CN-122027047-A - Nonlinear degree testing device and testing method

CN122027047ACN 122027047 ACN122027047 ACN 122027047ACN-122027047-A

Abstract

The embodiment of the application provides a nonlinearity testing device and a nonlinearity testing method, wherein the nonlinearity testing device is used for testing nonlinearity of a chip of the same type as the nonlinearity testing device, a frequency mixing module in the nonlinearity testing device is used for acquiring radio frequency signals sent by a chip to be tested and received by a receiving module, carrying out frequency mixing processing on the radio frequency signals to obtain intermediate frequency signals, a conversion module is used for carrying out analog-to-digital conversion on the intermediate frequency signals to obtain digital signals, a processing module is used for carrying out frequency domain conversion on the digital signals to obtain frequency spectrum data, determining main signal frequency point power and stray power according to the frequency spectrum data, further calculating a nonlinearity value, and calibrating the chip to be tested according to the nonlinearity value to enable the chip to be tested to work in a linear region, so that the problems that the nonlinearity testing of the existing chip depends on external equipment, is high in cost and low in testing efficiency are solved.

Inventors

LI XIGUANG
ZHANG GONGJIAN
ZHANG YUE
XU PENGZHI

Assignees

昆腾微电子股份有限公司

Dates

Publication Date: 20260512
Application Date: 20260212

Claims (11)

1. The nonlinearity testing device is characterized by being used for testing nonlinearity of chips of the same type as the nonlinearity testing device, and comprises a receiving module, a mixing module, a conversion module and a processing module, wherein the mixing module is connected with the processing module through the conversion module: the frequency mixing module is used for obtaining the radio frequency signal sent by the chip to be detected and received by the receiving module, and carrying out frequency mixing processing on the radio frequency signal to obtain an intermediate frequency signal; the conversion module is used for carrying out analog-to-digital conversion on the intermediate frequency signal to obtain a digital signal; The processing module is used for carrying out frequency domain transformation on the digital signals to obtain frequency spectrum data, determining main signal frequency point power and stray power according to the frequency spectrum data, determining a nonlinear value according to the main signal frequency point power and the stray power, and calibrating the chip to be tested according to the nonlinear value so that the chip to be tested works in a linear region.
2. The device for testing nonlinearity according to claim 1, wherein the processing module is configured to: Analyzing the frequency spectrum data, determining the main signal frequency point power and the stray power, and calculating the difference value of the main signal frequency point power and the stray power to obtain the nonlinear value, wherein the frequency spectrum data comprises frequency and power corresponding to the frequency.
3. The device for testing nonlinearity according to claim 2, wherein the processing module is configured to: acquiring carrier signal frequency and modulation signal frequency in the radio frequency signal, and determining the power of the main signal frequency point according to the carrier signal frequency and the modulation signal frequency; And searching the power of each spurious signal in the band within a preset bandwidth range to obtain the spurious power.
4. A device for testing nonlinearity according to claim 3, wherein the processing module is configured to: obtaining the frequency of a main signal frequency point according to the carrier signal frequency and the modulation signal frequency; And determining the power corresponding to the frequency of the main signal frequency point according to the frequency spectrum data and the frequency of the main signal frequency point.
5. A device for testing nonlinearity according to claim 3, wherein the processing module is configured to: Respectively calculating first power of a frequency point where the frequency of the carrier signal is located, second power of a frequency point where the frequency of the mirror image signal of the useful signal is located, and third power of a frequency point where the m-order harmonic of the modulating signal and the modulating signal of the carrier signal are located, wherein m is a natural number larger than 2; And determining the maximum value among the first power, the second power and the third power as the stray power.
6. The device for testing nonlinearity according to claim 1, wherein the processing module is configured to: and comparing the nonlinear value with a preset threshold value, and if the nonlinear value is smaller than the preset threshold value, calibrating the chip to be tested so that the chip to be tested works in a linear region.
7. The device for testing nonlinearity according to claim 6, wherein the processing module is configured to: And if the nonlinear value is smaller than the preset threshold value, adjusting the gain of the modulation signal of the chip to be tested.
8. The device for testing nonlinearity according to claim 7, wherein the processing module is configured to: and sending a control instruction to the chip to be tested through a serial bus communication protocol, wherein the control instruction comprises a transmitting signal after the gain of the modulation signal of the chip to be tested is adjusted.
9. The device for testing nonlinearity according to claim 1, further comprising a storage module for storing the digital signal.
10. The device for testing nonlinearity according to claim 9, wherein the processing module is configured to: and windowing the digital signal to obtain cache block data, and performing frequency domain transformation on the cache block data in a time domain to obtain frequency spectrum data corresponding to the cache block data.
11. A method for testing nonlinearity, applied to a nonlinearity testing apparatus as claimed in any one of claims 1 to 10, comprising: Receiving a radio frequency signal sent by a chip to be tested; Mixing the radio frequency signals to obtain intermediate frequency signals; Performing analog-to-digital conversion on the intermediate frequency signal to obtain a digital signal; And carrying out frequency domain transformation on the digital signal to obtain frequency spectrum data, determining main signal frequency point power and stray power according to the frequency spectrum data, determining a nonlinear value according to the main signal frequency point power and the stray power, and calibrating the chip to be tested according to the nonlinear value so as to enable the chip to be tested to work in a linear region.

Description

Nonlinear degree testing device and testing method Technical Field The application relates to the technical field of testing, in particular to a testing device and a testing method for nonlinearity. Background With rapid development and wide application of 5G communication technology, importance of high-performance Radio Frequency (RF) audio transmission systems in new intelligent hardware such as smart phones, internet of things devices, wearable devices, and intelligent terminals is increasingly highlighted. In the 5G radio frequency audio transmission link, the transmitting end chip is responsible for transmitting the baseband audio signal through a radio frequency channel after modulation, and the performance of the transmitting end chip directly determines the quality and stability of wireless transmission. The linearity of the rf front-end circuit is one of the key indicators affecting the overall performance of the system, so that the linearity of the rf front-end circuit of the transmitting end chip needs to be tested, and at present, an external high-precision testing instrument, such as a spectrum analyzer (Spectrum Analyzer) or a signal analyzer, is adopted, and the testing instrument has high cost and poor portability due to large volume. Disclosure of Invention According to the technical scheme, the processing module is used for carrying out frequency domain conversion on the digital signals to obtain frequency spectrum data, main signal frequency point power and stray power are determined according to the frequency point power and the stray power of the main signal, a nonlinear value is determined according to the frequency point power and the stray power of the main signal, the chip to be tested is calibrated according to the nonlinear value so as to enable the chip to be tested to work in a linear region, the method is implemented by the aid of the conversion module, the device to be tested is provided with the nonlinear chip, the device to be tested is subjected to frequency mixing processing to obtain intermediate frequency signals, the conversion module is used for carrying out analog-to-digital conversion on the intermediate frequency signals to obtain digital signals, the processing module is used for carrying out frequency domain conversion on the digital signals to obtain frequency spectrum data, the main signal frequency point power and the stray power are determined according to the frequency point power of the main signal and the stray power, the chip to be tested is calibrated according to the nonlinear value, the chip to be tested is enabled to work in a linear region, the method is carried out frequency domain conversion on the digital signals by the chip to be tested, the corresponding to the frequency point power of the main signal, the frequency point power and the stray power of the frequency signal is determined according to the frequency point power of the main signal, the nonlinear value is calibrated according to the frequency point power of the nonlinear value of the main signal, the chip is calibrated according to the nonlinear value, the nonlinear value is calibrated in a linear region, the chip to work is carried out on the chip to work on the chip to be tested, and the chip is not subjected to the linear value, and a corresponding to the chip is subjected to the chip, by utilizing the inherent capability of the SOC chip under the receiving function, the integrated test of the nonlinearity of the transmitting chip is realized, and the problems that the nonlinearity test of the existing transmitting chip depends on external equipment, the cost is high, and the power adjustment and the nonlinearity index are disjointed are solved. In a first aspect, some embodiments of the present application provide a device for testing nonlinearity of a chip of the same type as the device for testing nonlinearity, where the device for testing nonlinearity includes a receiving module, a mixing module, a converting module, and a processing module, and the mixing module is connected to the processing module through the converting module: the frequency mixing module is used for obtaining the radio frequency signal sent by the chip to be detected and received by the receiving module, and carrying out frequency mixing processing on the radio frequency signal to obtain an intermediate frequency signal; the conversion module is used for carrying out analog-to-digital conversion on the intermediate frequency signal to obtain a digital signal; The processing module is used for carrying out frequency domain transformation on the digital signals to obtain frequency spectrum data, determining main signal frequency point power and stray power according to the frequency spectrum data, determining a nonlinear value according to the main signal frequency point power and the stray power, and calibrating the chip to be tested according to the nonlinear value so that the chip to be tested works in a lin