallel, namely, after the global index variable is updated, calculating the device unique identifiers of the devices to be tested, which are positioned at the test sites at the current moment, according to the current global index variable and the physical position offset corresponding to the test sites by using an upper computer aiming at each test site in an activated state; S400, controlling the test authority based on the virtual shift register, wherein the upper computer accesses the virtual shift register residing in the running memory according to the unique identifier of the device, inquires the historical test state of the device to be tested in the last test period, accordingly determines to issue a test enabling instruction or a test shielding instruction to the current test site, and writes back a test result to the virtual shift register after the test is completed; And S500, merging asynchronous data, namely, using the unique identifier of the device as a main key by the upper computer, and correlating and splicing test logs of the test sites belonging to the same device to be tested to generate a complete device test record.
2. The method for supporting data merging for multi-site testing of an upper computer according to claim 1, wherein the step S100 is to establish a mapping relationship between a site serial number of the testing site and a physical position offset, and specifically includes: The upper computer analyzes the configuration file to obtain the number of physical station intervals between two adjacent test stations; The upper computer sets the physical position offset of the first test site to be zero; And the upper computer executes accumulation calculation on all the physical station interval numbers from the first test station to the current test station for each subsequent test station, and determines the value obtained by the accumulation calculation as the physical position offset of the current test station.
3. The method for supporting data merging for multi-site testing of a host computer according to claim 1, wherein the updating of the internally maintained global index variable in response to the change of the global index signal in S200 specifically comprises: When the global index signal is a pulse signal, the upper computer monitors the level jump state of the pulse signal, and when the effective level jump is detected, the upper computer executes the numerical value self-increasing operation on the global index variable; When the global index signal is a register count value, the upper computer periodically reads the register count value, and when the difference value between the currently read value and the cache value is calculated to be equal to a preset stepping increment, the value self-increasing operation is performed on the global index variable.
4. The method for supporting data merging for multi-site testing of a host computer according to claim 1, wherein in S300, according to the current global index variable and the physical position offset corresponding to the test site, calculating a device unique identifier of a device to be tested located at the test site at the current moment, specifically comprising the following steps that the host computer performs subtraction operation for each test site in an active state; The subtraction operation is to subtract the physical position offset corresponding to the current test site by using the current global index variable to obtain the unique identifier of the device.
5. The method for supporting data merging for multi-site testing of a host computer according to claim 1, wherein said virtual shift register in S400 is configured as a key value pair storage structure residing in a running memory, said virtual shift register comprising said device unique identifier as an index key; The test states include an initial state that characterizes the device as not arriving, a pass state that characterizes the test as passing, a fail state that characterizes the test as not passing, and a blank state that characterizes the device without physics.
6. The method for supporting data merging for multi-site testing of a host computer according to claim 5, wherein the step S400 is to query a historical testing state of the device under test in a previous testing period, and accordingly determine to issue a test enabling instruction or a test masking instruction to the current testing site, and specifically comprises: when the test station is a non-first test station, the upper computer reads a logic segment value corresponding to the last test station in the state vector; when the logic segment value of the last test site is the qualified state, the upper computer judges that the test is allowed and generates a control message containing an enabling operation code; and when the logic segment value of the last test station is in the failure state or the empty state, the upper computer judges the test mask and generates a control message containing a mask operation code.
7. The method for supporting data merging for multi-site testing of a host computer according to claim 6, wherein when generating the control message including the mask operation code, the method further comprises performing a state inheritance operation: and the upper computer directly updates the logic segment value corresponding to the current test site in the virtual shift register into the same value as the logic segment value of the last test site, so that the failure state or the empty state is transmitted backwards in the virtual shift register along with the unique identifier of the device.
8. The method for supporting data merging for multi-site testing of a host computer according to claim 1, wherein the test log in S500 comprises the unique device identifier, a site number and a generation timestamp; Before the test logs are associated and spliced, the method further comprises a data cleaning step, wherein the upper computer temporarily stores the received test logs into a buffer pool and groups a plurality of test logs with the same unique device identification and the same site number; And the upper computer keeps one test log with the largest generated timestamp value in each group as an effective test record, and removes the rest test logs in the same group.
9. The method for supporting data merging for multi-site testing of a host computer according to claim 8, wherein in S500, the test logs of the test sites belonging to the same device under test are associated and spliced, specifically comprising: The upper computer creates a target data table containing the unique identification column and a plurality of parameter columns of the device; The upper computer performs all-external connection operation on the effective test records, and fills the effective test records belonging to the same unique identifier of the device into the parameter columns corresponding to the target data table; And when the upper computer does not retrieve the valid test record corresponding to the specific test site, filling a preset null value code or a skip code in the corresponding position of the target data table.
10. The method for supporting data merging for multi-site testing of a host computer as set forth in claim 5, further comprising the step of processing for physical empty, wherein when said test site is a first test site and the entry sensor outputs a low level, the host computer marks the logical segment value corresponding to the first test site in said virtual shift register as said empty state; in the step of merging the asynchronous data in S500, when the upper computer recognizes that the test state corresponding to the device unique identifier is the empty state, the generated device test record is marked with a skip identifier.

Description

Method for supporting data merging by multi-site test of upper computer Technical Field The invention relates to the technical field of industrial automation testing, in particular to a method for combining multi-station testing support data of an upper computer. Background In the subsequent package test links of semiconductor chips and electronic components, a sorter generally needs to drive the devices to be tested to sequentially pass through a plurality of physical test stations so as to finish parallel or serial test of different electrical parameters. The upper computer system is used as a control core of the whole production line and is responsible for coordinating mechanical actions, issuing test instructions and collecting filing test data. Existing multi-site test systems typically rely on the time sequence of uploading test results or first-in-first-out queue logic when establishing a correspondence between the machine position and the test data. This approach requires that the mechanical action beats of the classifier remain strictly synchronized with the electrical testing time consumption of the individual stations. However, in actual production, the test time consumption of each test site tends to be different and is susceptible to communication blockage or instrument response delay. Once the test data of a certain site is uploaded with lag, the association mode which simply depends on the time stamp or the sequence count is extremely easy to cause the dislocation of all subsequent data records, so that the data in the test report cannot be correctly corresponding to an actual physical device. In terms of the transfer control of the device state, the conventional technology relies mostly on the level inversion of the hardware signal line to trigger the test or transfer the sorting result. This hardware coupling approach, while operating steadily in an ideal state, lacks flexibility in handling abnormal conditions. For example, when the suction nozzle of the classifier fails to suck physical empty materials or the device is judged to be unqualified in the previous process and the subsequent test is needed to be skipped, the hardware signal logic often has difficulty in bearing the complex state inheritance requirement. The logic queue index of the upper computer is easy to be disjointed with the actual state on the physical station, and the system cannot effectively identify and process empty materials or continuous failure conditions, so that errors of control instruction issuing are caused. In the final data summarization stage, the system faces difficulties in processing redundant data generated by simultaneous retesting or logs uploaded discretely at multiple sites due to the lack of a logic unique identifier penetrating through the whole process. The existing data processing mode is difficult to automatically reject invalid historical retest records, and scattered heterogeneous data cannot be spliced accurately under the condition of lacking a unified logical primary key. This not only increases the amount of manual data proofing, but may also lead to impaired integrity and traceability of the production report due to data line alignment errors. Disclosure of Invention Aiming at the defects of the prior art, the invention provides a method for supporting data merging by multi-station testing of an upper computer, which solves the problem of data dislocation caused by asynchronous mechanical action and electrical testing time sequence in multi-station testing and the problem of difficult state transmission and data merging under physical empty materials or abnormal working conditions. In order to achieve the above purpose, the invention is realized by the following technical scheme: the invention provides a method for supporting data combination for multi-station testing of an upper computer, which is applied to a testing system comprising the upper computer, a sorting machine and a plurality of testing stations arranged according to the physical station sequence. The method mainly comprises the steps of reading a configuration file by an upper computer, establishing a mapping relation between a site serial number and a physical position offset of a test site to determine the number of station intervals of each test site relative to a first test site, receiving global index signals sent by a sorting machine by the upper computer, updating global index variables maintained in the upper computer according to the changes of the global index signals, taking the global index variables as space-time reference standards of a test system, after the global index variables are updated, calculating unique device identifiers of devices to be tested, located at the test site at the current moment, according to the current global index variables and the physical position offset corresponding to the test site, by the upper computer, accessing a virtual shift register configured in an operation memory acc