Search

CN-224203357-U - Operational amplifier test equipment

CN224203357UCN 224203357 UCN224203357 UCN 224203357UCN-224203357-U

Abstract

The utility model discloses an operational amplifier test device which comprises a single chip microcomputer, a power supply noise superposition module, an operational amplifier module to be tested, an amplifying module and an upper computer, wherein the power supply noise superposition module is electrically connected with the single chip microcomputer to receive PWM signals of the single chip microcomputer, the power supply noise superposition module is used for dividing the PWM signals and processing superposition voltage, the power supply noise superposition module is electrically connected with the operational amplifier module to be tested and provides power for the amplifying module, the amplifying module is electrically connected with the operational amplifier module to be tested and receives noise output by the operational amplifier module to be tested, the amplifying module is used for amplifying the noise, the single chip microcomputer is electrically connected with the amplifying module, the single chip microcomputer is used for sampling the noise to obtain data signals, the upper computer is electrically connected with the single chip microcomputer and receives the data signals, and the upper computer analyzes the data signals to generate corresponding analysis reports, so that noise influence of an interference source is reduced, and stability of operational amplifier detection is improved.

Inventors

  • LI XIA
  • LI YULONG
  • SONG ZHE

Assignees

  • 深圳市易探科技有限公司

Dates

Publication Date
20260505
Application Date
20250303

Claims (8)

  1. 1. The operational amplifier test equipment is characterized by comprising a singlechip (100), a power supply noise superposition module (200), an operational amplifier module (300) to be tested, an amplifying module (400) and an upper computer (500); The power supply noise superposition module (200) is used for being electrically connected with the single chip microcomputer (100) to receive PWM signals of the single chip microcomputer (100), the power supply noise superposition module (200) is used for carrying out voltage division and superposition voltage processing on the PWM signals, the power supply noise superposition module (200) is also used for being electrically connected with the to-be-detected operational amplifier module (300) and providing power for the amplifying module (400), the amplifying module (400) is used for being electrically connected with the to-be-detected operational amplifier module (300) and receiving noise output by the to-be-detected operational amplifier module (300), the amplifying module (400) is used for amplifying the noise, the single chip microcomputer (100) is also used for being electrically connected with the amplifying module (400), the single chip microcomputer (100) is also used for sampling the noise to obtain data signals, the upper computer (500) is also used for being electrically connected with the single chip microcomputer (100) and receiving the data signals, and the upper computer (500) is also used for analyzing the data signals to generate corresponding analysis reports.
  2. 2. The operational amplifier test equipment according to claim 1, wherein the power supply noise superposition module (200) comprises a voltage division unit (201) and a superposition unit (202), the voltage division unit (201) is used for reducing voltage amplitude, the superposition unit (202) is used for outputting fixed direct-current voltage, the single chip microcomputer (100) and the power supply noise superposition module (200) are respectively electrically connected with the voltage division unit (201) and the superposition unit (202), wherein a PWM signal of the single chip microcomputer (100) is subjected to voltage amplitude reduction processing by the voltage division unit (201), and the superposition unit (202) is used for superposing the fixed direct-current voltage.
  3. 3. The operational amplifier testing device according to claim 2, wherein the power noise superposition module (200) further comprises an operational amplifier (203), an input end of the operational amplifier (203) is electrically connected to the single chip microcomputer (100), an output end of the operational amplifier (203) is electrically connected to the operational amplifier module (300) to be tested, and the operational amplifier (203) is configured to receive and amplify the PWM signal processed by the voltage division unit (201) and the superposition unit (202), and input the amplified PWM signal as a power input of the operational amplifier module (300) to be tested.
  4. 4. An op-amp test fixture according to claim 3, wherein the op-amp (203) is electrically connected to an adjusting resistor (204), the adjusting resistor (204) being configured to adjust the amplitude of the square wave superimposed by the PWM signal.
  5. 5. An op-amp test fixture as claimed in claim 4, wherein the op-amp (203) is of model LM358.
  6. 6. An op-amp test fixture as claimed in claim 1, wherein the amplifying module (400) comprises a second-order low-pass amplifier for receiving noise of the op-amp module (300) under test and amplifying the noise to output an amplified voltage.
  7. 7. An op-amp test fixture as defined in claim 6, wherein said second-order low-pass amplifier is of model LMV721.
  8. 8. An operational amplifier testing device according to claim 1, wherein the single chip microcomputer (100) is of the type STM32F030F4.

Description

Operational amplifier test equipment Technical Field The utility model relates to the technical field of detection, in particular to operational amplifier testing equipment. Background With the development of modern electronic technology, the technology is more advanced, the stability requirement on the integrated operational amplifier is higher, and the general testing method and testing instrument are gradually unable to meet all the performance testing requirements. In practice, the op-amp is typically subject to noise from the power line and other external sources of interference. Disclosure of utility model The utility model aims at solving the technical problems in the background technology and provides operational amplifier testing equipment. In order to achieve the technical purpose, the technical scheme adopted by the first aspect of the utility model is as follows: The utility model provides an operation and amplification test equipment, it includes the singlechip, power supply noise stack module, the module is put to the operation that awaits measuring, amplifier module and host computer, power supply noise stack module is connected with the singlechip electricity in order to receive the PWM signal of singlechip, power supply noise stack module carries out partial pressure and superimposed voltage to the PWM signal and handles, power supply noise stack module and the operation that awaits measuring is put the module electric connection and is provided the power for amplifier module, amplifier module and the operation that awaits measuring is put the module electric connection and is received the noise that awaits measuring and put the module output, amplifier module amplifies the noise, singlechip and amplifier module electric connection, the singlechip samples the noise in order to obtain data signal, host computer and singlechip electric connection and receipt data signal, the host computer analysis data signal is in order to produce corresponding analysis report. Preferably, the power supply noise superposition module comprises a voltage division unit and a superposition unit, the voltage division unit is used for reducing the voltage amplitude, the superposition unit is used for outputting fixed direct-current voltage, the singlechip is electrically connected with the voltage division unit and the superposition unit respectively, wherein PWM signals of the singlechip are subjected to voltage amplitude reduction through the voltage division unit, and the superposition unit is used for superposing the fixed direct-current voltage. Preferably, the power supply noise superposition module further comprises an operational amplifier, an input end of the operational amplifier is electrically connected with the single chip microcomputer, an output end of the operational amplifier is electrically connected with the operational amplifier module to be tested, wherein the operational amplifier is used for receiving and amplifying the PWM signals processed by the voltage division unit and the superposition unit, and inputting the amplified PWM signals to serve as a power supply input of the operational amplifier module to be tested. Preferably, the operational amplifier is electrically connected with an adjusting resistor, and the adjusting resistor is used for adjusting the amplitude of the square wave superimposed by the PWM signal. Preferably, the operational amplifier is of model LM358. Preferably, the amplifying module includes a second-order low-pass amplifier, and the second-order low-pass amplifier is configured to receive noise of the operational amplifier module to be tested and amplify the noise to output an amplified voltage. Preferably, the second order low pass amplifier is of model LMV721. Preferably, the model adopted by the singlechip is STM32F030F4. Compared with the prior art, the utility model has the following beneficial technical effects that the system comprises a singlechip, a power supply noise superposition module, an operational amplifier module to be tested, an amplifying module and an upper computer, wherein the power supply noise superposition module is electrically connected with the singlechip to receive PWM signals of the singlechip, the power supply noise superposition module is used for dividing the PWM signals and processing superposition voltage, the power supply noise superposition module is electrically connected with the operational amplifier module to be tested and supplying power to the amplifying module, the amplifying module is electrically connected with the operational amplifier module to be tested and receives noise output by the operational amplifier module to be tested, the amplifying module is used for amplifying the noise, the singlechip is electrically connected with the amplifying module, the singlechip is used for sampling the noise to obtain data signals, the upper computer is electrically connected with the singlechip and receives the data signals, an