CN-122017676-A - Open channel test circuit, system and method

CN122017676ACN 122017676 ACN122017676 ACN 122017676ACN-122017676-A

Abstract

The invention relates to the technical field of equipment testing, and particularly discloses a channel open-circuit testing circuit, a channel open-circuit testing system and a channel open-circuit testing method. The channel open-circuit test circuit comprises an MOS drive module, an open-circuit detection module and a fault diagnosis module, wherein the MOS drive module comprises a plurality of output ports and feedback ports fewer than the output channels, the MOS drive module forms the output channels through the output ports and corresponding external loads, the output ends of the open-circuit detection module are connected with the output channels, the feedback ports of the MOS drive module are connected with the fault diagnosis module, the open-circuit detection module generates open-circuit detection signals and transmits the open-circuit detection signals to the MOS drive module through the output channels to be detected, the MOS drive module generates diagnosis feedback signals according to the open-circuit detection signals and transmits the diagnosis feedback signals to the fault diagnosis module through the corresponding feedback ports, and the fault diagnosis module judges whether the open-circuit conditions of the output channels to be detected occur according to the level states of the diagnosis feedback signals, so that independent detection of the output channels is realized.

Inventors

LI WEI
SHEN GUODONG
DENG ZHIHENG
Fang Nani
MO SHIBIN
ZHANG CHUANMEI
LIU KECHENG
LAN QIULING

Assignees

东风柳州汽车有限公司

Dates

Publication Date: 20260512
Application Date: 20260120

Claims (10)

1. The channel open circuit test circuit is characterized by comprising a MOS driving module, an open circuit detection module and a fault diagnosis module, wherein the MOS driving module comprises a plurality of output ports and feedback ports, and the number of the feedback ports is less than that of the output channels; The MOS driving module forms an output channel with a corresponding external load through each output port, the output end of the open circuit detection module is connected with the output channel, and each feedback port of the MOS driving module is connected with the fault diagnosis module; the open circuit detection module is used for generating an open circuit detection signal and transmitting the open circuit detection signal to the MOS driving module through the output channel to be detected; The MOS driving module is used for generating a diagnosis feedback signal according to the open circuit detection signal and transmitting the diagnosis feedback signal to the fault diagnosis module through the corresponding feedback port; the fault diagnosis module is used for judging whether the output channel to be detected has an open circuit condition according to the level state of the diagnosis feedback signal transmitted by the feedback port.
2. The open channel test circuit of claim 1 wherein said open channel detection module comprises a first resistor corresponding to the number of output channels; The first end of each first resistor is connected with an external power supply end, and the second end of each first resistor is connected with the corresponding output channel.
3. The open channel test circuit of claim 2 wherein the number of output channels to be detected is two and the number of feedback ports is two; The open circuit detection module is used for generating an open circuit detection signal and transmitting the open circuit detection signal to the MOS driving module through the two output channels to be detected respectively; The MOS driving module generates two diagnosis feedback signals based on the open circuit detection signals respectively transmitted by the two output channels to be detected, and transmits the two diagnosis feedback signals to the fault diagnosis module through the two feedback ports respectively; And the fault diagnosis module is used for respectively judging whether the two output channels to be detected are in an open circuit state or not according to the level states of the two diagnosis feedback signals.
4. The open-channel test circuit of claim 1 wherein the fault diagnosis module comprises a main controller; The sampling end of the main controller is connected with each feedback port of the MOS driving module, and the control end of the main controller is connected with the input end of the open circuit detection module; The main controller is used for generating a time sequence control signal and transmitting the time sequence control signal to the open circuit detection module; The open circuit detection module is further configured to sequentially transmit the open circuit detection signal to the MOS driving module through the output channel to be detected according to the timing control signal.
5. The open channel test circuit of claim 4 wherein said open channel detection module comprises a single-pass detection unit corresponding to the number of output channels; each single-path detection unit is connected with the corresponding output channel respectively; each single-path detection unit is used for generating an open-circuit detection signal and transmitting the open-circuit detection signal to the MOS driving module through the corresponding output channel.
6. The open-channel test circuit according to claim 5, wherein each of the single-channel detection units includes second to fifth resistors, a first switching tube, and a second switching tube; The first end of second resistance with the first end of first switch tube is connected, the second end of first switch tube is connected with the first end of third resistance and external power supply end, the second end of third resistance with the third end of first switch tube and the first end of fourth resistance are connected, the second end of fourth resistance with the first end of second switch tube is connected, the second end of second switch tube with the first end of fifth resistance is connected, the second end of fifth resistance with the control end of main control unit, the third end of second switch tube ground connection.
7. The open channel test circuit of claim 6 wherein the number of output channels to be detected is four and the number of feedback ports is two; The open circuit detection module is used for sequentially transmitting the open circuit detection signals to the MOS driving module through the four output channels to be detected according to the time sequence control signals; the MOS driving module generates one diagnosis feedback signal based on the open circuit detection signals sequentially and respectively transmitted by the four output channels to be detected, and transmits the diagnosis feedback signal to the fault diagnosis module through two feedback ports respectively; the fault diagnosis module is used for judging whether the four output channels to be detected are in an open circuit condition or not according to the level states of the two diagnosis feedback signals and the time sequence control signal.
8. The open-channel test circuit according to any one of claims 1-7, wherein the fault diagnosis module is configured to determine that an open-channel condition occurs in the output channel to be detected when the diagnostic feedback signal transmitted by the feedback port is in a low level state; and the fault diagnosis module is further used for judging that the to-be-detected output channel has no open circuit condition when the diagnosis feedback signal transmitted by the feedback port is in a high level state.
9. An open channel test system comprising an open channel test circuit according to any one of claims 1 to 8.
10. An open channel test method, wherein the open channel test method is applied to the open channel detection system of claim 9, and the steps of the open channel test method include: generating an open circuit detection signal by using an open circuit detection module, and transmitting the open circuit detection signal to a MOS driving module through an output channel to be detected; generating a diagnosis feedback signal by using the MOS driving module according to the open circuit detection signal, and transmitting the diagnosis feedback signal to a fault diagnosis module through a corresponding feedback port; and judging whether the output channel to be detected has an open circuit condition or not according to the level state of the diagnosis feedback signal transmitted by the feedback port by using the fault diagnosis module.

Description

Open channel test circuit, system and method Technical Field The present invention relates to the field of device testing technologies, and in particular, to a channel open circuit testing circuit, a system, and a method. Background Under the development trend of the motorization and the intellectualization of the automobile, the multichannel MOS chip (such as an intelligent high-side switch chip) is widely applied to a whole automobile multi-load driving scene due to high integration level and strong driving capability. The 24V intelligent high-side switch chip BTS724G in the mainstream industry realizes high-side driving of a 4-channel through four pins, and meets the synchronous control requirement of multiple loads of an automobile. Under the automobile multi-load scene, the number of diagnosis feedback ports is far less than the number of output channels, and the feedback ports are shared by a plurality of output channels, so that specific fault channels cannot be accurately positioned, and the maintenance efficiency is low. The prior art focuses on open circuit diagnosis of single load, and is not aimed at a mixed driving scene design scheme of multiple channels and multiple types of loads of an automobile, and the requirements of high reliability and anti-interference (such as an on-board electromagnetic environment) of the automobile are not considered. The intelligent diagnosis system of the whole vehicle controller or the vehicle body controller is difficult to access, and the intelligent requirements of whole vehicle fault early warning, positioning and remote reporting cannot be met. The foregoing is provided merely for the purpose of facilitating understanding of the technical solutions of the present invention and is not intended to represent an admission that the foregoing is prior art. Disclosure of Invention The invention mainly aims to provide a channel open circuit test circuit, a channel open circuit test system and a channel open circuit test method, and aims to solve the technical problem that a specific fault channel cannot be positioned under multi-load driving in the prior art. In order to achieve the aim, the invention provides a channel open circuit test circuit, which comprises a MOS driving module, an open circuit detection module and a fault diagnosis module, wherein the MOS driving module comprises a plurality of output ports and feedback ports, and the number of the feedback ports is less than that of the output channels; The MOS driving module forms an output channel with a corresponding external load through each output port, the output end of the open circuit detection module is connected with the output channel, and each feedback port of the MOS driving module is connected with the fault diagnosis module; the open circuit detection module is used for generating an open circuit detection signal and transmitting the open circuit detection signal to the MOS driving module through the output channel to be detected; The MOS driving module is used for generating a diagnosis feedback signal according to the open circuit detection signal and transmitting the diagnosis feedback signal to the fault diagnosis module through the corresponding feedback port; the fault diagnosis module is used for judging whether the output channel to be detected has an open circuit condition according to the level state of the diagnosis feedback signal transmitted by the feedback port. In one embodiment, the open circuit detection module comprises a first resistor corresponding to the number of output channels; The first end of each first resistor is connected with an external power supply end, and the second end of each first resistor is connected with the corresponding output channel. In an embodiment, the number of the output channels to be detected is two, and the number of the feedback ports is two; The open circuit detection module is used for generating an open circuit detection signal and transmitting the open circuit detection signal to the MOS driving module through the two output channels to be detected respectively; The MOS driving module generates two diagnosis feedback signals based on the open circuit detection signals respectively transmitted by the two output channels to be detected, and transmits the two diagnosis feedback signals to the fault diagnosis module through the two feedback ports respectively; And the fault diagnosis module is used for respectively judging whether the two output channels to be detected are in an open circuit state or not according to the level states of the two diagnosis feedback signals. In one embodiment, the fault diagnosis module includes a main controller; The sampling end of the main controller is connected with each feedback port of the MOS driving module, and the control end of the main controller is connected with the input end of the open circuit detection module; The main controller is used for generating a time sequence control signal and trans