CN-224231906-U - Shu Laoyi mainboard aging test device

CN224231906UCN 224231906 UCN224231906 UCN 224231906UCN-224231906-U

Abstract

The utility model discloses a Shu Laoyi mainboard aging test device which comprises a test cabinet, wherein a plurality of layers of test frames are arranged in the middle of the test cabinet, a corresponding indicator lamp array is arranged above the test frames, a plurality of mainboard test fixtures are arranged on the test frames, each mainboard test fixture corresponds to one indicator lamp array, the mainboard test fixture comprises a fixture mounting base, a test fixture probe and a mainboard test fixture upper cover plate, the fixture mounting base is divided into an upper layer and a lower layer, the upper layer and the lower layer are mounted at intervals through connecting columns, one part of the test fixture probe penetrates through the upper layer, the other part of the test fixture probe penetrates through the lower layer, and the mainboard test fixture upper cover plate is mounted on the side surface of the upper layer through a hinge. The main board hardware detection device can monitor the temperature function, voltage and pulse output key parameters of the hardware in real time, and can help to find potential hardware faults.

Inventors

HAN JINMING
LI FAN
WANG HUI

Assignees

天津和治友德科技发展有限公司

Dates

Publication Date: 20260512
Application Date: 20250404

Claims (4)

1. Shu Laoyi the main board aging testing device comprises a testing cabinet (1) and is characterized in that a plurality of layers of testing frames (2) are arranged in the middle of the testing cabinet (1), corresponding indicator lamp arrays (3) are arranged above the testing frames (2), a plurality of main board testing clamps (4) are arranged on the testing frames (2), and each main board testing clamp (4) corresponds to one indicator lamp array (3); The main board test fixture (4) comprises a fixture mounting base (5), a test fixture probe (6) and a main board test fixture upper cover plate (7), wherein the fixture mounting base (5) is divided into an upper layer (5.1) and a lower layer (5.2), the upper layer (5.1) and the lower layer (5.2) are installed in a separated mode through a connecting column, one part of the test fixture probe (6) penetrates through the upper layer (5.1), the other part of the test fixture probe penetrates through the lower layer (5.2), and the main board test fixture upper cover plate (7) is installed on the side face of the upper layer (5.1) through a hinge.
2. The Shu Laoyi motherboard burn-in apparatus according to claim 1, wherein the upper layer (5.1) is provided with a recess.
3. The Shu Laoyi motherboard burn-in apparatus according to claim 1, wherein an opening is provided on one side of the motherboard test fixture upper cover plate (7), and a buckle plate (8) is provided at the opening.
4. The device for testing the aging of the Shu Laoyi main board of claim 1, wherein the testing cabinet (1) comprises a cabinet main body (1.1), a touch display (1.2), an industrial personal computer (1.3), a plurality of control switches (1.4) and a radiator (1.5).

Description

Shu Laoyi mainboard aging test device Technical Field The utility model relates to a testing device, in particular to a Shu Laoyi mainboard aging testing device. Background In order to improve the product quality of the vein relaxing instrument, the detection Shu Laoyi is used for detecting the functional deficiency and the battery performance, the detection equipment has high precision and repeatability, the consistent result can be kept in the repeated measurement, the human error is reduced, and the stability of the product quality is ensured. Unqualified products can be rapidly screened, production efficiency is improved, the number of unqualified products is reduced, and the device for testing the aging of the main board of the vein relaxing instrument is provided. Disclosure of utility model In view of the foregoing drawbacks or shortcomings of the prior art, it is desirable to provide a device for burn-in testing a motherboard of a vein relaxing machine. According to the technical scheme provided by the embodiment of the application, shu Laoyi mainboard aging testing device comprises a testing cabinet, wherein the middle part of the testing cabinet is provided with a plurality of layers of testing frames, a corresponding indicator lamp array is arranged above the testing frames, a plurality of mainboard testing fixtures are arranged on the testing frames, and each mainboard testing fixture corresponds to one indicator lamp array; The main board test fixture comprises a fixture mounting base, a test fixture probe and a main board test fixture upper cover plate, wherein the fixture mounting base is divided into an upper layer and a lower layer, the upper layer and the lower layer are installed in a separated mode through a connecting column, one part of the test fixture probe penetrates through the upper layer, the other part of the test fixture probe penetrates through the lower layer, and the main board test fixture upper cover plate is installed on the side face of the upper layer through a hinge. In the utility model, the upper layer is provided with a groove. In the utility model, one side of the upper cover plate of the main board test fixture is provided with an opening, and the opening is provided with a buckle plate. In the utility model, the test cabinet comprises a cabinet main body, a touch display, an industrial personal computer, a plurality of control switches and a radiator. In summary, the application has the following beneficial effects: The main board hardware detection device can monitor the temperature function, voltage and pulse output key parameters of the hardware in real time, and can help to find potential hardware faults. Drawings Other features, objects and advantages of the present application will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the accompanying drawings in which: FIG. 1 is a schematic diagram of the structure of the present utility model; fig. 2 is a schematic structural diagram of a motherboard testing fixture according to the present utility model. Reference numerals in the drawings: The test equipment comprises a test cabinet (1), a test rack (2), an indicator lamp array (3), a main board test fixture (4), a mounting base (5), a test fixture probe (6), a main board test fixture upper cover plate (7), a buckle plate (8), a main board to be tested (9), an upper layer (5.1), a lower layer (5.2), a cabinet main body (1.1), a touch display (1.2), an industrial personal computer (1.3), a control switch (1.4) and a radiator (1.5). Detailed Description The utility model is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting of the utility model. It should be noted that, for convenience of description, only the portions related to the utility model are shown in the drawings. It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other. The application will be described in detail below with reference to the drawings in connection with embodiments. The specific working process of the scheme is as follows: As shown in fig. 1 and fig. 2, a device for testing the aging of a motherboard of a vein relaxing instrument has the following specific working procedures: the first step is to start the test cabinet 1 through the control switch 1.4, then place all the mainboards 9 to be tested on the upper layer 5.1 of the mainboard test fixture 4, and access the pins of the mainboards 9 to be tested through the test fixture probes 6. And secondly, starting the industrial personal computer 1.3 through the control switch 1.4, wherein the industrial personal computer 1.3 wakes up the power supply module and the current detection module, at the moment, the communication