CN-122020979-A - Parameterization-based conductive bit processing method, apparatus, equipment and medium

CN122020979ACN 122020979 ACN122020979 ACN 122020979ACN-122020979-A

Abstract

The invention relates to a conductive level processing method, a device, equipment and a medium based on parameterization, wherein the method comprises the steps of constructing a CAD graph model of a conductive level to be processed, and setting the geometric characteristics of the conductive level as a plurality of adjustable parameter variables in the CAD graph model; the method comprises the steps of obtaining a plurality of geometric feature data of processed sample conducting bits, establishing a mapping matching relation between the geometric feature data and a plurality of parameter variables, calculating a size deviation value between each geometric feature data and a design value corresponding to each parameter variable according to the mapping matching relation, correcting the corresponding parameter variable in a CAD graph model according to the size deviation value and a preset compensation rule, generating an instruction file for driving processing equipment to execute conducting bit processing according to the CAD graph model, and feeding the instruction file back to the processing equipment. The invention solves the problem of low manual efficiency in the traditional conductive potential processing, realizes the automatic tuning of the conductive potential processing precision, and improves the processing yield and the debugging efficiency.

Inventors

YAN JUN
LIN HAIGUI
XIONG XIAOMING

Assignees

广东长盈精密技术有限公司

Dates

Publication Date: 20260512
Application Date: 20251230

Claims (10)

1. A parameterized conductivity bit processing method, comprising: constructing a CAD graph model of a conductive potential to be processed, and setting the geometric characteristics of the conductive potential as a plurality of adjustable parameter variables in the CAD graph model; acquiring a plurality of geometric feature data of processed sample conducting potential, and establishing a mapping matching relation between the geometric feature data and the parameter variables; calculating a size deviation value between each geometrical characteristic data and a design value corresponding to each parameter variable according to the mapping matching relation; Correcting corresponding parameter variables in the CAD graph model according to the size deviation value and a preset compensation rule; and generating an instruction file for driving the machining equipment to execute conducting bit machining according to the CAD graphic model, and feeding the instruction file back to the machining equipment to machine the conducting bit.
2. The parameterized conductive site processing method of claim 1, wherein the setting the geometric feature of the conductive site as an adjustable parameter variable in the CAD graphical model comprises: allocating unique identification labels for each shape feature, each size feature and each position feature of the conductive bit in the CAD graphic model, wherein the identification labels are used for establishing one-to-one correspondence between the geometric feature of the conductive bit and a plurality of parameter variables; And configuring the CAD graph model to update the shape, the size or the position of the conductive potential according to the identification tag and the design value corresponding to the identification tag.
3. The parameterized conductivity bit processing method of claim 2, wherein the plurality of geometric feature data comprises a plurality of measurement dimension names of the sample conductivity bits and a plurality of measurement point location data corresponding to the plurality of dimension names; The step of obtaining a plurality of geometric feature data of processed sample conducting potential, and establishing a mapping matching relation between the geometric feature data and the parameter variables comprises the following steps: Acquiring a measured data report of the sample conductivity level, and extracting the measurement size names and a plurality of measurement point location data corresponding to the plurality of size names from the measured data report; and matching the measurement size name with an identification label of the CAD graph model, and when the matching is successful, associating the measurement point location data with a parameter variable corresponding to the identification label.
4. The parameterized conductivity bit processing method of claim 1, wherein the preset compensation rules include a debug direction rule and a compensation multiplying power rule; and correcting the corresponding parameter variable in the CAD graph model according to the size deviation value and a preset compensation rule, wherein the correcting comprises the following steps: Determining the debugging direction of the parameter variable based on the corresponding relation between the measurement reference and the processing reference; determining the compensation multiplying power of the parameter variable according to the tolerance attribute category of the geometric feature; And carrying out weighted calculation on the size deviation value based on the debugging direction and the compensation multiplying power to obtain a target compensation value, and correcting a corresponding parameter variable in the CAD graph model according to the target compensation value.
5. The parameterized conductivity bit machining method of claim 4, wherein the compensation rate rule comprises: when the tolerance attribute category of the geometric feature is the position degree, setting the compensation multiplying power as a preset first compensation multiplying power; and when the tolerance attribute type of the geometric feature is profile degree, setting the compensation multiplying power as a preset second compensation multiplying power.
6. The parameterized conductive bit processing method of claim 1, wherein calculating a dimensional deviation value between each of the geometric feature data and a design value corresponding to each of the parameter variables according to the mapping matching relationship further comprises: judging whether the size deviation value exceeds a preset tolerance threshold value or not; If the tolerance threshold value is exceeded, executing the steps of correcting the corresponding parameter variable in the CAD graph model according to the size deviation value and a preset compensation rule, and marking the parameter variable exceeding the tolerance threshold value in the CAD graph model; and if the tolerance threshold is not exceeded, executing the step of generating an instruction file for driving the machining equipment to execute conducting bit machining according to the CAD graph model, and feeding back the instruction file to the machining equipment to machine the conducting bit.
7. The parameterized electrical conductivity bit machining method of claim 1, wherein generating an instruction file for driving a machining device to perform electrical conductivity bit machining according to the CAD graphics model, and feeding back the instruction file to the machining device to machine the electrical conductivity bit, further comprises: and processing the obtained conducting potential by the processing equipment according to the instruction file to set the current sample conducting potential.
8. A parameterized conductivity bit processing device, comprising: The CAD parameterized design module is used for constructing a CAD graph model of the conductive potential to be processed, and setting the geometric characteristics of the conductive potential as a plurality of adjustable parameter variables in the CAD graph model; The data interaction module is used for acquiring a plurality of geometric feature data of the processed sample conducting potential and establishing a mapping matching relation between the geometric feature data and the parameter variables; The data matching and deviation calculating module is used for calculating a size deviation value between each geometrical characteristic data and a design value corresponding to each parameter variable according to the mapping matching relation; the debugging compensation module is used for correcting the corresponding parameter variables in the CAD graphic model according to the size deviation value and a preset compensation rule; And the processing module is used for generating an instruction file for driving the processing equipment to execute conductive bit processing according to the CAD graphic model, and feeding the instruction file back to the processing equipment to process the conductive bit.
9. An electronic device comprising a memory and a processor, wherein: the memory is used for storing a computer program; the processor is configured to read the computer program in the memory and to perform the steps of the parameterized conductive bit processing method according to any of claims 1 to 7.
10. A computer readable storage medium, characterized in that a readable computer program is stored thereon, which program, when being executed by a processor, implements the steps of the parameterized conductive bit processing method according to any of claims 1 to 7.

Description

Parameterization-based conductive bit processing method, apparatus, equipment and medium Technical Field The invention relates to the technical field of precision machining, in particular to a parameterized conductive bit machining method, a parameterized conductive bit machining device, parameterized conductive bit machining equipment and a parameterized conductive bit machining medium. Background In the field of precision machining of metal parts, it is often involved in forming specific laser etched conductive sites by stripping an oxide layer on the surface of an anodic metal part by a laser technique. Traditional processing flows often rely on preset CAD static models for driving, and specific parts of a workpiece are processed through processing equipment. In the conventional technical scheme, in order to improve the machining precision of the conductive potential, a parameterized design method is generally introduced, and the geometric morphology of a machining area is controlled through a preset parameter variable. After the sample processing is completed, a technician obtains the actual size of the conductive potential by using a measuring tool, compares the actual size with a design value, and if the size deviates, manually corrects model parameters according to engineering experience and again tests the model parameters. However, the above scheme still has obvious limitations in the practical production of laser etching conductive potential. Because the requirements of the conductive bit on the position degree and the profile degree are extremely high, the traditional debugging mode is completely dependent on manual analysis and experience judgment of a large amount of discrete measurement data, the non-closed loop adjusting process is low in debugging efficiency, and when the complex geometric deviation is faced, accurate calculation and rapid convergence of the compensation value are difficult to realize, repeated processing, measurement and debugging cycles are often needed, and the production cost and the difficulty of processing precision control are greatly increased. Disclosure of Invention In view of the above problems, the present invention provides a method, an apparatus, a device and a medium for processing conductive bits based on parameterization, so as to solve the above technical problems. In a first aspect, the present invention provides a method for processing a conductive bit based on parameterization, including: constructing a CAD graph model of a conductive potential to be processed, and setting the geometric characteristics of the conductive potential as a plurality of adjustable parameter variables in the CAD graph model; acquiring a plurality of geometric feature data of processed sample conducting potential, and establishing a mapping matching relation between the geometric feature data and the parameter variables; calculating a size deviation value between each geometrical characteristic data and a design value corresponding to each parameter variable according to the mapping matching relation; Correcting corresponding parameter variables in the CAD graph model according to the size deviation value and a preset compensation rule; and generating an instruction file for driving the machining equipment to execute conducting bit machining according to the CAD graphic model, and feeding the instruction file back to the machining equipment to machine the conducting bit. In a second aspect, the present invention provides a parameterized conductive site processing apparatus, comprising: The CAD parameterized design module is used for constructing a CAD graph model of the conductive potential to be processed, and setting the geometric characteristics of the conductive potential as a plurality of adjustable parameter variables in the CAD graph model; The data interaction module is used for acquiring a plurality of geometric feature data of the processed sample conducting potential and establishing a mapping matching relation between the geometric feature data and the parameter variables; The data matching and deviation calculating module is used for calculating a size deviation value between each geometrical characteristic data and a design value corresponding to each parameter variable according to the mapping matching relation; the debugging compensation module is used for correcting the corresponding parameter variables in the CAD graphic model according to the size deviation value and a preset compensation rule; And the processing module is used for generating an instruction file for driving the processing equipment to execute conductive bit processing according to the CAD graphic model, and feeding the instruction file back to the processing equipment to process the conductive bit. In a third aspect, the invention provides an electronic device comprising a memory and a processor, wherein: the memory is used for storing a computer program; The processor is configured to read th