CN-122018860-A - Test program generating method, computer device, and computer-readable storage medium

CN122018860ACN 122018860 ACN122018860 ACN 122018860ACN-122018860-A

Abstract

The application provides a test program generation method, computer equipment and a computer readable storage medium, and belongs to the technical field of product testing. The method comprises the steps of obtaining types of test equipment and the number of parallel test objects according to program head information input by a user, determining target test equipment according to the types of the test equipment, generating structural test information corresponding to each object to be tested according to test specification of each object to be tested, distributing hardware resources in the target test equipment for each object to be tested according to the structural test information of each object to be tested, and generating a test program conforming to platform specifications of the target test equipment for each object to be tested according to the program head information, the structural test information corresponding to each object to be tested and the hardware resources distributed by each object to be tested. The application can achieve the effects of simplifying the development difficulty of the test program, shortening the development period of the test program, improving the development efficiency of the test program and further improving the stability and reliability of the development of the test program.

Inventors

LI BIN
Dong Hangqi
YI YI

Assignees

西安华讯微芯科技有限责任公司

Dates

Publication Date: 20260512
Application Date: 20260126

Claims (10)

1. A test program generation method, the method comprising: according to program head information input by a user, acquiring the type of test equipment and the number of concurrent objects, and determining target test equipment according to the type of the test equipment and the number of concurrent objects; Generating structural test information corresponding to each object to be tested according to the test specification of each object to be tested, wherein the structural test information comprises test program information, test item information, test clock information and test logic information, and the test program information comprises Pin definition information and Bin Pin definition information; According to the structural test information of each object to be tested, distributing hardware resources in the target test equipment for each object to be tested, wherein the hardware resources comprise power supply hardware resources and pin hardware resources; Generating a test program which accords with the platform specification of the target test equipment for each object to be tested according to the program header information, the structural test information corresponding to each object to be tested and the hardware resources allocated to each object to be tested, wherein the test program comprises a project file and a program source file.
2. The method for generating a test program according to claim 1, wherein the allocating hardware resources in the target test device to each object to be tested according to the structured test information of each object to be tested comprises: and distributing power hardware resources and Pin hardware resources in the target test equipment for each tested object to be tested according to the number of the tested objects, pin definition information of each tested object and idle hardware resources of the target test equipment at the current moment.
3. The method for generating a test program according to claim 2, wherein the idle hardware resources include an upper limit of an idle power supply number and an upper limit of an idle Pin number, and the allocating power supply hardware resources and Pin hardware resources in the target test device for each object to be tested according to the number of the objects to be tested, pin definition information of each object to be tested, and the idle hardware resources of the target test device at the current time includes: Determining the total power supply quantity required by all the objects to be tested according to the quantity of the objects to be tested and Pin foot definition information of each object to be tested; Determining the number of target power supplies provided by the target test equipment for all the objects to be tested according to the total number of power supplies and the upper limit of the number of idle power supplies; Determining the number of target power boards in the target test equipment according to the number of target power sources, and distributing at least one power channel for each measured object to be tested based on the number of the target power boards; determining the Pin quantity of each object to be tested and the total Pin quantity of all the objects to be tested according to Pin definition information of each object to be tested; determining the target pin number provided by the target test equipment for all the objects to be tested according to the total pin number and the upper limit of the idle pin number; and distributing logic pins for each tested object to be tested according to the corresponding pin number of each tested chip and the target pin number, and determining the mapping relation between the logic pins of each tested object and the physical logic board card.
4. The test program generating method according to claim 1, wherein the generating a test program for each object to be tested, which meets the platform specification of the target test device, according to the program header information, the structured test information corresponding to each object to be tested, and the hardware resources allocated to each object to be tested, includes: generating project files corresponding to all the objects to be tested according to the program header information, the Pin definition information of all the objects to be tested, the Bin definition information of all the objects to be tested and the Pin hardware resources allocated to all the objects to be tested; And generating a program source file corresponding to each object to be tested according to the test item information of each object to be tested, the test logic information of each object to be tested and the preset test item template.
5. The method of generating a test program according to claim 4, wherein generating the project file corresponding to each object to be tested according to the program header information, pin definition information of each object to be tested, bin Pin definition information of each object to be tested, and Pin hardware resources allocated to each object to be tested, comprises: generating first configuration information according to the program header information; generating second configuration information according to Pin definition information of each object to be tested and Pin hardware resources allocated to each object to be tested; Generating third configuration information according to the Bin pin definition information of each object to be tested; and generating project files corresponding to the objects to be tested according to the first configuration information, the second configuration information and the third configuration information.
6. The method for generating a test program according to claim 4, wherein the test item information includes a plurality of test items, and the generating a program source file corresponding to each object according to the test item information of each object, the test logic information of each object, and a preset test item template includes: according to each test item in the test item information of each object to be tested, calling a standard test template corresponding to each test item from a preset test item template, and respectively calling a test instruction set corresponding to each test item through each standard test template; Filling test parameters contained in each test item into a corresponding standard test template based on a test instruction set corresponding to each test item to generate an executable test instruction set corresponding to each test item, wherein the standard test template comprises at least one parameter placeholder, a parameter placeholder and a test module, wherein the parameter placeholder is used for indicating variable positions of the test parameters to be filled; And writing the executable test instruction set corresponding to each test item into the control flow code section in sequence according to the test logic information of each object to be tested so as to obtain the program source file of each object to be tested.
7. The method for generating a test program according to claim 6, wherein writing the executable test instruction set corresponding to each test item into the control flow code segment in turn according to the test logic information of each object to be tested to obtain the program source file of each object to be tested, comprises: Determining the execution sequence of each test item in the test item information of each object to be tested according to the test logic information of each object to be tested; and writing executable test instructions corresponding to the test items into the control flow code section in turn according to the execution sequence so as to obtain a program source file of each object to be tested.
8. The method for generating a test program according to claim 1, wherein before allocating the hardware resources in the target test device to each object to be tested according to the structured test information of each object to be tested, the method further comprises: Storing the structured test information of each object to be tested into a pre-constructed database, and respectively generating corresponding target codes for the structured test information of each object to be tested; when the program head information or the test specification of each object to be tested is changed, the corresponding structural test information to be modified is called from the database according to the target code, and the structural test information to be modified is modified.
9. A computer device comprising a memory and a processor, the memory having stored therein a computer program executable on the processor, when executing the computer program, performing the steps of the method according to any of claims 1 to 8.
10. A computer readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the method according to any of claims 1 to 8.

Description

Test program generating method, computer device, and computer-readable storage medium Technical Field The present application relates to the field of product testing technologies, and in particular, to a test program generating method, a computer device, and a computer readable storage medium. Background Integrated circuit (INTEGRATED CIRCUIT, abbreviated as IC) testing is a key step for ensuring that functions, performance, reliability and the like of chips meet design requirements, and automatic test equipment (Automatic Test Equipment, abbreviated as ATE) is used as a core tool for executing the IC testing, and directly controls a testing flow, measurement parameters and result judgment of the IC testing, which results in that development quality and efficiency of a testing program of the ATE seriously affect a marketing period and testing cost of the chips. However, to implement the test tasks of the ATE for a specific IC product, the ATE needs to develop a corresponding test program to define the contents of the test flow, pin configuration, resource allocation, test item sequence, and decision logic. In the related art, development of a specific test program of ATE mainly depends on a text editor, and a developer understands in depth a specific instruction set of a target ATE, a hardware architecture, and file organization specifications (such as project files xxx.prj and program source files xxx.prg) of the specific test program, and then uses a C language or a specific script language to strictly follow a program structure specified by the target ATE, and manually writes the specific test program including a test program header, a pin definition, a grading map, a test item code, and an execution sequence of the test item in the text editor. However, when the test program is developed on the ATE based on the related technology, a developer needs to deeply grasp the underlying control instruction, the program structure specification and the hardware resource management mechanism of the ATE, which results in long development period and great maintenance difficulty of the test program. In addition, the test program structure of ATE is complicated, and machine instruction is numerous, and this will greatly increase the degree of difficulty of test program development, influences test program development's stability and reliability. Disclosure of Invention The application aims to provide a test program generating method, computer equipment and a computer readable storage medium, which can achieve the effects of simplifying the development difficulty of a test program, shortening the development period of the test program, improving the development efficiency of the test program and further improving the stability and reliability of the development of the test program. Embodiments of the present application are implemented as follows: in a first aspect of an embodiment of the present application, there is provided a test program generating method, including: According to program head information input by a user, acquiring the type of the test equipment and the number of the concurrent test objects, and determining target test equipment according to the type of the test equipment and the number of the concurrent test objects; Generating structural test information corresponding to each object to be tested according to the test specification of each object to be tested, wherein the structural test information comprises test program information, test item information, test clock information and test logic information, and the test program information comprises Pin Pin definition information and Bin Pin definition information; According to the structural test information of each object to be tested, distributing hardware resources in the target test equipment for each object to be tested, wherein the hardware resources comprise power supply hardware resources and pin hardware resources; generating a test program which accords with the platform specification of the target test equipment for each object to be tested according to the program header information, the structured test information corresponding to each object to be tested and the hardware resources allocated to each object to be tested, wherein the test program comprises a project file and a program source file. As a possible implementation manner, according to the structured test information of each object to be tested, hardware resources in the target test device are allocated to each object to be tested, including: And distributing power hardware resources and Pin hardware resources in the target test equipment for each tested object to be tested according to the number of the tested objects, pin definition information of each tested object and idle hardware resources of the target test equipment at the current moment. As a possible implementation manner, the above-mentioned idle hardware resources include an upper limit of idle power supply number