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CN-224203651-U - Test main board for DDR memory strip

CN224203651UCN 224203651 UCN224203651 UCN 224203651UCN-224203651-U

Abstract

The utility model discloses a test main board for DDR memory strips, which comprises a PCB board, a CPU chip and a plurality of DIMM connectors. The PCB board is provided with a first surface and a second surface which are opposite. The CPU chip is arranged on the first surface of the PCB. And the DIMM connectors are arranged on the second surface of the PCB and are used for plugging DDR memory bars. The utility model can realize the independent heating of the DDR memory bank during the test, and can ensure the temperature of the CPU chip to be in a normal range during the test, thereby being convenient for long-term continuous operation.

Inventors

  • ZHAO MING
  • CHEN JIAO
  • LIU YU

Assignees

  • 武汉欧康诺电子科技股份有限公司

Dates

Publication Date
20260505
Application Date
20250221

Claims (6)

  1. 1. A test motherboard for a DDR memory stick, comprising: A PCB board (1), the PCB board (1) having opposite first (11) and second (12) surfaces; A CPU chip (3), the CPU chip (3) being arranged on the first surface (11) of the PCB (1); A plurality of DIMM connectors (4), wherein the DIMM connectors (4) are arranged on the second surface (12) of the PCB (1) and are used for plugging DDR memory strips; the PCB (1) is further integrated with a plurality of independent power supplies (5), the independent power supplies (5) are electrically connected with the DIMM connector (4), the independent power supplies (5) are provided with an OCP overcurrent protection mechanism, and a current and voltage detection device (6) is further arranged between the independent power supplies (5) and the DIMM connector (4).
  2. 2. The test motherboard for a DDR memory card according to claim 1, wherein a heat radiation fan is provided on one side of the CPU chip (3).
  3. 3. The test motherboard for a DDR memory card of claim 1, wherein a heat test device is provided on a side of the DIMM connector (4).
  4. 4. The test motherboard for a DDR memory card of claim 1, further comprising a motherboard power supply (2) and a plurality of in-place detection devices, wherein one end of the in-place detection device is electrically connected to the motherboard power supply (2) and the other end is connected to the DIMM connector (4).
  5. 5. The test motherboard for a DDR memory card of claim 4, wherein said DIMM connector (4) comprises a GND pin (41), said GND pin (41) being electrically connected to said in-place detection device.
  6. 6. The test motherboard for a DDR memory card of claim 5, wherein said in-place detection means comprises a resistor (71) and a detection module (72) interconnected, and said resistor (71) is electrically connected to said motherboard power supply (2), said detection module (72) is electrically connected to said GND pin (41), and said detection module (72) is for detecting a level signal to determine an installation state of said DDR memory card.

Description

Test main board for DDR memory strip Technical Field The utility model relates to the field of memory bank testing, in particular to a testing main board for DDR memory banks. Background With the continuous development of DDR (Double-rate synchronous dynamic random access memory) memory technology, the integration level of memory banks is higher and higher, and the performance is also improved. Higher integration means that the number of electronic components per unit area increases, and the amount of heat generated increases accordingly. To meet these high performance requirements, the performance of the memory bank at high temperatures needs to be tested to ensure that it is capable of stable operation. Currently, a motherboard for detecting a DDR Memory chip mainly includes a CPU (central processing unit ) chip and a DIMM (Dual-Inline-Memory-Modules) connector for plugging the DDR Memory chip, and the DIMM connector and the CPU chip are generally integrated on the same surface of a PCB (printed circuit board ), and the DIMM connector is disposed on both sides of the CPU chip. However, when detecting the memory, the DIMM connector and the CPU chip are on the same surface, so that the memory cannot be heated independently, even if the memory is heated, the test result is inaccurate, and even the CPU chip is affected, so that the CPU chip exceeds Wen Siji. Disclosure of utility model Aiming at the defects of the prior art, the utility model provides a test main board for DDR memory chips, which can independently heat the DDR memory chips, ensure the temperature of a CPU chip to be in a normal range and is convenient for long-term continuous operation. The utility model is realized by the following technical scheme: a test motherboard for a DDR memory stick, comprising: the PCB is provided with a first surface and a second surface which are opposite; the CPU chip is arranged on the first surface of the PCB; And the DIMM connectors are arranged on the second surface of the PCB and are used for plugging DDR memory bars. Further, a heat radiation fan is arranged on one side of the CPU chip. Further, a heat testing device is arranged on one side of the DIMM connector. Further, the main board further comprises a main board power supply and a plurality of in-place detection devices, wherein one end of each in-place detection device is electrically connected with the main board power supply, and the other end of each in-place detection device is connected with the DIMM connector. Further, the DIMM connector includes a GND pin electrically connected to the in-place detecting device. Further, the in-place detection device comprises a resistor and a detection module which are connected with each other, the resistor is electrically connected with a main board power supply, the detection module is electrically connected with the GND pin, and the detection module is used for detecting a level signal to determine the installation state of the DDR memory bank. Furthermore, a plurality of independent power supplies are integrated on the PCB, and the independent power supplies are electrically connected with the DIMM connector. Further, the independent power supply has an OCP over-current protection mechanism. Further, a current-voltage detection device is also arranged between the independent power supply and the DIMM connector. Compared with the prior art, the utility model has the advantages that: 1. Through setting up CPU chip and a plurality of DIMM connector respectively at the first surface and the second surface of PCB board, the DDR memory strip of messenger can heat alone when the test, and can guarantee that CPU chip temperature is in normal range, the long-term continuous operation of being convenient for. 2. By connecting the independent power supply to each DIMM connector, each DDR memory bar is independently powered so as to finely screen the short-circuited DDR memory bars, other DDR memory bars can be protected from being damaged greatly, and the test of the test machine is stable. 3. Through setting up the detection device that targets in place, use detection module detection level signal to confirm DDR memory bank's installation status to follow-up work goes on, has improved work efficiency. 4. And a current and voltage detection device is further arranged between the independent power supply and the DIMM connector to help a user measure the memory power consumption of the DDR memory bank in the working/standby state in the research and development or batch stage and objectively evaluate the performance of the DDR memory bank. Drawings FIG. 1 is a left side view of a test motherboard for DDR memory chips according to an embodiment of the utility model; FIG. 2 is a schematic circuit diagram of a stand-alone power supply and DIMM connector; fig. 3 is a schematic circuit diagram of an in-place detection device. The reference numerals comprise 1, a PCB board, 11, a first surface, 12, a second surface, 2, a mai