CN-224218362-U - Perovskite film battery piece IV testing arrangement

CN224218362UCN 224218362 UCN224218362 UCN 224218362UCN-224218362-U

Abstract

The utility model belongs to the technical field of perovskite solar cell preparation, and relates to a perovskite thin film cell IV test device which comprises a base and a light-transmitting cover, wherein a test cavity is arranged between the light-transmitting cover and the base, a support and a plurality of test clamp assemblies are arranged in the test cavity, each test clamp assembly comprises an insulating block, a locating block, a movable block, an elastic probe and a probe base, the locating block and the movable block are respectively and oppositely arranged on the insulating blocks, the locating block and the movable block are respectively abutted against four side edges of a perovskite thin film cell to be tested IV, the elastic probe is arranged on the probe base, and the elastic probe is in conductive contact with a test part at the bottom of the perovskite thin film cell to be tested IV. Helium holes, air suction holes and wire passing holes which are communicated with the testing cavity are respectively arranged on the side face of the base. The utility model can effectively slow down the decomposition of the film layer of the bare chip battery in the test process and improve the accuracy of the test result.

Inventors

DAI WANLEI
ZHU JIQUAN
YAN BUYI
YAO JIZHONG

Assignees

衢州纤纳新能源科技有限公司

Dates

Publication Date: 20260508
Application Date: 20250528

Claims (9)

1. The perovskite thin film battery piece IV testing device comprises a base and a light-transmitting cover which are mutually connected in a sealing way, wherein the light-transmitting cover is arranged at the upper part of the base, a testing cavity is arranged between the light-transmitting cover and the base, the perovskite thin film battery piece IV testing device is characterized in that a support and a plurality of testing clamp components are arranged in the testing cavity, the support is fixed on the base, the testing clamp components are arranged in an inner hole groove of the support, the testing clamp components comprise an insulating block, a positioning block, a movable block, an elastic probe and a probe base, the insulating block is arranged on the side wall of the inner hole groove, the positioning block and the movable block are respectively and oppositely arranged on the insulating block, the positioning block and the movable block respectively lean against the four side edges of the perovskite thin film battery piece to be tested IV, the elastic probe is arranged on the probe base, the probe base is fixed on the bottom surface of the inner hole groove, and the elastic probe is in conductive contact with a testing part at the bottom of the perovskite thin film battery piece to be tested IV; helium holes and air extraction holes are respectively formed in the side face of the base, the helium holes and the air extraction holes are respectively communicated with the testing cavity, and wire passing holes of the testing wires are further formed in the side face of the base.
2. The perovskite thin film cell IV test apparatus of claim 1, wherein a plurality of vent holes are provided in the bottom wall of the inner hole groove, one end of the vent hole is communicated with the air suction hole, and the other end is communicated with the test chamber.
3. The perovskite thin film cell IV test apparatus of claim 1 wherein a plurality of vent holes are provided in the bottom wall of the internal bore slot, one end of the vent holes being in communication with the helium gas port and the other end of the vent holes being in communication with the test chamber.
4. The perovskite thin film cell IV test apparatus of claim 1 wherein a plurality of lead holes are provided in the bottom wall of the internal hole groove, one end of the lead holes being in communication with the via holes and the other end thereof being in communication with the test chamber.
5. The perovskite thin film cell sheet IV testing device of claim 1, wherein a sealing ring is provided at the junction of the base and the light transmissive cover.
6. The perovskite thin film cell IV test apparatus of claim 1, wherein the bracket is fixed on the base by an adjusting bolt, and a height difference between the bracket and the elastic probe is adjusted by the adjusting bolt.
7. The perovskite thin film cell sheet IV testing device of claim 1, wherein a heating assembly is disposed within the support.
8. The perovskite thin film cell IV testing device according to claim 1, wherein the light-transmitting cover comprises a frame and a top cover which are connected in a sealing manner, wherein the frame is made of a transparent acrylic plate, and the top cover is made of a transparent quartz plate.
9. The perovskite thin film cell sheet IV test apparatus of claim 1, wherein the insulating block is made of polytetrafluoroethylene or bakelite.

Description

Perovskite film battery piece IV testing arrangement Technical Field The utility model belongs to the technical field of perovskite solar cell preparation, and particularly relates to a perovskite thin film cell IV testing device. Background In the process of new technology and new material exploration and research, the perovskite thin film battery generally utilizes an IV test device to perform parameter test on relevant performance of a battery bare chip, and the battery bare chip is directly exposed to air due to the fact that the film layer material of the battery bare chip is not subjected to a packaging technology, and substances such as oxygen, moisture and the like in the air accelerate the decomposition of the thin film material, so that the accuracy of a battery test result is directly affected. The laboratory usually performs the test in the glove box, but the glove box is huge, and in actual operation, the nitrogen replacement and the vacuumizing operation are performed for a plurality of times, which is time-consuming and has more accessory equipment, so that the batch rapid test requirement is inconvenient. Disclosure of utility model The technical problem to be solved by the utility model is to provide the perovskite thin film battery piece IV testing device which can effectively slow down the decomposition of a thin film layer of a bare chip battery piece in the testing process and improve the accuracy of a testing result. The utility model provides an IV test device for perovskite thin film battery pieces, which comprises a base and a light-transmitting cover which are mutually connected in a sealing way, wherein the light-transmitting cover is arranged at the upper part of the base, a test cavity is arranged between the light-transmitting cover and the base, a support and a plurality of test clamp assemblies are arranged in the test cavity, the support is fixed on the base, the test clamp assemblies are arranged in an inner hole groove of the support, the test clamp assemblies comprise insulating blocks, positioning blocks, movable blocks, elastic probes and probe bases, the insulating blocks are arranged on the side wall of the inner hole groove, the positioning blocks and the movable blocks are respectively and oppositely arranged on the insulating blocks, the positioning blocks and the movable blocks are respectively abutted against the four side edges of the perovskite thin film battery pieces to be tested in IV, the elastic probes are arranged on the probe bases, the probe bases are fixed on the bottom surface of the inner hole groove, the elastic probes are in conductive contact with the test part at the bottom of the perovskite thin film battery pieces to be tested in an electrical conduction way, helium hole and an air suction hole are respectively arranged on the side surface of the base, the helium hole and the air suction hole are respectively communicated with the test cavity, and a wire passing hole for testing wires is also arranged on the side surface of the base. Further, a plurality of exhaust holes are formed in the bottom wall of the inner hole groove, one end of each exhaust hole is communicated with the corresponding exhaust hole, and the other end of each exhaust hole is communicated with the corresponding testing cavity. Further, a plurality of vent holes are formed in the bottom wall of the inner hole groove, one end of each vent hole is communicated with the helium hole, and the other end of each vent hole is communicated with the testing cavity. Further, a plurality of lead holes are formed in the bottom wall of the inner hole groove, one end of each lead hole is communicated with the corresponding wire passing hole, and the other end of each lead hole is communicated with the testing cavity. Further, a sealing ring is arranged at the joint of the base and the light-transmitting cover. Further, the support is fixed on the base through an adjusting bolt, and the height difference between the support and the elastic probe is adjusted through the adjusting bolt. Further, a heating assembly is disposed within the holder. Further, the light-transmitting cover comprises a frame and a top cover which are connected in a sealing mode, the frame is made of a transparent acrylic plate, and the top cover is made of a transparent quartz plate. Further, the insulating block is made of polytetrafluoroethylene or bakelite. Compared with the prior art, the perovskite thin film battery piece IV testing device comprises a base and a light-transmitting cover which are arranged up and down, a testing cavity is arranged between the light-transmitting cover and the base, a support and a plurality of testing clamp assemblies are arranged in the testing cavity, the testing clamp assemblies are arranged in inner holes of the support, the testing clamp assemblies comprise insulating blocks, positioning blocks, movable blocks, elastic probes and probe bases, the insulating blocks are arrange