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CN-122017533-A - Chip multichannel parallel testing device and testing method

CN122017533ACN 122017533 ACN122017533 ACN 122017533ACN-122017533-A

Abstract

The application relates to the technical field of chip test, in particular to a chip multichannel parallel test device and a test method, comprising an equipment main body and a first motor, wherein the inner cavity of the equipment main body is rotationally connected with a third threaded rod, the outer surface of the equipment main body is provided with the first motor, the output end of the first motor is sleeved with the third threaded rod, the application can remove dust on the outer surface of a chip before the chip is tested through a dust removing mechanism, meanwhile, the adjustable flexible cleaning mode is adopted, damage to the chip in the cleaning process is avoided, multichannel parallel synchronous test can be carried out on the chip through the feeding assembly and the testing mechanism, the efficiency of test is greatly improved, the chip can be quickly taken out after the test is finished, the chip can be accurately positioned in the chip testing process, and poor contact in the testing process is avoided.

Inventors

  • LI FENGMING
  • SUN CHENGYONG
  • NIU JIE
  • LIANG WENBIN

Assignees

  • 广东顺为微电子技术有限公司

Dates

Publication Date
20260512
Application Date
20260224

Claims (8)

  1. 1. The utility model provides a parallel testing arrangement of chip multichannel, includes equipment main part (1) and first motor (2), the inner chamber rotation of equipment main part (1) is connected with third threaded rod, the surface of equipment main part (1) is provided with first motor (2), the output and the third threaded rod of first motor (2) cup joint, a serial communication port, the surface of equipment main part (1) is provided with dust removal mechanism (3), the surface fixed mounting of equipment main part (1) has lug (4), the surface of equipment main part (1) is provided with feeding subassembly (5), the top diapire of equipment main part (1) is provided with testing mechanism (6); The feeding assembly (5) comprises a feeding frame (51), a feeding mechanism (52) is arranged in an inner cavity of the feeding frame (51), a button (53) is arranged on the inner wall of the feeding frame (51), alarms (54) are fixedly arranged at two ends of the feeding frame (51), a connecting plate (55) is arranged on the outer surface of the dust removing mechanism (3), a positioning rod (56) is fixedly arranged on the outer surface of the testing mechanism (6), and a positioning wheel (57) is rotatably connected to the bottom end of the positioning rod (56).
  2. 2. The chip multichannel parallel testing device according to claim 1, wherein the feeding frame (51) is slidably connected with the device main body (1), the bottom end of the feeding frame (51) is connected with the third threaded rod through threads, buttons (53) are arranged on two sides of the feeding frame (51), a connecting plate (55) penetrates between the two buttons (53) when the feeding frame (51) moves, two ends of the buttons (53) are in a chamfer shape, the buttons (53) are electrically connected with the alarm (54), the pressing of the buttons (53) controls the alarm (54) to send out an alarm, two bumps (4) are arranged, and two ends of each bump (4) are in a chamfer shape.
  3. 3. The chip multichannel parallel test device according to claim 1, wherein the feeding mechanism (52) comprises a connecting block (521), a positioning groove (522) is formed in the upper surface of the connecting block (521), feeding plates (523) are fixedly installed at two ends of the positioning groove (522), discharging blocks (524) are uniformly installed on the upper surface of the feeding plates (523), sliding rods (525) are fixedly installed on the outer surfaces of the feeding plates (523) away from the connecting block (521), second springs (526) are sleeved on the outer surfaces of the sliding rods (525), stripping mechanisms (527) are arranged in inner cavities of the feeding plates (523), the connecting block (521) and the feeding plates (523) are in sliding connection with the feeding frames (51), the second springs (526) are located between the feeding plates (523) and the inner walls of the feeding frames (51), and when the positioning rods (56) move downwards, the positioning wheels (57) are clamped with the positioning grooves (522).
  4. 4. A multi-channel parallel chip testing device as claimed in claim 3, wherein the stripping mechanism (527) comprises a stripping plate (5271), two ends of the stripping plate (5271) are rotationally connected with a rotating wheel (5272), a jacking rod (5273) is fixedly arranged on the upper surface of the stripping plate (5271), a stripping plate (5274) is fixedly arranged at the top end of the jacking rod (5273), a third spring (5275) is sleeved on the outer surface of the jacking rod (5273), the distance between the rotating wheel (5272) and the distance between two bumps (4) are equal, the bottom end of the rotating wheel (5272) passes through the chamfer of the bumps (4) when the feeding frame (51) moves, the jacking rod (5273) is tightly attached to the inner cavity of the discharging block (524), the jacking rod (5273) is slidably connected with the discharging block (524), the third spring (5275) is positioned between the inner wall of the feeding plate (523) and the stripping plate (5271), and the feeding plate (523) is slidably connected with the top end of the feeding plate (5273).
  5. 5. The chip multichannel parallel testing device according to claim 1, wherein the dust removing mechanism (3) comprises a dust removing frame (31), a first threaded rod (32) is connected to an inner cavity of the dust removing frame (31) through threads, a lifting plate (33) is rotatably connected to the bottom end of the first threaded rod (32), a first limit rod (34) is fixedly arranged on the outer surface of the lifting plate (33), a storage rod (35) is fixedly arranged on the lower surface of the lifting plate (33) and is in sliding connection with the dust removing frame (31), a buffer rod (36) is slidably connected to the inner cavity of the storage rod (35), a first spring (37) is arranged in the inner cavity of the storage rod (35), a cleaning brush (38) is fixedly arranged at the bottom end of the buffer rod (36), cleaning cotton (39) is arranged on the lower surface of the cleaning brush (38), and connecting plates (55) are fixedly arranged on the inner walls of two sides of the dust removing frame (31).
  6. 6. The chip multichannel parallel testing device according to claim 1, wherein the testing mechanism (6) comprises a testing frame (61), an air cylinder (62) is fixedly installed on the inner wall of the top end of the device main body (1), a piston rod is slidably connected to an inner cavity of the air cylinder (62), the upper surface of the testing frame (61) is fixedly connected with the piston rod, a second limiting rod (63) is fixedly installed on the upper surface of the testing frame (61), the inner cavity of the testing frame (61) is connected with a second threaded rod (64), a second motor (65) is arranged on the outer surface of the testing frame (61), a first moving block (66) and a second moving block (69) are slidably connected to the outer surface of the testing frame (61), a rotating rod (67) is rotatably connected to the outer surface of the testing frame (61), a conveying belt (68) is sleeved on the outer surface of the rotating rod (67), detection probes (610) are fixedly installed on the lower surfaces of the first moving block (66) and the second moving block (69), and the lower surface of the positioning rod (61) are fixedly connected with each other.
  7. 7. The chip multichannel parallel testing device according to claim 6, wherein the second limiting rod (63) is slidably connected with the inner cavity of the device main body (1), the output end of the second motor (65) is sleeved with the second threaded rod (64), the first moving block (66) is in threaded connection with the second threaded rod (64), one side, away from the second threaded rod (64), of the first moving block (66) is fixedly connected with the conveyor belt (68), and one side, away from the first moving block (66), of the conveyor belt (68) is fixedly connected with the second moving block (69).
  8. 8. A chip multichannel parallel test method, according to any one of claims 1-7, characterized by comprising the following steps: s1, sequentially placing chips to be detected into an inner cavity of a feeding assembly (5) for feeding, and enabling the chips to move to the lower end of a testing mechanism (6) for detection; S2, in the feeding process, the third threaded rod is driven to rotate through the operation of the first motor (2), the rotation of the third threaded rod drives the dust removing mechanism (3) to move on the equipment main body (1), and the dust removing treatment is continuously carried out on the chip on the feeding assembly (5) when the chip moves to the dust removing mechanism (3); S3, carrying out multichannel parallel test on the chip through the cooperation of the feeding assembly (5) and the testing mechanism (6), so as to improve the testing efficiency; s4, after the test is finished, the feeding assembly (5) moves through the bump (4) to facilitate stripping treatment on the chip on the feeding assembly (5), and the chip is conveniently and rapidly taken out of the feeding assembly (5).

Description

Chip multichannel parallel testing device and testing method Technical Field The application relates to the technical field of chip testing, in particular to a chip multichannel parallel testing device and a testing method. Background The chip is a core carrier of the integrated circuit and is made of semiconductor materials, the core functions of the chip comprise data processing, signal conversion, storage control and the like, the chip is required to be tested in the production process, and the chip test is a key link for ensuring the performance and the reliability of the integrated circuit and covers function verification, performance evaluation and reliability detection. Along with the increase of the complexity of chips, the test requirements are increasing, the efficiency of the traditional single-channel serial test mode is low, and the requirement of mass production is difficult to meet. Therefore, it is necessary to create a chip multi-channel parallel test device to realize efficient parallel test, so as to improve the overall test efficiency and ensure the chip quality. The prior art also has the following problems: 1. The existing testing device cannot carry out dust removal treatment on a plurality of chips before testing, so that dust particles possibly fall on chip pins or probes in the testing process of part of chips, and inaccurate testing data are caused by poor contact. 2. The existing testing device is difficult to synchronously test multiple channels in parallel, so that testing efficiency is reduced, chips are difficult to take out quickly after testing is finished, a chip processing period is prolonged due to manual chip taking, high-speed automatic production line beats cannot be matched, in addition, accurate positioning of the chip position is difficult to ensure when the chips are fed, poor contact is caused by positioning errors, a parameter measured value deviates from a real level, a good product is possibly misjudged, the chip surface is possibly scratched or a probe is possibly damaged, and accordingly equipment is damaged. Disclosure of Invention In order to overcome the defects that a testing device cannot perform dust removal treatment on a plurality of chips before testing, so that dust particles possibly fall on chip pins or probes in the testing process of part of chips, inaccurate testing data is caused by poor contact, the testing device is difficult to synchronously test multiple channels simultaneously, testing efficiency is reduced, the chips are difficult to quickly take out after testing is finished, a chip processing period is prolonged due to manual chip taking, high-speed automatic production line beats cannot be matched, in addition, accurate positioning of the positions of the chips is difficult to ensure when the chips are fed, poor contact is caused by positioning errors, parameter measured values deviate from a real level, defective products can be misjudged, the surfaces of the chips can be scratched or the probes can be damaged, equipment is damaged, and the like, the invention aims to provide the chip multichannel parallel testing device and the testing method. The application provides a chip multichannel parallel testing device which comprises an equipment main body and a first motor, wherein a third threaded rod is rotatably connected to an inner cavity of the equipment main body, the first motor is arranged on the outer surface of the equipment main body, an output end of the first motor is sleeved with the third threaded rod, a dust removing mechanism is arranged on the outer surface of the equipment main body, a lug is fixedly arranged on the outer surface of the equipment main body, a feeding component is arranged on the outer surface of the equipment main body, a testing mechanism is arranged on the bottom wall of the top end of the equipment main body, the feeding component comprises a feeding frame, the inner cavity of the feeding frame is provided with the feeding mechanism, a button is arranged on the inner wall of the feeding frame, alarms are fixedly arranged at two ends of the feeding frame, a connecting plate is arranged on the outer surface of the dust removing mechanism, a positioning rod is fixedly arranged on the outer surface of the testing mechanism, and a positioning wheel is rotatably connected to the bottom end of the positioning rod. Further, pay-off frame and equipment main part sliding connection, and the bottom and the third threaded rod of pay-off frame pass through threaded connection, and the both sides of pay-off frame all are provided with the button, and the connecting plate passes between two buttons when the pay-off frame removes, and the both ends of button are chamfer form, button and siren electric connection, and the pressing control siren of button send out the police dispatch newspaper, and the lug has two, and the both ends of lug are chamfer form. Further, feeding mechanism includes the connecting block, t