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CN-224203273-U - Semiconductor test probe convenient to change

CN224203273UCN 224203273 UCN224203273 UCN 224203273UCN-224203273-U

Abstract

The utility model relates to the technical field of probes and discloses a semiconductor test probe convenient to replace, which comprises a pipe, wherein a connecting sleeve is arranged at the bottom of the pipe, a probe is arranged at the bottom of the connecting sleeve, a mounting column is fixedly connected to the top of the probe, a rotary sleeve is connected with an outer ring thread at the top of the mounting column, a limit groove is formed in the top of the rotary sleeve, a bidirectional threaded rod is connected inside the connecting sleeve in a rotating mode, a limit disc is fixedly connected with an outer ring at the front end of the bidirectional threaded rod, and a protection assembly is arranged inside the pipe. According to the utility model, the rotating sleeve is enabled to move up and down along the mounting column by utilizing the threaded connection relation between the rotating sleeve and the mounting column, the rotating sleeve is mounted, and then the bidirectional threaded rod drives the limiting plate, the moving plate, the nut pair and other parts to act, so that the bidirectional threaded rod rotates, and under the cooperation of the nut pair and the limiting rod, the probe and the mounting column can be conveniently taken out or put in from the bottom of the connecting sleeve, and the convenient replacement of the probe is realized.

Inventors

  • HUANG LIHONG

Assignees

  • 深圳市欧瑞特实业有限公司

Dates

Publication Date
20260505
Application Date
20250421

Claims (8)

  1. 1. The semiconductor test probe convenient to replace comprises a pipe (1) and is characterized in that a connecting sleeve (2) is arranged at the bottom of the pipe (1), a probe (3) is arranged at the bottom of the connecting sleeve (2), a mounting column (4) is fixedly connected to the top of the probe (3), a rotary sleeve (5) is connected to the outer ring of the top of the mounting column (4) in a threaded mode, a limit groove (6) is formed in the top of the rotary sleeve (5), a bidirectional threaded rod (8) is connected to the inside of the connecting sleeve (2) in a rotary mode, a limit disc (10) is fixedly connected to the outer ring of the front end of the bidirectional threaded rod (8), and a protection assembly is arranged inside the pipe (1).
  2. 2. A semiconductor test probe for easy replacement as claimed in claim 1, wherein the protection assembly comprises a connecting plate (15), and the connecting plate (15) is fixedly connected to the outer ring of the connecting sleeve (2).
  3. 3. The semiconductor test probe convenient to replace according to claim 1, wherein the outer rings at the front end and the rear end of the bidirectional threaded rod (8) are respectively connected with a nut pair (11) in a threaded manner.
  4. 4. The semiconductor test probe convenient to replace according to claim 3, wherein a limiting rod (9) penetrates through the interior of the nut pair (11) and is connected with the nut pair in a sliding mode, and the limiting rod (9) is fixedly connected with the inner wall of the connecting sleeve (2).
  5. 5. A semiconductor test probe convenient to replace according to claim 3, wherein a movable plate (12) is fixedly connected to the bottom of the nut pair (11).
  6. 6. The semiconductor test probe convenient to replace according to claim 5, wherein the bottom of the movable plate (12) is fixedly connected with a limiting plate (7), and the limiting plate (7) is in sliding connection with the limiting groove (6).
  7. 7. The semiconductor test probe for easy replacement as claimed in claim 1, wherein the tube (1) has holes (13) therein, and the holes (13) are slidably connected to the connection plate (15).
  8. 8. The semiconductor test probe convenient to replace according to claim 2, wherein the damping spring (14) is fixedly connected to the bottom of the connecting plate (15), and the damping spring (14) is fixedly connected with the inner wall of the pipe (1).

Description

Semiconductor test probe convenient to change Technical Field The utility model relates to the technical field of probes, in particular to a semiconductor test probe convenient to replace. Background With the rapid development of semiconductor technology, the integration level of chips is higher, the size is smaller, and the functions are more complex. This requires high precision, high reliability testing during the chip manufacturing process to ensure the quality and performance of the chip. The importance of semiconductor test probes as key components connecting test equipment to a chip is becoming increasingly prominent. For example, in the production of large-scale integrated circuits, electrical performance testing needs to be performed on each chip to screen out unqualified products, so that problems in subsequent packaging and application are avoided, and therefore, the production cost is reduced, and the production efficiency is improved. In the semiconductor production process, a testing link is critical and the workload is huge. The traditional probe replacing mode is complicated, for example, some probe bases are matched with the probe body, and the matched bases are required to be reinstalled during replacement, so that a great deal of time and labor are consumed. With the development of the semiconductor industry, the requirements on the test efficiency are higher and higher, the probes convenient to replace can rapidly replace worn or damaged probes, the downtime of the test equipment is reduced, the overall test efficiency is improved, and the requirement of mass production is met. Under the condition of inconvenient replacement, operators may carelessly damage the probe in the process of disassembly and assembly, such as bending, deformation or aggravation of wear of the needle tip, and the like, which not only affects the accuracy of the current test, but also shortens the service life of the probe. In view of the above problems, for this purpose, a semiconductor test probe that is easy to replace is proposed. Disclosure of utility model The utility model aims to provide a semiconductor test probe convenient to replace, which solves the problems that in the prior art, under the condition of inconvenient replacement, an operator may carelessly damage the probe in the process of disassembly and assembly, such as bending, deformation or aggravation of wear of a needle point, and the like, so that the precision of the current test is affected and the service life of the probe is shortened. The semiconductor test probe comprises a tube, a connecting sleeve is arranged at the bottom of the tube, a probe is arranged at the bottom of the connecting sleeve, a mounting column is fixedly connected to the top of the probe, a rotary sleeve is connected to the outer ring of the top of the mounting column in a threaded mode, a limit groove is formed in the top of the rotary sleeve, a bidirectional threaded rod is connected to the inside of the connecting sleeve in a rotary mode, a limit disc is fixedly connected to the outer ring of the front end of the bidirectional threaded rod, and a protection assembly is arranged inside the tube. Through adopting above-mentioned technical scheme, through the screw thread circle of erection column and the screw thread groove of rotatory cover, install rotatory cover again, install rotatory cover through spacing groove and limiting plate. As further description of the technical scheme, the protection component comprises a connecting plate, and the connecting plate is fixedly connected to the outer ring of the connecting sleeve. Through adopting above-mentioned technical scheme, fix the adapter sleeve through the connecting plate. As further description of the technical scheme, the outer rings at the front end and the rear end of the bidirectional threaded rod are respectively connected with a nut pair in a threaded manner. By adopting the technical scheme, the nut pair moves on the outer ring of the bidirectional threaded rod. As further description of the technical scheme, a limit rod penetrates through the interior of the nut pair and is connected with the interior of the nut pair in a sliding manner, and the limit rod is fixedly connected with the inner wall of the connecting sleeve. By adopting the technical scheme, the nut pair is subjected to limit control through the limit rod. As further description of the technical scheme, the bottom of the nut pair is fixedly connected with a movable plate. Through adopting above-mentioned technical scheme, remove through the nut pair and drive the movable plate and remove. As further description of the technical scheme, the bottom of the movable plate is fixedly connected with a limiting plate, and the limiting plate is in sliding connection with the limiting groove. Through adopting above-mentioned technical scheme, the limiting plate slides at the spacing inslot wall, then spacing control. As a further description of the