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CN-224203252-U - Clamp for diode test

CN224203252UCN 224203252 UCN224203252 UCN 224203252UCN-224203252-U

Abstract

The utility model discloses a clamp for diode test, and relates to the technical field of diode test equipment. This anchor clamps for diode test, including clamping unit and material loading unit, the clamping unit is located the right side of material loading unit, the clamping unit includes backup pad and curb plate, the curb plate is located the backup pad top, the curb plate inboard is provided with the conveyer belt, the conveyer belt outside is provided with evenly distributed's grip block, the grip face has been seted up to the grip block both sides, the grip face sets up to the arc. The clamp for testing the diode has the advantages that the arc-shaped clamping surface can be tightly attached to the diode, the friction force is increased, the diode is effectively prevented from being displaced in the testing process, the accuracy of a testing result is ensured, the automatic feeding of the diode is realized through the feeding unit, the testing efficiency is greatly improved by matching with the automatic operation of the clamping unit, the manual operation is reduced, and the labor intensity is reduced.

Inventors

  • ZHONG YUXIANG
  • Ang Yuqing

Assignees

  • 深圳市宏胜实业有限公司

Dates

Publication Date
20260505
Application Date
20250515

Claims (7)

  1. 1. The utility model provides a anchor clamps for diode test, includes clamping unit (1) and material loading unit (2), clamping unit (1) are located the right side of material loading unit (2), its characterized in that, clamping unit (1) includes: A support plate (11); Curb plate (12), curb plate (12) are located backup pad (11) top, curb plate (12) inboard is provided with conveyer belt (124), the conveyer belt (124) outside is provided with evenly distributed's grip block (1241), grip block (1242) have been seted up to grip block (1241) both sides, grip block (1242) set up to the arc.
  2. 2. The fixture for diode testing according to claim 1, wherein the top of the supporting plate (11) is provided with a vertical rod (111), a reinforcing rib (112) is arranged outside the vertical rod (111), and the vertical rod (111) is connected outside the side plate (12).
  3. 3. The fixture for diode testing according to claim 1, wherein a transmission roll shaft (121), a supporting roll shaft (122) and a linkage roll shaft (123) are inserted into the inner side of the side plate (12), and a linkage belt pulley (1211) is sleeved on the outer side of the transmission roll shaft (121).
  4. 4. A clamp for diode testing according to claim 3, characterized in that the clamping unit (1) is provided with a motor (13), the motor (13) is arranged on the supporting plate (11), a transmission belt pulley (131) is sleeved outside the output end of the motor (13), a transmission belt (132) is sleeved outside the transmission belt pulley (131), and the transmission belt (132) is sleeved outside the linkage belt pulley (1211).
  5. 5. The clamp for diode testing according to claim 1, wherein the feeding unit (2) is provided with a supporting frame (21), a feeding chute (22) is connected to the top of the supporting frame (21), one end of the feeding chute (22) is connected with a guide rod (221), and the guide rod (221) corresponds to the conveyor belt (124).
  6. 6. The fixture for diode testing according to claim 5, wherein the feeding chute (22) is provided with a clamping groove corresponding to the clamping plate (1241), and the clamping groove is positioned at the inner side of the guide rod (221).
  7. 7. The clamp for diode testing according to claim 6, wherein a limiting plate (23) is arranged above the feeding chute (22), a supporting rod (231) is connected to the outer side of the limiting plate (23), the supporting rod (231) is connected to the outer side of the feeding chute (22), and a diode (24) is arranged between the feeding chute (22) and the limiting plate (23).

Description

Clamp for diode test Technical Field The utility model relates to the technical field of diode test equipment, in particular to a clamp for diode test. Background In the manufacturing process of the diode, a plurality of performance tests, such as forward conduction voltage, reverse breakdown voltage and the like, need to be performed on the diode. During testing, the diode is clamped and fixed by using a clamp, so that the accuracy and stability of the testing are ensured. However, existing diode test fixtures have a number of problems. Some clamps adopt a manual clamping mode, so that the efficiency is low, the diode is easy to displace in the testing process due to instability of manual operation, and the accuracy of a testing result is affected. Therefore, there is a need to design a test fixture that has a simple structure, is convenient to operate, is stable in clamping, and can adapt to diodes of different specifications. Some clamps adopt manual clamping modes, because of low efficiency and instability caused by manual operation, diodes are easy to displace in the testing process to influence the accuracy of testing results, and other clamps realize automatic feeding and clamping to a certain extent, but have complex structures, higher cost and unsatisfactory clamping effects, and are difficult to meet the requirements of mass production testing. Disclosure of utility model Aiming at the defects of the prior art, the utility model provides the clamp for the diode test, which solves the problems that the efficiency is low and the instability exists due to manual operation in a manual clamping mode, the diode is easy to displace in the test process to influence the accuracy of the test result, and the other clamps realize the automatic feeding and clamping to a certain extent, but have complex structure, higher cost and unsatisfactory clamping effect and are difficult to meet the requirement of the large-scale production test. The clamp for diode test comprises a clamping unit and a feeding unit, wherein the clamping unit is positioned on the right side of the feeding unit, and the clamping unit comprises: a support plate; The side plate is located the backup pad top, the curb plate inboard is provided with the conveyer belt, the conveyer belt outside is provided with evenly distributed's grip block, the grip block both sides have been seted up the grip face, the grip face sets up to the arc. Preferably, the top of the supporting plate is provided with a vertical rod, the outer side of the vertical rod is provided with a reinforcing rib, and the vertical rod is connected to the outer side of the side plate. Preferably, the inner side of the side plate is inserted with a transmission roll shaft, a support roll shaft and a linkage roll shaft, and the outer side of the transmission roll shaft is sleeved with a linkage belt pulley. Preferably, the clamping unit is provided with a motor, the motor is arranged on the supporting plate, a transmission belt pulley is sleeved on the outer side of the output end of the motor, a transmission belt is sleeved on the outer side of the transmission belt pulley, and the transmission belt is sleeved on the outer side of the linkage belt pulley. Preferably, the feeding unit is provided with a supporting frame, the top of the supporting frame is connected with a feeding chute, one end of the feeding chute is connected with a guide rod, and the guide rod corresponds to the conveying belt. Preferably, the feeding chute is provided with a clamping groove corresponding to the clamping plate, and the clamping groove is positioned at the inner side of the guide rod. Preferably, a limiting plate is arranged above the feeding chute, a supporting rod is connected to the outer side of the limiting plate, the supporting rod is connected to the outer side of the feeding chute, and a diode is placed between the feeding chute and the limiting plate. The utility model discloses a clamp for testing a diode, which has the following beneficial effects: The arc-shaped clamping surface can be tightly attached to the diode, so that the friction force is increased, the diode is effectively prevented from being displaced in the test process, and the accuracy of a test result is ensured; The automatic feeding of the diode is realized through the feeding unit, and the automatic operation of the clamping unit is matched, so that the testing efficiency is greatly improved, the manual operation is reduced, and the labor intensity is reduced. Drawings In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled