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CN-224216753-U - Semiconductor chip test fixture with adjustable spacing

CN224216753UCN 224216753 UCN224216753 UCN 224216753UCN-224216753-U

Abstract

The utility model discloses a semiconductor chip testing fixture with adjustable spacing, which belongs to the field of semiconductor chips and comprises a placing plate, wherein four corners above the placing plate are fixedly connected with upright posts, the interiors of the four upright posts are respectively and rotatably connected with mounting rods, the tops of the four mounting rods are respectively and fixedly connected with a connecting rod, the middle part of one side of the connecting rod is provided with a groove, and the middle part of one side of the connecting rod is provided with eight round holes.

Inventors

  • ZHANG SHUPING

Assignees

  • 盐城芯辉电子科技有限公司

Dates

Publication Date
20260508
Application Date
20250522

Claims (7)

  1. 1. The utility model provides a semiconductor chip test fixture with adjustable interval, includes places board (1), its characterized in that place the equal fixedly connected with stand (11) in four corners department of board (1) top, four the inside of stand (11) is all rotated and is connected with installation pole (12), four the equal fixedly connected with connecting rod (13) in top of installation pole (12), recess (14) have been seted up at the middle part of connecting rod (13) one side, eight round holes (15) have been seted up at connecting rod (13) one side middle part, eight round holes (15) are equidistant linear array, eight round hole (15) and recess (14) intercommunication, the outside sliding connection of connecting rod (13) has sliding sleeve (16), the outside fixedly connected with installation piece (23) of sliding sleeve (16).
  2. 2. The semiconductor chip testing fixture with adjustable space as set forth in claim 1, wherein a spring (24) is fixedly connected to the inside of the mounting block (23), a clamping block (25) is fixedly connected to one end of the spring (24), and the clamping block (25) is slidably connected to the sliding sleeve (16).
  3. 3. The semiconductor chip testing fixture with adjustable spacing as claimed in claim 2, wherein one side of the clamping block (25) is arc-shaped, and the clamping block (25) is clamped inside the round hole (15).
  4. 4. The semiconductor chip testing fixture with adjustable space as set forth in claim 3, wherein the eccentric wheel (2) is rotatably connected to the outside of the sliding sleeve (16), a through groove (22) is formed in one side of the sliding sleeve (16), the through groove (22) is located right in front of the eccentric wheel (2), and one side of the eccentric wheel (2) is clamped with the inside of the groove (14).
  5. 5. The semiconductor chip testing fixture with adjustable spacing as claimed in claim 4, wherein the outer wall of the eccentric wheel (2) is fixedly connected with a handle (21).
  6. 6. The semiconductor chip testing fixture with adjustable spacing as claimed in claim 1, wherein the end part of the sliding sleeve (16) is rotatably connected with a threaded rod (17), and the top end of the threaded rod (17) is fixedly connected with a knob (18).
  7. 7. The semiconductor chip testing fixture with adjustable spacing as claimed in claim 6, wherein the bottom end of the threaded rod (17) is provided with a bearing (26), and the outer wall of the bearing (26) is fixedly connected with a pressing block (27).

Description

Semiconductor chip test fixture with adjustable spacing Technical Field The utility model relates to the field of semiconductor chips, in particular to a semiconductor chip testing fixture with adjustable spacing. Background At the moment of rapid development of the semiconductor industry, a semiconductor chip is used as a core element of modern electronic equipment, performance test of the semiconductor chip is a key link for ensuring product quality and reliability, with the vigorous development of emerging technologies such as artificial intelligence, internet of things, 5G communication and the like, requirements for high-performance and high-precision chips continuously rise, and a test fixture is used as a core element for bearing and fixing the chips, so that the accuracy and efficiency of a test result are directly influenced by the performance quality of the semiconductor chip. But among the prior art, like chinese patent "CN221088711U", a fixture for semiconductor chip processing, including placing the board, place the four corners position of board and all be fixed with the barrel, the inside of four barrels is all rotated and is assembled the body of rod, and the top of four bodies of rod all extends to the outside of corresponding barrel, and all is provided with on four bodies of rod and compresses tightly the subassembly, all is connected through spacing subassembly between four barrels and the four bodies of rod. However, in the above patent, the length of the jacket rod is fixed, and the application range is limited to a circular area with the length of the jacket rod as a radius, and the screw position cannot be further adjusted. When the facing dimension exceeds the circular area, or the chip is irregularly shaped and the pins are specially distributed, effective clamping and accurate positioning are difficult to realize. In addition, the fixture is difficult to adapt to quick switching tests of chips with different batches and different specifications due to the fixed structure, so that the test efficiency is low, the equipment purchasing cost and the time cost of enterprises are increased, inconvenience exists, and certain limitation exists during use. Disclosure of utility model 1. Technical problem to be solved Aiming at the problems existing in the prior art, the utility model aims to provide a semiconductor chip testing fixture with adjustable space, which can realize the function of adjusting the space of a pressing block. 2. Technical proposal In order to solve the problems, the utility model adopts the following technical scheme. The utility model provides a semiconductor chip test fixture of adjustable interval, is including placing the board, place the equal fixedly connected with stand in four corners department of board top, four the inside of stand is all rotated and is connected with the installation pole, four the equal fixedly connected with connecting rod in top of installation pole, the recess is seted up at the middle part of connecting rod one side, eight round holes are offered at connecting rod one side middle part, and eight round holes are equidistant linear array, eight round hole and recess intercommunication, the outside sliding connection of connecting rod has the slip cap, the outside fixedly connected with installation piece of slip cap. Further, the inside fixedly connected with spring of installation piece, the one end fixedly connected with fixture block of spring, fixture block and slip cap sliding connection. Further, one side of the clamping block is arc-shaped, and the clamping block is clamped in the round hole. Further, the outside of sliding sleeve rotates and is connected with the eccentric wheel, logical groove has been seted up to one side of sliding sleeve, logical groove is located the eccentric wheel in the place ahead, the inside joint of one side and recess of eccentric wheel. Further, the outer wall of the eccentric wheel is fixedly connected with a handle. Further, the end of the sliding sleeve is rotatably connected with a threaded rod, and the top end of the threaded rod is fixedly connected with a knob. Further, the bottom of threaded rod is installed the bearing, the outer wall fixedly connected with briquetting of bearing. 3. Advantageous effects Compared with the prior art, the utility model has the advantages that: (1) In this scheme, through the slip of slip cap on the connecting rod, the joint of the round hole of combining eight equidistance linear array and fixture block can realize the multi-gear adjustment of test part mounted position, no matter the size surpasses traditional fixed range's chip, or irregular shape, the special chip of pin distribution, the accurate adaptation is realized to the position of all accessible adjustment slip cap, has greatly widened the application scope of anchor clamps, has reduced the condition of frequently changing anchor clamps because of the chip specification difference, reduces enterpris