CN-224216817-U - Flying probe test equipment
Abstract
The utility model discloses flying probe testing equipment, which relates to the field of flying probe testing, and comprises a flying probe card and a testing probe detachably arranged on the flying probe card, wherein the testing probe comprises an outer cylinder, an adjusting block, a sliding block, a main probe, a first elastic piece and a second elastic piece, the upper end of the main probe is arranged in the outer cylinder in a sliding manner, the lower end of the main probe penetrates through the lower end of the outer cylinder, the adjusting block is detachably arranged at the upper end of the outer cylinder, the first elastic piece, the sliding block and the second elastic piece are sequentially arranged in the outer cylinder, the sliding block is arranged between the main probe and the adjusting block in a sliding manner, the first elastic piece is clamped between the adjusting block and the sliding block, and the second elastic piece is clamped between the sliding block and the main probe. More space allowance is reserved in the outer cylinder, a plurality of small springs are filled between the main probe and the regulating block, the distance between the main probe and the regulating block can be regulated by rotating the regulating block, the buffer stroke can be flexibly regulated, and the impact force is absorbed by the plurality of small springs to reduce the impact to the minimum.
Inventors
- JIANG GUOCHAO
- REN JUN
- LU YUHUA
Assignees
- 惠州市旺通达电子有限公司
Dates
- Publication Date
- 20260508
- Application Date
- 20250120
Claims (10)
- 1. The flying probe test equipment is characterized by comprising a flying probe card and a test probe detachably arranged on the flying probe card, wherein the test probe comprises an outer cylinder, an adjusting block, a sliding block, a main probe, a first elastic piece and a second elastic piece, the upper end of the main probe is slidably arranged in the outer cylinder, the lower end of the main probe is arranged at the lower end of the outer cylinder in a penetrating manner, the adjusting block is detachably arranged at the upper end of the outer cylinder, the first elastic piece, the sliding block and the second elastic piece are sequentially arranged in the outer cylinder, the sliding block is slidably arranged between the main probe and the adjusting block, the first elastic piece is clamped between the adjusting block and the sliding block, and the second elastic piece is clamped between the sliding block and the main probe.
- 2. The flying probe testing device of claim 1, wherein the main probe is formed by sequentially and coaxially connecting a probe main body and a probe end part from top to bottom, the probe main body and the probe end part are both cylinders, an upper through hole and a lower through hole are respectively formed in the upper end and the lower end of the outer cylinder, the probe main body is in clearance fit with the upper through hole, the probe main body is in clearance fit with the lower through hole, and the probe end part is in clearance fit with the lower through hole.
- 3. The flying probe testing device of claim 2, wherein the testing probe further comprises a wire, the wire is connected to one end of the probe body far away from the end of the probe, the adjusting block and the sliding block are respectively provided with an upper central hole and a lower central hole in a penetrating manner, the upper central hole, the lower central hole and the main probe are coaxially arranged, and the wire sequentially penetrates through the lower central hole and the upper central hole.
- 4. The flying probe testing device of claim 1, wherein the testing probe further comprises a third elastic member, a plurality of sliding blocks are slidably arranged between the main probe and the adjusting block, and the third elastic member is clamped between two adjacent sliding blocks.
- 5. The flying probe testing device according to claim 1, wherein the end of the probe, which is far away from the probe main body, is convexly provided with a tip for contacting the object to be tested, and the tip is any one of a cone, a table body and a hemisphere.
- 6. The flying probe testing device of claim 5, wherein the first elastic member, the second elastic member and the third elastic member are compression springs, and the outer diameter of the compression springs is smaller than or equal to the inner diameter of the outer cylinder.
- 7. The flying probe testing device according to claim 6, wherein the center positions of the upper end face of the probe main body and the lower end face of the sliding block are respectively provided with a lower protruding block in a protruding mode, and two ends of the second elastic piece are respectively sleeved on the two lower protruding blocks.
- 8. The flying probe testing device according to claim 6, wherein the central position of the lower end face of the adjusting block is convexly provided with a second bump, the central position of the upper end face of the sliding block is convexly provided with an upper bump, and two ends of the first elastic piece are respectively sleeved on the second bump and the upper bump.
- 9. The flying probe testing device of claim 8, wherein the central position of the upper end surface of the adjusting block is convexly provided with a first lug, the first lug is in a hexagonal prism shape, and the second lug and the first lug are symmetrically arranged.
- 10. The flying probe testing device according to claim 3, wherein the inner wall of the upper through hole is provided with internal threads, and the circumferential surface of the adjusting block is provided with external threads matched with the internal threads.
Description
Flying probe test equipment Technical Field The utility model relates to the field of flying probe testing, in particular to flying probe testing equipment. Background The flying probe tester is an instrument for testing a PCB (printed circuit board) with high element arrangement density, multiple layers, large wiring density and small measuring point distance, and mainly tests the insulation and conduction values of a circuit board. Because the test probes make physical contact with the vias and solder on the test pads, small pits may be left on the pads. For some customers, these small pits may be considered to be appearance defects, resulting in rejection. In the actual use process of the existing test probe, although a buffer spring is arranged in the test probe, the spring is thinner and longer, and has higher requirements on the precision of the buffer stroke. The machining precision requirement of the test probe is higher, and the machining difficulty is higher. This increases the cost of the test probe and the buffer stroke of the test probe cannot be adjusted. Therefore, the utility model provides the flying probe testing equipment, which solves the problems that the buffer stroke of the test probe cannot be adjusted, the buffer spring is slender and the cost is high. Disclosure of utility model The flying probe testing equipment comprises a flying probe card and a testing probe detachably arranged on the flying probe card, wherein the testing probe comprises an outer cylinder, an adjusting block, a sliding block, a main probe, a first elastic piece and a second elastic piece, the upper end of the main probe is arranged in the outer cylinder in a sliding mode, the lower end of the main probe is arranged at the lower end of the outer cylinder in a penetrating mode, the adjusting block is detachably arranged at the upper end of the outer cylinder, the first elastic piece, the sliding block and the second elastic piece are sequentially arranged in the outer cylinder, at least one sliding block is arranged between the main probe and the adjusting block in a sliding mode, the first elastic piece is clamped between the adjusting block and the sliding block, and the second elastic piece is clamped between the sliding block and the main probe. Preferably, the main probe is formed by sequentially coaxially connecting a probe main body and a probe end part from top to bottom, the probe main body and the probe end part are both cylinders, an upper through hole and a lower through hole are respectively formed in the upper end and the lower end of the outer cylinder, the probe main body is in clearance fit with the upper through hole, the probe main body is in clearance fit with the lower through hole, and the probe end part is in clearance fit with the lower through hole. Preferably, the test probe further comprises a wire, the wire is connected to one end, far away from the end part of the probe, of the probe body, the adjusting block and the sliding block are respectively provided with an upper central hole and a lower central hole in a penetrating mode, the upper central hole, the lower central hole and the main probe are coaxially arranged, and the wire sequentially penetrates through the lower central hole and the upper central hole. Preferably, the test probe further comprises a third elastic piece, a plurality of sliding blocks are slidably arranged between the main probe and the adjusting block, and the third elastic piece is clamped between two adjacent sliding blocks. Preferably, one end of the probe end far away from the probe main body is convexly provided with a tip for contacting the tested object, and the tip is any one of a cone, a table body and a hemisphere. Preferably, the first elastic piece, the second elastic piece and the third elastic piece are compression springs, and the outer diameter of each compression spring is smaller than or equal to the inner diameter of the outer cylinder. Preferably, the center positions of the upper end face of the probe main body and the lower end face of the sliding block are respectively provided with a lower protruding block in a protruding mode, and two ends of the second elastic piece are respectively sleeved on the two lower protruding blocks. Preferably, the central position of the lower end surface of the adjusting block is convexly provided with a second bump, the central position of the upper end surface of the sliding block is convexly provided with an upper bump, and two ends of the first elastic piece are respectively sleeved on the second bump and the upper bump. Preferably, a first bump is convexly arranged at the central position of the upper end face of the adjusting block, the first bump is a hexagonal prism, and the second bump and the first bump are symmetrically arranged. Because the upper center hole occupies a place, the first lug is matched with the sleeve to rotate the adjusting block. And the adjustment block may be used upside dow