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CN-224203365-U - Semiconductor chip testing device

CN224203365UCN 224203365 UCN224203365 UCN 224203365UCN-224203365-U

Abstract

The utility model discloses a semiconductor chip testing device, which relates to the field of chip testing and comprises a testing main board, wherein a base is arranged at the top of the testing main board in a protruding mode, a containing cavity is formed in the top of the base, a testing cavity is arranged in the center of the containing cavity, a limiting frame seat is arranged on the containing cavity in a containing mode, limiting blocks are symmetrically arranged on the side edges of the limiting frame seat in a protruding mode, limiting grooves are symmetrically formed in the two inner side edges of the containing cavity, the limiting grooves are matched and inserted with the limiting blocks, a positioning cavity is formed in the base, corresponding to the limiting grooves, a positioning component is arranged in the positioning cavity, a positioning hole is formed in the limiting block, and the positioning hole and the positioning component are matched and positioned. The utility model can select the corresponding limit frame seat according to the different sizes of the corresponding chips before working, so that the corresponding chips with the corresponding sizes can be effectively fixed, and the chips with the different sizes can be stably clamped at the corresponding positions without dislocation and the like in a test state.

Inventors

  • LIU HUAYUAN
  • MAO LELE
  • CAI CHANGWEI
  • ZHANG TIANYU
  • LU YEBO
  • LOU JUNBIN
  • HE YIXIN

Assignees

  • 浙江帕奇伟业半导体有限公司

Dates

Publication Date
20260505
Application Date
20250507

Claims (7)

  1. 1. The semiconductor chip testing device comprises a testing main board (1) and is characterized in that a base (2) is arranged at the top of the testing main board (1) in a protruding mode, a containing cavity (3) is formed in the top of the base (2), a testing cavity (51) is formed in the center of the containing cavity (3), and a limiting frame seat (5) is arranged on the containing cavity (3) in a containing mode; limiting blocks (6) are symmetrically arranged on the side edges of the limiting frame seat (5) in a protruding mode, limiting grooves (4) are symmetrically formed in the two inner side edges of the containing cavity (3), the limiting grooves (4) are matched with the limiting blocks (6) in an inserting mode, the base (2) is internally corresponding to the limiting grooves (4) in a locating cavity, locating components (7) are arranged at the locating cavity, locating holes (61) are formed in the limiting blocks (6), and the locating holes (61) are matched with the locating components (7) in location.
  2. 2. The semiconductor chip testing device according to claim 1, wherein the positioning assembly (7) comprises an embedded disc (8) rotatably embedded and installed on the base (2), a screw rod (10) is horizontally fixed on one side edge of the embedded disc (8), a positioning inserting column (9) is sleeved on the screw rod (10), the positioning inserting column (9) is in threaded fit with the screw rod (10), and the screw rod (10) is in fit insertion with the positioning hole (61).
  3. 3. A semiconductor chip testing apparatus according to claim 2, wherein said positioning pins (9) and said positioning holes (61) each have a hexagonal vertical cross section.
  4. 4. A semiconductor chip testing apparatus according to claim 1, wherein a top base (11) is fixed to one end of the top of the base (2) through a pin, and a pressing plate (111) is provided on a side of the top base (11) facing the base (2) in a protruding manner.
  5. 5. The semiconductor chip testing device according to claim 4, wherein the front section of the base (2) is provided with a clamping groove, a tensioning rod (12) is fixed at the clamping groove, a tensioning groove is formed at one end, far away from the pin shaft, of the top seat (11), a tensioning assembly (13) is mounted at the tensioning groove, and the tensioning rod (12) and the tensioning assembly (13) are fixed in a matched mode.
  6. 6. A semiconductor chip testing device according to claim 5, wherein the tensioning assembly (13) comprises a first tensioning block (14) and a second tensioning block (15), one end of the first tensioning block (14) facing the second tensioning block (15) is provided with a protruding plate (141) in a protruding mode, an inserting groove (151) for inserting the protruding plate (141) is formed in the second tensioning block (15), the second tensioning block (15) is installed in the tensioning groove in a hinged mode, a first connecting seat (16) is protruding from the top of the first tensioning block (14), a second connecting seat (17) is protruding from the top of the second tensioning block (15), an adjusting rod (18) is installed on the second connecting seat (17) in a penetrating mode, one end of the adjusting rod (18) is installed on the first connecting seat (16) in a rotating and embedded mode, and the second connecting seat (17) is in threaded fit with the adjusting rod (18), and a fixed rod (19) is installed on the end, far away from the first connecting seat (16), of the adjusting rod (18).
  7. 7. The semiconductor chip testing device according to claim 1, wherein the four corners of the test main board (1) are provided with mounting holes (20), and the mounting holes (20) penetrate through the test main board (1).

Description

Semiconductor chip testing device Technical Field The utility model relates to the field of chip testing, in particular to a semiconductor chip testing device. Background With the continuous development of the semiconductor industry and the continuous progress of technology, the application of the semiconductor chip testing device is also continuously expanded and deepened. In the future, the testing device will be more intelligent, automated and efficient, and can test the performance and quality problems of the chip more quickly, and provide more detailed and accurate test data and analysis reports. Meanwhile, with the continuous emergence of new materials and the continuous application of new technologies, the testing device also needs to be continuously updated and upgraded to adapt to new testing requirements. In summary, the semiconductor chip testing apparatus has a significant role and function in the semiconductor industry. The chip limiting frame seat, also called IC limiting frame seat or test socket, is one kind of standard test equipment for testing the electric performance and electric connection of IC device to check production and manufacture defect and bad component. The existing semiconductor chip testing device is characterized in that most of the testing areas used for testing are fixed in size, and because the testing areas are fixed, when the semiconductor chips with different sizes are tested, the semiconductor chips are easy to separate from the testing areas, the testing effect is affected, and the like, so that the semiconductor chip testing device cannot be well adapted to different working requirements, is poor in overall practicability, cannot well meet the different working requirements, and therefore needs to be assisted in solving the problem. Disclosure of utility model Based on this, the present utility model aims to provide a semiconductor chip testing device, so as to solve the technical problems that the existing semiconductor chip testing device has a testing area for testing, most of the sizes are fixed, and because the testing area is fixed, when testing semiconductor chips with different sizes, the semiconductor chip is easy to separate from the testing area, the testing effect is affected, and the like, the semiconductor chip testing device cannot well adapt to different working requirements, the overall practicality of the testing device is poor, and the different working requirements cannot be well met. The semiconductor chip testing device comprises a testing main board, wherein a base is arranged at the top of the testing main board in a protruding mode, a containing cavity is formed in the top of the base, a testing cavity is formed in the center of the containing cavity, and a limiting frame seat is arranged on the containing cavity in a containing mode; Limiting blocks are symmetrically arranged on the side edges of the limiting frame seat in a protruding mode, limiting grooves are symmetrically formed in the two inner side edges of the containing cavity, the limiting grooves are matched and inserted with the limiting blocks, a positioning cavity is formed in the base corresponding to the limiting grooves, a positioning assembly is arranged at the positioning cavity, positioning holes are formed in the limiting blocks, and the positioning holes are matched and positioned with the positioning assembly. The positioning assembly comprises an embedded disc which is rotatably embedded and installed on the base, a screw rod is horizontally fixed on one side edge of the embedded disc, a positioning inserting column is sleeved on the screw rod, the positioning inserting column is in threaded fit with the screw rod, and the screw rod is in fit insertion with the positioning hole. The utility model is further arranged that the vertical sections of the positioning inserting posts and the positioning holes are hexagonal. The utility model is further characterized in that one end of the top of the base is fixed with a top seat through a pin shaft, and a pressing plate is arranged on one side edge of the top seat, which faces the base, in a protruding mode. The utility model is further characterized in that the front section of the base is provided with a clamping groove, a tensioning rod is fixed at the clamping groove, one end of the top seat, which is far away from the pin shaft, is provided with a tensioning groove, a tensioning assembly is arranged at the tensioning groove, and the tensioning rod and the tensioning assembly are fixed in a matched manner. The utility model further provides that the tensioning assembly comprises a first tensioning block and a second tensioning block, wherein a protruding plate is arranged at one end of the first tensioning block, which faces the second tensioning block in a protruding mode, a splicing groove for splicing the protruding plate is formed in the second tensioning block, the second tensioning block is hinged to the tensionin