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CN-224232128-U - Temperature control device for testing electronic module and testing equipment

CN224232128UCN 224232128 UCN224232128 UCN 224232128UCN-224232128-U

Abstract

The utility model discloses a temperature control device and test equipment for electronic module testing, wherein the temperature control device comprises a heating module, a fan assembly and a temperature control device, wherein the heating module comprises a heating surface, the heating surface is used for heating an electronic module to be tested, an air channel is arranged on the heating module, the air channel passes through the heating surface, and the fan assembly is used for guiding external air flow to the air channel and entering a temperature control area through the air channel. The utility model improves the temperature control stability of the electronic module during testing, reduces the influence of temperature change on the performance of the electronic module, and can also more easily realize the technical effect of constant temperature control in a temperature control area.

Inventors

  • ZHANG TUOYU

Assignees

  • 浙江力积存储科技股份有限公司

Dates

Publication Date
20260512
Application Date
20250619

Claims (10)

  1. 1. A temperature control device for testing an electronic module, comprising: The heating module comprises a heating surface which is used for heating the electronic module to be tested, which is arranged in the temperature control area, and an air duct is arranged on the heating module and passes through the heating surface so that the air flow passing through the air duct can be preheated; and the fan assembly is used for guiding external airflow to the air duct and entering the temperature control area through the air duct.
  2. 2. The temperature control device for electronic module testing according to claim 1, further comprising a temperature control module for detecting a temperature of the electronic module to be tested and controlling a heating power of the heating module and a power of the fan assembly based on the temperature.
  3. 3. The temperature control device for electronic module testing according to claim 1, wherein the heat generating surface of the heat generating module is capable of conducting heat in a far infrared radiation manner.
  4. 4. A temperature control device for electronic module testing as recited in claim 3, wherein the heat generating module comprises a graphene assembly and the air duct comprises a plurality of through holes disposed on the graphene assembly.
  5. 5. The temperature control device for testing an electronic module according to claim 1, wherein the fan assembly is fixedly arranged on the heating module, an air outlet of the fan assembly corresponds to an air inlet of the air duct, and an air outlet of the air duct corresponds to the temperature control area and the electronic module to be tested.
  6. 6. The temperature control device for testing an electronic module according to claim 5, wherein the heat generating module is disposed above the electronic module to be tested, the fan assembly is fixedly disposed on an upper end surface of the heat generating module, and the air duct includes a through hole penetrating through the heat generating module up and down.
  7. 7. The temperature control device for electronic module testing according to claim 4, wherein the heat generating module further comprises a heat shield, the heat shield being disposed over the electronic module to be tested, the temperature control region being located between the heat shield and the electronic module to be tested; the graphene component is fixed in the heat shield, an opening is formed in the heat shield, and the fan component is fixed on the heat shield and corresponds to the opening.
  8. 8. The temperature control device for testing an electronic module of claim 7, wherein the heat shield is provided with a gas passing hole.
  9. 9. Test apparatus comprising a temperature control device according to any one of claims 1 to 8 and an electronic module to be tested.
  10. 10. The test apparatus of claim 9, wherein the electronic module to be tested comprises a memory bar to be tested, the memory bar to be tested is electrically connected to a test motherboard, the test motherboard is connected to a temperature control module, and the temperature control module detects the temperature of the memory bar to be tested through the test motherboard.

Description

Temperature control device for testing electronic module and testing equipment Technical Field The utility model relates to the technical field of electronic module testing, in particular to a temperature control device and testing equipment for electronic module testing. Background The electronic module usually needs to pass a series of tests to screen unqualified products, taking a memory bank test as an example, and conventional screening test is to insert the finished products after production into a PC motherboard, a server motherboard or a special test motherboard, run preset test degree and pattern data, trigger the occurrence of faults, and achieve the purpose of screening. According to industry research and practice, the temperature has obvious effect on the fault triggering of the memory. Therefore, in the test link of the memory, a heating device can be added to accelerate the screening of unqualified products. In the process of testing the memory bank, the temperature of the memory bank is required to have good uniformity and stability. When the conventional common memory temperature control system is used, when the temperature of the memory bank is higher than a set value, the fan is operated to blow and cool, but at the moment, the air blown by the fan is approximately at room temperature, and the temperature difference between the air and the heating area of the memory bank is larger, so that the temperature fluctuation of the heating area of the memory bank is easy to be larger, and great difficulty is brought to the constant temperature control of the memory bank. Disclosure of utility model The utility model mainly aims to provide a temperature control device for testing an electronic module, which is used for solving the problems that the temperature fluctuation of a temperature control area is large and the stability is difficult to control when the temperature control device is cooled in the related technology. In order to achieve the above object, the present utility model provides a temperature control device for testing an electronic module, comprising: The heating module comprises a heating surface which is used for heating the electronic module to be tested, which is arranged in the temperature control area, and an air duct is arranged on the heating module and passes through the heating surface so that the air flow passing through the air duct can be preheated; and the fan assembly is used for guiding external airflow to the air duct and entering the temperature control area through the air duct. Further, the electronic module temperature control device further comprises a temperature control module, wherein the temperature control module is used for detecting the temperature of the electronic module to be tested and controlling the heating power of the heating module and the power of the fan assembly based on the temperature. Further, the heating surface of the heating module can conduct heat in a far infrared radiation mode. Further, the heating module comprises a graphene assembly, and the air duct comprises a plurality of through holes formed in the graphene assembly. Further, the fan assembly is fixedly arranged on the heating module, an air outlet of the fan assembly corresponds to an air inlet of the air channel, and an air outlet of the air channel corresponds to the temperature control area and the electronic module to be tested. Further, the heating module is arranged above the electronic module to be tested, the fan assembly is fixedly arranged on the upper end face of the heating module, and the air duct comprises a through hole which penetrates through the heating module from top to bottom. Further, the heating module further comprises a heat shield, the heat shield is arranged on the electronic module to be tested, and the temperature control area is positioned between the heat shield and the electronic module to be tested; the graphene component is fixed in the heat shield, an opening is formed in the heat shield, and the fan component is fixed on the heat shield and corresponds to the opening. Further, the heat shield is provided with a gas passing hole. According to another aspect of the present utility model, there is provided a testing apparatus including the above temperature control device and an electronic module to be tested. Further, the electronic module to be tested comprises a memory bar to be tested, the memory bar to be tested is electrically connected with the test main board, the test main board is connected with the temperature control module, and the temperature control module detects the temperature of the memory bar to be tested through the test main board. The electronic module to be tested is provided with a heating module, the heating module comprises a heating surface, the heating surface is used for heating the electronic module to be tested, the heating module is provided with an air duct, the air duct passes through the heating surface, th