CN-122023678-A - Parameterized three-dimensional point cloud simulation generation method for circular wall measuring instrument

CN122023678ACN 122023678 ACN122023678 ACN 122023678ACN-122023678-A

Abstract

A parameterized three-dimensional point cloud simulation generation method for a circular wall measuring instrument comprises the steps of (1) reading hexadecimal coded data streams output by the circular wall measuring instrument, checking and analyzing to obtain an integer code value sequence, (2) reducing the integer code value sequence to a voltage sequence, denoising and repairing missing segments to obtain a normalized sequence, (3) extracting a periodic event point sequence, constructing phase parameters in each circle interval, (4) carrying out uniform phase resampling on each circle of signals to construct a two-dimensional expansion matrix, (5) carrying out parameterized three-dimensional mapping on the two-dimensional expansion matrix according to circumferential angle parameters, axial position parameters and radial mapping functions to generate point coordinates and strength attributes, and (6) outputting three-dimensional point cloud simulation data. The method can convert the one-dimensional time sequence voltage data obtained in the circular wall measurement process into the three-dimensional point cloud simulation data with structure maintenance and parameterization description so as to support subsequent three-dimensional structure analysis, algorithm verification and visual display.

Inventors

CHANG YASHENG
YAN CHENG

Assignees

源泰(连云港)仪器有限公司

Dates

Publication Date: 20260512
Application Date: 20260414

Claims (10)

1. A parameterized three-dimensional point cloud simulation generation method for a circular wall measuring instrument is characterized by comprising the following steps: (1) Reading hexadecimal coded data stream raw_hex output by the circular wall measuring instrument, checking a data frame and analyzing the data frame to obtain an integer code value sequence Marking the abnormal code; (2) The obtained integer code value sequence Reduction to a voltage sequence : Wherein the method comprises the steps of Is a proportional coefficient, Zero offset; Denoising and repairing the missing segment, and normalizing the voltage sequence to [0,1] to obtain u [ k ]: Wherein the method comprises the steps of 0 Is an extremely small constant, avoiding the occurrence of a divide-by-0 operation; (3) At the position of Extracting periodic event point sequence To define each circle of signal interval and construct phase parameter in each circle interval ; (4) Resampling the phase of each signal according to the uniform phase sampling number W to construct a two-dimensional spreading matrix And applying periodic boundary processing to the column direction to ensure circumferential closure consistency, and constructing uniform phase sampling points for each circle ; ; ; Wherein the method comprises the steps of A linear interpolation operator or spline interpolation operator; (5) Expanding the two-dimensional matrix According to the circumferential angle parameter Axial position parameter Radial mapping function Performing parameterized three-dimensional mapping to generate point coordinates (x, y, z) and an intensity attribute I; (6) And forming quality factors in the frame verification, abnormal code marking, missing segment repair, filtering and circumferential closing processing processes, fusing and generating a point-level uncertainty attribute U, and finally outputting three-dimensional point cloud simulation data containing (x, y, z, I and U).
2. The method for generating parameterized three-dimensional point cloud with respect to a circular wall measuring instrument as set forth in claim 1, wherein the periodic event points are obtained by local peak detection, zero crossing detection or detection related to a template signal, and a minimum interval constraint and an amplitude threshold are set during the detection process to suppress glitch events.
3. The method for generating parameterized three-dimensional point cloud simulation for a circular wall measuring instrument as defined in claim 1, wherein performing anomaly repair on the periodic event point sequence comprises counting adjacent periodic event intervals When (when) And when the detection range exceeds the preset range, merging, splitting or interpolating correction processing is carried out on the detection omission or false detection events.
4. The method for generating parameterized three-dimensional point cloud for a circular wall measuring instrument according to claim 1, wherein the phase parameters satisfy the following conditions And press Generating uniform phase sampling points, and carrying out phase uniform resampling on each circle of signals through interpolation to obtain a two-dimensional expansion matrix Where k represents the sequence number of the current sampling point, k n represents a certain reference sampling point sequence number in the nth turn signal, Is the uniform phase value corresponding to the j-th column in the two-dimensional expansion matrix, and j is the column index in the two-dimensional expansion matrix.
5. The method for generating parameterized three-dimensional point cloud for circular wall measuring instrument according to claim 1, wherein the phase sampling number W is calculated by each circle of sampling number A number W of phase samples that optimize circumferential closure continuity is determined or selected from a candidate set.
6. The method of claim 1, wherein the periodic boundary processing comprises performing a circular smoothing or periodic convolution on the j=0 and j=w-1 neighbors to make the circumferential closure continuously free of abrupt changes.
7. The method for generating parameterized three-dimensional point cloud with circular wall measuring instrument as defined in claim 1, wherein the quality factors at least comprise frame check factors Abnormal code factor Interpolation repair factor Residual factor of filtering And may further include a closure correction factor 。
8. The method for generating a parameterized three-dimensional point cloud for a circular wall measuring instrument as defined in claim 1 or 7, wherein the point level uncertainty U satisfies Wherein As a quality factor of the quality of the product, As the weight coefficient of the light-emitting diode, Is a very small positive number, used to avoid zero denominator, clip is a function that truncates the input to the [0,1] interval.
9. The method for generating a parameterized three-dimensional point cloud with respect to a circular wall measuring instrument as defined in claim 1, wherein the axial position parameter z (i) is a fixed step Δz or a dynamic step per turn Z (i) is obtained by cumulative calculation.
10. The method for generating parameterized three-dimensional point cloud simulation for a circular wall measuring instrument according to claim 1, wherein the radial mapping function is Where g (·) is a monotonic mapping function.

Description

Parameterized three-dimensional point cloud simulation generation method for circular wall measuring instrument Technical Field The invention relates to the technical field of circular wall measuring instruments, in particular to a parameterized three-dimensional point cloud simulation generation method for a circular wall measuring instrument. Background In the scenes of industrial inner wall detection, cylinder component detection, equipment health monitoring and the like, the circular wall measuring instrument is used for continuously sampling the surface of a measured circular wall along the circumferential direction or the axial direction. The related measurement system generally adopts a one-dimensional solid light sensor to acquire a voltage signal changing along with time, and transmits or stores the voltage signal in a hexadecimal coding form for adapting to an embedded communication protocol, reducing transmission bandwidth and storage overhead, and the like. Because the circular wall measuring instrument does not have three-dimensional imaging hardware such as a laser radar, structured light or multi-view vision, the output of the circular wall measuring instrument is usually only one-dimensional time sequence signals, and real three-dimensional point cloud data representing a circular wall space structure is difficult to directly obtain. In the prior engineering practice, the processing of the one-dimensional signals mainly takes waveform, spectrum or two-dimensional visualization, and a unified method and a data generation mechanism which are oriented to a circular wall detection task and can convert one-dimensional hexadecimal voltage data into parameterized three-dimensional point cloud simulation data maintained by a structure are lacked. In addition, the situations of speed drift, uneven propulsion, jitter triggering and the like often occur in the actual acquisition process, so that the number of sampling points in each circle is inconsistent, if the fixed width W is adopted to rearrange and spread according to the sampling sequence, circumferential phase slip and dislocation are easy to generate, so that artifacts such as twills, breaks, and smear appear in a two-dimensional spreading matrix and a three-dimensional point cloud, meanwhile, the traditional false point cloud generally only outputs coordinates and intensity, and lacks explicit marks of 'repair points' such as abnormal codes, interpolation repair and boundary fusion, so that the engineering usability of the point cloud in algorithm evaluation and system joint debugging is reduced. Disclosure of Invention Aiming at the defects of the prior art, the invention provides a parameterized three-dimensional point cloud simulation generation method for a circular wall measuring instrument, which can convert one-dimensional time sequence voltage data obtained in the circular wall measuring process into three-dimensional point cloud simulation data with structure maintenance and parameterization description on the premise of not adding expensive three-dimensional imaging hardware such as laser radar, structured light or multi-view vision, so as to support subsequent three-dimensional structure analysis, algorithm verification and visual display. The technical problems to be solved by the invention are realized by the following technical proposal. The invention relates to a parameterized three-dimensional point cloud simulation generation method for a circular wall measuring instrument, which comprises the following steps: (1) Reading hexadecimal coded data stream raw_hex output by the circular wall measuring instrument, checking a data frame and analyzing the data frame to obtain an integer code value sequence Marking the abnormal code; (2) The obtained integer code value sequence Reduction to a voltage sequence: Wherein the method comprises the steps ofIs a proportional coefficient,Zero offset; Denoising and repairing the missing segment, and normalizing the voltage sequence to [0,1] to obtain u [ k ]: Wherein the method comprises the steps of 0 Is an extremely small constant, avoiding the occurrence of a divide-by-0 operation; (3) At the position of Extracting periodic event point sequenceTo define each circle of signal interval and construct phase parameter in each circle interval; (4) Resampling the phase of each signal according to the uniform phase sampling number W to construct a two-dimensional spreading matrixAnd applying periodic boundary processing to the column direction to ensure circumferential closure consistency, and constructing uniform phase sampling points for each circle Wherein the method comprises the steps ofA linear interpolation operator or spline interpolation operator; (5) Expanding the two-dimensional matrix According to the circumferential angle parameterAxial position parameterRadial mapping functionPerforming parameterized three-dimensional mapping to generate point coordinates (x, y, z) and an intensity at