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CN-224203274-U - Direct current probe mounting structure

CN224203274UCN 224203274 UCN224203274 UCN 224203274UCN-224203274-U

Abstract

The application relates to the technical field of chip testing, and provides a direct-current probe mounting structure which is mounted on a rack and comprises a probe arm, a probe and a connecting component, wherein the probe arm is mounted on the rack, the probe is connected with the probe arm through the connecting component, a connecting piece is arranged at one end of the probe, a connecting groove for the connecting piece to be inserted is formed at one end of the probe arm, a first inserting groove communicated with the connecting groove is formed in the probe arm, a second inserting groove communicated with the first inserting groove is formed in the connecting piece, the connecting component comprises an anti-falling rod and an anti-falling component, the anti-falling rod is inserted into the first inserting groove and the second inserting groove, and the anti-falling component is used for preventing the anti-falling rod from being separated from the second inserting groove. The application relates to a direct current probe mounting structure which is used for facilitating the replacement of a probe.

Inventors

  • HUANG XIAOTING

Assignees

  • 上海柯舜科技有限公司

Dates

Publication Date
20260505
Application Date
20250512

Claims (8)

  1. 1. The direct current probe mounting structure is mounted on a rack (5) and is characterized by comprising a probe arm (1), a probe (2) and a connecting component (3), wherein the probe arm (1) is mounted on the rack (5), the probe (2) is connected with the probe arm (1) through the connecting component (3), a connecting piece (21) is arranged at one end of the probe (2), a connecting groove (11) for the connection piece (21) to be connected is formed at one end of the probe arm (1), a first inserting groove (12) communicated with the connecting groove (11) is formed in the probe arm (1), a second inserting groove (22) communicated with the first inserting groove (12) is formed in the connecting piece (21), the connecting component (3) comprises a falling-preventing rod (31) and a falling-preventing component (32), the falling-preventing rod (31) is inserted into the first inserting groove (12) and the second inserting groove (22), and the falling-preventing component (32) is used for preventing the falling-preventing rod (31) from falling out of the second inserting groove (22).
  2. 2. The DC probe mounting structure according to claim 1, wherein the anti-falling component (32) comprises a first threaded portion (33) arranged on the outer wall of the anti-falling rod (31) and a second threaded portion (34) arranged on the inner wall of the second inserting groove (22), and the first threaded portion (33) and the second threaded portion (34) are matched.
  3. 3. The structure according to claim 1, wherein the outer wall of the anti-falling rod (31) is provided with a first rubber layer (314).
  4. 4. The direct current probe mounting structure of claim 1, wherein the anti-falling component (32) comprises an anti-falling block (35), the anti-falling block (35) is arranged on the inner wall of the first inserting groove (12), a mounting groove (311) for inserting the anti-falling block (35) is formed in one end of the anti-falling rod (31), the extending direction of the mounting groove (311) is in the same direction as the extending direction of the anti-falling rod (31), a limiting groove (312) for inserting the anti-falling block (35) is formed in the inner wall of the mounting groove (311), and the limiting groove (312) is circumferentially arranged around the anti-falling rod (31).
  5. 5. The structure according to claim 4, wherein the second rubber layer (36) is wrapped around the outer wall of the anti-falling block (35).
  6. 6. The direct current probe mounting structure according to claim 1, wherein the anti-falling component (32) comprises a fixed block (37) and a spring (39), a first fixed groove (313) is formed in the outer wall of the anti-falling rod (31), the fixed block (37) is movably mounted in the first fixed groove (313), a half ball head (38) is arranged at one end, far away from the first fixed groove (313), of the fixed block (37), a second fixed groove (13) for the half ball head (38) to be inserted is formed in the inner wall of the first inserting groove (12), and the elastic force of the spring (39) is used for enabling the half ball head (38) to be inserted into the second fixed groove (13) normally.
  7. 7. The direct current probe installation structure according to claim 1, wherein the inner wall of the first inserting groove (12) is provided with a guide block, and the outer wall of the anti-falling rod (31) is provided with a guide groove for inserting the guide block.
  8. 8. A direct current probe mounting structure according to claim 1, wherein the probe arm (1) is connected with the frame (5) through a movable component (4), and the movable component (4) is used for driving the probe arm (1) to move along the triaxial of X, Y, Z.

Description

Direct current probe mounting structure Technical Field The application relates to the technical field of chip testing, in particular to a direct current probe mounting structure. Background The probe station is mainly applied to the semiconductor industry, the photoelectric industry, the integrated circuit and the package test, and is widely applied to the tight electrical appliance measurement of complex and high-speed devices. Its main function is to ensure the quality and reliability of the product, and at the same time to shorten the development time and reduce the process cost. The conventional probe station comprises a frame, a probe arm and a probe, wherein the probe arm and the probe are arranged on the frame, the probe is usually directly and fixedly connected to the probe arm, and the stable connection is realized by means of machining or welding and the like. However, the probe mounting manner has the defects that the probes and the probe arms are fixedly connected, so that the operation is inconvenient when the probes with different specifications are replaced, the probes cannot be flexibly adapted to diversified test requirements, and the test efficiency is seriously affected. Accordingly, there is a need for a probe mounting structure that facilitates replacement of probes. Disclosure of utility model In order to facilitate the replacement of the probe, the application provides a direct current probe mounting structure. The application provides a direct current probe mounting structure which adopts the following technical scheme: The direct current probe mounting structure is mounted on a rack and comprises a probe arm, a probe and a connecting component, wherein the probe arm is mounted on the rack, the probe is connected with the probe arm through the connecting component, a connecting piece is arranged at one end of the probe, a connecting groove for the connecting piece to be inserted is formed in one end of the probe arm, a first inserting groove communicated with the connecting groove is formed in the probe arm, a second inserting groove communicated with the first inserting groove is formed in the connecting piece, the connecting component comprises an anti-falling rod and an anti-falling component, the anti-falling rod is inserted into the first inserting groove and the second inserting groove, and the anti-falling component is used for preventing the anti-falling rod from being separated from the second inserting groove. Through adopting foretell technical scheme, the condition that anticreep pole was unexpected from first grafting groove is avoided to the condition that has been separated from to the setting of anticreep part, ensures that the connecting piece can peg graft in the spread groove firmly to realize the reliable connection between probe and the probe arm. When the probes with different specifications need to be replaced, the connection between the connecting piece and the connecting groove is only required to be released, so that the connection between the probe and the probe arm can be canceled, the operation is simple and convenient, and the flexibility and the practicability of the probe mounting structure are improved. Optionally, the anticreep part is including setting up in the first screw thread portion of anticreep pole outer wall and setting up in the second screw thread portion of second jack groove inner wall, first screw thread portion and second screw thread portion cooperate. Through adopting foretell technical scheme, realize connecting through screw-thread fit between anticreep pole and the second jack groove for the anticreep pole can be fixed through the mode of rotatory locking after inserting first jack groove and second jack groove, effectively prevents that the anticreep pole from breaking away from the second jack groove because of the exogenic action. Optionally, the outer wall of the anti-falling rod is provided with a first rubber layer. Through adopting foretell technical scheme, anticreep pole outer wall sets up first rubber layer, can effectively promote the frictional force between staff's hand and the anticreep pole to prevent the hand in the operation process and slide. Optionally, the anti-falling component comprises an anti-falling block, the anti-falling block is arranged on the inner wall of the first inserting groove, an installing groove for inserting the anti-falling block is formed in one end of the anti-falling rod, the extending direction of the installing groove is the same as the extending direction of the anti-falling rod, a limiting groove for inserting the anti-falling block is formed in the inner wall of the installing groove, and the limiting groove is circumferentially arranged around the anti-falling rod. Through adopting foretell technical scheme, at the in-process of inserting the anticreep pole into first jack groove, the anticreep pole can realize grafting cooperation with the mounting groove to can follow self axis