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CN-224216759-U - Multi-path voltage test fixture for PCB (printed circuit board)

CN224216759UCN 224216759 UCN224216759 UCN 224216759UCN-224216759-U

Abstract

The utility model discloses a multipath voltage testing jig for a PCB main board, which comprises a workbench, a positioning plate, a side frame and a probe assembly, wherein the positioning plate is arranged on the table top of the workbench, the side frame is fixed on one side of the workbench, two sides of the top of the side frame are respectively provided with a seat, the seats are provided with a guide post, the guide posts are vertically arranged, the bottom ends of the guide posts are fixedly connected to the workbench, two sides of the probe assembly are respectively provided with a linear bearing, the probe assembly is respectively arranged on the guide posts on the two sides in a sliding manner through the linear bearings on the two sides, the probe assembly is positioned right above the positioning plate, a lifting handle is hinged to the top of the side frame, and the lifting handle is in transmission connection with the probe assembly so as to lift and drive the probe assembly. The contact accuracy of the needle head of the probe is improved, and the test success rate of the equipment is improved.

Inventors

  • HE HAILI
  • WU WENJIAN
  • CHEN BAOGANG
  • HE JINHONG

Assignees

  • 东莞市肯和电子有限公司

Dates

Publication Date
20260508
Application Date
20250425

Claims (10)

  1. 1. A multi-path voltage test fixture for a PCB main board comprises a workbench (1), a positioning plate (6), a side frame (2) and a probe assembly (5), wherein the positioning plate (6) is arranged on the table top of the workbench (1), the side frame (2) is fixed on one side of the workbench (1), and is characterized in that two sides of the top of the side frame (2) are respectively provided with a seat (22), the seats (22) are provided with a guide post (23), the guide posts (23) are vertically arranged, the bottom ends of the guide posts are fixedly connected to the workbench (1), two sides of the probe assembly (5) are respectively provided with a linear bearing (512), the probe assembly (5) is respectively arranged on the guide posts (23) on the two sides in a sliding manner through the linear bearings (512) on the two sides, the probe assembly (5) is positioned right above the positioning plate (6), The top hinge of the side frame (2) is provided with a lifting handle (41), and the lifting handle (41) is connected with the probe assembly (5) in a transmission way so as to lift the driving probe assembly (5).
  2. 2. The multi-path voltage testing jig for the PCB main board of claim 1, wherein a transverse suspension assembly (21) is arranged on one side of the side frame (2) facing the positioning plate (6), the transverse suspension assembly (21) is horizontally extended, an arch-shaped piece (3) is arranged at the outer end of the transverse suspension assembly (21), a lifting part (31) is arranged at the top of the arch-shaped piece (3), a guide sleeve head (32) is arranged at the bottom of the arch-shaped piece, The lifting handle (41) is arranged in an L shape, one end of the lifting handle (41) is arranged on the lifting part (31) through a rotating shaft, a supporting shaft is arranged at the bending position of the lifting handle (41), the supporting shaft extends to two side faces of the lifting handle respectively and is provided with a side arm (42) in a rotating mode, the middle parts of the two side arms (42) are arranged in an arch bridge shape and protrude towards the left side and the right side respectively, an avoidance space is reserved between the two side arms (42), a hanging rod (43) is arranged in the center of the top face of the probe assembly (5), the hanging rod (43) movably penetrates through the guide sleeve head (32), the top of the hanging rod (43) is provided with another supporting shaft, and the hanging rod is hinged to the bottom ends of the side arms (42) on the two sides respectively.
  3. 3. The multi-path voltage testing jig for a PCB main board of claim 2, wherein a connecting piece (511) is arranged at the center of the top surface of the probe assembly (5), the connecting piece (511) is arranged in a bench shape, two sides of the connecting piece (511) are connected with the probe assembly (5) through bolts, a connecting hole penetrating up and down is arranged at the middle position of the connecting piece (511), a buffer space is reserved at the bottom of the connecting piece (511), a buffer emulsion (45) is arranged at the bottom surface of the buffer space, The lower extreme of jib (43) is equipped with spacing bulge loop (44), and jib (43) activity cross-under is in the joint hole to spacing bulge loop (44) block the cooperation with the joint hole, and the lower terminal surface activity of jib (43) is supported and is pressed in buffering emulsion (45), avoids pressing the mainboard that awaits measuring.
  4. 4. The multi-path voltage testing jig of the PCB main board of claim 1, wherein the probe assembly (5) comprises a top plate (51) and a bottom plate (52), the top plate (51) and the bottom plate (52) are arranged at intervals up and down, and the four corners are respectively connected with a layering connecting rod (53), The bottom plate (52) is provided with a plurality of jacks, each jack is respectively inserted with a probe unit (54), the lower end of each probe unit (54) extends to the lower part of the bottom plate (52) by taking the bottom plate (52) as a limit, and forms a contact part, the upper part of each probe unit (54) forms a wiring part for connecting wires, Each probe unit (54) is respectively provided with a test state and an idle state, when the probe unit (54) is in the test state, a gap is reserved between the top end of the probe unit (54) and the bottom surface of the top plate (51), the needle heads of the probe units (54) are arranged in a downward protruding mode relative to the needle heads of other probe units (54), and when the probe unit (54) is in the idle state, the top end of the probe unit (54) is contacted with the bottom surface of the top plate (51).
  5. 5. The multi-path voltage testing jig of a PCB main board of claim 4, wherein the probe units (54) are arranged in an array, and the distance between two adjacent probe units (54) is not more than 1cm.
  6. 6. The multi-path voltage testing jig of a PCB main board according to claim 5, wherein the thickness of the bottom plate (52) is 2cm-4cm to form the insertion hole with the length of 2cm-4cm, and the hole wall of the insertion hole is in clearance fit with the probe unit (54) to fasten and stabilize the position of the probe unit (54) in the vertical direction.
  7. 7. The multi-path voltage testing jig for a PCB main board according to claim 2, wherein two sides of the top of the side frame (2) are respectively provided with a U-shaped groove (20) which extends vertically, and the cross suspension assembly (21) is mounted on the two U-shaped grooves (20) through bolts so as to realize the adjustment of the limit height of the probe assembly (5).
  8. 8. The multi-path voltage testing jig for the PCB main board of claim 1, wherein the top surface of the positioning plate (6) is provided with a profiling positioning recess (60) for clamping and positioning the main board to be tested, the left side and the right side of the profiling positioning recess (60) are respectively provided with an avoidance recess (61) for carrying the main board to be tested, the avoidance recesses (61) are communicated with the profiling positioning recess (60), and the depth of the avoidance recesses (61) is larger than that of the profiling positioning recess (60).
  9. 9. The multi-path voltage testing jig for a PCB main board according to claim 1, wherein two sides of the workbench (1) are respectively provided with a holding opening (12) for hand-moving the testing jig.
  10. 10. The multi-path voltage testing jig for the PCB main board of claim 1, wherein a testing switch key (11) is arranged on one side of the top surface of the workbench (1).

Description

Multi-path voltage test fixture for PCB (printed circuit board) Technical Field The utility model relates to the technical field of PCB main board detection equipment, in particular to a multi-path voltage test fixture for a PCB main board. Background During the manufacturing process, various problems may occur in the PCB such as poor soldering, component damage, short circuits, open circuits, etc. If these defects are not detected, they can lead to failure of the final product, affect brand reputation, and even create a safety hazard. The test system is an important element to ensure the quality of the product. In the prior art, the voltage test of the PCB main board is usually carried out by means of a multimeter in an artificial mode, so that the voltage test is very complicated, contacts are required to be found every time, and the efficiency is very low. There is also test fixture of many needles among the prior art, like application number "CN202121276045.3", patent name is "a PCB mainboard multichannel voltage test system", wherein, including the base, the first mounting panel of top installation of base, and the PCB mainboard has been placed on the top of first mounting panel, the top fixedly connected with frame of base, and the installing frame is installed to one side of frame, the bottom of installing frame is connected with the connecting rod, and the pressfitting handle is installed on the top of connecting rod, the bottom of connecting rod is connected with the second mounting panel, and the top of second mounting panel is connected with the connecting plate, the probe is installed to the bottom of connecting plate, and the top of connecting plate is connected with the connecting wire. However, the test system still has the defects of non-adjustable lifting stroke, small application range, unstable movement structure of the mounting plate and the probe, easy deviation, and inaccurate contact with the target contact, so that improvement is needed. Disclosure of utility model Aiming at the defects in the prior art, the utility model aims to provide a multi-path voltage testing jig for a PCB main board, so that the stability of a motion structure of a probe is improved, the accuracy of contact of the probe is improved, and the detection efficiency is improved. In order to achieve the above purpose, the technical scheme includes that the multi-path voltage testing jig for the PCB main board comprises a workbench, a positioning plate, a side frame and a probe assembly, wherein the positioning plate is arranged on a table surface of the workbench, the side frame is fixed on one side of the workbench, two sides of the top of the side frame are respectively provided with a seat, each seat is provided with a guide post, the guide posts are vertically arranged, the bottom ends of the guide posts are fixedly connected to the workbench, two sides of the probe assembly are respectively provided with a linear bearing, the probe assembly is slidably arranged on the guide posts on the two sides through the linear bearings on the two sides, the probe assembly is arranged right above the positioning plate, a lifting handle is hinged to the top of the side frame and is connected to the probe assembly in a transmission mode so as to lift and drive the probe assembly. In a further technical scheme, a lateral suspension component is arranged on one side of a side frame facing a positioning plate, the lateral suspension component is horizontally extended, an arch piece is arranged at the outer end of the lateral suspension component, a lifting part is arranged at the top of the arch piece, a guide sleeve head is arranged at the bottom of the lateral suspension component, a lifting handle is arranged in an L shape, one end of the lifting handle is arranged on the lifting part through a rotating shaft, a supporting shaft is arranged at a bending part of the lifting handle, the supporting shafts respectively extend to two side faces of the lifting handle and respectively rotatably provided with a side arm, the middle parts of the two side arms are arranged in an arch bridge shape and respectively protrude towards the left side and the right side, an avoidance space is reserved between the two side arms, a hanging rod is arranged at the center of the top face of the probe component, the hanging rod movably penetrates through the guide sleeve head, and the top of the hanging rod is provided with another supporting shafts and is respectively hinged to the bottom ends of the side arms on the two sides. In further technical scheme, the central point of the top surface of probe subassembly puts and is equipped with the connecting piece, and this connecting piece is bench shape setting, and bolted connection is passed through in probe subassembly to the both sides of connecting piece, and the spliced eye that runs through from top to bottom has been seted up to the intermediate position of connecting piece, and buffer space