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CN-224231830-U - Traceless test needle die assembly compatible with height difference and test device

CN224231830UCN 224231830 UCN224231830 UCN 224231830UCN-224231830-U

Abstract

The utility model is suitable for the field of flexible printed circuit board testing, and provides a traceless test pin die assembly compatible with height difference and a test device. The traceless test needle mold assembly compatible with the height difference comprises a first needle mold, a fulcrum adjusting unit, a needle head fixing unit, a probe and a double-end needle, wherein the first needle mold is used for controlling the needle outlet amount of the probe and positioning products, the probe sequentially penetrates through the fulcrum adjusting unit and the first needle mold, two ends of the fulcrum adjusting unit are connected with the probe to form an adjustable fulcrum distance, the needle head fixing unit is used for fixing the double-end needle, one end of the double-end needle penetrates out of the needle head fixing unit, and the other end of the double-end needle is connected with the probe. The PIN die assembly can be suitable for the PIN PINs of products with different height differences, improves the applicability, avoids the probe from damaging the products, and improves the product yield.

Inventors

  • XU JINGXIN
  • WAN CHAO

Assignees

  • 深圳市燕麦科技股份有限公司

Dates

Publication Date
20260512
Application Date
20250416

Claims (7)

  1. 1. The traceless test needle die assembly compatible with the height difference is characterized by comprising a first needle die, a fulcrum adjusting unit, a needle head fixing unit, a probe and a double-end needle, wherein the first needle die is used for controlling the needle outlet amount of the probe and positioning products, the probe sequentially penetrates through the fulcrum adjusting unit and the first needle die, two ends of the fulcrum adjusting unit are connected with the probe to form an adjustable fulcrum distance, the needle head fixing unit is used for fixing the double-end needle, one end of the double-end needle penetrates out of the needle head fixing unit, and the other end of the double-end needle is connected with the probe.
  2. 2. The differential height compatible traceless test pin die assembly of claim 1, wherein the fulcrum adjustment unit comprises a second pin die, a third pin die, and an adjustment post, the probe is inserted from the third pin die, sequentially passes through the second pin die and the first pin die, connects one end of the double ended pin, the adjustment post is disposed between the second pin die and the third pin die, the second pin die and the third pin die together are used for confirming a probe fulcrum distance, and the first pin die is used for controlling a needle yield and positioning a product.
  3. 3. The differential height compatible traceless test pin die assembly of claim 2, wherein the adjustment posts are a plurality of support posts of different lengths.
  4. 4. The differential height compatible traceless test pin die assembly of claim 2, wherein the adjustment post is a telescoping post of telescopically varying length.
  5. 5. The differential height compatible traceless test pin die assembly of claim 2, wherein the pin head fixing unit comprises a fourth pin die and a fifth pin die, the fourth pin die is used for fixing the double-ended pin, one end of the double-ended pin penetrates out of the fifth pin die, and the other end of the double-ended pin is connected with the probe.
  6. 6. The differential height compatible traceless test pin die assembly as set forth in claim 5, wherein, the non-trace test pin die assembly compatible with the height difference also comprises a pin die PCB, the pin die PCB is connected with the fifth pin die and touches the extending end of the double-headed pin.
  7. 7. The traceless testing device compatible with the height difference is characterized by comprising a crown plate assembly, a carrier assembly and at least one traceless testing needle die assembly compatible with the height difference, wherein the traceless testing needle die assembly compatible with the height difference is arranged at the bottom of the crown plate assembly and/or the top of the carrier assembly, the carrier assembly is used for placing a product, and the crown plate assembly is used for driving the traceless testing needle die assembly compatible with the height difference to be pressed down onto a connector of the product.

Description

Traceless test needle die assembly compatible with height difference and test device Technical Field The utility model belongs to the field of flexible printed circuit board testing, and particularly relates to a seamless test pin die assembly compatible with a height difference and a test device. Background Along with the popularization of mobile electronic products and the coming of the 5G age, the mobile electronic products such as mobile phones, wearable devices and the like have higher and higher requirements on the size and the functions of the electronic products, and the flexible printed circuit assembly (Flexible Printed Circuit Assembly, FPCA) is used as a connecting and controlling element in the electronic products, so that the test items are more diversified, the form is changeable, the test difficulty is improved, and the test requirements are higher and higher. A flexible circuit board (Flexible Printed Circuit, FPC) is a printed circuit board made of a flexible substrate, and various components are arranged on the FPC at the same time. There are several kinds of components, and the height difference of each component is different, for example, the connector, and the place to be tested is not necessarily on the same horizontal plane. The conventional test method is that the heads of the probes are in the same horizontal plane in theory, however, the test parts of the connectors are different in height, and the compression of the probes is different. The prior testing method is fixed, namely, the probe is fixed on the needle mould, so that if components with inconsistent heights are encountered, inconsistent compression of the probe is caused, and the test needle insertion is unstable. If the probe compression is small, the contact of the product is possibly unstable, and after the probe compression is large, the product is easily pricked or stabbed, and the product is damaged. Therefore, the PIN of the existing connector has a height difference, which easily causes PIN marks after the probe is tested, and further cannot pass quality inspection. Disclosure of Invention The embodiment of the utility model aims to provide a traceless test pin die assembly compatible with height differences, which aims to solve the problems that connectors with different height differences cannot be compatible and traceless test cannot be realized. The embodiment of the utility model discloses a seamless test needle mold assembly compatible with height differences, which comprises a first needle mold, a fulcrum adjusting unit, a needle head fixing unit, a probe and a double-end needle, wherein the first needle mold is used for controlling the needle outlet amount and positioning products of the probe, the probe sequentially passes through the fulcrum adjusting unit and the first needle mold, two ends of the fulcrum adjusting unit are connected with the probe to form an adjustable fulcrum distance, the needle head fixing unit is used for fixing the double-end needle, one end of the double-end needle passes through the needle head fixing unit, and the other end of the double-end needle is connected with the probe. The fulcrum adjusting unit comprises a second needle die, a third needle die and an adjusting column, the probe is inserted from the third needle die, sequentially penetrates through the second needle die and the first needle die and is connected with one end of the double-headed needle, the adjusting column is arranged between the second needle die and the third needle die, the second needle die and the third needle die are used for confirming the fulcrum distance of the probe, and the first needle die is used for controlling the needle discharging amount and positioning products. Further, the adjusting column is a plurality of supporting columns with different lengths. Further, the adjusting column is a telescopic column with a telescopic length. Further, the needle fixing unit comprises a fourth needle die and a fifth needle die, the fourth needle die is used for fixing the double-ended needle, one end of the double-ended needle penetrates out of the fifth needle die, and the other end of the double-ended needle is connected with the probe. Further, the differential height compatible traceless test pin die assembly further comprises a pin die PCB, wherein the pin die PCB is connected with the fifth pin die and touches the extending ends of the double-ended pins. The embodiment of the utility model further provides a compatible height difference traceless testing device, which comprises a crown plate assembly, a carrier assembly and at least one compatible height difference traceless testing needle mold assembly, wherein the compatible height difference traceless testing needle mold assembly is arranged at the bottom of the crown plate assembly and/or the top of the carrier assembly, the carrier assembly is used for placing a product, and the crown plate assembly is used for driving the compatible heigh