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CN-224231819-U - Chip test socket

CN224231819UCN 224231819 UCN224231819 UCN 224231819UCN-224231819-U

Abstract

The utility model relates to a chip test socket which comprises a base, wherein a placing groove is formed in the base, a placing seat is connected in the placing groove, a fixed pinhole is formed in the placing groove, probe holes are formed in the placing seat, each probe hole is arranged in one-to-one correspondence with each fixed pinhole, a probe is connected in the fixed pinhole in a penetrating way, meanwhile, the upper end of the probe stretches into the probe hole, movable gaps are formed in the left side and the right side of the base, a first movable part is connected in the movable gap, gaps are formed in the left side and the right side of the placing seat, a pressing mechanism is connected on the first movable part, one side of the pressing mechanism penetrates through the gaps and is pressed on the placing seat, the other side of the pressing mechanism is connected with a pressing frame through a second movable part, a movable groove is formed in the base positioned on the side of the movable gap, a sliding block sliding in the movable groove is connected on the pressing frame, and a spring is connected between the pressing frame and the base. The utility model can improve the working efficiency.

Inventors

  • GAO XIANGDONG
  • Xue Zongmin

Assignees

  • 苏州竣合信半导体科技有限公司

Dates

Publication Date
20260512
Application Date
20250519

Claims (8)

  1. 1. The chip test socket is characterized by comprising a base (1), a placement groove (2) is formed in the center of the base (1), a placement seat (3) is connected in the placement groove (2), a regular arranged fixed pin hole (4) is formed in the placement seat (3), each probe pin hole (4) is arranged in a one-to-one correspondence with each fixed pin hole, a probe (5) is connected in the fixed pin hole in a penetrating manner, meanwhile, the upper end of the probe (5) stretches into the probe pin hole (4) and is contacted with a test point placed in the chip in the placement seat, movable gaps are formed in the left side and the right side of the base (1), a first movable piece (6) is connected in the movable gap, gaps are formed in the left side and the right side of the placement seat (3) corresponding to the movable gaps, a pressing mechanism (7) is connected on the first movable piece (6), one side of the pressing mechanism (7) penetrates through the pressing gap on the placement seat, the upper end of the pressing mechanism (7) is contacted with a test point placed in the placement seat, the left side of the sliding block (9) is connected with the movable block (11) through the movable block (9), a spring (12) is connected between the pressing frame (9) and the base (1).
  2. 2. A chip test socket according to claim 1, wherein the pressing mechanism (7) comprises a pressing connection plate (71), the pressing connection plate (71) is movably connected to the first movable piece (6), an auxiliary pressing assembly (72) is connected to one side of the pressing connection plate (71) which is in contact with a product, the other end of the pressing connection plate (71) is connected with the sliding block (11) through the second movable piece, and a guiding jacking table (73) for guiding the pressing connection plate (71) to lift is connected in the movable notch.
  3. 3. The chip test socket of claim 2, wherein the guide jack-up table (73) is provided with a positioning groove, and the pressing connection plate (71) is connected with a positioning block corresponding to the positioning groove.
  4. 4. The chip test socket of claim 2, wherein the auxiliary pressing assembly (72) comprises an auxiliary pressing plate (75), an auxiliary groove (76) is formed in the pressing connection plate (71) at one side in contact with a product, a third movable part (77) is connected to the auxiliary groove (76), the auxiliary pressing plate (75) is movably connected to the third movable part (77), one side of the auxiliary pressing plate (75) is in contact with the product, the other side of the auxiliary pressing plate (75) is located in the auxiliary groove and moves, and an auxiliary spring (74) is connected between the other side of the auxiliary pressing plate (75) and the auxiliary groove (76).
  5. 5. The chip test socket according to claim 4, wherein the third movable member (77) is a rotating shaft.
  6. 6. The chip test socket of claim 1, wherein the first movable member and the second movable member are both shafts.
  7. 7. The chip test socket of claim 1, wherein the base (1) is provided with a guide groove, and the pressing frame (9) is connected with a guide block sliding in the guide groove.
  8. 8. The chip test socket of claim 7, wherein the guide slot is connected with a limiting block for limiting the moving distance of the guide block.

Description

Chip test socket Technical Field The utility model relates to a chip test socket, in particular to a chip test socket suitable for a BGA297 model. Background With the development of science and technology, electronic chips have been widely used in various electronic products. After the mass production of the chips is completed, the qualification of the chips needs to be detected, so that unqualified chips are selected, and qualified chips are reserved. However, in the current semiconductor chip testing field, the test socket mainly includes a lower test socket body, a test probe and a lower test socket probe holding board, so as to complete the testing of the single-sided pin array chip. And the function of the test socket is to test the chips of the single-sided pin array, and the test socket does not have the function of testing the upper surface and the lower surface of the chips at different times aiming at the novel packaging technology chips of the double-sided pin array, especially the main chip surface of the laminated semiconductor chip. Through retrieval, the aging test socket (CN 202222685037.5) capable of assisting chip heat dissipation comprises an upper needle hole plate, an upper metal clamping plate, a lower needle hole plate and probes, wherein the upper surface of the upper needle hole plate is provided with a test groove, the middle part of the upper needle hole plate is provided with four insulating plates, the middle part of the test groove is provided with a first mounting groove, the upper metal clamping plate is fixedly mounted in the first mounting groove, the upper surfaces of the upper metal clamping plate and the lower metal clamping plate are respectively provided with a plurality of probe holes, the upper surface of the lower needle hole plate is provided with a second mounting groove, and the lower metal clamping plate is fixedly mounted in the second mounting groove. The structure realizes the fixation of the product by the cover plate, and the fixing is needed by operators, so that the working efficiency is reduced, and the taking and placing are inconvenient. In view of the above-mentioned drawbacks, the present designer is actively researched and innovated to create a novel structure of the chip test socket, so that the chip test socket has more industrial utilization value. Disclosure of utility model In order to solve the above technical problems, an object of the present utility model is to provide a chip test socket. In order to achieve the above purpose, the utility model adopts the following technical scheme: The utility model provides a chip test socket, includes the base, the central authorities department of base has seted up and has placed the recess, place the recess in-connection and have placed the seat, set up the orderly fixed pinhole of range in the recess of placing, set up the neat probe hole of range on placing the seat, every probe hole sets up with every fixed pinhole looks one-to-one, the cross-under has the probe in the fixed pinhole, the upper end of probe stretches into in the probe hole and contacts with the test point of placing the chip in the seat simultaneously, movable gap has all been seted up on the left side and the right side of base, be connected with first movable part in the movable gap, the breach has all been seted up on the left side and the right side of placing the seat corresponding with movable gap, be connected with hold-down mechanism on the first movable part, wherein hold-down mechanism's one side passes the breach and compresses tightly the frame and links to each other, is located movable notch side set up movable groove on the base, be connected with the sliding block that slides in the movable groove on the frame, be connected with the spring between hold-down frame and the base. Preferably, the pressing mechanism comprises a pressing connection plate, the pressing connection plate is movably connected to the first movable part, an auxiliary pressing assembly is connected to one side of the pressing connection plate, which is in contact with a product, the other end of the pressing connection plate is connected with the sliding block through the second movable part, when the pressing frame is pressed down, the pressing connection plate and the auxiliary pressing assembly are driven to be tilted together and form an open state, and a guide jacking table for guiding the pressing connection plate to be lifted is connected to the movable notch. Preferably, in the chip test socket, a positioning groove is formed in the guide jacking table, and a positioning block corresponding to the positioning groove is connected to the compression connecting plate. Preferably, the auxiliary pressing assembly comprises an auxiliary pressing plate, an auxiliary groove is formed in the pressing connection plate and is in contact with a product, a third movable part is connected to the auxiliary groove, the auxiliary pressing plate is movably