CN-224218363-U - Solar cell space defect grading diagnosis system

CN224218363UCN 224218363 UCN224218363 UCN 224218363UCN-224218363-U

Abstract

The utility model provides a solar cell space defect grading diagnosis system. The system comprises an electroluminescence diagnosis module, at least one stage of transient photoelectric diagnosis module, a sample stage, an accurate displacement device and an automatic control and data processing unit, wherein the electroluminescence diagnosis module corresponds to an electroluminescence test position and is used for exciting an electroluminescence phenomenon of a solar cell to be tested and collecting electroluminescence images of the solar cell to be tested, the at least one stage of transient photoelectric diagnosis module corresponds to at least one photoelectric test position and is used for exciting transient photoelectric signals in a corresponding target range of the solar cell to be tested and collecting transient photoelectric properties of the solar cell to be tested under excitation, the sample stage is used for keeping electricity of the solar cell to be tested, the accurate displacement device is used for enabling the sample stage to be located at different test positions according to the sequence from the electroluminescence test position to each stage of photoelectric test position, and the automatic control and data processing unit is configured to collect the electroluminescence images and the transient photoelectric properties and determine defect positions of the solar cell to be tested step by step. And realizing the grading research and rapid positioning of the space defects of the solar cell.

Inventors

SHI JIANGJIAN
LI YIMING
WANG JINGCHEN
MENG QINGBO
LI DONGMEI
LUO YANHONG
WU HUIJUE

Assignees

中国科学院物理研究所

Dates

Publication Date: 20260508
Application Date: 20250120

Claims (10)

1. A solar cell spatial defect grading diagnostic system, comprising: The electroluminescence diagnosis module is corresponding to the electroluminescence test bit and is configured to excite the electroluminescence phenomenon of the solar cell to be tested and collect the electroluminescence image of the solar cell to be tested; The at least one level of transient photoelectric diagnosis module corresponds to at least one photoelectric test bit respectively, and each level of transient photoelectric diagnosis module is configured to excite transient photoelectric signals in a corresponding target range of the solar cell to be detected and collect transient photoelectric properties of the solar cell to be detected under excitation; The sample stage is used for holding the solar cell to be tested and connecting the solar cell to be tested into the electroluminescence diagnosis module and the at least one stage of transient photoelectric diagnosis module; accurate displacement means arranged to cause the sample stage to be positioned at different test sites in order from the electroluminescent test site to each of the optoelectronic test sites, and And the automatic control and data processing unit is respectively connected with the electroluminescence diagnosis module, the at least one-stage transient photoelectric diagnosis module and the accurate displacement device and is configured to control the operations of the electroluminescence diagnosis module, the at least one-stage transient photoelectric diagnosis module and the accurate displacement device, collect the electroluminescence image and the transient photoelectric property and step by step determine the defect position of the solar cell to be tested according to the electroluminescence image and the transient photoelectric property.
2. The solar cell spatial defect grading diagnostic system according to claim 1, wherein the electroluminescent diagnostic module comprises: The imaging instrument is arranged corresponding to the electroluminescence test bit and is used for collecting electroluminescence images of the solar battery to be tested; the at least one stage transient optoelectronic diagnostic module includes: at least one stage of laser light source respectively corresponding to the at least one photoelectric test bit, each stage of laser light source configured to generate pulse laser light to excite transient photoelectric signals in a corresponding target range of the solar cell to be tested, and The transient photoelectric measurement unit is used for collecting transient photoelectric properties of the solar cell to be measured under the excitation of the laser light source at each stage; The sample stage is also used for connecting the solar cell to be tested with the adjustable power supply and the transient photoelectric measurement unit; The accurate displacement device is further configured to realize spatial scanning of the laser light source of each stage on a corresponding target range of the solar cell to be detected; The automatic control and data processing unit is respectively connected with the adjustable power supply, the imaging instrument, the laser light source of each stage, the transient photoelectric measurement unit and the accurate displacement device and is configured to control the operation of the adjustable power supply, the imaging instrument, the laser light source of each stage, the transient photoelectric measurement unit and the accurate displacement device.
3. The solar cell spatial defect graded diagnosis system according to claim 2, wherein the spot size of the pulsed laser light generated by the at least one primary laser light source is reduced stepwise.
4. The solar cell spatial defect graded diagnosis system according to claim 3, wherein the at least one primary laser light source comprises a primary light source configured to generate a pulsed laser of a specific frequency, an intensity-tunable and a variable spot shape, and a secondary light source configured to generate a pulsed laser of a specific frequency, an intensity-tunable, micro-scale spot size.
5. The solar cell spatial defect graded diagnosis system according to claim 4, wherein, The primary light source includes: A shaping element for outputting a millimeter-sized light spot of a target shape, and The first diaphragm is used for adjusting the intensity of the pulse laser; the secondary light source includes: And the second diaphragm is used for adjusting the intensity of the pulse laser.
6. The solar cell spatial defect grading diagnostic system according to any of claims 1-5, further comprising: One or more optical microscopes respectively corresponding to one or more photoelectric test sites in the at least one photoelectric test site and configured to respectively collect microscopic images of the solar cell to be tested at the one or more photoelectric test sites; The automatic control and data processing unit is also connected with the one or more optical microscopes and is configured to collect microscopic images, utilize the microscopic images to assist a transient photoelectric diagnosis module corresponding to the one or more photoelectric test sites in exciting transient photoelectric signals within a corresponding target range of the solar cell to be tested, and/or utilize the microscopic images to assist in determining the defect position.
7. The solar cell spatial defect grading diagnostic system according to any of claims 1-5, wherein the accurate displacement device comprises: the displacement platform is used for bearing the sample platform; A displacement track for carrying the displacement table and allowing the displacement table to drive the sample table to move along the displacement track in an x-y two-dimensional degree of freedom, and And the driving element is connected with the automatic control and data processing unit and is used for driving the displacement table to move under the control of the automatic control and data processing unit.
8. The solar cell spatial defect grading diagnostic system according to claim 7, wherein the displacement stage comprises: a coarse adjustment displacement table arranged on the displacement track, and The fine adjustment displacement platform is arranged on the coarse adjustment displacement platform and is used for bearing the sample platform; the driving element includes: a coarse adjustment motor for driving the coarse adjustment displacement table to move on the displacement track with millimeter-level displacement precision, and And the stepping motor is used for driving the fine-adjustment displacement platform to move with micron-level displacement precision on the coarse-adjustment displacement platform.
9. The solar cell spatial defect grading diagnostic system according to any of claims 1-5, wherein the sample stage comprises: An adjustable clamp configured to be adjustable according to the size of the solar cell to be measured to fix the solar cells to be measured of different sizes, and And the probe is used for contacting the electrode of the solar cell to be tested and connecting the solar cell to be tested into the electroluminescence diagnosis module and the at least one stage of transient photoelectric diagnosis module.
10. The solar cell spatial defect grading diagnostic system according to claim 9, wherein the adjustable clamp comprises a magnet base and a movable magnetic clamp disposed on the magnet base, the magnet base and the magnetic clamp being attracted to each other to secure the solar cell under test between the magnetic clamps; the probe includes a probe arm and/or a conductive film disposed at the adjustable clamp.

Description

Solar cell space defect grading diagnosis system Technical Field The utility model relates to the technical field of photoelectric measurement, in particular to a solar cell space defect grading diagnosis system. Background Solar cells are an important clean energy technology that is widely used in industry and life by directly converting solar energy into electric energy. The focus of solar cell applications is on how to produce solar cell devices with large area, few defects and uniform performance, so it is also important to precisely locate and study the nature of defects to optimize the solar cell production process. Techniques for studying macroscopic defects such as electroluminescence or techniques for studying microscopic non-uniformities such as the micro-area J-V curve technique have emerged. However, the existing characterization means either only look at macroscopic device improvement or are limited by microscopic performance characterization, and cannot be used for solar cells with different structures, or defect research on the same solar cell with different dimensions. Therefore, in order to meet the research needs of solar cells with different structures and to perform defect characterization on the solar cells from a macroscopic device level and a microscopic uniformity level at the same time, development of a spatial defect diagnosis scheme capable of performing macroscopic-microscopic, rapid positioning and grading research is needed. Disclosure of utility model In view of the above, the present utility model proposes a solar cell spatial defect classification diagnostic system that overcomes or at least partially solves the above-mentioned problems. The utility model aims to provide a solar cell space defect grading diagnosis system which can realize grading research and rapid positioning of space defects of semiconductor devices such as solar cells. A further object of the present utility model is to achieve accurate measurement of transient photoelectric properties of semiconductor devices such as solar cells at different spatial scales. It is yet a further object of the present utility model to further improve the accuracy of defect localization. It is still a further object of the present utility model to achieve defect localization and transient photoelectric property measurement of semiconductor devices such as solar cells in different material systems, different structures, different dimensions and different operating conditions. In particular, according to an aspect of the present utility model, there is provided a solar cell spatial defect classification diagnosis system including: The electroluminescence diagnosis module is corresponding to the electroluminescence test bit and is configured to excite the electroluminescence phenomenon of the solar cell to be tested and collect the electroluminescence image of the solar cell to be tested; The at least one level of transient photoelectric diagnosis module corresponds to the at least one photoelectric test bit respectively, and each level of transient photoelectric diagnosis module is configured to excite transient photoelectric signals in a corresponding target range of the solar cell to be detected and collect transient photoelectric properties of the solar cell to be detected under excitation; the sample stage is used for holding the solar cell to be tested and connecting the solar cell to be tested into the electroluminescent diagnosis module and the at least one-stage transient photoelectric diagnosis module; Accurate displacement means arranged to cause the sample stage to be positioned at different test sites in order from the electroluminescent test site to each of the optoelectronic test sites, and The automatic control and data processing unit is respectively connected with the electroluminescence diagnosis module, the at least one stage of transient photoelectric diagnosis module and the accurate displacement device and is configured to control the operation of the components connected with the automatic control and data processing unit, collect electroluminescence images and transient photoelectric properties, and gradually determine the defect position of the solar cell to be detected according to the electroluminescence images and the transient photoelectric properties. Optionally, the electroluminescent diagnostic module comprises: The imaging instrument is arranged corresponding to the electroluminescence test position and is used for collecting electroluminescence images of the solar battery to be tested; the at least one stage transient optoelectronic diagnostic module includes: At least one stage of laser light source respectively corresponding to the at least one photoelectric test bit, each stage of laser light source configured to generate pulse laser light to excite transient photoelectric signals in a corresponding target range of the solar cell to be tested, and The transient photoelectric measurement uni