CN-122022317-A - Distributed test system and method for intelligent manufacturing system

CN122022317ACN 122022317 ACN122022317 ACN 122022317ACN-122022317-A

Abstract

The application relates to the technical field of industrial automation and testing, in particular to a distributed testing system and method for an intelligent manufacturing system. The testing system provided by the application adopts a layered decoupling architecture, improves the flexibility and expansibility of the system through the collaborative operation of a data layer, an algorithm layer, an application upper layer and an application lower layer, supports the rapid access of new equipment and test items, optimizes resource allocation and task parallelism through an intelligent scheduling algorithm, remarkably improves the testing efficiency and throughput, enhances the process controllability and decision transparency by means of a visual billboard, realizes closed-loop reliable control through automatic execution and real-time feedback, ensures the data accuracy and compliance by means of a full-flow data tracking and forced checking mechanism, and effectively solves the problems of insufficient flexibility, low efficiency, rough control and the like in the prior art.

Inventors

YANG TINGTING
DONG YI
ZOU JINPEI
OUYANG SHI
ZHANG JIANZHENG

Assignees

上海飒智智能科技有限公司

Dates

Publication Date: 20260512
Application Date: 20260128

Claims (10)

1. An intelligent manufacturing system-oriented distributed test system employing a hierarchical decoupling architecture, the test system comprising: The data layer is used for providing and managing basic data required by the test system; The algorithm layer is connected with the data layer and is used for generating a test task scheduling scheme through an optimization algorithm according to the basic data and preset constraint conditions; The application upper layer is connected with the algorithm layer and is used for carrying out visual presentation and interaction on the scheduling scheme and generating a test sub-order; And the application lower layer is connected with the application upper layer and is used for receiving and executing the test sub-order and feeding back the execution state in real time to form a closed loop test flow.
2. The test system of claim 1, wherein the data layer comprises a warehouse management system, a device management system, and a quality management system; the warehouse management system is used for carrying out full-flow management on the test materials through visual identification and automatic code scanning; The equipment management system is used for carrying out full life cycle management and calibration compliance control on the test equipment; the quality management system is used for checking the compliance of the test flow in real time and generating a tamper-proof test report.
3. The test system of claim 2, wherein the device management system is coupled to the control system of the test device via an API interface, and wherein the system automatically locks the test device from entering test mode when the device exceeds a calibration expiration date.
4. The test system of claim 1, wherein the algorithm layer adopts a multi-level constraint programming scheduling algorithm, abstracts a scheduling problem into an optimization model containing variables, constraints and objective functions through constraint modeling, and solves by utilizing constraint propagation and intelligent search to support splitting, pooling and parallel scheduling of task processes.
5. The test system of claim 4, wherein the algorithm layer, when performing the scheduling calculations, directly jumps to a subsequent solving step after a pre-optimization objective is achieved if the subsequent objective is cured in scope or without improvement.
6. The test system according to claim 1, wherein the application upper layer is provided with a visual interaction interface, the visual interaction interface comprising at least: The resource view angle shows task arrangement on all the test resources in the form of a time axis Gantt chart; From a testing perspective, longitudinally displaying the complete process flow and key nodes of a single test order in a time line mode; and from the view angle of progress, dynamically simulating and displaying the execution progress of the test procedure at any time point in real time and in the future.
7. The test system of claim 1, wherein the application lower layer comprises intelligent test terminals deployed at each test station, the intelligent test terminals having independent control and buffering capabilities for directly driving automated test equipment, sensors and standard test instruments of the station to perform test tasks.
8. The test system of claim 7, wherein the application lower layer further comprises a transfer robot for automatically transferring test materials between a warehouse and a test station according to a scheduling result, the transfer robot and the intelligent test terminal performing data exchange and control instruction transmission through an API interface.
9. A distributed testing method for an intelligent manufacturing system, applied to the system according to any one of claims 1 to 8, comprising: Digitally managing the test materials, the equipment and the quality standard through the data layer; The method comprises the steps of generating an optimized test task scheduling scheme through calculation based on management data and business constraint by the algorithm layer, visualizing the test task scheduling scheme by the application upper layer, and decomposing to generate an executable test sub-order; and receiving and automatically executing the sub-orders through the application lower layer, and reporting the execution process data in real time so as to update the scheduling state and the test report.
10. The method of claim 9, wherein the step of executing sub-orders by the application lower layer automation comprises: Receiving the sub-order by an intelligent test terminal deployed at a test station; the intelligent test terminal schedules the automatic transfer robot to finish the picking and placing operation of the corresponding test materials; the intelligent test terminal drives the test equipment and the sensor of the station to execute a preset test case, and test data and equipment states are collected in real time; And the acquired data and the state are returned to the upper application layer in real time through a communication interface.

Description

Distributed test system and method for intelligent manufacturing system Technical Field The invention relates to the technical field of industrial automation and testing, in particular to a distributed testing system and method for an intelligent manufacturing system. Background With the deep integration of the internet of things, artificial intelligence and mobile communication technologies, intelligent devices have been widely applied to various fields such as consumer electronics, industrial control and automotive electronics. The requirements on functional complexity and reliability are increasingly improved, so that efficient and accurate test verification becomes a key link of product research and development and quality assurance. Currently, intelligent device testing technology has evolved from early manual operation to an automated script testing and modular testing platform stage, aiming at improving the automation degree and coverage range of test execution. However, in face of modern industry demands for device type diversification, complexity of test scenarios, and rapid production tact, existing test systems still have significant limitations. The system has the advantages of stiff structure, insufficient expansibility, difficulty in rapidly adapting to new equipment or test requirements, high transformation and integration cost, easiness in becoming a performance bottleneck in a centralized control mode, difficulty in further improving the test efficiency due to the fact that response delay and throughput are limited in large-scale concurrent test, difficulty in performing deep analysis and intelligent mining on massive test data in the test process, incapability of realizing value-added capabilities such as fault prediction and optimization suggestion, and difficulty in achieving the requirements of green manufacturing and refined operation due to rough scheduling of test resources, energy efficiency management loss and uneven equipment utilization rate. Therefore, in the prior art, the intelligent device testing system has obvious short boards in the aspects of flexibility, efficiency, intellectualization, resource utilization and the like, and a testing system architecture capable of realizing dynamic scheduling of resources, intelligent scheduling of tasks, full-flow visual management and control and supporting distributed execution is needed to improve the testing efficiency, the data value and the overall resource utilization rate. Disclosure of Invention In view of the above, the present invention is directed to a distributed testing system and an intelligent device testing method for an intelligent manufacturing system. In a first aspect, an embodiment of the present invention provides a distributed test system for an intelligent manufacturing system, where a hierarchical decoupling architecture is adopted, the test system includes: The data layer is used for providing and managing basic data required by the test system; the algorithm layer is connected with the data layer and is used for generating a test task scheduling scheme through an optimization algorithm according to the basic data and preset constraint conditions; The application upper layer is connected with the algorithm layer and is used for visually presenting and interacting the scheduling scheme and generating a test sub-order; The application lower layer is connected with the application upper layer and is used for receiving and executing the test sub-order and feeding back the execution state in real time to form a closed loop test flow. With reference to the first aspect, the data layer includes a warehouse management system, a device management system, and a quality management system; The warehouse management system is used for carrying out full-flow management on the test materials through visual identification and automatic code scanning; The equipment management system is used for carrying out full life cycle management and calibration compliance control on the test equipment; the quality management system is used for checking the compliance of the test flow in real time and generating a tamper-proof test report. In combination with the first aspect, the device management system is linked with the control system of the test device through an API interface, and when the device exceeds the calibration validity period, the system automatically locks the test device so that the test device cannot enter a test mode. In combination with the first aspect, the algorithm layer adopts a multi-level constraint programming scheduling algorithm, the scheduling problem is abstracted into an optimization model containing variables, constraints and objective functions through constraint modeling, constraint propagation and intelligent search are utilized for solving, and the splitting, the single spelling and the parallel scheduling of task procedures are supported. In combination with the first aspect, when the algorithm layer