CN-224216591-U - Glass substrate detection equipment

Abstract

The utility model relates to a quality testing technical field specifically discloses a glass substrate check out test set, and it includes frame, charging tray, horizontal drive subassembly, first light source subassembly, second light source subassembly and image acquisition subassembly, and the image acquisition subassembly is including installing the lift drive subassembly in the detection room and by the image acquisition ware of lift drive subassembly drive lift; the device utilizes the cooperation of the first light source component and the image acquisition component to detect the reflection quality of the glass substrate, and utilizes the cooperation of the second light source component and the image acquisition component to detect the transmission quality of the glass substrate, so that the closed type and multi-mode quality detection of the glass substrate is realized, the influence of external environment light on a detection result is reduced, the detection efficiency and accuracy are obviously improved, and the labor cost and the misjudgment rate are reduced.

Inventors

• HUANG HAIJUN
• LIN QIWEN

Assignees

• 中科博创(广东)科技有限公司

Dates

Publication Date

20260508

Application Date

20250515

Claims (10)

1. 1. The glass substrate detection device is used for detecting the surface quality and the optical performance of a lens and is characterized by comprising a frame, a charging tray, a horizontal driving assembly, a first light source assembly, a second light source assembly and an image acquisition assembly, wherein the frame is provided with a detection chamber, the charging tray is used for bearing a glass substrate to be detected, the horizontal driving assembly is arranged in the detection chamber and is used for driving the charging tray to horizontally displace in the detection chamber, the first light source assembly and the image acquisition assembly are arranged in the detection chamber and are positioned above the charging tray, the image acquisition assembly comprises a lifting driving assembly arranged in the detection chamber and an image acquisition device driven to lift by the lifting driving assembly, and the second light source assembly is arranged in the charging tray and is positioned below the glass substrate to be detected borne by the charging tray.
2. 2. The glass substrate inspection apparatus according to claim 1, further comprising a gantry fixed in the inspection chamber, the elevation drive assembly being detachably fixed in a middle of a beam of the gantry, the first light source assembly being detachably fixed on the beam of the gantry and on one side of the elevation drive assembly, an illumination direction of the first light source assembly being inclined downward toward the tray.
3. 3. The glass substrate inspection apparatus according to claim 1, wherein the frame has a window corresponding to a top of the inspection chamber, and a fan filter unit provided to cover the window is installed at the top of the frame.
4. 4. The glass substrate inspection apparatus according to claim 1, wherein the inspection chamber top is further provided with an illumination lamp.
5. 5. The glass substrate detection apparatus according to claim 1, wherein a limit through groove for limiting the bearing position of the glass substrate to be detected is formed in the middle of the material tray, the second light source assembly is located below the limit through groove, and grooves for facilitating taking and placing of the glass substrate to be detected are formed in two sides of the limit through groove.
6. 6. The glass substrate inspection apparatus according to claim 1, wherein the frame comprises a bottom frame and a top frame, the inspection chamber is located on the top frame, the top frame is detachably mounted on the bottom frame, a wire passing hole is formed in the bottom of the top frame, a power supply end is arranged in the bottom frame, and terminals of the horizontal driving assembly, the first light source assembly, the second light source assembly and the image acquisition assembly are connected with the power supply end through the wire passing hole.
7. 7. The glass substrate inspection apparatus according to claim 1, wherein the bottom of the frame is provided with adjustable feet and universal wheels.
8. 8. The glass substrate inspection apparatus according to claim 1, wherein the horizontal driving assembly comprises a longitudinal driving assembly and a lateral driving assembly, the lateral driving assembly is mounted on a movable end of the longitudinal driving assembly, the longitudinal driving assembly is fixed at the bottom of the inspection chamber for driving the lateral driving assembly to move longitudinally, the tray is fixed on a movable end of the lateral driving assembly, and the lateral driving assembly is used for driving the tray to move laterally.
9. 9. The glass substrate inspection apparatus according to claim 8, wherein a limit assembly is provided at one side of the longitudinal driving assembly, and the limit assembly includes a plurality of limit switches thereon for limiting a movement range of the movable end of the longitudinal driving assembly.
10. 10. The glass substrate inspection apparatus according to claim 8, wherein the elevation drive assembly, the longitudinal drive assembly, and the lateral drive assembly are all electric linear modules.

Description

Glass substrate detection equipment Technical Field The application relates to the technical field of quality detection, in particular to glass substrate detection equipment. Background At the moment of rapid development of display technology, the glass substrate is used as a key raw material of display devices such as a liquid crystal panel, an OLED panel and the like, and the quality of the glass substrate directly determines the performance and the yield of display products. Therefore, defect detection of the glass substrate is increasingly important. At present, most enterprises still rely on manual detection of glass substrate defects, but glass substrate production processes are complicated, various tiny defects such as particles, scratches and micro cracks are easy to generate, manual detection efficiency is low, high-speed production rhythm is difficult to match, detection precision is difficult to ensure, detection omission and misjudgment are easy to occur, and some enterprises still adopt automatic detection equipment to detect, but the equipment is only provided with a single light source to carry out single-mode quality detection, and generally has no closed structure, is easily influenced by external environment light, and has the defects of insufficient detection efficiency and low detection accuracy. In view of the above problems, no effective technical solution is currently available. Disclosure of utility model The application aims to provide glass substrate detection equipment, which improves detection efficiency and accuracy and reduces labor cost and misjudgment rate. The application provides glass substrate detection equipment which is used for detecting the surface quality and the optical performance of a lens, and comprises a frame, a charging tray, a horizontal driving assembly, a first light source assembly, a second light source assembly and an image acquisition assembly, wherein the frame is provided with a detection chamber, the charging tray is used for bearing a glass substrate to be detected, the horizontal driving assembly is arranged in the detection chamber and is used for driving the charging tray to horizontally displace in the detection chamber, the first light source assembly and the image acquisition assembly are both arranged in the detection chamber and are positioned above the charging tray, the image acquisition assembly comprises a lifting driving assembly arranged in the detection chamber and an image acquisition device driven to lift by the lifting driving assembly, and the second light source assembly is arranged in the charging tray and is positioned below the glass substrate to be detected borne by the charging tray. The glass substrate detection equipment can detect the reflection quality of the glass substrate by utilizing the matching of the first light source component and the image acquisition component in a closed detection chamber, and detect the transmission quality of the glass substrate by utilizing the matching of the second light source component and the image acquisition component, so that the closed and multi-mode quality detection of the glass substrate is realized, the influence of external environment light on a detection result is reduced, the detection efficiency and accuracy are obviously improved, and the labor cost and the misjudgment rate are reduced. The glass substrate detection equipment further comprises a portal frame, the portal frame is fixed in the detection chamber, the lifting driving assembly is detachably fixed in the middle of a beam of the portal frame, the first light source assembly is detachably fixed on the beam of the portal frame and located on one side of the lifting driving assembly, and the illumination direction of the first light source assembly is inclined downwards and faces the material tray. In this example, the first light source assembly is fixed on the beam of the portal frame and is located at one side of the lifting driving assembly, and the illumination direction of the first light source assembly is set obliquely downwards towards the tray, and this illumination angle enables light to irradiate the surface of the glass substrate and generate reflection, and the reflected light is received by the image collector located above, so that the image for detecting the reflectivity quality is collected. The glass substrate detection equipment is characterized in that a window is arranged at the top of the frame corresponding to the detection chamber, and a fan filter unit arranged to cover the window is arranged at the top of the frame. The glass substrate detection equipment is characterized in that an illuminating lamp is further arranged at the top of the detection chamber. The glass substrate detection equipment is characterized in that a limiting through groove used for limiting the bearing position of the glass substrate to be detected is formed in the middle of the material tray, the second light sour