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CN-224231899-U - Be used for full dynamic testing arrangement of high-voltage silicon heap

CN224231899UCN 224231899 UCN224231899 UCN 224231899UCN-224231899-U

Abstract

The utility model discloses a full-dynamic testing device for a high-voltage silicon stack, which comprises a testing device, wherein the front surface of the testing device is provided with a fixing mechanism, the fixing mechanism comprises a fixing block, the rear surface of the fixing block is provided with a movable groove, the front surface of the fixing block is provided with a through hole, the inside of the through hole is connected with two movable blocks in a sliding manner, the front surface of the movable block is fixedly provided with a movable plate, the front surface of the movable plate is fixedly provided with a rectangular block, the opposite sides of the two movable plates are respectively provided with a sliding groove, the movable plate is moved according to the length of the high-voltage silicon stack, the two movable plates adapt to the length of the high-voltage silicon stack, a C-shaped rod is moved, the C-shaped rod moves with the movable block, and the movable magnetic block and the fixed magnetic block are folded to absorb each other, so that the two ends of the high-voltage silicon stack are clamped, the testing device is started for the fixed test of the high-voltage silicon stack, and the two ends of the high-voltage silicon stack are not required to be contacted by holding two meters for the test, and the test is simple and convenient.

Inventors

  • LIU NIANFU
  • WEI LAI
  • CHEN YIMIN
  • WU ZHIGANG

Assignees

  • 杭州高裕电子科技股份有限公司

Dates

Publication Date
20260512
Application Date
20250609

Claims (6)

  1. 1. The full-dynamic testing device for the high-voltage silicon stack comprises a testing device (1) and is characterized in that a fixing mechanism (2) is arranged on the front surface of the testing device (1), the fixing mechanism (2) comprises a fixing block (107), a movable groove (123) is formed in the rear surface of the fixing block (107), a through hole (108) is formed in the front surface of the fixing block (107), two moving blocks (126) are connected to the inside of the through hole (108) in a sliding mode, a moving plate (104) is fixed to the front surface of the moving block (126), a rectangular block (110) is fixed to the front edge surface of the moving plate (104), and sliding grooves (113) are formed in the opposite sides of the two moving plates (104); The inside sliding connection of spout (113) has connecting rod (122), the other end of connecting rod (122) is fixed with movable block (101), the inside lower surface of movable groove (123) is fixed with magnetic stripe (124), the bottom of movable block (126) is fixed with iron plate (125), the top of rectangle piece (110) is fixed with electric piece (106), the front surface of testing arrangement (1) is fixed with two connecting wires (105), the other end of connecting wire (105) passes movable block (126) with movable plate (104); And with electric piece (106) fixed connection, the top sliding connection of movable block (101) has C type pole (118), slide opening (109) have all been seted up to the left side both sides of fixed block (107), both ends of C type pole (118) respectively with two slide opening (109) sliding connection, the bottom of connecting rod (122) is fixed with movable magnet (117), the left and right sides of movable plate (104) all is fixed with fixed magnet (111).
  2. 2. The full-dynamic testing device for the high-voltage silicon stack, as set forth in claim 1, is characterized in that two moving rods (103) are connected inside the movable block (101) in a sliding manner, clamping plates (115) are fixed at the bottom ends of the moving rods (103), extrusion springs (102) are fixed at the tops of the clamping plates (115), and the other ends of the extrusion springs (102) are fixedly connected with the movable block (101).
  3. 3. The full-dynamic testing device for the high-voltage silicon stack, as set forth in claim 2, wherein the bottom end of the connecting rod (122) is fixed with a compression spring (114), the other end of the compression spring (114) is fixedly connected with the inner lower surface of the sliding groove (113), and the elastic force of the compression spring (114) is smaller than the suction force between the movable magnetic block (117) and the fixed magnetic block (111).
  4. 4. The full-dynamic testing device for a high-voltage silicon stack according to claim 3, wherein a limiting rod (112) is connected inside the connecting rod (122) in a sliding mode, two ends of the limiting rod (112) are connected with the sliding groove (113) in a sliding mode, and the limiting rod (112) is located on the inner side of the compression spring (114).
  5. 5. The full-dynamic testing device for the high-voltage silicon stack, as set forth in claim 4, wherein two rectangular plates (121) are fixed at the bottom of the C-shaped rod (118), ejector rods (116) are slidably connected inside the rectangular plates (121), extrusion blocks (120) are fixed at opposite sides of the two ejector rods (116), inclined surfaces are arranged at one ends, far away from the movable plate (104), of the fixed magnetic blocks (111) and the movable magnetic blocks (117), extension springs (119) are sleeved on the outer sides of the ejector rods (116), and two ends of each extension spring (119) are fixedly connected with the corresponding extrusion blocks (120) and the corresponding rectangular plates (121).
  6. 6. The full-dynamic test device for a high-voltage silicon stack according to claim 5, wherein a pressing block is fixed at one end of the ejector rod (116) far away from the pressing block (120).

Description

Be used for full dynamic testing arrangement of high-voltage silicon heap Technical Field The utility model relates to the technical field of high-voltage silicon stack testing, in particular to a full-dynamic testing device for a high-voltage silicon stack. Background The high voltage silicon stack is also called a silicon column. It is a silicon high-frequency high-voltage rectifier diode. The operating voltage is between several kilovolts and several tens of thousands of volts. It is used for high-frequency high-voltage rectification in black-and-white TV set or other electronic instrument. When the existing high-voltage silicon stack testing device tests the high-voltage silicon stack, the two meter pens are contacted with the two ends of the high-voltage silicon stack to test, so that the high-voltage silicon stack testing device is quite inconvenient, a longer power line is connected between the meter pens and the testing device, the power line is required to be wound when the high-voltage silicon stack testing device is not used for storage, the power line is easy to knot after being wound, and quite inconvenient to use. Disclosure of utility model Aiming at the defects of the prior art, the utility model provides a full-dynamic testing device for a high-voltage silicon stack, which solves the problems proposed by the background art. The utility model is realized by the following technical scheme that the full-dynamic testing device for the high-voltage silicon stack comprises a testing device, wherein the front surface of the testing device is provided with a fixing mechanism, the fixing mechanism comprises a fixing block, the rear surface of the fixing block is provided with a movable groove, the front surface of the fixing block is provided with a through hole, the inside of the through hole is connected with two moving blocks in a sliding manner, the front surface of the moving block is fixedly provided with a moving plate, the front surface of the moving plate is fixedly provided with a rectangular block, and the opposite sides of the two moving plates are respectively provided with a sliding groove; The inside sliding connection of spout has the connecting rod, the other end of connecting rod is fixed with the movable block, the inside lower surface of movable slot is fixed with the magnetic stripe, the bottom of movable block is fixed with the iron plate, the top of rectangle piece is fixed with the electric plate, testing arrangement's front surface is fixed with two connecting wires, the other end of connecting wire passes movable block and movable plate; And with electric plate fixed connection, the top sliding connection of movable block has C type pole, the slide opening has all been seted up to the left side both sides of fixed block, the both ends of C type pole respectively with two slide opening sliding connection, the bottom of connecting rod is fixed with the removal magnetic path, the left and right sides of movable plate all is fixed with fixed magnetic path. Preferably, the inside sliding connection of movable block has two movable rods, the bottom mounting of movable rod has splint, the top of splint is fixed with extrusion spring, extrusion spring's the other end with movable block fixed connection. Preferably, the bottom end of the connecting rod is fixed with a compression spring, the other end of the compression spring is fixedly connected with the inner lower surface of the sliding groove, and the elastic force of the compression spring is smaller than the attractive force between the movable magnetic block and the fixed magnetic block. Preferably, the inside sliding connection of connecting rod has the gag lever post, the both ends of gag lever post with spout sliding connection, the gag lever post is located compression spring's inboard. Preferably, the bottom of C type pole is fixed with two rectangular plates, the inside sliding connection of rectangular plate has the ejector pin, two the opposite side of ejector pin all is fixed with the extrusion piece, fixed magnet with the one end that the movable magnet kept away from the movable plate is equipped with the inclined plane, the outside cover of ejector pin is equipped with extension spring, extension spring's both ends respectively with extrusion piece with rectangular plate fixed connection. Preferably, a pressing block is fixed at one end of the ejector rod away from the pressing block. The utility model provides a full-dynamic testing device for a high-voltage silicon stack. Compared with the prior art, the method has the following beneficial effects: This a full dynamic testing arrangement for high-voltage silicon heap through setting up fixed establishment, removes the movable plate according to the length of high-voltage silicon heap, makes two movable plates adapt to the length of high-voltage silicon heap, moves C type pole, and C type pole carries movable block to remove, and movable magnet piece and fixed m