Search

CN-224231248-U - Electronic device testing device

CN224231248UCN 224231248 UCN224231248 UCN 224231248UCN-224231248-U

Abstract

The utility model relates to the field of electronic device testing and discloses an electronic device testing device which comprises a testing box, wherein a testing table is fixedly connected in the testing box, a pressing support is fixedly connected on the testing table, one side of the pressing support is provided with an adjusting hole, an adjusting block is slidably connected in the adjusting hole, a reciprocating pressing mechanism for driving the adjusting block to slide up and down is arranged in the pressing support, one side of the adjusting block is fixedly connected with a connecting arm, the other end of the connecting arm is fixedly connected with a testing arm, a fixing table is fixedly connected under the testing arm on the testing table, a placing groove is arranged on the fixing table, high-temperature testing covers are slidably connected on two sides of the fixing table, a heater is arranged in the high-temperature testing covers, and a moving mechanism for driving the high-temperature testing covers on two sides to slide relatively is arranged on the testing table. Compared with the prior art, the utility model has the advantage that the press life of the key can be tested in a simulated high-temperature environment.

Inventors

  • YI CONG
  • SONG ZEFANG
  • ZHANG SHUPENG

Assignees

  • 山东理工职业学院

Dates

Publication Date
20260512
Application Date
20250529

Claims (6)

  1. 1. The utility model provides an electronic device testing arrangement, includes test box (1), fixedly connected with testboard (2) in test box (1), its characterized in that: the test bench (2) is fixedly connected with a pressing support (3), one side of the pressing support (3) is provided with an adjusting hole (4), an adjusting block (5) is connected in a sliding manner in the adjusting hole (4), a reciprocating pressing mechanism for driving the adjusting block (5) to slide up and down is arranged in the pressing support (3), one side of the adjusting block (5) is fixedly connected with a connecting arm (8), and the other end of the connecting arm (8) is fixedly connected with a test arm; The test bench (2) is located under the test arm and fixedly connected with fixed bench (18), be equipped with the standing groove on fixed bench (18), be located on test bench (2) fixed bench (18) both sides sliding connection has high temperature test cover (20), be equipped with the heater in high temperature test cover (20), be equipped with the drive both sides on test bench (2) high temperature test cover (20) relative sliding's moving mechanism.
  2. 2. The electronic device testing apparatus of claim 1, wherein the reciprocating pressing mechanism comprises a pressing slide plate (6) fixedly connected to the other end of the adjusting block (5) and slidably connected to the pressing support (3), an eccentric cam rotary table (16) matched with the pressing slide plate (6) is rotatably connected to the inner side of the pressing support (3), a first motor (17) for driving the eccentric cam rotary table (16) to rotate is fixedly connected to the pressing support (3), and a spring telescopic rod is fixedly connected between the pressing slide plate (6) and the test board (2).
  3. 3. The electronic device testing apparatus of claim 1, wherein the moving mechanism comprises a moving chute (19) positioned on the test bench (2), a bidirectional screw (23) is rotatably connected to the moving chute (19), a second motor (22) for driving the bidirectional screw (23) to rotate is fixedly connected to the moving chute (19), and moving blocks (21) which are in threaded connection with two sides of the bidirectional screw (23) are fixedly connected to the lower end of the high-temperature test cover (20).
  4. 4. The electronic device testing apparatus of claim 1, wherein the testing arm comprises a fixing arm (9) fixedly connected to one end of the connecting arm (8), an adjusting cavity is formed in the fixing arm (9), an adjusting plate (10) is slidably connected in the adjusting cavity, a pressing rod (11) which slidably extends to the lower end of the fixing arm (9) is fixedly connected to the lower end of the adjusting plate (10), an adjusting bolt (12) is connected to the upper end of the fixing arm (9) in a threaded manner, and the lower end of the adjusting bolt (12) is rotatably connected to the upper end of the adjusting plate (10).
  5. 5. The electronic device testing apparatus of claim 2, wherein the lower end of the spring telescopic rod is fixedly connected with a sliding rod (13), the upper end of the test table (2) is fixedly connected with a telescopic sleeve (15) matched with the sliding rod (13), and a reset spring (14) matched with the sliding rod (13) is fixedly connected in the telescopic sleeve (15).
  6. 6. An electronic device testing apparatus according to claim 2, wherein the upper end of the pressing slide plate (6) is rotatably connected with slide rollers (7) which are uniformly arranged.

Description

Electronic device testing device Technical Field The utility model relates to the technical field of electronic device testing, in particular to an electronic device testing device. Background The electronic device test is to detect the electrical performance, mechanical performance, material process quality, software and hardware functions, etc. of the electronic device, and in the process of detecting the mechanical performance of the electronic device, the detection of the pressing life of the key element is an important test item. The conventional key pressing life testing device only repeatedly presses and detects a key, and is difficult to ensure the stability of the mechanical performance of the key in a high-temperature environment. Disclosure of utility model The utility model aims to solve the technical problems and provide the electronic device testing device which can test the pressing life of a key in a simulated high-temperature environment. In order to solve the technical problems, the technical scheme is that the electronic device testing device comprises a testing box, a testing table is fixedly connected in the testing box, a pressing support is fixedly connected to the testing table, an adjusting hole is formed in one side of the pressing support, an adjusting block is connected in a sliding mode in the adjusting hole, a reciprocating pressing mechanism for driving the adjusting block to slide up and down is arranged in the pressing support, a connecting arm is fixedly connected to one side of the adjusting block, a testing arm is fixedly connected to the other end of the connecting arm, a fixing table is fixedly connected to the testing table, a placing groove is formed in the fixing table, high-temperature testing covers are connected to the testing table in a sliding mode on two sides of the fixing table, a heater is arranged in the high-temperature testing cover, and a moving mechanism for driving the high-temperature testing covers to slide relatively is arranged on the testing table. As an improvement, the reciprocating pressing mechanism comprises a pressing slide plate fixedly connected to the other end of the adjusting block and slidably connected to the pressing support, an eccentric cam rotary table matched with the pressing slide plate is rotatably connected to the inner side of the pressing support, a first motor for driving the eccentric cam rotary table to rotate is fixedly connected to the pressing support, and a spring telescopic rod is fixedly connected between the pressing slide plate and the test bench. As an improvement, the moving mechanism comprises a moving chute positioned on the test bench, a bidirectional screw rod is rotationally connected to the moving chute, a second motor for driving the bidirectional screw rod to rotate is fixedly connected to the moving chute, and moving blocks which are in threaded connection with two sides of the bidirectional screw rod are fixedly connected to the lower end of the high-temperature test cover. As an improvement, the test arm includes fixed arm fixed connection in linking arm one end, be equipped with the regulation chamber in the fixed arm, sliding connection has the regulating plate in the regulation chamber, regulating plate lower extreme fixedly connected with sliding extension reaches the push rod of fixed arm lower extreme, fixed arm upper end threaded connection has adjusting bolt, the adjusting bolt lower extreme rotate connect in the regulating plate upper end. As an improvement, the lower end of the spring telescopic rod is fixedly connected with a sliding rod, the upper end of the test bench is fixedly connected with a telescopic sleeve matched with the sliding rod, and a reset spring matched with the sliding rod is fixedly connected in the telescopic sleeve. As an improvement, the upper end of the pressing sliding plate is rotationally connected with sliding rollers which are uniformly arranged. Compared with the prior art, the utility model has the advantages that the electronic device to be tested is placed in the placing groove of the fixed table, the high-temperature test covers at the two sides are driven by the starting moving mechanism to be mutually close and butted, the heater is started to heat the high-temperature test cover, the reciprocating pressing mechanism is started to drive the test arm to slide up and down in a reciprocating manner, the key is repeatedly pressed, and the pressing life of the key can be tested in a simulated high-temperature environment. Drawings Fig. 1 is an exploded view of an electronic device testing apparatus according to the present utility model. Fig. 2 is a schematic structural diagram of an electronic device testing apparatus according to the present utility model. Fig. 3 is a cross-sectional view of an electronic device testing apparatus of the present utility model. Fig. 4 is a schematic diagram of a pressing bracket structure of an electronic device testing appar