CN-224225075-U - Double-crystal probe assembly capable of being quickly disassembled and assembled and automatic wheel flaw detection equipment

CN224225075UCN 224225075 UCN224225075 UCN 224225075UCN-224225075-U

Abstract

The utility model discloses a quick-detachable bimorph probe assembly and automatic wheel flaw detection equipment, which comprises a base, probes, elastic components, auxiliary plates and cover plates, wherein the base is provided with two rows of evenly spaced plug holes along the length direction of the base, the upper rows of plug holes and the lower rows of plug holes are arranged in a staggered mode, the probes are inserted into each plug hole of the base, the elastic components are arranged between the probes and the base and are used for vertically lifting the probes upwards, the auxiliary plates are detachably arranged on the base, the auxiliary plates are provided with a plurality of dismounting holes which are in one-to-one correspondence with the probes, the probes are arranged in the dismounting holes in a penetrating mode, the probes are mounted and dismounted through the dismounting holes, the cover plates are positioned above the auxiliary plates, one cover plate corresponds to one probe, the upper parts of the probes can extend out of the through holes, and the cover plates are detachably connected with the auxiliary plates. The utility model can effectively reduce the consumption and damage of the probe and efficiently treat the damage of the probe.

Inventors

GAO XUERONG
LI WEI
PENG JIE
Jiang Guhao
YIN HONGGUANG
LV RUILONG
YANG BING
Hou Baohai
DAI SHUNLI
YANG SHUN
CHEN JINGPU
HU ZHAOSHI
ZHANG BIAO
MA HAOJIE

Assignees

中国铁路上海局集团有限公司南京东车辆段

Dates

Publication Date: 20260512
Application Date: 20250516

Claims (10)

1. A bimorph probe assembly capable of being quickly disassembled and assembled, comprising: the base is provided with two rows of evenly spaced plug holes along the length direction of the base, and the plug holes of the upper row and the plug holes of the lower row are staggered; A probe inserted into each of the insertion holes of the base; An elastic component arranged between the probe and the base and used for vertically lifting the probe upwards; The auxiliary plate is detachably arranged on the base, a plurality of dismounting holes corresponding to the probes one by one are formed in the auxiliary plate, the probes penetrate through the dismounting holes, and the probes are mounted and dismounted through the dismounting holes; The cover plate is positioned above the auxiliary plate, one cover plate corresponds to one probe, a through hole is formed in the cover plate, the upper portion of the probe can extend out of the through hole, and the cover plate is connected with the auxiliary plate in a detachable mode.
2. The rapidly detachable bimorph probe head assembly of claim 1, wherein: The dismounting hole on the auxiliary plate is a special-shaped hole and is used for pressing down the elastic component and limiting the probe in the inserting hole, the probe can circumferentially rotate in the special-shaped hole, and after the probe rotates to a preset angle, the probe can penetrate into or penetrate out of the special-shaped hole.
3. The rapidly detachable bimorph probe head assembly of claim 2, wherein: The probe is divided into an upper rectangular block and a lower inverted circular table, two opposite side surfaces of the rectangular block are close to the bottom surface and horizontally extend outwards to form a convex edge, the probe is rotated to change the positions of the convex edges on two sides, and when the convex edges on two sides fall into the special-shaped holes completely, the probe can penetrate into or out of the special-shaped holes.
4. A rapidly detachable bimorph probe module according to claim 3, wherein: The through hole on the cover plate is a rectangular hole, the size of the through hole is matched with the size of the rectangular block on the upper part of the probe, and the probe cannot be circumferentially rotated after penetrating into the through hole on the cover plate.
5. A rapidly detachable bimorph probe module according to claim 3, wherein: the elastic component is a spring, the elastic component is sleeved on the inverted circular table of the probe, the plug hole on the base is a stepped hole with a wide upper part and a narrow lower part, the lower part of the spring is inserted into the stepped hole to limit the spring downwards, and the joint of the rectangular block and the inverted circular table is used as the upper limit of the spring.
6. The rapidly detachable bimorph probe head assembly of claim 1, wherein: the base is fixedly provided with a plurality of auxiliary plate studs, the auxiliary plate is provided with a plurality of assembly holes corresponding to the auxiliary plate studs one by one, and the auxiliary plate is fixed by matching the screws with the assembly holes and the auxiliary plate studs.
7. The rapidly detachable bimorph probe head assembly of claim 1, wherein: The auxiliary plate is provided with at least two threaded holes in the surrounding area of each dismounting hole, the cover plate is provided with assembly holes coaxially arranged with the threaded holes, and the cover plate is fixed by matching screws with the assembly holes and the threaded holes.
8. The rapidly detachable bimorph probe head assembly of claim 1, wherein: The auxiliary plate is provided with at least two guide rods in the surrounding area of each dismounting hole, the cover plate is provided with assembly holes coaxially arranged with the guide rods, the guide rods penetrate through the assembly holes of the cover plate, and the cover plate is fixed in the pin holes of the guide rods above the cover plate through cotter pins.
9. An automatic wheel inspection apparatus, comprising: a quickly detachable bimorph probe assembly according to any one of claims 1 to 8, arranged on a side of the rail in the direction of extension of the rail; the automatic probe array lifting system is fixed on the side part of the rail, and the bimorph probe assembly is arranged on the automatic probe array lifting system.
10. An automatic wheel inspection apparatus according to claim 9, wherein: The probe array automatic lifting system comprises a protective cover, a lifting device and a driving device, wherein the lifting device and the driving device are arranged in the protective cover, and the bimorph probe assembly is arranged on the lifting device.

Description

Double-crystal probe assembly capable of being quickly disassembled and assembled and automatic wheel flaw detection equipment Technical Field The utility model relates to a bimorph probe assembly capable of being quickly disassembled and assembled, and belongs to the technical field of automatic wheel flaw detection equipment. Background In the field of on-line automatic flaw detection of railway wagon wheels, when the wheels pass, detection probes are in contact with the wheels for detection, periodic damage to the probes exists due to the fact that equipment is frequently impacted by the wheels, the number of the probes in the single equipment is large, although the equipment can accept a certain number of single probes to be damaged without affecting the functions of the equipment through redundant design, the whole probe is required to be detached and maintained and replaced after the critical value is reached, time and labor are wasted, and the maintenance is difficult because a detection system in a standby state is located at a position on the side face of a rail, and the space for normal state maintenance is narrow and development, which is not beneficial to detachment and installation. The service life of the probe is prolonged by the aid of the protecting device, when the probe is damaged and needs to be maintained, the time for maintaining the damaged probe is shortened, maintenance staff can conveniently and quickly maintain the probe, the working time of integral on-line detection of equipment is prolonged, and efficiency is improved. Disclosure of Invention The utility model provides a double-crystal probe assembly capable of being quickly disassembled and assembled, which can effectively reduce the consumption and damage of a probe and efficiently treat the damage of the probe. The utility model is realized according to the following technical scheme: in a first aspect, the present utility model provides a rapidly detachable bimorph probe assembly comprising: the base is provided with two rows of evenly spaced plug holes along the length direction of the base, and the plug holes of the upper row and the plug holes of the lower row are staggered; A probe inserted into each of the insertion holes of the base; An elastic component arranged between the probe and the base and used for vertically lifting the probe upwards; The auxiliary plate is detachably arranged on the base, a plurality of dismounting holes corresponding to the probes one by one are formed in the auxiliary plate, the probes penetrate through the dismounting holes, and the probes are mounted and dismounted through the dismounting holes; The cover plate is positioned above the auxiliary plate, one cover plate corresponds to one probe, a through hole is formed in the cover plate, the upper portion of the probe can extend out of the through hole, and the cover plate is connected with the base in a detachable mode. In some embodiments, the dismounting hole on the auxiliary plate is a special-shaped hole for pressing down the elastic component and limiting the probe in the inserting hole, the probe can circumferentially rotate in the special-shaped hole, and the probe can penetrate into or out of the special-shaped hole after rotating to a preset angle. In some embodiments, the probe is divided into an upper rectangular block and a lower inverted circular table, two opposite side surfaces of the rectangular block are close to the bottom surface and horizontally extend outwards to form a convex edge, the probe is rotated to change the positions of the convex edges on two sides, and when the convex edges on two sides completely fall into the special-shaped hole, the probe can penetrate into or out of the special-shaped hole. In some embodiments, the through hole on the cover plate is a rectangular hole, the size of the through hole is matched with the size of the rectangular block on the upper part of the probe, and the probe cannot be circumferentially rotated after penetrating into the through hole on the cover plate. In some embodiments, the elastic component is a spring, the elastic component is sleeved on the inverted circular table of the probe, the plug hole on the base is a stepped hole with a wide upper part and a narrow lower part, the lower part of the spring is inserted into the stepped hole to limit the spring downwards, and the joint of the rectangular block and the inverted circular table is used as the upper limit of the spring. In some embodiments, a plurality of auxiliary board studs are fixed on the base, a plurality of assembly holes corresponding to the auxiliary board studs one by one are formed in the auxiliary board, and the auxiliary board is fixed through the cooperation of screws, the assembly holes and the auxiliary board studs. In some embodiments, the auxiliary plate is provided with at least two threaded holes in the surrounding area of each dismounting hole, the cover plate is provided with assembly hole