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CN-224216755-U - Semiconductor test probe contact mechanism

CN224216755UCN 224216755 UCN224216755 UCN 224216755UCN-224216755-U

Abstract

The utility model discloses a semiconductor test probe contact mechanism, which belongs to the field of semiconductor test and comprises a mounting seat and two fixing seats, wherein mounting grooves are formed in the two fixing seats, a first spring is fixedly connected in the mounting grooves, limiting blocks are fixedly connected to the ends of the first spring and are slidably connected in the mounting grooves, clamping blocks are slidably connected in the fixing seats, the upper parts of the clamping blocks and the limiting blocks are clamped, and connecting blocks are fixedly connected to one sides of the limiting blocks.

Inventors

  • ZHANG SHUPING

Assignees

  • 盐城芯辉电子科技有限公司

Dates

Publication Date
20260508
Application Date
20250522

Claims (7)

  1. 1. The semiconductor test probe contact mechanism comprises a mounting seat (1) and two fixing seats (15) and is characterized in that two mounting grooves (16) are formed in the fixing seats (15), a first spring (17) is fixedly connected to the inside of each mounting groove (16), a limiting block (18) is fixedly connected to the end portion of each first spring (17), the limiting block (18) is slidably connected to the inside of each mounting groove (16), a clamping block (23) is slidably connected to the inside of each fixing seat (15), the upper portion of each clamping block (23) is clamped with the corresponding limiting block (18), a connecting block (19) is fixedly connected to one side of each limiting block (18), an inclined block (2) is fixedly connected to one end of each connecting block (19), and each connecting block (19) and each inclined block (2) are slidably connected to the inside of each fixing seat (15).
  2. 2. The semiconductor test probe contact mechanism of claim 1, wherein a second spring (21) is fixedly connected to the upper portion of the fixing seat (15), a pressing rod (22) is fixedly connected to the top end of the second spring (21), and the bottom end of the pressing rod (22) is located above the inclined block (2).
  3. 3. A semiconductor test probe contact mechanism according to claim 2, wherein a chamfer is provided on one side of the lower end of said pressing rod (22).
  4. 4. The semiconductor test probe contact mechanism according to claim 3, wherein a third spring (24) is fixedly connected to the lower portion of the fixing seat (15), and a test probe (25) is fixedly connected to the bottom end of the third spring (24).
  5. 5. The semiconductor test probe contact mechanism as set forth in claim 4, wherein a handle (26) is fixedly connected to the lower portion of the fixture block (23), and the handle (26) is located on one side of the third spring (24).
  6. 6. The semiconductor test probe contact mechanism of claim 1, wherein one side of the mounting seat (1) is rotatably connected with a bidirectional screw rod (12), one side of the mounting seat (1) is fixedly connected with a limiting rod (14), one side of the two fixing seats (15) is respectively in threaded connection with one side of the outer wall of the bidirectional screw rod (12), and the two fixing seats (15) are both in sliding connection with the limiting rod (14).
  7. 7. The semiconductor test probe contact mechanism according to claim 6, wherein one end of the bidirectional screw rod (12) located outside the mounting seat (1) is fixedly connected with a knob (13), and the top end of the mounting seat (1) is fixedly connected with a hook (11).

Description

Semiconductor test probe contact mechanism Technical Field The utility model relates to the field of semiconductor testing, in particular to a semiconductor testing probe contact mechanism. Background At the moment of rapid development of the semiconductor industry, performance testing of semiconductor devices is of great importance, and the performance of the test probe contact mechanism serving as a core component directly affects the testing accuracy and efficiency. In the prior art, as chinese patent CN209231396U proposes a semiconductor test probe, which comprises a housing, two test probes are movably installed on the inboard of shell, two test probes upper ends are through screw thread movable mounting installed part, fixedly be provided with first spring between the upper end of installed part and the inboard upper end of shell, shell middle part movable mounting has double-end screw rod, two test probes respectively through screw thread and double-end screw rod swing joint, the both sides of shell are movable mounting fixed part respectively, two fixed parts pass through bearing and double-end screw rod swing joint, the one end of double-end screw rod is fixed and is provided with the carousel, the lower extreme of two fixed parts is through screw thread movable mounting there is the locating part, the one end that the locating part is close to the shell is fixed and is provided with the rubber pad. However, in the above patent, although the turntable is rotated to drive the double-ended screw rod to rotate so as to drive the two test probes to adjust the distance between the two test probes according to the requirements, the semiconductor probe is inconvenient to rapidly mount and dismount the probes in the use process, so that inconvenience is brought in replacement or maintenance, and certain limitation exists in the use process. Disclosure of utility model 1. Technical problem to be solved Aiming at the problems existing in the prior art, the utility model aims to provide a semiconductor test probe contact mechanism which can realize the function of quickly disassembling and assembling a test probe. 2. Technical proposal In order to solve the problems, the utility model adopts the following technical scheme. The utility model provides a semiconductor test probe contact mechanism, includes mount pad and two fixing bases, two the mounting groove has all been seted up to the inside of fixing base, the inside fixedly connected with spring of mounting groove, the tip fixedly connected with stopper of spring, stopper sliding connection is in the inside of mounting groove, the inside sliding connection of fixing base has the fixture block, the top and the stopper joint of fixture block, one side fixedly connected with connecting block of stopper, the one end fixedly connected with sloping block of connecting block, the equal sliding connection of connecting block and sloping block is in the inside of fixing base. Further, the top fixedly connected with spring No. two of fixing base, the top fixedly connected with of spring No. two presses the pole, the bottom of pressing the pole is located the top of sloping block. Further, a chamfer is formed on one side of the lower end of the pressing rod. Further, the below fixedly connected with spring No. three of fixing base, the bottom fixedly connected with test probe of spring No. three. Further, a handle is fixedly connected to the lower portion of the clamping block, and the handle is located on one side of the third spring. Further, one side of mount pad rotates and is connected with two-way screw rod, one side fixedly connected with gag lever post of mount pad, two one side of fixing base respectively with one side threaded connection of two-way screw rod outer wall, two the fixing base all with gag lever post sliding connection. Further, one end of the bidirectional screw rod, which is positioned outside the mounting seat, is fixedly connected with a knob, and the top end of the mounting seat is fixedly connected with a hook. 3. Advantageous effects Compared with the prior art, the utility model has the advantages that: (1) According to the scheme, the second spring and the pressing rod with the chamfer angle enable pressing operation to be easy and smooth, the pressing rod can be pressed down to push the inclined block to drive the limiting block to move, separation of the clamping block and the limiting block is achieved, the fixing seat is convenient to detach and adjust, the second spring is automatically reset after pressing, manual operation is simplified, the handle below the clamping block is further optimized to operate, the clamping block is convenient to slide, clamping connection and separation are rapidly completed, and operation efficiency is improved. (2) In this scheme, through bi-directional screw and gag lever post on the mount pad, the collocation knob can be convenient two fixing base intervals of adjustment, and the different speci