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CN-122019275-A - Test equipment, test system and test method

CN122019275ACN 122019275 ACN122019275 ACN 122019275ACN-122019275-A

Abstract

The application relates to the technical field of data transmission and discloses test equipment, a test system and a test method, wherein the test equipment is in communication connection with a terminal and a board card to be tested, a first control instruction sent by the terminal is received through the test equipment, and the working mode of the test equipment is set to be a master equipment mode or a slave equipment mode according to the first control instruction, wherein the board card to be tested is used for receiving a second control instruction sent by the terminal so as to set the working mode of the board card to be tested to be the slave equipment mode or the master equipment mode, and when the test equipment is in the master equipment mode, the board card to be tested is in the slave equipment mode, or the test equipment is in the slave equipment mode, the board card to be tested is in the master equipment mode, the interface test is carried out on the board card to be tested.

Inventors

  • CHEN ZHIPENG

Assignees

  • 广州视源电子科技股份有限公司
  • 广州视源创新科技有限公司

Dates

Publication Date
20260512
Application Date
20241111

Claims (10)

  1. 1. A test device is characterized by comprising a communication connection terminal and a board to be tested, wherein, The test equipment is used for receiving a first control instruction sent by the terminal and setting the working mode of the test equipment to be a master equipment mode or a slave equipment mode according to the first control instruction, wherein the board card to be tested is used for receiving a second control instruction sent by the terminal so as to set the working mode of the board card to be tested to be the slave equipment mode or the master equipment mode; and when the test equipment is in a master equipment mode, the board card to be tested is in a slave equipment mode, or the test equipment is in a slave equipment mode and the board card to be tested is in a master equipment mode, performing interface test on the board card to be tested.
  2. 2. The test device according to claim 1, wherein the test device comprises a main control chip and a microcontroller; The main control chip is in communication connection with the terminal and the microcontroller and is used for analyzing a first control instruction sent by the terminal to obtain an instruction identification result and sending the instruction identification result to the microcontroller; the microcontroller is in communication connection with the main control chip and is used for setting the working mode of the test equipment to be a master equipment mode or a slave equipment mode according to the instruction identification result.
  3. 3. The test device of claim 2, wherein the microcontroller comprises a hardware register for setting an operating mode of the hardware register to a master device mode or a slave device mode according to the instruction recognition result.
  4. 4. The test apparatus of claim 3, wherein the test apparatus comprises a plurality of test cells, When the test equipment is in a main equipment mode, the microcontroller is used for sending data to the board to be tested; And when the test equipment is in the slave equipment mode, the microcontroller is used for receiving data sent by the board card to be tested.
  5. 5. The test device of claim 4, wherein the microcontroller comprises a universal serial bus interface comprising a first universal serial bus interface corresponding to a first universal serial bus standard and a second universal serial bus interface corresponding to a second universal serial bus standard; the microcontroller is used for carrying out data transmission with the board card to be tested through the first universal serial bus interface so as to test the data transmission rate of the first universal serial bus interface, or The microcontroller is used for carrying out data transmission with the board card to be tested through the second universal serial bus interface so as to test the data transmission rate of the first universal serial bus interface.
  6. 6. The test device of claim 5, wherein the board under test includes a TypeC interface, the test device further comprising an interface identification module; The interface identification module is in communication connection with the main control chip and the board card to be tested, and is used for identifying the positive and negative states of the TypeC interface, obtaining the positive and negative state information of the TypeC interface and sending the positive and negative state information to the main control chip; And the main control chip is also used for configuring a data transmission channel of the test board card according to the positive and negative state information after receiving the positive and negative state information sent by the interface identification module.
  7. 7. The test apparatus of claim 1, further comprising a power control module for providing power to the board under test when the test board and the board under test are communicatively coupled.
  8. 8. A test system, comprising: The test device according to any one of claims 1-7, configured to receive a first control instruction sent by the terminal, and set a working mode of the test device to a master device mode or a slave device mode according to the first control instruction; And the terminal is used for sending a first control instruction to the test equipment and sending a second control instruction to the board card to be tested.
  9. 9. A test method applied to the test system of claim 8, the method comprising: The terminal generates a first control instruction and a second control instruction, sends the first control instruction to the test equipment, and sends the second control instruction to a board to be tested; The test equipment sets the working mode of the test equipment as a master equipment mode or a slave equipment mode according to the first control instruction; the board to be tested sets the working mode of the board to be tested as a slave device mode or a master device mode according to the second control instruction; and when the test equipment is in a master equipment mode, the board card to be tested is in a slave equipment mode, or the test equipment is in a slave equipment mode and the board card to be tested is in a master equipment mode, performing interface test on the board card to be tested.
  10. 10. The method according to claim 9, wherein the test device includes a master control chip and a microcontroller, and the setting the operation mode of the test device to the master device mode or the slave device mode according to the first control instruction includes: The main control chip analyzes the first control instruction to obtain an instruction identification result; And the microcontroller sets the working mode of the test equipment to be a master equipment mode or a slave equipment mode according to the instruction identification result.

Description

Test equipment, test system and test method Technical Field The embodiment of the application relates to the technical field of data transmission, in particular to test equipment, a test system and a test method. Background In the universal serial bus (Universal Serial Bus, USB) architecture, HOST and DEVICE are two basic roles or functions. HOST is a controller or master device in a USB system, typically a computer or other device capable of managing and controlling USB connections. DEVICE is a slave DEVICE connected to HOST, typically external hardware such as printers, USB flash drives, keyboards, mice, cameras, etc. The HOST function is responsible for control and management, while the DEVICE function is used to execute HOST instructions and provide specific functions. At present, when testing the HOST function of a certain board card, a USB flash disk needs to be accessed for testing, and when testing the DEVICE function of the board card, the board card needs to be accessed into a computer for testing. Because different DEVICEs need to be switched to test when testing the HOST function and the DEVICE function of the board card, the time for plugging and unplugging the DEVICEs is increased, and the test efficiency is low. Disclosure of Invention In order to solve the technical problems, the embodiment of the application provides test equipment, a test system and a test method, solves the problem of low test efficiency caused by equipment plugging in and out in different working modes at present, can avoid frequent plugging in and out of the equipment, realizes quick switching of the working modes, and improves the test efficiency of a board card. In order to solve the technical problems, the embodiment of the application provides the following technical scheme: In a first aspect, an embodiment of the present application provides a test apparatus, a communication connection terminal, and a board to be tested, where, The test equipment is used for receiving a first control instruction sent by the terminal and setting the working mode of the test equipment to be a master equipment mode or a slave equipment mode according to the first control instruction, wherein the board card to be tested is used for receiving a second control instruction sent by the terminal so as to set the working mode of the board card to be tested to be the slave equipment mode or the master equipment mode; And when the test equipment is in the master equipment mode, the board card to be tested is in the slave equipment mode, or the test equipment is in the slave equipment mode, and the board card to be tested is in the master equipment mode, carrying out interface test on the board card to be tested. In some embodiments, the test equipment comprises a main control chip and a microcontroller; The main control chip is connected with the terminal and the microcontroller in a communication way and is used for analyzing a first control instruction sent by the terminal to obtain an instruction identification result and sending the instruction identification result to the microcontroller; And the microcontroller is in communication connection with the main control chip and is used for setting the working mode of the test equipment to be a master equipment mode or a slave equipment mode according to the instruction identification result. In some embodiments, the microcontroller includes a hardware register for setting an operating mode of the hardware register to a master mode or a slave mode according to the instruction recognition result. In some embodiments, the microcontroller is configured to send data to the board under test when the test device is in the master device mode; when the test equipment is in the slave mode, the microcontroller is used for receiving data sent by the board card to be tested. In some embodiments, the microcontroller comprises a universal serial bus interface comprising a first universal serial bus interface corresponding to a first universal serial bus standard and a second universal serial bus interface corresponding to a second universal serial bus standard; The microcontroller is used for carrying out data transmission with the board card to be tested through the first universal serial bus interface so as to test the data transmission rate of the first universal serial bus interface, or The microcontroller is used for carrying out data transmission with the board card to be tested through the second universal serial bus interface so as to test the data transmission rate of the first universal serial bus interface. In some embodiments, the board card to be tested includes a TypeC interface, and the test equipment further includes an interface identification module; The interface identification module is in communication connection with the main control chip and the board card to be tested and is used for identifying the positive and negative states of the TypeC interface, obtaining the positive and negati