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CN-224216823-U - Chip temperature test experiment platform device

CN224216823UCN 224216823 UCN224216823 UCN 224216823UCN-224216823-U

Abstract

The utility model relates to a chip temperature test experiment platform device which comprises a machine body, wherein the machine body is provided with a test chamber, a pre-temperature chamber and a regulating chamber which are separated through a partition structure, the test chamber is used for carrying out temperature test on a chip, the pre-temperature chamber is used for pre-cooling the chip when carrying out low-temperature test on the chip, the regulating chamber is communicated with the outside of the machine body through an exhaust fan, the exhaust fan is an exhaust fan with adjustable rotating speed, the test chamber is communicated with the pre-temperature chamber, the pre-temperature chamber is communicated with the regulating chamber, the test chamber is provided with a first cold air inlet, and the pre-temperature chamber is provided with a second cold air inlet. According to the technical scheme of the utility model, the exhaust fan is started to accelerate air flow, and as the first cold air inlet and the second cold air inlet continuously input low dew point drying air into the test chamber and the pre-temperature chamber, the dew points in the test chamber and the pre-temperature chamber can be rapidly reduced to reach the required dew points, so that the efficiency of reducing the dew points in the test chamber and the pre-temperature chamber can be improved.

Inventors

  • CAO GUOGUANG
  • XIE GUOQING
  • Cao Huangdong
  • LUO YIZHEN
  • Ding Yukang

Assignees

  • 东莞市华越半导体技术股份有限公司

Dates

Publication Date
20260508
Application Date
20250506

Claims (8)

  1. 1. The chip temperature test experiment platform device is characterized by comprising a machine body (1), wherein the machine body (1) is provided with a test chamber (3), a pre-temperature chamber (4) and a regulating chamber (5) which are separated through a partition structure; the test chamber (3) is used for performing temperature test on the chip; The pre-heating chamber (4) is used for pre-heating the chip when the chip is subjected to low-temperature test; The adjusting chamber (5) is communicated with the outside of the machine body (1) through an exhaust fan (6), and the exhaust fan (6) is an exhaust fan with adjustable rotating speed; The test chamber (3) is communicated with the pre-heating chamber (4), the pre-heating chamber (4) is communicated with the adjusting chamber (5), the test chamber (3) is provided with a first cold air inlet (101), and the pre-heating chamber (4) is provided with a second cold air inlet (102).
  2. 2. The device for testing a temperature of a chip according to claim 1, The partition structure comprises a partition plate, and the inside of the machine body (1) is partitioned into a testing chamber (3), a preheating chamber (4) and a regulating chamber (5) through the partition plate.
  3. 3. The device for testing a temperature of a chip according to claim 2, The machine body (1) comprises a machine table (21) and a first outer cover (22), the first outer cover (22) is arranged on the machine table (21) in a covering mode, a first chamber is formed between the machine table and the first outer cover, the first partition (23) is located above the machine table (21), the first partition (23) is located in the first chamber, and the first chamber is divided into the test chamber (3) and the pre-temperature chamber (4); the test device comprises a first partition board (23) and a machine table (21), wherein a first gap (211) is formed between the first partition board (23) and the machine table (21) so that the test chamber (3) and the pre-heating chamber (4) are communicated through the first gap (211), and a first cold air inlet (101) and a second cold air inlet (102) are both arranged on the machine table (21) and are both arranged upwards.
  4. 4. The device for testing a temperature of a chip according to claim 3, The machine body (1) further comprises a second housing (7), the second housing (7) is arranged on one side of the machine table (21) away from the first housing (22), and the adjusting chamber (5) is formed between the second housing and the first housing; The machine table (21) is provided with vent holes (212) penetrating through two sides, and the preheating chamber (4) and the regulating chamber (5) are communicated through the vent holes (212).
  5. 5. The temperature-on-chip test bench device according to any of claim 1 to 4, it is characterized in that the method comprises the steps of, The first cold air inlet (101) is provided with a first throttling structure for throttling the gas flowing into the test cavity, and/or the second cold air inlet (102) is provided with a second throttling structure for throttling the gas flowing into the preheating chamber (4).
  6. 6. The device for testing a temperature of a chip according to claim 5, The first throttle structure is a first air dividing block (8) arranged at the first cold air inlet (101), and/or the second throttle structure is a second air dividing block (9) arranged at the second cold air inlet (102).
  7. 7. The chip temperature test experiment platform device according to any one of claims 1-4, 6, further comprising a transfer mechanism for transferring chips in the test chamber (3) out of the test chamber (3), and a temperature sensor provided in the test chamber (3) for detecting the chip temperature in the test chamber (3); The conveying mechanism is provided with a heating device (12), and the heating device (12) is used for heating the chips on the conveying mechanism.
  8. 8. The device for testing a temperature of a chip according to claim 7, The conveying mechanism comprises a driving mechanism (10) and a sliding block (11), wherein the sliding block (11) is used for providing support for the chip, and the driving mechanism (10) is used for driving the sliding block (11) to move so as to send the chip out of the testing chamber (3) through the sliding block (11); The heating device (12) is arranged on the sliding block (11), and the heating device (12) is used for heating the sliding block (11) so as to heat the chip through the sliding block (11).

Description

Chip temperature test experiment platform device Technical Field The utility model relates to the technical field of chip temperature testing, in particular to a chip temperature testing experiment platform device. Background At present, a chip temperature test experiment platform device is generally used for testing the service performance of a chip in a cold environment. The prior chip temperature test experiment platform device comprises a machine body, wherein the machine body is provided with a test chamber and a pre-temperature chamber which are separated through a partition structure. The test chamber is used for performing temperature test on the chip. The pre-temperature chamber is used for pre-cooling the chip when the chip is subjected to low-temperature test. Specifically, when the chip is subjected to low-temperature test, the chip is placed into a pre-temperature chamber to pre-cool the chip, so that the temperature of the chip is reduced to a preset temperature range. And then the chip is sent into a testing chamber for low-temperature testing, and the chip is sent out of the testing chamber after the testing is finished. When the chip is tested at low temperature, the dew point of the chip testing environment is required to be reduced. At present, dry compressed air with the dew point lower than the required dew point is generally introduced into the test chamber and the pre-temperature chamber, so that the water vapor content in the environment is continuously reduced, the dew point is reduced, the dew point reduction efficiency is low, the air consumption is high, and the problem needs to be solved. Disclosure of utility model In view of the above, the utility model provides a chip temperature test experiment platform device, which mainly solves the technical problem of improving the efficiency of reducing the dew points in a test chamber and a pre-temperature chamber. In order to achieve the above purpose, the present utility model mainly provides the following technical solutions: The embodiment of the utility model provides a chip temperature test experiment platform device, which comprises a machine body, wherein the machine body is provided with a test chamber, a pre-temperature chamber and a regulating chamber which are separated by a partition structure; The test chamber is used for performing temperature test on the chip; the pre-heating chamber is used for pre-heating the chip when the chip is subjected to low-temperature test; The adjusting cavity is communicated with the outside of the machine body through an exhaust fan, and the exhaust fan is an exhaust fan with adjustable rotating speed; The test chamber is communicated with the pre-heating chamber, the pre-heating chamber is communicated with the adjusting chamber, the test chamber is provided with a first cold air inlet, and the pre-heating chamber is provided with a second cold air inlet. Preferably, the partition structure comprises a partition plate, and the partition structure divides the inside of the machine body into a testing chamber, a preheating chamber and a regulating chamber through the partition plate. Preferably, the partition board comprises a first partition board for separating the test chamber and the pre-temperature chamber, the machine body comprises a machine table and a first outer cover, the first outer cover is arranged on the machine table and forms a first chamber therebetween, the first partition board is positioned above the machine table and is positioned in the first chamber and separates the first chamber into the test chamber and the pre-temperature chamber; The first partition board is provided with a first gap between the machine table, so that the test chamber and the preheating chamber are communicated through the first gap, and the first cold air inlet and the second cold air inlet are both arranged on the machine table and are both upward. Preferably, the machine body further comprises a second housing, wherein the second housing is arranged on one side of the machine table, which is away from the first housing, and the adjusting chamber is formed between the second housing and the first housing; The machine table is provided with vent holes penetrating through two sides, and the preheating chamber and the regulating chamber are communicated through the vent holes. Preferably, the first cold air inlet is provided with a first throttling structure for throttling the gas flowing into the test cavity, and/or the second cold air inlet is provided with a second throttling structure for throttling the gas flowing into the pre-temperature chamber. Preferably, the first throttling structure is a first air dividing block arranged at the first cold air inlet, and/or the second throttling structure is a second air dividing block arranged at the second cold air inlet. Preferably, the chip temperature test experiment platform device further comprises a conveying mechanism and a temperature sensor,