CN-224231898-U - Test device
Abstract
The utility model belongs to the technical field of semiconductor testing, and discloses a testing device. The testing device comprises a testing frame, a mounting plate and a fixing assembly. The test frame is internally provided with a plurality of groups of test board card assemblies, each group of test board card assemblies is communicated with a hose, the mounting plate is arranged on the test frame, and the fixing assembly is arranged on the mounting plate and is clamped with the hose to fix the hose. This testing arrangement is through fixing the hose on the mounting panel, ensures that the installation stability of hose is better, can stabilize and carry the cooling liquid for semiconductor test equipment can not take place to rock in the use or in the transportation, has effectively reduced the hose and has disordered the possibility of even taking place to tie knots, is favorable to improving the whole harmony of semiconductor test equipment and stability when removing.
Inventors
- Ye Qiutao
- CHEN JIE
- ZHOU CONGCONG
Assignees
- 杭州长川科技股份有限公司
Dates
- Publication Date
- 20260512
- Application Date
- 20250528
Claims (10)
- 1. A test device, comprising: The testing device comprises a testing frame (1), wherein a plurality of groups of testing board card assemblies are arranged in the testing frame (1), and each group of testing board card assemblies is communicated with a hose; A mounting plate (2) provided on the test frame (1); The fixing component (3) is arranged on the mounting plate (2) and is clamped with the hose so as to fix the hose.
- 2. Testing device according to claim 1, characterized in that the securing assembly (3) comprises a clamping member (31) and a locking member (32), the clamping member (31) being adapted to the hose profile for clamping the hose, the locking member (32) being adapted to lock the hose.
- 3. The testing device according to claim 2, wherein the clamping piece (31) is mounted on the mounting plate (2), and the clamping piece (31) is provided with a clamping notch (311) which is matched with the shape of the pipe body of the hose so as to clamp the pipe body of the hose.
- 4. A testing device according to claim 3, wherein the clamping members (31) are distributed in sequence along the length direction of the mounting plate (2) and are arranged in staggered sequence along the width direction of the mounting plate (2).
- 5. A testing device according to claim 3, wherein the locking members (32) are disposed between adjacent clamping members (31) at intervals and located at one side of the extending direction of the clamping notch (311).
- 6. The test device according to claim 2, wherein the clamping member (31) is a mounting hole formed on the mounting plate (2), the mounting hole being adapted to the shape of the joint of the hose to clamp the joint of the hose.
- 7. Testing device according to claim 2, characterized in that the locking element (32) has a tie for binding the hose.
- 8. The test device according to any one of claims 2-7, wherein the fixing assembly (3) comprises a plurality of groups and is distributed in sequence along the length direction of the mounting plate (2), wherein the clamping members (31) and the locking members (32) are distributed in sequence at intervals.
- 9. The test device of any one of claims 1-7, wherein the test board card assembly comprises a test board card and a cooling plate, the cooling plate is used for cooling the test board card, and the hose is communicated with the cooling plate.
- 10. A test device according to any one of claims 2-7, wherein each of said test board assemblies is provided with a corresponding set of said fixing assemblies (3).
Description
Test device Technical Field The utility model relates to the technical field of semiconductor testing, in particular to a testing device. Background In semiconductor test equipment, timely cooling and heat dissipation of each component in the equipment is an important link for ensuring smooth completion of the test, so that a plurality of hoses can be distributed in the equipment to enable liquid cooling medium to circularly flow in the equipment. In the prior art, the semiconductor test equipment comprises a frame, wherein a plurality of hoses are arranged in the frame, and when an integrated circuit board is inserted in the frame, one path or a plurality of paths of hoses are communicated with the integrated circuit board, so that a cold area liquid circulation flow channel can smoothly conduct efficient heat dissipation on the integrated circuit board. However, during the transportation or moving of the semiconductor test equipment, the hoses may swing along with the shaking of the frame, which easily causes the hoses to intertwine or even tie knots, and affects the normal flow of the cooling liquid. Disclosure of utility model The utility model aims to provide a testing device, which solves the problem that hoses of semiconductor testing equipment are easy to swing, so that a plurality of hoses can be mutually wound or even knotted to influence the normal flow of cooling liquid in the prior art. To achieve the purpose, the utility model adopts the following technical scheme: the present utility model provides a test device comprising: The test device comprises a test frame, wherein a plurality of groups of test board card assemblies are arranged in the test frame, and each group of test board card assemblies is communicated with a hose; The mounting plate is arranged on the test frame; the fixing assembly is arranged on the mounting plate and is clamped with the hose so as to fix the hose. Optionally, the fixing assembly includes a clamping member adapted to the shape of the hose to clamp the hose, and a locking member for locking the hose. Optionally, the clamping piece is installed in the mounting panel, the clamping piece have with the clamping breach of the pipe shaft shape adaptation of hose, in order to carry out the joint to the pipe shaft of hose. Optionally, the clamping pieces are distributed in sequence along the length direction of the mounting plate, and are staggered in sequence along the width direction of the mounting plate. Optionally, the locking piece interval sets up between adjacent the joint piece, and is located the one side of joint breach extending direction. Optionally, the clamping piece is a mounting hole formed on the mounting plate, and the mounting hole is matched with the joint shape of the hose so as to clamp the joint of the hose. Optionally, the locking member has a strap for binding the hose. Optionally, the fixed subassembly includes the multiunit and follows the length direction of mounting panel distributes in proper order, wherein the joint spare with the locking piece interval distribution in proper order. Optionally, the test board card assembly includes test board card and cooling plate, the cooling plate is used for cooling down to test board card, the intercommunication has on the cooling plate the hose. Optionally, each test board card assembly is correspondingly provided with a group of fixing assemblies. The utility model has the beneficial effects that: Through set up the mounting panel on test frame to utilize fixed subassembly fixed hose, with the range of motion of restriction hose, then the activity of the hose that multiunit test integrated circuit board subassembly corresponds all receives the restriction, thereby avoids testing arrangement in the test process and remove the in-process hose and take place to rock. With this testing arrangement through fixing the hose on the mounting panel, ensure that the installation stability of hose is better, can stabilize and carry the cooling liquid for semiconductor test equipment can not take place to rock in the use or in the transportation, effectively reduced the hose and disordered even take place the possibility of knoing, be favorable to improving the whole harmony of semiconductor test equipment and stability when removing. Drawings FIG. 1 is a schematic diagram of a test apparatus according to a first embodiment of the present utility model; FIG. 2 is a schematic view of the mounting plate and the fixture assembly of the test apparatus according to the first embodiment of the present utility model; FIG. 3 is a schematic view of the mounting plate and the fixing assembly of the test apparatus according to the second embodiment of the present utility model. In the figure: 1. A test frame; 2, a mounting plate, 3, a fixing component, 31, a clamping piece, 311, a clamping notch, 32, a locking piece, 4, a liquid inlet connector and 5, a liquid outlet connector. Detailed Description The utility model is des