CN-122024798-A - Optimal read voltage determining method of storage device, electronic equipment and storage medium

CN122024798ACN 122024798 ACN122024798 ACN 122024798ACN-122024798-A

Abstract

The application discloses a method for determining optimal read voltage of a storage device, electronic equipment and a storage medium. The method for determining the optimal read voltage of the storage device comprises the steps of obtaining a plurality of unit distribution numbers of the storage device in different voltage intervals, determining minimum values in the plurality of unit distribution numbers, traversing the plurality of unit distribution numbers by taking the positions of the minimum values as references until the maximum values in the plurality of unit distribution numbers are determined, determining the boundary of a fitting range based on the maximum values to determine the fitting range in the plurality of unit distribution numbers, and performing data fitting based on the unit distribution numbers in the fitting range to determine the position of the optimal read voltage to obtain the optimal read voltage. By the scheme, the accuracy of the optimal reading voltage can be improved, the number of error bits is reduced, and the probability of successful data reading is improved.

Inventors

DONG GUIQIANG
ZHANG YIFAN
WANG TAO

Assignees

慧忆微(上海)科技有限公司

Dates

Publication Date: 20260512
Application Date: 20260413

Claims (9)

1. An optimal read voltage determination method for a memory device, the optimal read voltage determination method comprising: acquiring the distribution quantity of a plurality of units of the storage device in different voltage intervals; Determining minimum values in the unit distribution numbers, and traversing the unit distribution numbers by taking the positions of the minimum values as references until the maximum values in the unit distribution numbers are determined; determining a boundary of the fitting range based on the maximum value to determine a fitting range among a plurality of the unit distribution numbers; And carrying out data fitting based on the number of the unit distribution in the fitting range so as to determine the position of the optimal reading voltage and obtain the optimal reading voltage.
2. The method of claim 1, wherein determining the boundary of the fitting range based on the maximum value to determine the fitting range among the plurality of cell distribution numbers comprises: in response to the presence of the maximum value on one side of the minimum value, marking a unit distribution number located on a side of the maximum value away from the minimum value among the plurality of unit distribution numbers as invalid, or marking a unit distribution number located on a side of the minimum value away from the maximum value among the plurality of unit distribution numbers as invalid; A fitting range among a plurality of the cell distribution numbers is determined based on the cell distribution numbers between the maximum value and the minimum value.
3. The method of claim 1, wherein determining the boundary of the fitting range based on the maximum value to determine the fitting range among the plurality of cell distribution numbers comprises: In response to the presence of the maxima on opposite sides of the minimum, marking, respectively, as invalid, the cell distribution numbers on sides of two of the plurality of cell distribution numbers that are distant from each other; A fitting range among a plurality of the unit distribution numbers is determined based on the two maximum values and the unit distribution number between the two maximum values.
4. A method of determining an optimal read voltage for a memory device according to any of claims 1-3, wherein said traversing through a plurality of said cell distribution numbers until a maximum of a plurality of said cell distribution numbers is determined, further comprises: in response to at least two identical maximum values existing on one side of the minimum value among the plurality of unit distribution numbers, a maximum value close to the minimum value is taken as the maximum value.
5. The method for determining an optimal read voltage of a memory device according to claim 1, wherein the performing data fitting based on the number of cell distributions in the fitting range to determine a position of the optimal read voltage, and obtaining the optimal read voltage, comprises: Performing data fitting based on the unit distribution quantity in the fitting range through an objective function to obtain a fitting curve, and determining the position of the optimal reading voltage based on the lowest point in the fitting curve to obtain the optimal reading voltage; The objective function comprises a quadratic function, a piecewise composite function of the quadratic function, a Gaussian function, a piecewise composite function of the Gaussian function, or a polynomial function of a plurality of times, and a piecewise composite function of the Gaussian function.
6. The method of determining an optimal read voltage for a memory device according to claim 1, wherein said determining a minimum value among a plurality of said cell distribution numbers, previously comprises: and carrying out smoothing treatment on the plurality of unit distribution numbers to obtain a plurality of smoothed unit distribution numbers.
7. The method of determining an optimal read voltage of a memory device according to claim 1, wherein the obtaining a plurality of cell distribution numbers of the memory device in different voltage intervals comprises: And respectively carrying out multiple data reading on the storage device through a plurality of different offset voltages to obtain the distribution quantity of the units of the storage device in different voltage intervals.
8. An electronic device comprising a memory and a processor coupled to each other, the processor being configured to execute program instructions stored in the memory to implement the method of determining an optimal read voltage for a memory device according to any one of claims 1 to 7.
9. A computer readable storage medium having stored thereon program instructions, which when executed by a processor, implement the optimal read voltage determination method of a storage device according to any of claims 1 to 7.

Description

Optimal read voltage determining method of storage device, electronic equipment and storage medium Technical Field The present application relates to the field of storage technologies, and in particular, to a method for determining an optimal read voltage of a storage device, an electronic device, and a storage medium. Background When the storage device reads data, the optimal reading voltage can provide the lowest data error rate, so that the decoding success probability of the error correction code is greatly improved. In practical applications, due to the influence of various practical factors such as retention time and erasing times, the statistical information obtained based on the default threshold voltage may be shifted. And the position of the optimal read voltage obtained by solving based on the statistical information of the offsets is easy to be misaligned. Disclosure of Invention The application mainly solves the technical problem of providing a method for determining the optimal read voltage of a storage device, electronic equipment and a storage medium, so as to solve the problem of insufficient accuracy of the optimal read voltage under the offset condition. In order to solve the problems, the application provides a method for determining the optimal read voltage of a storage device, which comprises the steps of obtaining a plurality of unit distribution numbers of the storage device in different voltage intervals, determining minimum values in the plurality of unit distribution numbers, traversing the plurality of unit distribution numbers by taking the positions of the minimum values as references until the maximum values in the plurality of unit distribution numbers are determined, determining the boundary of a fitting range based on the maximum values to determine the fitting range in the plurality of unit distribution numbers, and performing data fitting based on the unit distribution numbers in the fitting range to determine the position of the optimal read voltage so as to obtain the optimal read voltage. Wherein determining the boundary of the fitting range based on the maxima to determine the fitting range in the plurality of cell distribution amounts includes marking a cell distribution amount on a side of the maxima from the minima among the plurality of cell distribution amounts as invalid or further marking a cell distribution amount on a side of the minima from the maxima from the plurality of cell distribution amounts as invalid in response to the presence of the maxima on a single side of the minima, and determining the fitting range in the plurality of cell distribution amounts based on the cell distribution amounts between the maxima and the minima. The method comprises the steps of determining a fitting range of a plurality of unit distribution numbers based on a boundary of the fitting range determined based on the maximum values, wherein the method comprises the steps of respectively marking the unit distribution numbers of two maximum values far away from each other in the plurality of unit distribution numbers as invalid in response to the fact that the maximum values exist on two opposite sides of the minimum value, and determining the fitting range of the plurality of unit distribution numbers based on the two maximum values and the unit distribution numbers between the two maximum values. Wherein traversing among the plurality of cell distribution amounts until a maximum value among the plurality of cell distribution amounts is determined, further comprising, in response to at least two identical maximum values existing on a single side of the minimum value among the plurality of cell distribution amounts, taking a maximum value near the minimum value as the maximum value. The method comprises the steps of performing data fitting based on the number of unit distribution in a fitting range to determine the position of the optimal reading voltage to obtain the optimal reading voltage, wherein the data fitting is performed based on the number of unit distribution in the fitting range through an objective function to obtain a fitting curve, the position of the optimal reading voltage is determined based on the lowest point in the fitting curve to obtain the optimal reading voltage, and the objective function comprises a quadratic function, a piecewise composite function of the quadratic function, a Gaussian function, a piecewise composite function of the Gaussian function, a multi-polynomial function, and a piecewise composite function of the Gaussian function. Before determining the minimum value in the plurality of unit distribution numbers, smoothing the plurality of unit distribution numbers to obtain smoothed plurality of unit distribution numbers. The method comprises the steps of respectively reading data of the storage device for multiple times through multiple different offset voltages to obtain the distribution quantity of the units of the storage device in dif