CN-122017532-A - Method and device for detecting test programming errors or misconvergence of chip

CN122017532ACN 122017532 ACN122017532 ACN 122017532ACN-122017532-A

Abstract

The application provides a method and a device for detecting a chip test programming error or a wrong mixing material, and relates to the technical field of chip detection. Analyzing the test data file, extracting the programming value and the chip identification of each chip in the current batch, and uploading the programming value and the chip identification to a database. Comparing the programming value and the chip identification of each chip in the current batch with corresponding data in a database, and judging whether the current batch has programming errors or misconvergence. If the current batch has programming errors or misconvergence, the report checking system triggers the out-of-control action planning flow in the manufacturing execution system. If the current batch does not have programming errors and error mixing, the report checking system informs the manufacturing execution system of allowing the chips of the current batch to normally go out of the station, so that the detection efficiency and accuracy are improved, and the delivery quality of the chips is ensured.

Inventors

ZHANG WENYAN
QIAN YULI
ZUO YAO

Assignees

苏州共进微电子技术有限公司

Dates

Publication Date: 20260512
Application Date: 20260224

Claims (10)

1. A method for detecting a test programming error or misconvergence of a chip, the method comprising the steps of: The report checking system acquires a test data file obtained after the final test procedure of the chips in the current batch is completed; Analyzing the test data file, extracting the programming value and the chip identification of each chip in the current batch, and uploading the programming value and the chip identification to a database; Comparing the programming value and the chip identifier of each chip in the current batch with corresponding data in the database, and judging whether the current batch has programming errors or error mixing; If the current batch has programming errors or wrong materials, triggering an out-of-control action planning flow in the manufacturing execution system by the report checking system; if the current batch does not have programming errors and error mixing, the report checking system informs the manufacturing execution system to allow the chips of the current batch to normally go out of the station.
2. The method for detecting a programming error or a misconnection of chips according to claim 1, wherein the step of comparing the programming value and the chip identifier of each chip in the current lot with the corresponding data in the database to determine whether the programming error or misconnection exists in the current lot comprises: comparing the programming value of each chip in the current batch with the corresponding programming target value in the database, and if the programming value is inconsistent with the programming target value, judging that the current batch has programming errors; And comparing the chip identification of each chip in the current batch with the chip identification of the historical batch in the database, and if the chip identification has a matching item in the historical batch record, judging that the current batch has wrong materials.
3. The method for detecting a chip test programming error or a miscompare as claimed in claim 2, wherein comparing the programming value of each chip in the current lot with the corresponding programming target value in the database, and if the programming value is inconsistent with the programming target value, determining that the current lot has the programming error comprises: reading a programming target value of a test item corresponding to the current chip from the database; Comparing the programming value of the current chip with the programming target value; If the programming value of the current chip is inconsistent with the programming target value, determining that the current chip has programming errors; if at least one chip in the current batch is judged to be the programming error, the current batch is judged to be the programming error.
4. The method for detecting a programming error or a miscompare of claim 2, wherein the step of comparing the chip identifier of each chip in the current lot with the chip identifiers of the historical lots in the database, and determining that the miscompare exists in the current lot if the chip identifiers have a matching entry in the historical lot record comprises: Checking and comparing the chip identification of the current chip with the chip identifications of the rest chips in the current batch and the chip identifications of all the chips in the historical batch stored in the database; If the chip identification of the current chip has a matching item in the current batch or the history batch record, judging that the current chip has wrong materials; if at least one chip in the current batch is judged to be mixed in a wrong way, judging that the current batch is mixed in a wrong way.
5. The method for detecting a programming error or a miscompare of a chip test according to claim 1, wherein the step of obtaining the test data file obtained after the final test procedure of the chips of the current lot by the report checking system comprises: After finishing the final test procedure of the chips in the current batch, the automatic tester generates a test data file and uploads the test data file to a data server; the report checking system reads the test data file from the data server.
6. The method for detecting a chip test programming error or miscompare of claim 1, wherein the step of the report checking system triggering an out of control action planning procedure in a manufacturing execution system comprises: the report checking system sends a detection failed signal to the manufacturing execution system; the manufacturing execution system responds to the detection failed signal, intercepts the current batch to pass the station, and starts an out-of-control action planning flow.
7. The method of claim 1, wherein the step of notifying the manufacturing execution system of the permission of the current lot of chips to normally go out of station comprises: the report checking system sends a detection passing signal to the manufacturing execution system; And the manufacturing execution system responds to the detection passing signal and allows the chips of the current batch to normally pass through the station to enter the next process.
8. The method of claim 1, wherein the report checking system communicates with the manufacturing execution system via an application programming interface.
9. The method for detecting a chip test programming error or misconvergence as claimed in claim 1, further comprising: after the comparison of the programming values and the chip identification is executed, the report checking system generates a log file and stores the log file in a preset local path, wherein the log file comprises the detection time, batch number, checking results of all test items and abnormal chip numbers; When the current batch is judged to have a programming error or a wrong mixture, the report checking system sends the log file to a preset recipient mailbox through a mail.
10. An apparatus for detecting a chip test programming error or misconvergence, applied to the report checking system, for performing the method for detecting a chip test programming error or miscompare as set forth in any one of claims 1 to 9, the apparatus comprising: The acquisition module is used for acquiring test data files obtained after the final test procedure of the chips in the current batch is completed; The analysis module is used for analyzing the test data file, extracting the programming value and the chip identification of each chip in the current batch and uploading the programming value and the chip identification to the database; the comparison module is used for comparing the programming value and the chip identifier of each chip in the current batch with corresponding data in the database and judging whether programming errors or error mixing exist in the current batch; the linkage module is used for triggering an out-of-control action planning flow in the manufacturing execution system when the current batch has programming errors or error mixing, and informing the manufacturing execution system to allow the chips of the current batch to normally go out of the station when the current batch does not have programming errors or error mixing.

Description

Method and device for detecting test programming errors or misconvergence of chip Technical Field The application relates to the technical field of chip detection, in particular to a method and a device for detecting a chip test programming error or a wrong material mixing. Background In the semiconductor chip test link, a final test (FINAL TEST, FT) procedure is required to perform an electrical test on the chip, and a test program or configuration data is programmed into the chip. If chip programming errors or wrong mixing occur, abnormal chip functions or batch confusion can be caused. The traditional method relies on manual spot inspection, so that the efficiency is low, the spot inspection is easy, and the delivery quality of the chip is difficult to guarantee. Disclosure of Invention The application aims to provide a method and a device for detecting a test programming error or a wrong mixing material of a chip, so as to improve the detection efficiency and accuracy and ensure the delivery quality of the chip. In order to achieve the above purpose, the technical scheme adopted by the application is as follows: in one aspect, the application provides a method for detecting a test programming error or a misconvergence of a chip, the method comprising the following steps: The report checking system acquires a test data file obtained after the final test procedure of the chips in the current batch is completed; Analyzing the test data file, extracting the programming value and the chip identification of each chip in the current batch, and uploading the programming value and the chip identification to a database; Comparing the programming value and the chip identifier of each chip in the current batch with corresponding data in the database, and judging whether the current batch has programming errors or error mixing; If the current batch has programming errors or wrong materials, triggering an out-of-control action planning flow in the manufacturing execution system by the report checking system; if the current batch does not have programming errors and error mixing, the report checking system informs the manufacturing execution system to allow the chips of the current batch to normally go out of the station. Further, comparing the programming value and the chip identifier of each chip in the current batch with the corresponding data in the database, and judging whether the current batch has programming errors or misconvergence comprises the following steps: comparing the programming value of each chip in the current batch with the corresponding programming target value in the database, and if the programming value is inconsistent with the programming target value, judging that the current batch has programming errors; And comparing the chip identification of each chip in the current batch with the chip identification of the historical batch in the database, and if the chip identification has a matching item in the historical batch record, judging that the current batch has wrong materials. Further, comparing the programming value of each chip in the current batch with the corresponding programming target value in the database, and if the programming value is inconsistent with the programming target value, determining that the current batch has programming errors includes: reading a programming target value of a test item corresponding to the current chip from the database; Comparing the programming value of the current chip with the programming target value; If the programming value of the current chip is inconsistent with the programming target value, determining that the current chip has programming errors; if at least one chip in the current batch is judged to be the programming error, the current batch is judged to be the programming error. Further, comparing the chip identifier of each chip in the current batch with the chip identifiers of the historical batches in the database, if the chip identifiers have matching items in the historical batch records, the step of judging that the current batch has error mixing comprises the following steps: Checking and comparing the chip identification of the current chip with the chip identifications of the rest chips in the current batch and the chip identifications of all the chips in the historical batch stored in the database; If the chip identification of the current chip has a matching item in the current batch or the history batch record, judging that the current chip has wrong materials; if at least one chip in the current batch is judged to be mixed in a wrong way, judging that the current batch is mixed in a wrong way. Further, the step of obtaining the test data file obtained by the report checking system after the final test procedure of the chips in the current batch includes: After finishing the final test procedure of the chips in the current batch, the automatic tester generates a test data file and uploads the test data file to a data server; t