CN-122029588-A - Display device, inspection device for display device, and control method for inspection device

CN122029588ACN 122029588 ACN122029588 ACN 122029588ACN-122029588-A

Abstract

The inspection apparatus includes a memory, an image sensor configured to obtain a luminance image of a display apparatus including a plurality of pixels, and a processor configured to identify a defective pixel based on the obtained luminance image, to identify location information of the identified defective pixel, and to control the memory to store the identified location information of the defective pixel.

Inventors

Xuan Bingzhe

Assignees

三星电子株式会社

Dates

Publication Date: 20260512
Application Date: 20241029
Priority Date: 20231228

Claims (15)

1. A display device, comprising: A display panel including a plurality of pixels; A memory storing position information of a defective pixel among the plurality of pixels, and A processor configured to limit an electrical signal sent to the defective pixel based on the positional information of the defective pixel stored in the memory.
2. The display device according to claim 1, Wherein the memory stores normal position information and normal luminance correction information of each of normal pixels other than the defective pixel among the plurality of pixels, Wherein the processor is further configured to obtain normal luminance information of each of the normal pixels based on image information, to correct the obtained normal luminance information of each of the normal pixels based on normal position information and normal luminance correction information of each of the normal pixels, to generate an electrical signal of each of the normal pixels based on the corrected normal luminance information of each of the normal pixels, and to transmit the generated electrical signal to each of the normal pixels, Wherein the normal luminance correction information of each of the normal pixels includes information corresponding to a difference between an average value of luminance values of the plurality of pixels and the luminance value of each of the normal pixels.
3. The display device according to claim 2, Wherein the memory includes a detachable nonvolatile memory and stores a value smaller than a minimum value among the luminance values of the plurality of pixels as luminance correction information of the defective pixel, Wherein the processor is further configured to limit the electrical signal sent to the defective pixel based on the brightness correction information of the defective pixel.
4. The display device according to claim 1, Wherein the memory stores the brightness correction information of the defective pixel as 0 (zero), and Wherein the processor is further configured to limit an electrical signal sent to the defective pixel to 0 (zero) based on the brightness correction information of the defective pixel.
5. The display device according to claim 1, further comprising: A communication circuit configured to communicate with the server, Wherein the processor is further configured to receive, via the communication circuit, location information of the defective pixel detected by the inspection device.
6. The display device according to claim 1, wherein, The processor is further configured to detect a voltage value applied to each of the plurality of pixels, to identify a value less than or equal to a reference voltage value from the voltage values of each of the plurality of pixels, and to identify the pixel to which the identified value is applied as the defective pixel.
7. The display device according to claim 1, Wherein the display panel comprises a self-luminous Light Emitting Diode (LED) display panel, and Wherein the defective pixel includes a pixel in an open circuit state in terms of a circuit.
8. An inspection apparatus comprising: a memory; an image sensor configured to obtain a luminance image of a display device including a plurality of pixels, and A processor configured to identify a defective pixel from the plurality of pixels based on the obtained luminance image, wherein the processor is further configured to identify location information of the identified defective pixel, and further configured to control the memory to store the identified location information of the defective pixel, Wherein the memory is detachably connected to at least one of the display device and the processor, and Wherein the positional information of the defective pixel stored in the memory includes information indicating that an electrical signal of the defective pixel applied to the display device is limited.
9. The inspection apparatus according to claim 8, wherein, The processor is further configured to obtain a luminance value of each of the plurality of pixels based on the obtained luminance image, to identify a luminance value of the obtained luminance value of each of the plurality of pixels that is less than or equal to a reference luminance value, and to identify a pixel of the plurality of pixels having the identified luminance value as a defective pixel, and The processor is further configured to identify another pixel of the plurality of pixels having a normal luminance value greater than the reference luminance value among the obtained luminance values of each of the plurality of pixels as a normal pixel, to obtain an average value of the luminance values of each of the plurality of pixels, to obtain luminance correction information of each of the normal pixels based on the obtained luminance value of a normal pixel of the plurality of pixels including the normal pixel and the obtained average value, and to control the memory to store the obtained luminance correction information of each of the normal pixels and the position information of each of the normal pixels.
10. The inspection apparatus according to claim 8, wherein, The processor is further configured to store the brightness correction value of the identified defective pixel as 0 (zero) in the memory.
11. The inspection device of claim 8, further comprising: A communication circuit configured to communicate with the display device, Wherein the processor is further configured to send the location information of the identified defective pixel to the display panel via the communication circuit.
12. The inspection device of claim 8, further comprising: the display portion is provided with a display portion, Wherein the processor is further configured to identify a number of defective pixels including the defective pixel among the plurality of pixels, and further configured to control the display portion to display the identified number of defective pixels and the positional information of the defective pixels based on the identified number of defective pixels being greater than or equal to a reference number.
13. A control method of an inspection apparatus, the control method comprising: obtaining a luminance image of a display panel including a plurality of pixels; Obtaining a luminance value of each of the plurality of pixels based on the obtained luminance image; Identifying a luminance value of the obtained luminance values of each of the plurality of pixels that is less than or equal to a reference luminance value; identifying a pixel of the plurality of pixels having the identified luminance value as a defective pixel; Identifying location information of the identified defective pixel, and The identified location information of the defective pixel is stored in the memory.
14. The control method of an inspection apparatus according to claim 13, further comprising: Identifying a pixel having a luminance value larger than the reference luminance value among the obtained luminance values of each pixel among the plurality of pixels as a normal pixel; Obtaining an average value of luminance values of the plurality of pixels; Obtaining luminance correction information of each of the normal pixels based on the obtained luminance value of the normal pixel including the normal pixel among the plurality of pixels and the obtained average value; Storing the obtained luminance correction information of each of the normal pixels and the position information of each of the normal pixels in the memory, and The brightness correction value of the identified defective pixel is stored as a limit value in a removable memory.
15. The control method of an inspection apparatus according to claim 13, further comprising: Transmitting the position information of the identified defective pixel to a display device through a communication circuit; Identifying the number of defective pixels identified, and The number of the identified defective pixels and the positional information of the defective pixels are displayed by a display section and based on the number of the identified defective pixels being greater than or equal to a reference number.

Description

Display device, inspection device for display device, and control method for inspection device Technical Field The present disclosure relates to an inspection apparatus configured to inspect whether a pixel of a display panel is defective and a control method thereof, and to a display apparatus configured to perform luminance correction on the defective pixel. Background With the development of electronic technology, various types of electronic products have been developed and released. As the use of electronic devices increases, so does the demand of users for various display devices. Widely used display devices include Liquid Crystal Display (LCD) -based display devices, organic Light Emitting Diode (OLED) -based display devices, mini LED-based display devices, and micro LED-based display devices. Display devices based on mini LEDs or display devices based on micro LEDs are attracting attention as next-generation display devices due to advantages in terms of high contrast ratio, response speed, color reproducibility, viewing angle, brightness, and lifetime. As for the LED-based display device, when one subpixel is electrically open and defective, the defective subpixel is not lit when it should be lit, and a normal subpixel connected to the defective subpixel circuit is erroneously lit (e.g., the normal subpixel is lit when it should not be lit). Disclosure of Invention Technical problem The present disclosure relates to providing an inspection apparatus capable of identifying positional information of a defective pixel based on luminance values of a plurality of pixels provided on a display panel, and a control method thereof. Further, the present disclosure relates to providing a display device capable of controlling an electric signal applied to a defective pixel based on position information of the defective pixel stored in a memory. Technical proposal There is provided a display apparatus including a display panel including a plurality of pixels, a memory storing position information of a defective pixel among the plurality of pixels, and a processor configured to limit an electrical signal transmitted to the defective pixel based on the position information of the defective pixel stored in the memory. The memory may store normal position information and normal luminance correction information of each of the normal pixels other than the defective pixel among the plurality of pixels, and the processor may be further configured to obtain the normal luminance information of each of the normal pixels based on the image information, may be further configured to correct the obtained normal luminance information of each of the normal pixels based on the normal position information and the normal luminance correction information of each of the normal pixels, may be further configured to generate an electrical signal of each of the normal pixels based on the corrected normal luminance information of each of the normal pixels, and may be further configured to transmit the generated electrical signal to each of the normal pixels, and the normal luminance correction information of each of the normal pixels may include information corresponding to a difference between an average value of luminance values of the plurality of pixels and the luminance value of each of the normal pixels. The memory may include a detachable nonvolatile memory and store a value smaller than a minimum value among the luminance values of the plurality of pixels as luminance correction information of the defective pixel, and the processor may be further configured to limit the electrical signal transmitted to the defective pixel based on the luminance correction information of the defective pixel. The memory may store luminance correction information of the defective pixel as 0 (zero), and the processor may be further configured to limit an electrical signal transmitted to the defective pixel to 0 (zero) based on the luminance correction information of the defective pixel. The display device may include a communication circuit configured to communicate with the server, and the processor may be further configured to receive, through the communication circuit, positional information of the defective pixel detected by the inspection device. The processor may be further configured to detect a voltage value applied to each of the plurality of pixels, may be further configured to identify a value less than or equal to a reference voltage value from the voltage values of each of the plurality of pixels, and may be further configured to identify the pixel to which the identified value is applied as a defective pixel. The display panel may include a self-luminous Light Emitting Diode (LED) display panel, and wherein the defective pixel may include a pixel in an open circuit state in terms of a circuit. There is provided an inspection apparatus including a memory, an image sensor configured to obtain a luminance image of a display apparatus includi