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CN-224203277-U - Test needle and four-wire test device

CN224203277UCN 224203277 UCN224203277 UCN 224203277UCN-224203277-U

Abstract

A test needle comprises a first probe, a second probe and a test head, wherein the second probe is arranged side by side with the first probe, the test head is electrically contacted with the first probe and the second probe along a contact direction, and the cross section area of at least one part of the test head in the contact direction is larger than the sum of the cross section area of the first probe in the contact direction and the cross section area of the second probe in the contact direction. A four-wire testing device is suitable for a component to be tested and comprises a testing jig and two testing needle tools as described above, wherein the testing jig is provided with a bearing area for bearing the component to be tested, and the two testing needle tools are respectively arranged on two opposite sides of the bearing area and are electrically contacted with the testing jig. The test needle and the four-wire test device can expand the contact area of the test piece to be tested relative to the original test needle, thereby reducing the width limit or/and the spacing limit of the original test needle, further reducing the manufacturing cost and improving the production yield of the test needle.

Inventors

  • CHENG SHIWEI
  • WU MINJUN

Assignees

  • 欣兴电子股份有限公司

Dates

Publication Date
20260505
Application Date
20250509

Claims (10)

  1. 1. A test pin, the test pin comprising: A first probe; a second probe arranged side by side with the first probe, and And the test head is electrically contacted with the first probe and the second probe along the contact direction, wherein the sectional area of at least one part of the test head in the contact direction is larger than the sum of the sectional area of the first probe in the contact direction and the sectional area of the second probe in the contact direction.
  2. 2. The test probe of claim 1, wherein the test head comprises: A first segment having a first side and a second side opposite to each other, wherein the first side is in electrical contact with the first probe and the second probe, and And a second section electrically contacting the second side of the first section, wherein a cross-sectional area of the first section in the contact direction is larger than a cross-sectional area of the second section in the contact direction.
  3. 3. The test needle of claim 2, wherein the first section and the second section are each cylindrical.
  4. 4. The test probe of claim 3, wherein the diameter of the first section is at least 20 microns greater than the sum of the diameter of the first probe and the diameter of the second probe, and the diameter of the second section is greater than the diameter of the first probe or the diameter of the second probe.
  5. 5. The test pin of claim 2, wherein the height of the first section in the contact direction is 200 microns.
  6. 6. The test probe tool of claim 1, wherein the test head comprises two insertion holes for inserting the first probe and the second probe to electrically contact the first probe and the second probe.
  7. 7. The test pin of claim 6, wherein the two insertion holes each have a diameter of 30 microns.
  8. 8. The test pin of claim 6, wherein the distance between the two insertion holes is 20 microns.
  9. 9. The test probe of claim 1, wherein the test head is a cylinder.
  10. 10. A four-wire test device, the four-wire test device being adapted for use with a component under test and comprising: A test fixture having a bearing area for bearing the component to be tested, and Two test pins according to any one of claims 1-9, respectively disposed on opposite sides of the carrying region, and electrically contacting the test fixture.

Description

Test needle and four-wire test device Technical Field The present invention relates to a test needle and a four-wire test device. Background In the existing four-wire test probes, since four probes are connected to test pieces (such as solder balls) to be tested on two sides of a component (such as a circuit board) to be tested, two pins on one side are required to be connected to the same test piece at the same time, and two pins have limitation of maximum width. In addition, depending on the operational indication of the test, the two pins must still be kept properly spaced from each other during the test and cannot be contacted, which limits the width of the two pins to a smaller size. Since the manufacturing cost and yield of the needle are proportional to the size of the needle tip and the minimum distance between the two needles, the manufacturing of the needle faces greater challenges as the device to be tested is miniaturized. Disclosure of utility model In order to solve the above problems, the present invention provides a test needle and a four-wire test device. One embodiment of the present disclosure discloses a test probe tool comprising a first probe, a second probe, and a test head, wherein the second probe is arranged in parallel with the first probe. The test head electrically contacts the first probe and the second probe along a contact direction, wherein a cross-sectional area of at least a portion of the test head in the contact direction is greater than a sum of a cross-sectional area of the first probe in the contact direction and a cross-sectional area of the second probe in the contact direction. According to one embodiment, the test head comprises a first section having a first side and a second side opposite to each other, wherein the first side is in electrical contact with the first probe and the second probe, and a second section in electrical contact with the second side of the first section, wherein a cross-sectional area of the first section in the contact direction is larger than a cross-sectional area of the second section in the contact direction. According to an embodiment, the first section and the second section are each cylindrical. According to an embodiment, the diameter of the first section is at least 20 micrometers greater than the sum of the diameter of the first probe and the diameter of the second probe, and the diameter of the second section is greater than the diameter of the first probe or the diameter of the second probe. According to an embodiment, the height of the first segment in the contact direction is 200 micrometers. According to one embodiment, the test head includes two insertion holes for inserting the first probe and the second probe to electrically contact the first probe and the second probe. According to one embodiment, the two insertion holes each have a diameter of 30 microns. According to one embodiment, the distance between the two insertion holes is 20 microns. According to one embodiment, the test head is cylindrical. The four-wire testing device disclosed in one embodiment of the present invention is suitable for a device under test, and includes a testing fixture and two testing pins as described above. The test fixture is provided with a bearing area for bearing the component to be tested. The two test pins are respectively arranged on two opposite sides of the bearing area and are electrically contacted with the test fixture. According to the test pin and the four-wire test device disclosed in the above embodiments, a thick pin can be electrically contacted with the test piece to be tested on the component to be tested first, and then electrically contacted with two thin pins used in the original test. The foregoing description of the present invention and the following description of embodiments are presented to illustrate and explain the principles of the present invention and to provide a further explanation of the scope of the present invention. Drawings FIG. 1 is a schematic side view of a four-wire test apparatus according to an embodiment of the present invention. FIG. 2 is a schematic perspective view of a test needle according to an embodiment of the present invention. FIG. 3 is a schematic perspective view of a first section of a test head of a test needle according to an embodiment of the present invention. FIG. 4 is a schematic perspective view of a test needle according to another embodiment of the present invention. Detailed Description The detailed features and advantages of the present invention will be set forth in the detailed description that follows, and in part will be readily apparent to those skilled in the art from that description or recognized by practicing the invention as described herein. The following examples illustrate the aspects of the present invention in further detail, but are not intended to limit the scope of the present invention in any way. The four-wire test device and test pins described be